CN103983294A - Electronic and electrical appliance part linearity and non-linearity detection method - Google Patents

Electronic and electrical appliance part linearity and non-linearity detection method Download PDF

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Publication number
CN103983294A
CN103983294A CN201410230446.3A CN201410230446A CN103983294A CN 103983294 A CN103983294 A CN 103983294A CN 201410230446 A CN201410230446 A CN 201410230446A CN 103983294 A CN103983294 A CN 103983294A
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analog
linear
channel
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measured
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CN201410230446.3A
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Chinese (zh)
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谭飞
王志杰
周玲玲
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天津瑞能电气有限公司
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Priority to CN201410230446.3A priority Critical patent/CN103983294A/en
Publication of CN103983294A publication Critical patent/CN103983294A/en

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Abstract

The invention discloses an electronic and electrical appliance part linearity and non-linearity detection method. Low-frequency signals with the same frequency and the same amplitude are input through a standard analog quantity passageway and an analog quantity passageway to be detected, synchronous sampling is conducted on output signals of the two passageways respectively, sampling results form a two-dimensional point set, non-linear error analysis and linear regression analysis are conducted through the point set, and then linear and non-linear characteristic information of the analog quantity passageway to be detected is obtained. The electronic and electrical appliance part linearity and non-linearity detection method has the advantages that the requirement for the input source signals is low, the analysis result is visual, comprehensive and accurate, the analysis speed is high, automation and batching can be easily achieved, only one standard passageway is needed for any large system, all link control and data processing can be completed through computers without any manual intervention, and the large automated detection system can be easily integrated.

Description

The linear nonlinear detection method of a kind of electronic apparatus parts
Technical field
The present invention relates to a kind of detection method of electronic apparatus parts; The analog quantity sense channel and the linear sensor nonlinear characteristic detection method that particularly relate to a kind of electronic apparatus parts, be particularly useful for the correlative technology field that analog signal detection and linear transducer detect.
Background technology
Various instrument and equipments in industrial control field often will detect analog signalses such as voltage, electric current, temperature, pressure, flows, the foundation of controlling as system.In this case, the levels of precision that analog quantity detects will directly affect the control performance of system.Determine that analog quantity detects two whether accurate main causes, be sensor performance and to sensor output signal sample, the performance of the treatment circuit of shaping, that is, and the performance of analog quantity sense channel.
For sensor; most important is exactly to guarantee that the linear characteristic of input, output is good; yet, non-linear due to material or electron device, and; some uncontrollable defective workmanships in process; conventionally can make input, the output characteristics of sensor occur certain non-linear and linear error, when this just requires sensor to dispatch from the factory, and; when user uses, according to certain standard, its linear nonlinear characteristic is done to detailed check.
Equally, for analog quantity sense channel, it is also most important undoubtedly that the input of assurance passage, output have good linear characteristic, yet, non-linear due to some electron device in the middle of channel circuit, and, the trueness error of the devices such as capacitance-resistance, conventionally also can cause passage to produce certain non-linear and linear error, therefore, must to the linear nonlinear characteristic of passage, detect and error correction in time.
At present, attribute inspection for sensor, normally add specified input signal or several representational input signal, then, detect the error of output signal and theoretical value, such detection method, specified input point can only be detected, or, the deviation of limited several input points, input, the output characteristics in all intervals in reaction rated range that can not entirely accurate, and this scheme is very high to input signal precision and the accuracy requirement of output signal checkout equipment, and, if the situation that multiple spot detects needs the longer time of cost.
In prior art, characteristic detecting method for analog quantity sense channel, mainly that input end adds respectively the direct current signal of the standard of different amplitudes by signal source, then, detect corresponding output signal, input, output valve are carried out to described point, then, investigate the linear characteristic of this passage, the number of sampling of described point is 5 or 10 points conventionally, is no more than at most 20 points.This scheme can reflect linearity and the nonlinear characteristic of passage substantially, and still, due to the finiteness of number of sampling, thereby the input of depicting, curve of output is more coarse and precision is lower.In addition, also very high to the requirement of input signal and checkout equipment precision, operate cumbersomely, be difficult for realizing robotization, mass and detect.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of electronic apparatus parts linear nonlinear detection method.
