CN104007313A - Chip detection method and system in testing process - Google Patents

Chip detection method and system in testing process Download PDF

Info

Publication number
CN104007313A
CN104007313A CN201410193767.0A CN201410193767A CN104007313A CN 104007313 A CN104007313 A CN 104007313A CN 201410193767 A CN201410193767 A CN 201410193767A CN 104007313 A CN104007313 A CN 104007313A
Authority
CN
China
Prior art keywords
described
chip
pick
up unit
reference time
Prior art date
Application number
CN201410193767.0A
Other languages
Chinese (zh)
Inventor
李国强
吴大畏
陈寄福
Original Assignee
深圳市硅格半导体有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市硅格半导体有限公司 filed Critical 深圳市硅格半导体有限公司
Priority to CN201410193767.0A priority Critical patent/CN104007313A/en
Publication of CN104007313A publication Critical patent/CN104007313A/en

Links

Abstract

The invention discloses a chip detection method and system in a testing process. A detecting device is connected with a chip; when the detecting device receives a detection instruction, clock frequency of an oscillator is obtained according to external reference time signals; the detecting device judges whether the clock frequency of the oscillator is within a preset frequency range, if the clock frequency of the oscillator is not in the preset frequency range, frequency parameters of the clock frequency are adjusted, and the adjusted frequency parameters are stored in the chip. According to the method and system, the situation that due to performance differences of chips in different batches, performance differences of finished products with the chips used occur can be prevented. Besides, a high-precision internal oscillator does not need to be used, the circuit structure of the internal oscillator does not need to be changed, and reduction of cost is facilitated.

Description

Chip detecting method in test process and system

Technical field

The present invention relates to chip testing field, relate in particular to chip detecting method and system in test process.

Background technology

Clock signal in chip comprises two kinds of sources: external oscillator, internal oscillator.The signal accuracy of external oscillator is high, cost is high, volume is large, and internal oscillator precision is low, cost is low, volume is little.

For the chip that uses internal oscillator, unstable due to manufacturing process, the reasons such as the difference of working environment, in the process of this chip of large-scale production, the clock frequency that its internal oscillator produces can be drifted about, clock accuracy is therefore undesirable, and the clock frequency of internal oscillator can directly affect the performance of chip, cause the properties of product of different batches to occur difference, therefore, in chip large-scale production, its internal oscillator clock frequency is undesirable, thereby causes the problem of performance difference of each batch of chip urgently to be resolved hurrily.

Foregoing only, for auxiliary understanding technical scheme of the present invention, does not represent and admits that foregoing is prior art.

Summary of the invention

Fundamental purpose of the present invention is to provide chip detecting method and the system in test process, be intended in testing process, clock frequency to the internal oscillator of chip detects, thereby to prevent the undesirable performance difference that causes each batch of chip of clock frequency of internal oscillator.

For achieving the above object, the chip detecting method in the test process that the embodiment of the present invention provides, comprises the following steps:

Pick-up unit set up with chip between be connected;

Pick-up unit, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal;

Whether the clock frequency that pick-up unit judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.

Preferably, described pick-up unit is when receiving detection instruction, and the step of obtaining the clock frequency of oscillator according to outside reference time signal comprises:

Pick-up unit utilizes described outside reference time signal to carry out timing and obtains time value;

Pick-up unit receiving chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output;

Pick-up unit, according to described time value and described count value, obtains the clock frequency of described oscillator.

Preferably, described chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output, and the step that described count value is sent to pick-up unit comprises:

Chip, when described outside reference time signal being detected and occur to change for the first time, starts the clock signal of oscillator output to count;

Chip, when described outside reference time signal being detected and occur to change for the second time, stops the clock signal of oscillator output to count, and exports described count value to pick-up unit.

Preferably, described pick-up unit sends outside reference time signal to chip, and utilizes outside reference time signal to carry out the step that timing obtains time value to comprise:

Pick-up unit is controlled described outside reference time signal and is occurred to change for the first time, and starts timing;

Pick-up unit is controlled described outside reference time signal and is occurred to change for the second time, and stops timing and obtain described time value.

Preferably, described pick-up unit foundation comprises with the step being connected between chip afterwards:

Pick-up unit obtains the high-precision described outside reference time signal that external clock source sends, and described outside reference time signal is offered to chip.

