CN104064485B - The wire solder joint intensifying method of semiconductor device - Google Patents

The wire solder joint intensifying method of semiconductor device Download PDF

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Publication number
CN104064485B
CN104064485B CN201410308073.7A CN201410308073A CN104064485B CN 104064485 B CN104064485 B CN 104064485B CN 201410308073 A CN201410308073 A CN 201410308073A CN 104064485 B CN104064485 B CN 104064485B
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wire
frame
lead
locking
arc
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CN104064485A (en
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石海忠
郇林香
缪小勇
吴晶
虞国良
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Tongfu Microelectronics Co Ltd
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Nantong Fujitsu Microelectronics Co Ltd
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Publication of CN104064485A publication Critical patent/CN104064485A/en
Priority to US15/106,774 priority patent/US9837371B2/en
Priority to PCT/CN2014/090580 priority patent/WO2016000377A1/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07511Treating the bonding area before connecting, e.g. by applying flux or cleaning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07551Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07551Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
    • H10W72/07552Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in structures or sizes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/521Structures or relative sizes of bond wires
    • H10W72/527Multiple bond wires having different sizes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/547Dispositions of multiple bond wires
    • H10W72/5475Dispositions of multiple bond wires multiple bond wires connected to common bond pads at both ends of the wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/884Die-attach connectors and bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/736Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

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  • Wire Bonding (AREA)

Abstract

本发明提供一种半导体器件的导线焊点强化方法,包括:在框架内引线的焊接区开设至少两个通孔;在所述焊接区焊接导线,所述导线的焊接位置位于两个相邻的所述通孔之间;在所述通孔内设置锁定卡来将所述导线与所述框架内引线紧紧卡箍在一起。本发明提供的上述方案,通过锁定卡将焊接于框架内引线上的导线,牢靠的卡箍在框架内引线上,有效的避免了导线与框架内引线剥离的情况发生,加强了导线与框架内引线的电连接,提高了半导体器件,特别是半导体功率器件的可靠性。

The invention provides a wire welding point strengthening method of a semiconductor device, comprising: opening at least two through holes in the welding area of the lead wire in the frame; welding wires in the welding area, and the welding positions of the wires are located in two adjacent Between the through holes; a locking card is provided in the through holes to tightly clamp the wires and the lead wires in the frame together. In the above scheme provided by the present invention, the wires welded to the lead wires in the frame are firmly clamped on the lead wires in the frame through the locking clip, which effectively avoids the situation that the wires and the lead wires in the frame are peeled off, and strengthens the connection between the wires and the wires in the frame. The electrical connection of the leads improves the reliability of semiconductor devices, especially semiconductor power devices.

Description

半导体器件的导线焊点强化方法Wire solder joint strengthening method for semiconductor devices

技术领域technical field

本发明涉及半导体器件封装技术领域,尤其涉及一种半导体器件的导线焊点强化方法。The invention relates to the technical field of semiconductor device packaging, in particular to a method for strengthening solder joints of semiconductor devices.

背景技术Background technique

在半导体功率器件封装过程中,主要使用铝线、铝带等金属线将芯片和引线框架的框架内引线之间实现有效焊接,以满足功率器件工作时的大电压、大电流等高电性能要求。封装结构示意如图1-图4所示,包括:用以散热和承载芯片2的框架载片台1;用以电连结的框架内引线3;用以连结芯片2与框架内引线3的铝线4和/或铝带5;用以将芯片2粘接在框架载片台1的装片胶6。In the packaging process of semiconductor power devices, metal wires such as aluminum wires and aluminum strips are mainly used to achieve effective welding between the chip and the inner leads of the lead frame to meet the high electrical performance requirements such as high voltage and high current when the power device is working. . The schematic diagram of the packaging structure is shown in Figures 1-4, including: a frame carrier 1 for heat dissipation and carrying the chip 2; a frame inner lead 3 for electrical connection; an aluminum alloy for connecting the chip 2 and the frame inner lead 3 wire 4 and/or aluminum tape 5; die-mounting glue 6 for bonding the chip 2 to the frame loading table 1.