The technical solution adopted in the present invention is that the linear nonlinear detection method of a kind of electronic apparatus parts, comprises the following steps;
The foundation of step 1, analog quantity sense channel; Analog quantity sense channel, comprises, low frequency signal source, standard analog amount passage and analog quantity channel to be measured, and described low frequency signal source is at the input end of standard analog amount passage and analog quantity channel to be measured, and the same frequency of synchronous input is with the low-frequency ac signal of width respectively;
The foundation of step 2, microcontroller; Microcontroller, comprise, synchronous data sampling, A/D conversion chip, data storage and communication interface, described microcontroller, the data of standard analog amount passage and analog quantity channel to be measured are carried out to synchronous acquisition, by A/D conversion chip, the data of synchronous acquisition are carried out to data storage after A/D conversion, and by communication interface and computer interactive, transmit data and control information;
Step 3, computing machine are controlled the sampling of microcontroller on the one hand by communication interface, on the other hand sampled data is processed, and by data processing, draw test result output.
The quantity of described step 1 Plays analog quantity channel is 1, and the quantity of analog quantity channel to be measured is n (n is positive integer).
Described step 3 Computer data handling procedure, comprises the following steps;
Step 1, sampled data is formed to f 0_ f mtwo dimension point set, establishes T constantly i(i=1,2,3 ... n), f 0and f (t) m(t) sampled value is respectively f 0(T i) and f m(T i), point (f 0(T i), f m(T i)) be f 0and f ma point in the two dimensional surface forming, all point (f 0(T i), f m(T i)) (n=1,2,3 ...) formed a point set f 0_ f m={ (f 0(T 1), f m(T 1)), (f 0(T 2), f m(T 2)) ... (f 0(T n), f m(T n));
Step 2, point set f0_fM is carried out to linear regression analysis and nonlinear analysis, calculate linear error (proportional error A and zero point drift amount B), linearly dependent coefficient and nonlinearity erron;
Proportional error A:
A = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2
Zero point drift amount B:
B = y ‾ - A x ‾
Linearly dependent coefficient R:
R = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2 Σ i = 1 n ( y i - y ‾ ) 2
Nonlinearity erron δ:
δ=(max(|f M(T 1)‐f 0(T 1)|,|f M(T 2)‐f 0(T 2)|…|f M(T n)‐f 0(T n)|)/f R)*100%
Wherein:
xi=f0(Ti),yi=fM(Ti)
x ‾ = 1 n Σ i = 1 n x i
y ‾ = 1 n Σ i = 1 n y i ;
F r: be the specified input range of analog quantity channel;
Step 3, according to point set f 0_ f mdescribe input, the output characteristic curve of analog quantity channel to be measured, describe f 0_ f mstraight line f under coordinate system m(t)=f 0(t);
Step 4, according to predefined index request, and the measured value of each index comprehensively draw testing result and output.
In described step 1 to two-dimentional point set f 0and f (t) m(t) data sampling frequency is 50~100KHz, and the time span of data sampling is that the signal with low frequency signal source repeatedly changes 5 to 10 times in regulation variation range.
The frequency of described low frequency signal source is with interior alternating signal G0 (t) at 50Hz; Standard analog amount passage, the electronic apparatus parts identical with analog quantity channel 26S Proteasome Structure and Function to be measured, passed through a reference channel of high precision inspection and calibration, as the basis of reference of check tunnels analogy amount to be measured, its linear characteristic and nonlinear characteristic must be very good; Analog quantity sense channel to be measured, possesses the 26S Proteasome Structure and Function electronic apparatus parts identical with standard analog amount passage, and linear nonlinear characteristic needs to detect.
The output signal of described low frequency signal source is continually varying low frequency signal F in the specified input range of analog quantity sense channel 0(t), to signal, whether be periodic signal, whether be sinusoidal signal, whether amplitude is accurate, and whether amplitude fluctuates does not all require.
