CN104064429A - Mass spectrum ionization source - Google Patents
Mass spectrum ionization source Download PDFInfo
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- CN104064429A CN104064429A CN201410339881.XA CN201410339881A CN104064429A CN 104064429 A CN104064429 A CN 104064429A CN 201410339881 A CN201410339881 A CN 201410339881A CN 104064429 A CN104064429 A CN 104064429A
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- 238000001819 mass spectrum Methods 0.000 title claims abstract description 68
- 239000007788 liquid Substances 0.000 claims abstract description 47
- 239000007789 gas Substances 0.000 claims abstract description 32
- 230000004888 barrier function Effects 0.000 claims abstract description 18
- 239000012159 carrier gas Substances 0.000 claims abstract description 8
- 238000009413 insulation Methods 0.000 claims abstract description 7
- 238000007789 sealing Methods 0.000 claims description 19
- 238000005070 sampling Methods 0.000 claims description 14
- 239000012530 fluid Substances 0.000 claims description 12
- 230000015572 biosynthetic process Effects 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 8
- 230000008602 contraction Effects 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 230000002411 adverse Effects 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 238000004807 desolvation Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 9
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 239000002904 solvent Substances 0.000 abstract description 3
- 238000002347 injection Methods 0.000 abstract 3
- 239000007924 injection Substances 0.000 abstract 3
- 230000001846 repelling effect Effects 0.000 abstract 2
- 239000012495 reaction gas Substances 0.000 abstract 1
- 150000002500 ions Chemical class 0.000 description 20
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 239000012491 analyte Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 150000004045 organic chlorine compounds Chemical class 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000004753 textile Substances 0.000 description 1
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201410339881.XA CN104064429B (en) | 2014-07-16 | 2014-07-16 | Mass spectrum ionization source |
Applications Claiming Priority (1)
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CN201410339881.XA CN104064429B (en) | 2014-07-16 | 2014-07-16 | Mass spectrum ionization source |
Publications (2)
Publication Number | Publication Date |
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CN104064429A true CN104064429A (en) | 2014-09-24 |
CN104064429B CN104064429B (en) | 2017-02-22 |
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Family Applications (1)
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CN201410339881.XA Active CN104064429B (en) | 2014-07-16 | 2014-07-16 | Mass spectrum ionization source |
Country Status (1)
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CN (1) | CN104064429B (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104538276A (en) * | 2014-12-26 | 2015-04-22 | 宁波大学 | Ion source soft ionization device and method under barometric pressure |
CN105355535A (en) * | 2015-09-18 | 2016-02-24 | 宁波华仪宁创智能科技有限公司 | Ion source and ionization method |
CN105758930A (en) * | 2016-03-31 | 2016-07-13 | 东华理工大学 | Gas heat assisting surface desorption normal-pressure chemical ionization source and mass spectrometry method |
CN106783509A (en) * | 2016-11-10 | 2017-05-31 | 宁波华仪宁创智能科技有限公司 | Open type atmospheric pressure ionization device and method |
WO2017103819A1 (en) * | 2015-12-17 | 2017-06-22 | Wolf Jan-Christoph | Use of an ionizing device, device and method for ionizing a gaseous substance and device and method for analyzing a gaseous ionized substance |