由于功率产品在工作时器件内部温度较高、有时外部工作环境也比较恶劣,要求铝线4和/或铝带5跟框架内引线3之间的焊接可靠性比较高,但是在功率产品可靠性中、实际应用时还是会因为热应力、湿气、过程质量控制的波动等使铝线4、铝带5跟框架内引线3之间产生剥离,导致产品的电参数、功能失效。针对此失效,业内虽然通过键合参数、钢嘴结构、材料、过程分层控制等方面改善焊接可靠性,但是还不能非常有效地避免铝线4、铝带5跟框架内引线3之间的剥离。Due to the high internal temperature of the device when the power product is working, and sometimes the external working environment is relatively harsh, it is required that the welding reliability between the aluminum wire 4 and/or aluminum strip 5 and the lead wire 3 in the frame is relatively high, but the reliability of the power product During medium and practical applications, the aluminum wire 4, the aluminum strip 5 and the inner lead wire 3 of the frame will still be peeled off due to thermal stress, moisture, fluctuations in process quality control, etc., resulting in failure of the electrical parameters and functions of the product. In response to this failure, although the industry has improved welding reliability through bonding parameters, steel nozzle structure, materials, and process layered control, it has not been able to effectively avoid the gap between the aluminum wire 4, the aluminum strip 5, and the lead wire 3 in the frame. peel off.

发明内容Contents of the invention

在下文中给出关于本发明的简要概述,以便提供关于本发明的某些方面的基本理解。应当理解,这个概述并不是关于本发明的穷举性概述。它并不是意图确定本发明的关键或重要部分,也不是意图限定本发明的范围。其目的仅仅是以简化的形式给出某些概念,以此作为稍后论述的更详细描述的前序。A brief overview of the invention is given below in order to provide a basic understanding of some aspects of the invention. It should be understood that this summary is not an exhaustive overview of the invention. It is not intended to identify key or critical parts of the invention nor to delineate the scope of the invention. Its purpose is merely to present some concepts in a simplified form as a prelude to the more detailed description that is discussed later.

本发明提供一种半导体器件的导线焊点强化方法,包括:The invention provides a method for strengthening solder joints of semiconductor devices, comprising:

在框架内引线的焊接区开设至少两个通孔;Open at least two through holes in the soldering area of the lead in the frame;

在所述焊接区焊接导线,所述导线的焊接位置位于两个相邻的所述通孔之间;Welding wires in the welding area, the welding position of the wires is located between two adjacent through holes;

在所述通孔内设置锁定卡来将所述导线与所述框架内引线紧紧卡箍在一起。A locking card is provided in the through hole to tightly clamp the wire and the lead wire in the frame together.

本发明提供的上述方案,通过锁定卡将焊接于框架内引线上的导线,牢靠的卡箍在框架内引线上,有效的避免了导线与框架内引线剥离的情况发生,加强了导线与框架内引线的电连接,提高了半导体器件,特别是半导体功率器件的可靠性。In the above scheme provided by the present invention, the wire welded to the lead wire in the frame is firmly clamped on the lead wire in the frame by locking the card, which effectively avoids the situation that the wire and the lead wire in the frame are peeled off, and strengthens the connection between the wire and the lead wire in the frame. The electrical connection of the leads improves the reliability of semiconductor devices, especially semiconductor power devices.

附图说明Description of drawings

参照下面结合附图对本发明实施例的说明,会更加容易地理解本发明的以上和其它目的、特点和优点。附图中的部件只是为了示出本发明的原理。在附图中,相同的或类似的技术特征或部件将采用相同或类似的附图标记来表示。The above and other objects, features and advantages of the present invention will be more easily understood with reference to the following description of the embodiments of the present invention in conjunction with the accompanying drawings. The components in the drawings are only to illustrate the principles of the invention. In the drawings, the same or similar technical features or components will be denoted by the same or similar reference numerals.