The invention has the beneficial effects as follows, have and the source signal of input is required to low, analysis result is directly perceived comprehensively accurately, analysis speed is fast, be beneficial to features such as realizing robotization mass, arbitrarily large-scale system all only needs a standard channel, all links are controlled and data processing all can be completed without any human intervention by computing machine, are easy to integrated large-scale automated detection system.
Accompanying drawing explanation
Fig. 1 is the theory diagram that in the present invention, the linear nonlinear characteristic of analog quantity sense channel detects;
Fig. 2 is the theory diagram that neutral line linear sensor nonlinear characteristic of the present invention detects;
Fig. 3 is analog quantity sense channel Characteristics Detection system extension structured flowchart in the present invention;
Fig. 4 is control box analog signal detection module principle assumption diagram in the embodiment of the present invention;
Fig. 5 is the system architecture diagram of the embodiment of the present invention;
Fig. 6 is the process flow diagram of the linear nonlinear characteristic check of element to be measured in the embodiment of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail:
Fig. 1 is the theory diagram that the linear nonlinear characteristic of the analog quantity sense channel in of the present invention detects; As shown in Figure 1, the linear nonlinear detection method of electronic apparatus parts of the present invention, comprises the following steps;
The foundation of step 1, analog quantity sense channel; Analog quantity sense channel, comprises, low frequency signal source, standard analog amount passage and analog quantity channel to be measured, and described low frequency signal source is at the input end of standard analog amount passage and analog quantity channel to be measured, and the same frequency of synchronous input is with the low-frequency ac signal of width respectively;
The foundation of step 2, microcontroller; Microcontroller, comprise, synchronous data sampling, A/D conversion chip, data storage and communication interface, described microcontroller, the data of standard analog amount passage and analog quantity channel to be measured are carried out to synchronous acquisition, by A/D conversion chip, the data of synchronous acquisition are carried out to data storage after A/D conversion, and by communication interface and computer interactive, transmit data and control information;
Step 3, computing machine are controlled the sampling of microcontroller on the one hand by communication interface, on the other hand sampled data is processed, and by data processing, draw test result output.
The quantity of described step 1 Plays analog quantity channel is 1, and the quantity of analog quantity channel to be measured is n (n is positive integer).
Above-mentioned steps three Computer data handling procedures, comprise the following steps;
Step 1, sampled data is formed to f 0_ f mtwo dimension point set, establishes T constantly i(i=1,2,3 ... n), f 0and f (t) m(t) sampled value is respectively f 0(T i) and f m(T i), point (f 0(T i), f m(T i)) be f 0and f ma point in the two dimensional surface forming, all point (f 0(T i), f m(T i)) (n=1,2,3 ...) formed a point set f 0_ f m={ (f 0(T 1), f m(T 1)), (f 0(T 2), f m(T 2)) ... (f 0(T n), f m(T n)); In step 1 to two-dimentional point set f 0and f (t) m(t) data sampling frequency is 50~100KHz, and the time span of data sampling is that the signal with low frequency signal source repeatedly changes 5 to 10 times in regulation variation range.
Step 2, point set f0_fM is carried out to linear regression analysis and nonlinear analysis, calculate linear error (proportional error A and zero point drift amount B), linearly dependent coefficient and nonlinearity erron;
Proportional error A:
A = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2
Zero point drift amount B:
B = y ‾ - A x ‾
Linearly dependent coefficient R:
R = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2 Σ i = 1 n ( y i - y ‾ ) 2
Nonlinearity erron δ:
δ=(max(|f M(T 1)‐f 0(T 1)|,|f M(T 2)‐f 0(T 2)|…|f M(T n)‐f 0(T n)|)/f R)*100%
Wherein:
x i=f 0(T i),y i=f M(T i)
x ‾ = 1 n Σ i = 1 n x i
y ‾ = 1 n Σ i = 1 n y i ;
F r: be the specified input range of analog quantity channel;
Step 3, according to point set f 0_ f mdescribe input, the output characteristic curve of analog quantity channel to be measured, describe f 0_ f mstraight line f under coordinate system m(t)=f 0(t);
Step 4, according to predefined index request, and the measured value of each index comprehensively draw testing result and output.