Chip detecting system in the test process that the embodiment of the present invention further provides, comprises pick-up unit, and described pick-up unit is used for:

Set up with chip between be connected;

When receiving detection instruction, according to outside reference time signal, obtain the clock frequency of oscillator;

Whether the clock frequency that judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.

Preferably, described pick-up unit also for:

Utilize described outside reference time signal to carry out timing and obtain time value;

Receiving chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output;

According to described time value and described count value, obtain the clock frequency of described oscillator.

Preferably, described system also comprises chip, and described chip is used for:

When described outside reference time signal being detected and occur to change for the first time, start the clock signal of oscillator output to count;

When described outside reference time signal being detected and occur to change for the second time, stop the clock signal of oscillator output to count, export described count value to pick-up unit.

Preferably, described pick-up unit also for:

Control described outside reference time signal and occur to change for the first time, and start timing;

Control described outside reference time signal and occur to change for the second time, and stop timing and obtain described time value.

Preferably, described pick-up unit also for:

Obtain the high-precision described external timing signal that external reference clock signal source is sent, and described external reference clock signal is offered to chip.

Embodiment of the present invention pick-up unit set up with chip between be connected; Pick-up unit, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal; Whether the clock frequency that pick-up unit judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.The embodiment of the present invention is in the process of the finished product of test use chip, utilize clock frequency that external detection device judges described oscillator whether within the scope of predeterminated frequency, for the clock frequency of the oscillator chip within the scope of predeterminated frequency not, it is undesirable chip, the frequency parameter of the clock frequency of its oscillator is adjusted, thus prevent different batches chip performance difference and cause the end properties difference of using this chip.In addition, the embodiment of the present invention does not need to use high-precision internal oscillator not need to change the circuit structure of internal oscillator yet, is conducive to reduce costs.

Accompanying drawing explanation

Fig. 1 is the schematic flow sheet of chip detecting method the first embodiment in test process of the present invention;

Fig. 2 is the schematic flow sheet of chip detecting method the second embodiment in test process of the present invention;

Fig. 3 is the waveform schematic diagram of the clock signal of chip detecting method peripheral signal reference time in Fig. 2 test process and oscillator output;

Fig. 4 is the high-level schematic functional block diagram of chip detecting system one embodiment in test process of the present invention.

The realization of the object of the invention, functional characteristics and advantage, in connection with embodiment, are described further with reference to accompanying drawing.

Embodiment

Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.

The invention provides the chip detecting method in a kind of test process.

With reference to Fig. 1, Fig. 1 is the schematic flow sheet of chip detecting method the first embodiment in test process of the present invention.

In the first embodiment of described method, comprise the following steps:

Step S01, pick-up unit set up with chip between be connected;

Step S02, pick-up unit, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal;

In the process that the finished product of use chip is tested, chip is detected.First, pick-up unit set up with chip between be connected, pick-up unit is when receiving detection instruction, according to outside reference time signal, obtain the clock frequency of oscillator, for example, pick-up unit is counted outside signal reference time, the clock signal of oscillator output is counted simultaneously, within one identical period, obtain the second count value of the first count value of outside reference time signal and the clock signal of oscillator output, the ratio of the frequency of the clock signal of the frequency of outside reference time signal and oscillator output is the first ratio, the ratio of the clock signal of the first count value and oscillator output is the second ratio, and the first ratio equates with the second ratio, wherein the frequency of outside reference time signal is known also fixing, therefore, the frequency that can calculate the clock signal of oscillator output is the clock frequency of oscillator.The method of obtaining the clock frequency of oscillator according to outside reference time signal can also be to utilize the outside reference time to carry out timing, the clock signal of oscillator output is counted, according to the clock frequency of the clocking value obtaining and count value calculating oscillator simultaneously.

Step S03, pick-up unit judges that the clock frequency of described oscillator is whether within the scope of predeterminated frequency;

Step S04, if not, adjusts the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip; If so, stop carrying out.

Pick-up unit is according to the clock frequency of the oscillator that obtains, judges that the clock frequency of oscillator is whether within the scope of predeterminated frequency.Wherein predeterminated frequency scope is the setting of the historical data of pick-up unit based on predeterminated frequency scope, or pick-up unit arranging of triggering based on user's side technician instruction arranges.