图1为现有技术的结构示意图;Fig. 1 is the structural representation of prior art;

图2为图1的A-A剖面图;Fig. 2 is the A-A sectional view of Fig. 1;

图3为另一现有技术的结构示意图;Fig. 3 is a structural schematic diagram of another prior art;

图4为图3的B-B剖面图;Fig. 4 is the B-B sectional view of Fig. 3;

图5为采用本发明实施例方法所获得的半导体器件的导线焊点强化结构的示意图;FIG. 5 is a schematic diagram of a strengthened structure of a wire solder joint of a semiconductor device obtained by a method according to an embodiment of the present invention;

图6为图5的C-C剖面图;Fig. 6 is the C-C sectional view of Fig. 5;

图7为本发明实施例中将锁定卡向框架内引线上安装的示意图;Fig. 7 is a schematic diagram of installing the locking card on the lead wire in the frame in the embodiment of the present invention;

图8为本发明实施例中锁定卡安装于框架内引线上的示意图。Fig. 8 is a schematic diagram of the lock card installed on the lead wire in the frame in the embodiment of the present invention.

具体实施方式detailed description

下面参照附图来说明本发明的实施例。在本发明的一个附图或一种实施方式中描述的元素和特征可以与一个或更多个其它附图或实施方式中示出的元素和特征相结合。应当注意,为了清楚的目的,附图和说明中省略了与本发明无关的、本领域普通技术人员已知的部件和处理的表示和描述。Embodiments of the present invention will be described below with reference to the drawings. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not related to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.

本发明实施例提供一种半导体器件的导线焊点强化方法,包括:An embodiment of the present invention provides a method for strengthening solder joints of semiconductor devices, including:

在框架内引线的焊接区开设至少两个通孔;Open at least two through holes in the soldering area of the lead in the frame;

在焊接区焊接导线,导线的焊接位置位于两个相邻的通孔之间;Solder the wire in the welding area, and the welding position of the wire is located between two adjacent through holes;

在通孔内设置锁定卡来将导线与框架内引线紧紧卡箍在一起。A locking card is provided in the through hole to tightly clamp the wire and the lead wire in the frame together.

其中,通孔的数量由所要焊接的导线数量来定,且至少保证每根导线的两侧均至少有一个通孔。例如,要加固两根导线可以采用四个通孔,每个导线两侧均设置独立的通孔。当然,加固两根导线也可以采用三个通孔,即可以公共位于中间的一个通孔,在共用通孔的情况下,被共用的通孔可以采用较大尺寸的孔或长条孔。Wherein, the number of through holes is determined by the number of wires to be soldered, and at least one through hole is ensured on both sides of each wire. For example, four through holes may be used to reinforce two wires, and independent through holes are provided on both sides of each wire. Of course, three through holes can also be used to reinforce the two wires, that is, a through hole located in the middle can be shared. In the case of sharing a through hole, the shared through hole can use a larger-sized hole or a long hole.

本发明提供的上述方案,通过锁定卡将焊接于框架内引线上的导线,牢靠的卡箍在框架内引线上,有效的避免了导线与框架内引线剥离的情况发生,加强了导线与框架内引线的电连接,提高了半导体器件,特别是半导体功率器件的可靠性。In the above scheme provided by the present invention, the wire welded to the lead wire in the frame is firmly clamped on the lead wire in the frame by locking the card, which effectively avoids the situation that the wire and the lead wire in the frame are peeled off, and strengthens the connection between the wire and the lead wire in the frame. The electrical connection of the leads improves the reliability of semiconductor devices, especially semiconductor power devices.

需要说明的是,若焊接区靠近框架内引线边缘位置处时,则至少有一个通孔是设置在边缘上的,则这个通孔可以认为是穿透框架内引线的凹槽。该凹槽的形状例如但不限于为半圆形。It should be noted that if the welding area is close to the edge of the lead in the frame, at least one through hole is provided on the edge, and this through hole can be regarded as a groove penetrating the lead in the frame. The shape of the groove is, for example but not limited to, a semicircle.