CN106898538A (en) * | 2017-03-31 | 2017-06-27 | 广东联捷生物科技有限公司 | Mass ion source |
CN109270049A (en) * | 2018-09-18 | 2019-01-25 | 四川大学 | Atomic Emission Spectral Analysis detection device based on hollow electrode point discharge |
US11201045B2 (en) | 2017-06-16 | 2021-12-14 | Plasmion Gmbh | Apparatus and method for ionizing an analyte, and apparatus and method for analysing an ionized analyte |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101211741A (en) * | 2006-12-28 | 2008-07-02 | 东华理工学院 | Mass spectrometer multifunctional multichannel ion source |
CN101510493A (en) * | 2008-11-18 | 2009-08-19 | 清华大学 | Method and ion source for direct ionization of sample of low-temperature plasma |
WO2010037238A1 (en) * | 2008-10-03 | 2010-04-08 | National Research Council Of Canada | Plasma-based direct sampling of molecules for mass spectrometric analysis |
CN203967030U (en) * | 2014-07-16 | 2014-11-26 | 昆山禾信质谱技术有限公司 | A kind of mass spectrum ionization source |
-
2014
- 2014-07-16 CN CN201410339881.XA patent/CN104064429B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101211741A (en) * | 2006-12-28 | 2008-07-02 | 东华理工学院 | Mass spectrometer multifunctional multichannel ion source |
WO2010037238A1 (en) * | 2008-10-03 | 2010-04-08 | National Research Council Of Canada | Plasma-based direct sampling of molecules for mass spectrometric analysis |
CN101510493A (en) * | 2008-11-18 | 2009-08-19 | 清华大学 | Method and ion source for direct ionization of sample of low-temperature plasma |
CN203967030U (en) * | 2014-07-16 | 2014-11-26 | 昆山禾信质谱技术有限公司 | A kind of mass spectrum ionization source |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104538276A (en) * | 2014-12-26 | 2015-04-22 | 宁波大学 | Ion source soft ionization device and method under barometric pressure |
CN105355535A (en) * | 2015-09-18 | 2016-02-24 | 宁波华仪宁创智能科技有限公司 | Ion source and ionization method |
CN108701578A (en) * | 2015-12-17 | 2018-10-23 | 普拉斯米昂有限责任公司 | The purposes of ionization device, the method for device and the gaseous material for ionization and the device and method for analyzing the gaseous material being ionized |
CN108701578B (en) * | 2015-12-17 | 2020-11-03 | 普拉斯米昂有限责任公司 | Ionization device, ionization method, ionization application, analyzer and method for analyzing sample substances |
WO2017103819A1 (en) * | 2015-12-17 | 2017-06-22 | Wolf Jan-Christoph | Use of an ionizing device, device and method for ionizing a gaseous substance and device and method for analyzing a gaseous ionized substance |
US10777401B2 (en) | 2015-12-17 | 2020-09-15 | Plasmion Gmbh | Use of an ionizing device, device and method for ionizing a gaseous substance and device and method for analyzing a gaseous ionized substance |
CN105758930A (en) * | 2016-03-31 | 2016-07-13 | 东华理工大学 | Gas heat assisting surface desorption normal-pressure chemical ionization source and mass spectrometry method |
CN105758930B (en) * | 2016-03-31 | 2018-08-21 | 东华理工大学 | A kind of gas hot auxiliary surface desorption atmospheric chemical ionization source and mass spectrometric analysis method |
CN106783509B (en) * | 2016-11-10 | 2018-02-09 | 宁波华仪宁创智能科技有限公司 | Open type atmospheric pressure ionization device and method |
CN106783509A (en) * | 2016-11-10 | 2017-05-31 | 宁波华仪宁创智能科技有限公司 | Open type atmospheric pressure ionization device and method |
CN106898538B (en) * | 2017-03-31 | 2019-10-22 | 广东联捷生物科技有限公司 | Mass ion source |
CN106898538A (en) * | 2017-03-31 | 2017-06-27 | 广东联捷生物科技有限公司 | Mass ion source |
US11201045B2 (en) | 2017-06-16 | 2021-12-14 | Plasmion Gmbh | Apparatus and method for ionizing an analyte, and apparatus and method for analysing an ionized analyte |