Pick-up unit, when the clock frequency of judging oscillator is not within the scope of predeterminated frequency, is adjusted the frequency parameter of clock frequency, and frequency parameter refers to the parameter of the clock frequency that determines oscillator.After the frequency parameter of clock frequency is adjusted, the frequency parameter after adjusting is stored in chip, when the clock frequency of judging oscillator is within the scope of predeterminated frequency, stop carrying out subsequent step.

Chip when being used at every turn, and as chip inserted on computers time, chip reads the frequency parameter after the adjustment of storage, and based on frequency parameter and according to the clock frequency of the frequency parameter configuration oscillator reading.Now, the clock frequency of oscillator is within the scope of predeterminated frequency.

It should be noted that the frequency parameter after adjustment is stored in chip, if no longer change frequency parameter, chip when being used at every turn so, and the clock frequency of the oscillator of configuration also no longer changes.

The present embodiment pick-up unit set up with chip between be connected; Pick-up unit, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal; Whether the clock frequency that pick-up unit judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.The present embodiment is in the process of the finished product of test use chip, utilize clock frequency that external detection device judges described oscillator whether within the scope of predeterminated frequency, for the clock frequency of the oscillator chip within the scope of predeterminated frequency not, it is undesirable chip, the frequency parameter of the clock frequency of its oscillator is adjusted, thereby prevented from causing because of the performance difference of the chip of different batches the end properties difference of using this chip.In addition, the present embodiment does not need to use high-precision internal oscillator not need to change the circuit structure of internal oscillator yet, is conducive to reduce costs.

Please, referring again to Fig. 1, in one embodiment of the present invention, described pick-up unit foundation comprises with the step being connected between chip afterwards:

Pick-up unit obtains the high-precision described external reference clock signal that external clock source sends, and described external reference clock signal is offered to chip.

The high accurate clock signal that outside reference time signal is sent for the signal source of clock with pick-up unit communication connection.Pick-up unit obtains the high-precision described clock signal that external clock source sends, and offers chip, and after carrying out this step, pick-up unit and chip have all obtained external reference clock signal.

Because the clock frequency of oscillator is obtained based on outside reference time signal, therefore, the precision of outside reference time signal has determined the accuracy of the clock frequency of the oscillator that obtains, and the precision of outside reference time signal is higher, and the clock frequency of the oscillator obtaining is just more accurate.In addition, outside reference time signal can be also the clock signal of one section of known duration.

With reference to Fig. 2, Fig. 2 is the schematic flow sheet of chip detecting method the second embodiment in test process of the present invention.

In the second embodiment of described method, the difference of the present embodiment and the first embodiment is, the present embodiment is on the basis of the first embodiment, and described pick-up unit is when receiving detection instruction, and the step of obtaining the clock frequency of oscillator according to outside reference time signal comprises:

Step S21, pick-up unit utilizes described outside reference time signal to carry out timing and obtains time value;

Step S22, pick-up unit receiving chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output;

Step S23, pick-up unit, according to described time value and described count value, obtains the clock frequency of described oscillator.

Pick-up unit utilizes outside reference time signal to carry out timing and obtains time value, chip is counted the clock signal of oscillator output simultaneously, after experience a period of time, pick-up unit can arrange the time of timing, automatically stop timing, also can the instruction based on user's side technician stop timing simultaneously and obtain time value, when stopping timing, control chip stops counting, obtain count value, can arrange that to take the one-period of clock signal of oscillator output be unit count, also can arrange that to take the number of times that the clock signal of oscillator output changes be unit count.According to the time value obtaining and count value, calculate the clock frequency of oscillator.For example, pick-up unit utilizes outside reference time signal to carry out timing and obtains time value, chip be take the one-period of clock signal to the clock signal of oscillator output and is counted to get count value as digit, this count value is in one period of reference time for time value representative, the number in the cycle of the clock signal signal experience of oscillator output, is count value the clock frequency of oscillator divided by time value.

It should be noted that time value is longer, the error of calculation of the clock frequency of oscillator is just less, and the value of the clock frequency of the oscillator obtaining is just more accurate.

The precise time value that the present embodiment pick-up unit utilizes the timing of outside reference time signal to obtain, chip counts to get to the clock signal of oscillator output the clock frequency that count value can calculate oscillator accurately, and time value is longer, the clock frequency of the oscillator calculating is more accurate.