如图5、图6所示,采用本发明实施例方法所获得的半导体器件的导线焊点强化结构,包括框架内引线3,框架内引线3的表面具有焊接区,焊接区焊接有导线,还包括锁定卡;导线的两侧均设置有贯穿框架内引线的通孔;锁定卡包括按压部,按压部向外悬伸有锁定部,按压部压在导线上,锁定部穿越通孔,且卡在框架内引线背离导线的一侧。As shown in Fig. 5 and Fig. 6, the wire solder joint strengthening structure of the semiconductor device obtained by the method of the embodiment of the present invention includes a lead wire 3 in the frame, the surface of the lead wire 3 in the frame has a welding area, and the welding area is welded with a wire. It includes a locking card; both sides of the wire are provided with through holes through the lead wires in the frame; the locking card includes a pressing part, and a locking part is suspended from the pressing part, and the pressing part is pressed on the wire, and the locking part passes through the through hole, and the card The side of the lead facing away from the wire within the frame.

具体地,锁定部具有远离所述按压部的悬伸末端,悬伸末端弯折扣于框架内引线3背离导线的一侧。其中,锁定部可以是从按压部向外悬伸的金属条或金属片。金属条或金属片远离按压部的一端即为悬伸末端。在金属条或金属片穿过通孔后,将其悬伸末端进行折弯,使其紧紧的压在框架内引线3的一侧。采用此种结构连接可靠性高,连接工艺易于实现,成本低。Specifically, the locking portion has an overhanging end far away from the pressing portion, and the overhanging end is bent over the side of the lead wire 3 in the frame that is away from the wire. Wherein, the locking part may be a metal strip or a metal sheet that hangs outward from the pressing part. The end of the metal strip or the metal sheet away from the pressing part is the overhanging end. After the metal strip or metal sheet passes through the through hole, its overhanging end is bent so that it is tightly pressed against one side of the lead wire 3 in the frame. Adopting this structure has high connection reliability, easy realization of the connection process, and low cost.

实际使用中,按压部上同向向外悬伸有两个锁定部,两锁定部的悬伸末端相向弯折。相向弯折占用框架内引线侧面的空间小,可以尽量利用框架内引线侧面的空间。作为其中一种优选的实现方式,锁定卡可以采用各边大体呈直线的直边C形结构。In actual use, there are two locking parts hanging outwards in the same direction on the pressing part, and the hanging ends of the two locking parts are bent towards each other. Opposite bending takes up little space on the side of the lead in the frame, so the space on the side of the lead in the frame can be utilized as much as possible. As one of the preferred implementation manners, the locking card may adopt a straight-sided C-shaped structure in which each side is generally straight.

实际使用中,导线可以为铝线4、铝带5或铝线4与铝带5的组合。In actual use, the wire can be aluminum wire 4 , aluminum strip 5 or a combination of aluminum wire 4 and aluminum strip 5 .

在导线采用铝线4时,铝线4背离框架内引线3的一侧具有弧形凸起,按压部具有弧形拱起,弧形凸起与弧形拱起吻合配合,使锁定卡7与导线接触更加紧密,提高了锁定卡7与铝线4连接的稳定性。以锁定卡7采用直边C形结构为例,正对锁定卡7开口的大体呈直线的部分为按压部9,在该大体呈直线的部分的中部设置了弧形拱起,在按压部9的两侧,分别向下延伸形成锁定部10,锁定部10的悬伸末端弯折卡在框架内引线3的下侧面。When the wire adopts the aluminum wire 4, the side of the aluminum wire 4 away from the lead wire 3 in the frame has an arc-shaped protrusion, and the pressing part has an arc-shaped arch, and the arc-shaped protrusion matches the arc-shaped arch, so that the locking card 7 and the arc-shaped arch are matched. The wire contact is closer, which improves the stability of the connection between the locking card 7 and the aluminum wire 4 . Taking the straight-edge C-shaped structure of the locking card 7 as an example, the generally linear part facing the opening of the locking card 7 is the pressing part 9, and an arc-shaped arch is provided in the middle of the generally linear part. The two sides extend downwards respectively to form a locking part 10, and the overhanging end of the locking part 10 is bent and stuck on the lower side of the lead wire 3 in the frame.