US11923184B2 (en) | 2017-06-16 | 2024-03-05 | Plasmion Gmbh | Apparatus and method for ionizing an analyte, and apparatus and method for analyzing an ionized analyte |
CN109270049A (en) * | 2018-09-18 | 2019-01-25 | 四川大学 | Atomic Emission Spectral Analysis detection device based on hollow electrode point discharge |
Also Published As
Publication number | Publication date |
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CN104064429B (en) | 2017-02-22 |
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Owner name: GUANGZHOU HEXIN ANALYTICAL INSTRUMENT CO., LTD. SH Effective date: 20150129 |
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Inventor after: Liu Jixing Inventor after: Zhu Hui Inventor after: Cheng Ping Inventor after: Huang Zhengxu Inventor after: Gao Wei Inventor after: Dong Junguo Inventor after: Zhou Zhen Inventor after: Fu Zhong Inventor before: Cheng Ping Inventor before: Liu Jixing Inventor before: Zhu Hui Inventor before: Dong Junguo Inventor before: Zhou Zhen |
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Free format text: CORRECT: INVENTOR; FROM: CHENG PING LIU JIXING ZHU HUI DONG JUNGUO ZHOU ZHEN TO: LIU JIXING ZHU HUI CHENG PING HUANG ZHENGXU GAO WEI DONG JUNGUO ZHOU ZHEN FU ZHONG |
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TA01 | Transfer of patent application right |
Effective date of registration: 20150129 Address after: 215311 Jiangsu City, Suzhou province Kunshan City, Pakistan, Xueyuan Road, No. 828, Pudong Software Park, building 2, building 3 Applicant after: Kunshan Hexin Zhipu Technology Co.,Ltd. Applicant after: Guangzhou Hexin Analytical Instrument Co., Ltd. Applicant after: Shanghai University Address before: 215311 Jiangsu City, Suzhou province Kunshan City, Pakistan, Xueyuan Road, No. 828, Pudong Software Park, building 2, building 3 Applicant before: Kunshan Hexin Zhipu Technology Co.,Ltd. |
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Address after: 215311 Jiangsu City, Suzhou province Kunshan City, Pakistan, Xueyuan Road, No. 828, Pudong Software Park, building 2, building 3 Applicant after: Kunshan Hexin Zhipu Technology Co.,Ltd. Applicant after: Guangzhou Hexin Instruments Co., Ltd. Applicant after: Shanghai University Address before: 215311 Jiangsu City, Suzhou province Kunshan City, Pakistan, Xueyuan Road, No. 828, Pudong Software Park, building 2, building 3 Applicant before: Kunshan Hexin Zhipu Technology Co.,Ltd. Applicant before: Guangzhou Hexin Analytical Instrument Co., Ltd. Applicant before: Shanghai University |
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Address after: 510530 Room 102, building A3, No. 11, Kaiyuan Avenue, Huangpu District, Guangzhou City, Guangdong Province Patentee after: GUANGZHOU HEXIN INSTRUMENT Co.,Ltd. Patentee after: KUNSHAN HEXIN MASS SPECTROMETRY TECHNOLOGY Co.,Ltd. Patentee after: Shanghai University Address before: 215311 3 floor, 2 building, Pudong Software Park, 828 Xueyuan Road Town, Kunshan, Suzhou, Jiangsu. Patentee before: KUNSHAN HEXIN MASS SPECTROMETRY TECHNOLOGY Co.,Ltd. Patentee before: GUANGZHOU HEXIN INSTRUMENT Co.,Ltd. Patentee before: Shanghai University |
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Address after: 510535 No. 16, Xinrui Road, Huangpu District, Guangzhou, Guangdong Patentee after: GUANGZHOU HEXIN INSTRUMENT Co.,Ltd. Patentee after: KUNSHAN HEXIN MASS SPECTROMETRY TECHNOLOGY Co.,Ltd. Patentee after: Shanghai University Address before: 510530 Room 102, building A3, No. 11, Kaiyuan Avenue, Huangpu District, Guangzhou City, Guangdong Province Patentee before: GUANGZHOU HEXIN INSTRUMENT Co.,Ltd. Patentee before: KUNSHAN HEXIN MASS SPECTROMETRY TECHNOLOGY Co.,Ltd. Patentee before: Shanghai University |
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