Please, referring again to Fig. 2, in one embodiment of the present invention, described chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output, and the step that described count value is sent to pick-up unit comprises:

Chip, when described outside reference time signal being detected and occur to change for the first time, starts the clock signal of oscillator output to count;

Chip, when described outside reference time signal being detected and occur to change for the second time, stops the clock signal of oscillator output to count, and exports described count value to pick-up unit.

The waveform of outside reference time signal can be sine wave, cosine wave (CW), square wave etc., chip is when outside reference time signal being detected and occur to change for the first time, start the clock signal of oscillator output to count, chip detects the variation of outside reference time signal in real time, if the outside reference time being detected occurs to change for the second time, stop the clock signal of oscillator output to count, output count value is to pick-up unit.It should be noted that, the condition that flip chip starts and stop counting being not limited to inferior, chip can be when outside reference time signal occurs to change for the first time, to start counting detecting, when the 4th variation of outside reference time signal generation being detected, stop counting or other any applicable conditions.

Chip also can arrange detection based on historical data to be changed for the first time and detects for the second time the condition changing, and the instruction that also can trigger based on user's side technician arranges detection and changes for the first time and detect the condition of variation for the second time.

The present embodiment chip, when described outside reference time signal being detected and occur to change for the first time, starts the clock signal of oscillator output to count; Chip, when described outside reference time signal being detected and occur to change for the second time, stops the clock signal of oscillator output to count, and exports described count value to pick-up unit.The present embodiment can be realized chip and automatically start and stop counting, and does not need user manually to control, convenient for users to use.

Please referring again to Fig. 2, in one embodiment of the present invention, described pick-up unit sends outside reference time signal to chip, and utilizes outside reference time signal to carry out the step that timing obtains time value to comprise:

Pick-up unit is controlled described outside reference time signal and is occurred to change for the first time, and starts timing;

Pick-up unit is controlled described outside reference time signal and is occurred to change for the second time, and stops timing and obtain described time value.

Pick-up unit is controlled the variation of outside reference time signal, to control pick-up unit, starts and stop timing, and control chip starts and stop counting simultaneously.Pick-up unit or user's side technician can arrange the condition that the generation of outside reference time signal changes for the first time and occurs to change for the second time that triggers based on historical data.Therefore, pick-up unit can be controlled the interval time that outside reference time signal variation for the first time occurs and changes for the second time.Because time value is longer, the error of calculation of the clock frequency of oscillator is just less, and pick-up unit can arrange outside reference time signal and occurs to change for the first time and be one suitable long period the interval time changing for the second time.

The present embodiment pick-up unit is controlled described outside reference time signal and is occurred to change for the first time, and starts timing; Pick-up unit is controlled described outside reference time signal and is occurred to change for the second time, and stops timing and obtain described time value.The present embodiment can be realized pick-up unit and automatically start and stop timing, and can automatically start and stop counting by control chip, and does not need user manually to control, convenient for users to use.

With reference to Fig. 3, Fig. 3 is the waveform schematic diagram of the clock signal of detection method peripheral signal reference time in Fig. 2 chip production process and oscillator output.

Lifting an example below helps to understand.

Therefore there is high level and low level in case of external signal reference time, presents square wave, and the clock signal of oscillator output also exists high level and low level, is therefore also rendered as square wave.It is that outside reference time signal becomes high level from low level that chip arranges the condition that detection changes for the first time, and detecting the condition changing is for the second time that outside reference time signal becomes low level from high level.Pick-up unit is controlled outside reference time signal and is become low level from high level, and start timing, chip detection occurred to change for the first time to the outside reference time simultaneously, start that the clock signal of oscillator output be take to the one-period of this clock signal and as unit counts, calculate the periodicity of clock signal experience, pick-up unit is controlled outside reference time signal and is become high level from low level, and stop timing and obtain time value, chip detection occurred to change for the second time to the outside reference time simultaneously, stop the clock signal of oscillator output to count, output count value is to pick-up unit.

It should be noted that, the clock signal of outside reference time signal and oscillator output is not only square wave, also can be other waveform, the condition that need to change for the first time and change for the second time according to its concrete Waveform Design and the unit to the clock signal counting of oscillator output.

The present invention further provides the chip detecting system in a kind of test process.

With reference to Fig. 4, Fig. 4 is the high-level schematic functional block diagram of chip detecting system the first embodiment in test process of the present invention.