在将铝线4及框架内引线通过锁定卡7卡箍在一起的过程中,参见图7、图8,在框架内引线3下方设置垫块13,垫块13上表面设置有与通孔15相通的弧形槽14,弧形槽14从两相邻通孔中的一个的下方向另一个偏移,通过推进机构16向下推进锁定卡7,在锁定部的悬伸末端接触到弧形槽14时,推进机构继续向下运动,促使锁定卡7的悬伸末端沿弧形槽14弯折并卡在框架内引线3的侧面,以将铝线4与框架内引线3紧紧的卡箍在一起。In the process of clamping the aluminum wire 4 and the lead wire in the frame together through the locking clip 7, referring to Fig. 7 and Fig. 8, a spacer 13 is provided under the lead wire 3 in the frame, and the upper surface of the spacer 13 is provided with a through hole 15 Connected arc groove 14, arc groove 14 is shifted from the bottom of one of two adjacent through holes to the other, and the locking card 7 is pushed down by the pushing mechanism 16, and the overhanging end of the locking part contacts the arc. When the groove 14 is reached, the propulsion mechanism continues to move downwards, so that the overhanging end of the locking card 7 is bent along the arc groove 14 and stuck on the side of the lead wire 3 in the frame, so that the aluminum wire 4 and the lead wire 3 in the frame are tightly clamped. Hoop together.

此外,两锁定部的悬伸末端还可以是相背弯折。采用此种结构在实施该方法时,在框架内引线下方设置垫块,垫块上表面设置有与通孔相通的弧形槽,弧形槽从两相邻通孔中的一个的下方向另一个背离,通过推进机构向下推进锁定卡,在锁定部的悬伸末端接触到弧形槽时,推进机构继续向下运动,促使锁定卡7的悬伸末端沿弧形槽相背弯折并卡在框架内引线的侧面,以将铝线与框架内引线紧紧的卡箍在一起。In addition, the overhanging ends of the two locking parts can also be bent opposite to each other. When this structure is used to implement the method, a spacer is provided under the lead in the frame, and the upper surface of the spacer is provided with an arc-shaped groove communicating with the through hole, and the arc-shaped groove is from the bottom of one of the two adjacent through holes to the other. One deviates from, the locking card is pushed downwards by the pushing mechanism, and when the overhanging end of the locking part touches the arc groove, the pushing mechanism continues to move downward, impelling the overhanging end of the locking card 7 to bend back along the arc groove and Clamp on the side of the frame inner lead to tightly clamp the aluminum wire and the frame inner lead together.

在导线采为铝带5时,按压部11朝向铝带5的一侧为平面,平面与铝带5的表面吻合配合,使锁定卡8与导线接触更加紧密,提高了锁定卡8与铝带5连接的稳定性。以锁定卡8采用直边C形结构为例,正对锁定卡8开口的直线的部分为按压部11。在按压部11的两侧,分别向下延伸形成锁定部12,锁定部12的悬伸末端弯折卡在框架内引线3的下侧面。通过锁定卡将铝带5与框架内引线3卡箍在一起的工艺过程与通过锁定卡将铝线4与框架内引线3卡箍在一起的工艺过程相同,这里不再赘述。When the wire is adopted as the aluminum strip 5, the side of the pressing portion 11 facing the aluminum strip 5 is a plane, and the plane matches the surface of the aluminum strip 5, so that the locking card 8 is in closer contact with the wire, and the contact between the locking card 8 and the aluminum strip is improved. 5 The stability of the connection. Taking the straight-sided C-shaped structure of the locking card 8 as an example, the straight line facing the opening of the locking card 8 is the pressing portion 11 . On both sides of the pressing part 11 , locking parts 12 are respectively extended downwards, and the overhanging ends of the locking parts 12 are bent and locked on the lower side of the lead wire 3 in the frame. The process of clamping the aluminum strip 5 and the lead wire 3 in the frame through the locking card is the same as the process of clamping the aluminum wire 4 and the lead wire 3 in the frame through the locking card, and will not be repeated here.