The frequency of described low frequency signal source is with interior alternating signal G0 (t) at 50Hz; Standard analog amount passage, the electronic apparatus parts identical with analog quantity channel 26S Proteasome Structure and Function to be measured, passed through a reference channel of high precision inspection and calibration, as the basis of reference of check tunnels analogy amount to be measured, its linear characteristic and nonlinear characteristic must be very good; Analog quantity sense channel to be measured, possesses the 26S Proteasome Structure and Function electronic apparatus parts identical with standard analog amount passage, and linear nonlinear characteristic needs to detect.
The output signal of described low frequency signal source is continually varying low frequency signal F in the specified input range of analog quantity sense channel 0(t), to signal, whether be periodic signal, whether be sinusoidal signal, whether amplitude is accurate, and whether amplitude fluctuates does not all require.
The detection of embodiment 1, the linear nonlinear characteristic of analog quantity channel:
(1) processing procedure
The source signal F0 (t) of signal source output, processing through standard analog amount passage and analog quantity channel to be measured is converted to signal f0 (t) and fM (t) respectively, microprocessor controls A/D conversion chip, f0 (t) and fM (t) are sampled simultaneously, and store sampled data into data buffer, after microcontroller sampling finishes, mode by the sampled data in buffer zone by communication sends computing machine to and processes, finally, computing machine is processed and is drawn testing result and result is exported sampled data according to default algorithm.
(2) link function declaration
Low frequency signal source: output continually varying low frequency (in 50Hz) signal F0 (t) in the specified input range of analog quantity sense channel, to signal, whether be periodic signal, whether be sinusoidal signal, and whether whether amplitude accurately fluctuate and all do not require.
Standard analog amount passage: i.e. standard analog amount sense channel, it is just the same with analog quantity channel structure to be measured, but passed through a reference channel of high precision inspection and calibration, as the basis of reference of check passage to be measured, its linear characteristic and nonlinear characteristic must be very good.
Analog quantity channel to be measured: need to carry out the analog quantity sense channel of linear nonlinear characteristic detection, it possesses structure and the signal processing function identical with standard analog amount passage, but linear nonlinear characteristic whether up to standard needs detect.
Microcontroller: can control A/D conversion chip and f0 (t) and fM (t) be carried out to high frequency (50~100KHz) sampling simultaneously, and have enough storage spaces to keep in sampled data, also possessing communication interface can carry out communication with computing machine simultaneously.
Computing machine: sample by Communication Control microcontroller on the one hand, on the other hand sampled data is processed, draw test result output
(3) index that analog quantity channel to be measured detects:
Linear characteristic aspect comprises " proportional error A ", " zero point drift amount B ", " linearly dependent coefficient R ", nonlinear characteristic mainly comprises " nonlinearity erron δ ", and wherein the better R value of channel linear characteristic to be measured more approaches 1, δ value and more approaches 0, non-linear larger R value is less, and δ value is larger.
(4) method of sampling:
The sampling of all passages must be synchronous, and sample frequency must be higher, and the signal that the time span of sampling is exported with low frequency signal source repeatedly changes 5 to 10 times and is advisable in regulation variation range.
(5) sampled-data processing method:
First sampled data is formed to f0_fM two dimension point set.If moment Ti (i=1,2,3 ... n), the sampled value of f0 (t) and fM (t) is respectively f0 (Ti) and fM (Ti), and point (f0 (Ti), fM (Ti)) is a point in the two dimensional surface that forms of f0 and fM.All points (f0 (Ti), fM (Ti)) (n=1,2,3 ...) formed a point set f0_fM={ (f0 (T1), fM (T1)), (f0 (T2), fM (T2)) ... (f0 (Tn), fM (Tn)) }.
Secondly, point set f0_fM is carried out to linear regression analysis and nonlinear analysis, calculate linear error (proportional error A and zero point drift amount B), linearly dependent coefficient and nonlinearity erron.