In the first embodiment of described system, comprise pick-up unit 01, described pick-up unit 01 for:

Set up with chip 02 between be connected;

When receiving detection instruction, according to outside reference time signal, obtain the clock frequency of oscillator;

In the process that the finished product of use chip 02 is tested, chip 02 is detected.First, pick-up unit 01 set up with chip 02 between be connected, pick-up unit 01 is when receiving detection instruction, according to outside reference time signal, obtain the clock frequency of oscillator, for example, 01 pair of pick-up unit outside reference time of signal is counted, the clock signal of oscillator output is counted simultaneously, within one identical period, obtain the second count value of the first count value of outside reference time signal and the clock signal of oscillator output, the ratio of the frequency of the clock signal of the frequency of outside reference time signal and oscillator output is the first ratio, the ratio of the clock signal of the first count value and oscillator output is the second ratio, and the first ratio equates with the second ratio, wherein the frequency of outside reference time signal is known also fixing, therefore, the frequency that can calculate the clock signal of oscillator output is the clock frequency of oscillator.The method of obtaining the clock frequency of oscillator according to outside reference time signal can also be to utilize the outside reference time to carry out timing, the clock signal of oscillator output is counted, according to the clock frequency of the clocking value obtaining and count value calculating oscillator simultaneously.

Whether the clock frequency that judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip 02.

Pick-up unit 01 is according to the clock frequency of the oscillator obtaining, and judges that the clock frequency of oscillator is whether within the scope of predeterminated frequency.Wherein predeterminated frequency scope is the setting of the historical data of pick-up unit 01 based on predeterminated frequency scope, or pick-up unit 01 arranging of triggering based on user's side technician instruction arranges.

Pick-up unit 01, when the clock frequency of judging oscillator is not within the scope of predeterminated frequency, is adjusted the frequency parameter of described clock frequency, and frequency parameter refers to the parameter of the clock frequency that determines oscillator.After the frequency parameter of clock frequency is adjusted, the frequency parameter after adjusting is stored in chip 02, when the clock frequency of judging oscillator is within the scope of predeterminated frequency, stop carrying out subsequent step.

Chip 02 when being used at every turn, and while pegging graft on computers as chip 02, chip 02 reads the frequency parameter after the adjustment of storage, and based on frequency parameter and according to the clock frequency of the frequency parameter configuration oscillator reading.Now, the clock frequency of oscillator is within the scope of predeterminated frequency.

It should be noted that the frequency parameter after adjustment is stored in chip 02, if no longer change frequency parameter, chip 02 when being used at every turn so, and the clock frequency of the oscillator of configuration also no longer changes.

The present embodiment pick-up unit 01 set up with chip 02 between be connected; Pick-up unit 01, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal; Whether the clock frequency that pick-up unit 01 judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip 02.The present embodiment is in the process of the finished product of test use chip 02, utilize clock frequency that external detection device 01 judges described oscillator whether within the scope of predeterminated frequency, for the clock frequency of the oscillator chip within the scope of predeterminated frequency 02 not, it is undesirable chip 02, the frequency parameter of the clock frequency of its oscillator is adjusted, thereby prevented from causing because of the performance difference of the chip 02 of different batches the end properties difference of using this chip 02.In addition, the present embodiment does not need to use high-precision internal oscillator not need to change the circuit structure of internal oscillator yet, is conducive to reduce costs.

Please referring again to Fig. 4, in one embodiment of the present invention, described pick-up unit 01 also for:

Obtain the high-precision described external reference clock signal that external clock source sends, and described external reference clock signal is offered to chip 02.

The high accurate clock signal that outside reference time signal is sent for the signal source of clock with pick-up unit 01 communication connection.Pick-up unit 01 obtains the high-precision described clock signal that external clock source sends, and offers chip 02, and after carrying out this step, pick-up unit 01 and chip 02 have all obtained external reference clock signal.

Because the clock frequency of oscillator is obtained based on outside reference time signal, therefore, the precision of outside reference time signal has determined the accuracy of the clock frequency of the oscillator that obtains, and the precision of outside reference time signal is higher, and the clock frequency of the oscillator obtaining is just more accurate.In addition, outside reference time signal can be also the clock signal of one section of known duration.

Please at this with reference to Fig. 4, in one embodiment of the present invention, described pick-up unit 01 also for:

Utilize described outside reference time signal to carry out timing and obtain time value;

Receiving chip 02 counts to get count value according to described outside reference time signal to the clock signal of oscillator output; According to described time value and described count value, obtain the clock frequency of described oscillator.