实际使用中,采用本发明实施例方法所获得的半导体器件的导线焊点强化结构还包括框架载片台1,框架载片台1上固定连接有芯片2,可以采用装片胶6将芯片2粘接在框架载片台1上,导线远离框架内引线3的一端与芯片2焊接。In actual use, the wire solder joint strengthening structure of the semiconductor device obtained by the method of the embodiment of the present invention also includes a frame loading table 1, on which the chip 2 is fixedly connected, and the chip 2 can be fixed by using the chip mounting adhesive 6. Adhesive on the frame loading table 1, the end of the wire away from the lead wire 3 in the frame is welded to the chip 2.

此外,需要说明的是,实施该方法通过锁定卡来紧箍导线及框架内引线,可以将垫块13及推进机构16设置在铝线或铝带键合机上,在铝线或铝带键合后直接在铝线或铝带键合机上实施上述方法。当然,也可以将垫块13及推进机构16制作为单独的设备,在铝线或铝带键合后,将框架从铝线或铝带键合机上取下,再在由垫块13及推进机构16组成的设备上实施上述方法。In addition, it should be noted that, in implementing this method, the lead wires and the lead wires in the frame can be tightened by locking the clips, and the spacer 13 and the propulsion mechanism 16 can be arranged on the aluminum wire or aluminum ribbon bonding machine, and the aluminum wire or aluminum ribbon can be bonded Then implement the above method directly on the aluminum wire or aluminum strip bonding machine. Of course, the pad 13 and the propulsion mechanism 16 can also be made as separate equipment. After the aluminum wire or the aluminum strip is bonded, the frame is taken off from the aluminum wire or the aluminum strip bonding machine, and then the pad 13 and the propelling mechanism 16 can be used to advance the frame. The above-mentioned method is implemented on the equipment formed by the mechanism 16.

最后应说明的是:以上实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: it can still be Modifications are made to the technical solutions described in the foregoing embodiments, or equivalent replacements are made to some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims (8)