Tentative standard passage and passage to be measured are all completely linear, can derive and draw fM (t)=A*f0 (t)+B, be f0 (t) and fM (t) be complete linear dependence that is to say that point set f0_fM's is a little linear dependence, wherein A is the proportional error of passage to be measured, and B is the zero point drift amount of passage to be measured.Yet tentative standard passage is linear in reality, treat that wing passage is with less non-linear, two-dimentional point set f0_fM can think near-linear dependency, the linear dependence level that the non-linear more young waiter in a wineshop or an inn of passage to be measured ties up point set f0_fM is higher.By two-dimentional point set f0_fM is carried out to linear regression analysis, can be in the hope of analog quantity channel to be measured
Proportional error A:
A = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2
Zero point drift amount B:
B = y ‾ - A x ‾
Linearly dependent coefficient R:
R = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2 Σ i = 1 n ( y i - y ‾ ) 2
Wherein:
xi=f0(Ti),yi=fM(Ti)
x ‾ = 1 n Σ i = 1 n x i
y ‾ = 1 n Σ i = 1 n y i ;
Two-dimentional point set f0_fM is carried out to nonlinear analysis can be in the hope of the nonlinearity erron of analog quantity channel to be measured:
δ=(max(|fM(T1)-f0(T1)|,|fM(T2)-f0(T2)|…|fM(Tn)-f0(Tn)|)/fR)*100%
Wherein:
FR is the specified input range of analog quantity channel
According to point set f0_fM, describe again the input-output characteristic curve of passage to be measured.The input-output curve of depicting passage to be measured can make testing staff more intuitively judge more all sidedly the linear nonlinear characteristic of passage to be measured, the characteristic of passage is better, and the curve of depicting more approaches straight line fM (the t)=f0 (t) under f0_fM coordinate system.
Finally, according to the measured value of predefined index request and each index, comprehensively draw testing result output.
(5) system extension
Microcontroller can be controlled multi-disc A/D conversion chip and sample simultaneously, a slice A/D conversion chip also can be sampled to many passages simultaneously, also a plurality of microcontrollers can be linked to be to bus network, utilize interruption synchronizing signal to control a plurality of microcontrollers samples simultaneously, can be integrated arbitrarily large-scale detection system, this system all only needs a standard channel, as shown in Figure 3.In addition, all links in the present invention are controlled and data processing, all can be completed by computing machine, without any human intervention, thereby utilize this programme to be easy to integrated large-scale automated detection system.
The detection of embodiment 2, linear sensor nonlinear characteristic
(1) processing procedure
Detect principle as shown in Figure 2, the source signal G0 (t) of low frequency signal source output, G0 (t) is converted into signal F0 (t) and FM (t) through a high precision reference sensor and a sensor to be measured respectively, F0 (t) and FM (t) are converted to signal f0 (t) and fM (t) through the processing of standard analog amount passage and analog quantity channel to be measured respectively again, microprocessor controls A/D conversion chip is sampled to f0 (t) and fM (t) simultaneously, and store sampled data into data buffer, after microcontroller sampling finishes, by the sampled data in buffer zone, mode by communication sends computing machine to and processes, finally, computing machine is processed sampled data according to default algorithm, draw testing result and result is exported.
(2) related link function declaration
Signal source: whether output continually varying low frequency (in 50Hz) signal G0 (t) in the specified sensing range of sensor is whether whether periodic signal and amplitude accurately fluctuate and all do not require to signal.Be noted that signal source now may be electric current and voltage source, constant temperature oven, fluid line, or other measured carrier being detected by respective sensor, corresponding source signal G0 (t) may be also the signals such as voltage, electric current, temperature, flow.
High-precision sensor: it is the sensor of the same type with sensor to be measured, can be point-device the sensor of conversion G0 (t), as the basis of reference of check sensor to be measured, its linear characteristic and nonlinear characteristic all will exceed qualified at least one grade of sensor to be measured.
Sensor to be measured: the sensor that will be verified linear nonlinear characteristic.
Standard analog amount passage:, linear characteristic and nonlinear characteristic be very good analog quantity sense channel all, and all characteristics of rear class analog quantity channel of reference sensor and sensor to be measured must be highly consistent.