Pick-up unit 01 utilizes outside reference time signal to carry out timing and obtains time value, the clock signal of 02 pair of oscillator output of chip is simultaneously counted, after experience a period of time, pick-up unit 01 can arrange the time of timing, automatically stop timing, also can the instruction based on user's side technician stop timing simultaneously and obtain time value, when stopping timing, control chip 02 stops counting, obtain count value, can arrange that to take the one-period of clock signal of oscillator output be unit count, also can arrange that to take the number of times that the clock signal of oscillator output changes be unit count.Pick-up unit 01, according to the time value and the count value that obtain, calculates the clock frequency of oscillator.For example, pick-up unit 01 utilizes outside reference time signal to carry out timing and obtains time value, the clock signal of the 02 pair of oscillator of chip output be take the one-period of clock signal and is counted to get count value as digit, this count value is in one period of reference time for time value representative, the number in the cycle of the clock signal signal experience of oscillator output, pick-up unit 01 is count value the clock frequency of oscillator divided by time value.

It should be noted that time value is longer, the error of calculation of the clock frequency of oscillator is just less, and the value of the clock frequency of the oscillator obtaining is just more accurate.

The precise time value that the present embodiment pick-up unit 01 utilizes the timing of outside reference time signal to obtain, the clock signal of 02 pair of oscillator output of chip counts to get the clock frequency that count value can calculate oscillator accurately, and time value is longer, the clock frequency of the oscillator calculating is more accurate.

Please, referring again to Fig. 4, in one embodiment of the present invention, described system also comprises chip 02, described chip 02 for:

When described outside reference time signal being detected and occur to change for the first time, start the clock signal of oscillator output to count;

When described outside reference time signal being detected and occur to change for the second time, stop the clock signal of oscillator output to count, export described count value to pick-up unit 01.

The waveform of outside reference time signal can be sine wave, cosine wave (CW), square wave etc., chip 02 is when outside reference time signal being detected and occur to change for the first time, start the clock signal of oscillator output to count, chip 02 detects the variation of outside reference time signal in real time, if the outside reference time being detected occurs to change for the second time, stop the clock signal of oscillator output to count, output count value is to pick-up unit 01.It should be noted that, the condition that flip chip 02 starts and stop counting being not limited to inferior, chip 02 can be when outside reference time signal occurs to change for the first time, to start counting detecting, when the 4th variation of outside reference time signal generation being detected, stop counting or other any applicable conditions.

Chip 02 also can arrange detection based on historical data to be changed for the first time and detects for the second time the condition changing, and the instruction that also can trigger based on user's side technician arranges detection and changes for the first time and detect the condition of variation for the second time.

The present embodiment chip 02, when described outside reference time signal being detected and occur to change for the first time, starts the clock signal of oscillator output to count; Chip 02, when described outside reference time signal being detected and occur to change for the second time, stops the clock signal of oscillator output to count, and exports described count value to pick-up unit 01.The present embodiment can be realized chip 02 and automatically start and stop counting, and does not need user manually to control, convenient for users to use.

Please referring again to Fig. 4, in one embodiment of the present invention, described pick-up unit 01 also for:

Control described outside reference time signal and occur to change for the first time, and start timing;

Control described outside reference time signal and occur to change for the second time, and stop timing and obtain described time value.

Pick-up unit 01 is controlled the variation of outside reference time signal, to control pick-up unit 01, starts and stop timing, and control chip 02 starts and stop counting simultaneously.Pick-up unit 01 or user's side technician can arrange the condition that the generation of outside reference time signal changes for the first time and occurs to change for the second time that triggers based on historical data.Therefore, pick-up unit 01 can be controlled the interval time that outside reference time signal variation for the first time occurs and changes for the second time.Because time value is longer, the error of calculation of the clock frequency of oscillator is just less, and pick-up unit 01 can arrange outside reference time signal and occurs to change for the first time and be one suitable long period the interval time changing for the second time.

The present embodiment pick-up unit 01 is controlled described outside reference time signal and is occurred to change for the first time, and starts timing; Pick-up unit 01 is controlled described outside reference time signal and is occurred to change for the second time, and stops timing and obtain described time value.The present embodiment can be realized pick-up unit 01 and automatically start and stop timing, and can automatically start and stop counting by control chip 02, and does not need user manually to control, convenient for users to use.