1.一种半导体器件的导线焊点强化方法,其特征在于,包括:1. A wire solder joint strengthening method for a semiconductor device, characterized in that it comprises: 在框架内引线的焊接区开设至少两个通孔;Open at least two through holes in the soldering area of the lead in the frame; 在所述焊接区焊接导线,所述导线的焊接位置位于两个相邻的所述通孔之间;Welding wires in the welding area, the welding position of the wires is located between two adjacent through holes; 在所述通孔内设置锁定卡来将所述导线与所述框架内引线紧紧卡箍在一起,所述锁定卡包括按压部,所述按压部向外悬伸有锁定部,所述按压部压在所述导线上,所述锁定部穿越所述通孔,且卡在所述框架内引线背离所述导线的一侧;A locking card is provided in the through hole to tightly clamp the wire and the lead wire in the frame together. The locking card includes a pressing part, and a locking part hangs outward from the pressing part. The pressing part The part is pressed on the wire, the locking part passes through the through hole, and is stuck on the side of the lead wire in the frame away from the wire; 所述框架内引线的边缘处设置有凹槽,所述锁定部通过所述凹槽穿过所述框架内引线。A groove is provided at the edge of the lead in the frame, and the locking part passes through the lead in the frame through the groove. 2.根据权利要求1所述的半导体器件的导线焊点强化方法,其特征在于,所述锁定部具有远离所述按压部的悬伸末端,所述悬伸末端弯折扣于所述框架内引线背离所述导线的一侧。2 . The method for strengthening solder joints of semiconductor devices according to claim 1 , wherein the locking portion has an overhanging end far away from the pressing portion, and the overhanging end is bent over the lead in the frame. The side facing away from the wire. 3.根据权利要求2所述的半导体器件的导线焊点强化方法,其特征在于,所述按压部上同向向外悬伸有两个锁定部,两所述锁定部的所述悬伸末端相向弯折。3. The wire solder joint strengthening method of a semiconductor device according to claim 2, characterized in that two locking parts are suspended outwards in the same direction on the pressing part, and the overhanging ends of the two locking parts are Bend towards each other. 4.根据权利要求3所述的半导体器件的导线焊点强化方法,其特征在于,在所述框架内引线下方设置垫块,所述垫块上表面设置有与所述通孔相通的弧形槽,所述弧形槽从两相邻所述通孔中的一个的下方向另一个偏移,向下推进所述锁定卡,使所述锁定卡的悬伸末端沿所述弧形槽弯折并卡在所述框架内引线的侧面。4. The method for strengthening solder joints of semiconductor devices according to claim 3, wherein a spacer is provided under the lead in the frame, and the upper surface of the spacer is provided with an arc that communicates with the through hole. The arc-shaped slot deviates from the bottom of one of the two adjacent through holes to the other, and pushes the locking card downward so that the overhanging end of the locking card bends along the arc-shaped slot. Fold and snap the sides of the leads inside the frame. 5.根据权利要求2所述的半导体器件的导线焊点强化方法,其特征在于,所述按压部上同向向外悬伸有两个锁定部,两所述锁定部的所述悬伸末端相背弯折。5. The wire solder joint strengthening method of a semiconductor device according to claim 2, characterized in that two locking parts are suspended outwards in the same direction on the pressing part, and the overhanging ends of the two locking parts are Bend away from each other. 6.根据权利要求5所述的半导体器件的导线焊点强化方法,其特征在于,在所述框架内引线下方设置垫块,所述垫块上表面设置有与所述通孔相通的弧形槽,所述弧形槽从两相邻所述通孔中的一个的下方向另一个背离,向下推进所述锁定卡,使所述锁定卡的悬伸末端沿所述弧形槽相背弯折并卡在所述框架内引线的侧面。6. The method for strengthening solder joints of semiconductor devices according to claim 5, characterized in that a spacer is provided under the lead in the frame, and the upper surface of the spacer is provided with an arc that communicates with the through hole. The arc-shaped slot deviates from the bottom of one of the two adjacent through holes to the other, and the locking card is pushed downward so that the overhanging ends of the locking card face away from each other along the arc-shaped slot. Bend and snap the sides of the leads inside the frame. 7.根据权利要求1-4任一项所述的半导体器件的导线焊点强化方法,其特征在于,所述导线为铝线,所述铝线背离所述框架内引线的一侧具有弧形凸起,所述按压部具有弧形拱起,所述弧形凸起与所述弧形拱起吻合配合。7. The method for strengthening solder joints of semiconductor devices according to any one of claims 1-4, wherein the wire is an aluminum wire, and the side of the aluminum wire away from the lead in the frame has an arc shape The pressing part has an arc-shaped arch, and the arc-shaped protrusion matches with the arc-shaped arch. 8.根据权利要求1-4任一项所述的半导体器件的导线焊点强化方法,其特征在于,所述导线为铝带,所述按压部朝向所述铝带的一侧为平面,所述平面与所述铝带的表面吻合配合。8. The wire solder joint strengthening method of a semiconductor device according to any one of claims 1-4, wherein the wire is an aluminum strip, and the side of the pressing portion facing the aluminum strip is a plane, so Said plane matches the surface of said aluminum strip.
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