Microcontroller: can control A/D conversion chip and f0 (t) and fM (t) be carried out to the sampling of high frequency (50~100KHz) simultaneously, and there are enough storage spaces to keep in sampled data, meanwhile, also possess communication interface and can carry out communication with computing machine.
Computing machine: by the sampling of Communication Control microcontroller, on the other hand sampled data is processed on the one hand, drawn test result output.
(3) sensor to be measured detects index:
Linear characteristic aspect comprises " proportional error A ", " zero point drift amount B ", " linearly dependent coefficient R ", and nonlinear characteristic mainly comprises " nonlinearity erron δ ", wherein, the better R value of linear sensor characteristic to be measured more approaches 1, δ value more approaches 0, and non-linear larger R value is less, and δ value is larger.
(4) sampled-data processing method:
First sampled data is formed to f0_fM two dimension point set.If moment Ti (i=1,2,3 ... n), the sampled value of f0 (t) and fM (t) is respectively f0 (Ti) and fM (Ti), and point (f0 (Ti), fM (Ti)) is a point in the two dimensional surface that forms of f0 and fM.All points (f0 (Ti), fM (Ti)) (n=1,2,3 ...) formed a two-dimentional point set f0_fM={ (f0 (T1), fM (T1)), (f0 (T2), fM (T2)) ... (f0 (Tn), fM (Tn)) }.
Again two-dimentional point set f0_fM is carried out to linear regression analysis and nonlinear analysis, calculate linear error (proportional error A and zero point drift amount B), linearly dependent coefficient and nonlinearity erron, computing method detect with analog quantity channel characteristic.
According to two-dimentional point set f0_fM, describe again input, the output characteristic curve of sensor to be measured.Depict input, the curve of output of sensor to be measured, make testing staff more intuitively judge more all sidedly the linear nonlinear characteristic of sensor to be measured, the characteristic of passage is better, and the curve of depicting more approaches straight line fM (the t)=f0 (t) under f0_fM coordinate system.
According to the measured value of predefined index request and each index, comprehensively draw testing result output.
(5) system extension
Can be with detecting the same system extension method, integrated large automatic sensor detecting system with analog quantity channel.
The detection of embodiment 3, the linear nonlinear characteristic of double-fed frequency converter
Control box analog signal detection module principle assumption diagram as shown in Figure 4, double-fed frequency converter is controlled the normal operation of whole frequency converter by Main Control Tank, and this Main Control Tank need to detect 5 road voltage signal 9 road current signals as controlling foundation.Wherein, voltage signal and current signal detect by voltage, current sensor respectively, the current signal of voltage, current sensor outputting standard, this current signal is input in Main Control Tank, through corresponding analog quantity sense channel, change the voltage signal of standard into, and then through A/D conversion chip, be converted to digital quantity and be input in DSP (being equivalent to microcontroller) for controlling.
In this equipment, the order of accuarcy of input directly has influence on the control performance of frequency converter, therefore, must to all analog quantity sense channels of all Main Control Tanks, carry out linear nonlinear characteristic detection on the one hand, to reject non-linear larger defective Main Control Tank, meanwhile, but the non-linear less Main Control Tank of linear error that exists is carried out to linear error correction; Must carry out linear nonlinear characteristic check to all backup sensors on the other hand, to reject underproof sensor.Because number of elements to be checked is huge, and accuracy of detection requirement is very high, therefore, is difficult to meet the needs of daily production by traditional detection method.
Each Main Control Tank needs Dui14 road analog quantity channel to carry out Characteristics Detection, and, also to carry out the correction of linear error to every passage of qualified Main Control Tank, the linear error that correct comprises proportional error A and the zero point drift amount B of passage.Then, for voltage-current sensor, only need to test, not need to carry out linear error correction.
As shown in Figure 5 and Figure 6, the agent structure for the treatment of examining system comprises N Main Control Tank, wherein No. 0 Main Control Tank is the basis box meticulously screening as other Main Control Tank of check, and its all analog quantity channels can be thought standard channel, and other N-1 Main Control Tank is to treat measuring tank.Each Main Control Tank is all usingd the output signal of 5 road high precision electro pressure sensors and 9 road high precision electric current transducers as input signal.