These are only the preferred embodiments of the present invention; not thereby limit the scope of the claims of the present invention; every equivalent structure or conversion of equivalent flow process that utilizes instructions of the present invention and accompanying drawing content to do; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present invention.

Claims (10)

1. the chip detecting method in test process, is characterized in that, comprises the following steps:
Pick-up unit set up with chip between be connected;
Pick-up unit, when receiving detection instruction, obtains the clock frequency of oscillator according to outside reference time signal;
Whether the clock frequency that pick-up unit judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.
2. the chip detecting method in test process as claimed in claim 1, is characterized in that, described pick-up unit is when receiving detection instruction, and the step of obtaining the clock frequency of oscillator according to outside reference time signal comprises:
Pick-up unit utilizes described outside reference time signal to carry out timing and obtains time value;
Pick-up unit receiving chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output;
Pick-up unit, according to described time value and described count value, obtains the clock frequency of described oscillator.
3. the chip detecting method in test process as claimed in claim 2, it is characterized in that, described chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output, and the step that described count value is sent to pick-up unit comprises:
Chip, when described outside reference time signal being detected and occur to change for the first time, starts the clock signal of oscillator output to count;
Chip, when described outside reference time signal being detected and occur to change for the second time, stops the clock signal of oscillator output to count, and exports described count value to pick-up unit.
4. the chip detecting method in test process as claimed in claim 2 or claim 3, is characterized in that, described pick-up unit sends outside reference time signal to chip, and utilizes outside reference time signal to carry out the step that timing obtains time value to comprise:
Pick-up unit is controlled described outside reference time signal and is occurred to change for the first time, and starts timing;
Pick-up unit is controlled described outside reference time signal and is occurred to change for the second time, and stops timing and obtain described time value.
5. the chip detecting method in the test process as described in any one in claim 1-3, is characterized in that, described pick-up unit foundation comprises with the step being connected between chip afterwards:
Pick-up unit obtains the high-precision described outside reference time signal that external clock source sends, and described outside reference time signal is offered to chip.
6. the chip detecting system in test process, is characterized in that, comprises pick-up unit, and described pick-up unit is used for:
Set up with chip between be connected;
When receiving detection instruction, according to outside reference time signal, obtain the clock frequency of oscillator;
Whether the clock frequency that judges described oscillator within the scope of predeterminated frequency, if not, is adjusted the frequency parameter of described clock frequency and the described frequency parameter after adjusting is stored in chip.
7. the chip detecting system in test process as claimed in claim 6, is characterized in that, described pick-up unit also for:
Utilize described outside reference time signal to carry out timing and obtain time value;
Receiving chip counts to get count value according to described outside reference time signal to the clock signal of oscillator output;
According to described time value and described count value, obtain the clock frequency of described oscillator.
8. the chip detecting system in test process as claimed in claim 7, is characterized in that, described system also comprises chip, and described chip is used for:
When described outside reference time signal being detected and occur to change for the first time, start the clock signal of oscillator output to count;
When described outside reference time signal being detected and occur to change for the second time, stop the clock signal of oscillator output to count, export described count value to pick-up unit.
9. the chip detecting system in test process as claimed in claim 7 or 8, is characterized in that, described pick-up unit also for:
Control described outside reference time signal and occur to change for the first time, and start timing;
Control described outside reference time signal and occur to change for the second time, and stop timing and obtain described time value.
10. the chip detecting system in the test process as described in any one in claim 6-8, is characterized in that, described pick-up unit also for:
Obtain the high-precision described external timing signal that external reference clock signal source is sent, and described external reference clock signal is offered to chip.
CN201410193767.0A 2014-05-08 2014-05-08 Chip detection method and system in testing process CN104007313A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410193767.0A CN104007313A (en) 2014-05-08 2014-05-08 Chip detection method and system in testing process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410193767.0A CN104007313A (en) 2014-05-08 2014-05-08 Chip detection method and system in testing process

Publications (1)

Publication Number Publication Date
CN104007313A true CN104007313A (en) 2014-08-27

Family

ID=51368065

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410193767.0A CN104007313A (en) 2014-05-08 2014-05-08 Chip detection method and system in testing process

Country Status (1)

Country Link
CN (1) CN104007313A (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1355434A (en) * 2000-11-30 2002-06-26 中国科学院微电子中心 Method and device for measuring frequency and period
CN101038325A (en) * 2007-02-14 2007-09-19 北京中星微电子有限公司 Method and device for testing chip
CN102857197A (en) * 2012-09-22 2013-01-02 福州大学 Calibration method for improving frequency accuracy of built-in remote control (RC) oscillator
CN103176042A (en) * 2011-12-21 2013-06-26 北京普源精电科技有限公司 Frequency measurement method and device and frequency meter
CN103344817A (en) * 2013-06-26 2013-10-09 中国科学院计算技术研究所 Chip inner portion voltage drop measuring device and measuring method
KR20130135409A (en) * 2012-05-31 2013-12-11 주식회사 만도 Embeded system and method for detecting malfunction thereof
US20140009140A1 (en) * 2012-07-03 2014-01-09 Qiang Guo System for testing real time clock

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1355434A (en) * 2000-11-30 2002-06-26 中国科学院微电子中心 Method and device for measuring frequency and period
CN101038325A (en) * 2007-02-14 2007-09-19 北京中星微电子有限公司 Method and device for testing chip
CN103176042A (en) * 2011-12-21 2013-06-26 北京普源精电科技有限公司 Frequency measurement method and device and frequency meter
KR20130135409A (en) * 2012-05-31 2013-12-11 주식회사 만도 Embeded system and method for detecting malfunction thereof
US20140009140A1 (en) * 2012-07-03 2014-01-09 Qiang Guo System for testing real time clock
CN102857197A (en) * 2012-09-22 2013-01-02 福州大学 Calibration method for improving frequency accuracy of built-in remote control (RC) oscillator
CN103344817A (en) * 2013-06-26 2013-10-09 中国科学院计算技术研究所 Chip inner portion voltage drop measuring device and measuring method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
徐成 等: "一种全同步数字频率测量方法的研究", 《电子技术应用》 *
韦平安: "一种基于RC振荡器的液位检测方法", 《经营管理者》 *

Similar Documents

Publication Publication Date Title
CN106094620B (en) Remote analog amount acquires alarm system
CN105379120B (en) It is detected using Δ/Σ conversion capacitive proximity
CN106323353B (en) A kind of calibration method of proximity sensor, device and terminal
WO2015143993A1 (en) Time-domain integrated temperature sensor
US9158644B2 (en) Autonomous, multi-channel USB data acquisition transducers
CN103248356B (en) A kind of counter and implementation method based on adopting phase-locked loop pulse interpolation technology
CN100575965C (en) A kind of method of measuring frequency of single-chip
CN102466748B (en) There is the digital oscilloscope of equivalent sampling function and for the equivalent sampling method of digital oscilloscope
US7796719B2 (en) Signal detection apparatus and method thereof
CN102590784B (en) Single-phase intelligent energy meter distributed correction method
US9797705B2 (en) Laser heterodyne interferometric signal processing method based on locking edge with high frequency digital signal
CN101359042B (en) Auto calibration method for single-phase electronic type electric energy meter
TWI444835B (en) A master controller for correcting the sampling phase, a semiconductor device, and a method for correcting the same
CN101470164B (en) Method for measuring S parameter of passive circuit and measuring apparatus for implementing the same
CN100468060C (en) Equal observations method and measuring device of rotary table rate
CN104914268B (en) For detecting the device of motor speed
CN103048538B (en) Method for testing collective frequency of radio frequency card and tester for realizing method
CN102073033B (en) Method for generating high-precision stepping delay capable of dynamic calibration
CN103575312B (en) A kind of fluttering method that disappears of the incremental optical-electricity encoder for photoelectric turntable
US20120307866A1 (en) Temperature sensing system for supporting single-point calibration
CN104143961B (en) A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system
CN102045062B (en) Digital phase-locked loop based on Cordic algorithm
CN104020437A (en) Electric energy meter correction method
CN104991191B (en) The system and method for dynamic detection battery capacity of mobile terminal
CN106768757B (en) Shake table ultralow frequency sine sweep signal amplitude recognition methods based on variable sampling rate sampling

Legal Events

Date Code Title Description
PB01 Publication
C06 Publication
SE01 Entry into force of request for substantive examination
C10 Entry into substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20140827

RJ01 Rejection of invention patent application after publication