All control boxs, as slave station, are connected to form bus network by RS485 bus and PC (main website).Main website is basis box by No. 0 node, controls all control boxs in network input signal is sampled simultaneously, samples complete, and computing machine is gathered all sampled datas to process and export result by bus.It should be noted that, in this network, No. 0 website is received after the sample command of computing machine, by a sync level signal of a road DO mouth output, this signal enters the DSP in its Main Control Tank by the DI mouth of each website, triggers DSP external interrupt, then, by this interrupt response programmable sampling, with this, reach the whole network of control and the source signal of signal source is carried out to the object of synchronized sampling.
The signal source of this system, for voltage sensor, be frequency 50Hz, the civil power that voltage effective value is 690 volts (the specified range of voltage sensor is ± 1000V) is frequency 50Hz for current sensor, the electric current that the civil power that voltage effective value is 220V produces by resistance R.The break-make of signal source is controlled by the DO signal of No. 0 website in network, meanwhile, feeds back the on off operating mode of oneself by the DI mouth of this website.
System as shown in Figure 5, both can be used for detecting the analog quantity channel of control box, also can be used for detecting voltage-current sensor.When all sensors all adopt high-precision sensor, No. 0 Main Control Tank adopts standard control box, and when other all Main Control Tanks all adopt Main Control Tank to be measured, system can be used for Main Control Tank analog quantity channel to carry out attribute inspection.When all Main Control Tanks all adopt standard Main Control Tank, the sensor that No. 0 Main Control Tank is corresponding adopts high-precision sensor, and the sensor that all other Main Control Tanks are corresponding all adopts while waiting for side senser, and system can be used for sensor to carry out attribute inspection.
To the attribute inspection index of Main Control Tank analog quantity channel, be respectively " proportional error A ", " zero point drift amount B ", " linearly dependent coefficient R ", " nonlinearity erron δ ".The linearly dependent coefficient R that stipulates qualified analog quantity channel must be more than or equal to R0, nonlinearity erron δ must be less than or equal to δ 0, if certain passage R value being detected is less than R0 or δ value and is greater than 0 of δ and judges that this passage is defective, when all passages of certain Main Control Tank being detected when all qualified, judge that this Main Control Tank is qualified, now, according to " proportional error A ", " the zero point drift amount B " of every passage detection gained, the linear error of this passage is proofreaied and correct.
To the Characteristics Detection index of voltage, current sensor, be " proportional error A ", " zero point drift amount B ", " linearly dependent coefficient R ", " nonlinearity erron δ " equally.The proportional error A that regulation is closed voltage, current sensor must be less than or equal to A0, zero point drift amount B must be less than or equal to B0, linearly dependent coefficient R must be more than or equal to R0, nonlinearity erron δ must be less than or equal to δ 0, when if certain sensor being detected and having any one index defective, judge that this sensor is defective, when all indexs of certain sensor being detected when all qualified, judge that this sensor is qualified.
Analog quantity sense channel provided by the invention and linear sensor and the nonlinear characteristic method of inspection, have that, analysis result low to input source semaphore request is directly perceived comprehensively accurately, analysis speed is fast, system extension is flexible, be beneficial to features such as realizing robotization, be specially adapted to carry out to Related product the occasion of high precision fast detecting in enormous quantities.

Claims (6)

1. the linear nonlinear detection method of electronic apparatus parts, is characterized in that, comprises the following steps;
The foundation of step 1, analog quantity sense channel; Analog quantity sense channel, comprises, low frequency signal source, standard analog amount passage and analog quantity channel to be measured, and described low frequency signal source is at the input end of standard analog amount passage and analog quantity channel to be measured, and the same frequency of synchronous input is with the low-frequency ac signal of width respectively;
The foundation of step 2, microcontroller; Microcontroller, comprise, synchronous data sampling, A/D conversion chip, data storage and communication interface, described microcontroller, the data of standard analog amount passage and analog quantity channel to be measured are carried out to synchronous acquisition, by A/D conversion chip, the data of synchronous acquisition are carried out to data storage after A/D conversion, and by communication interface and computer interactive, transmit data and control information;
Step 3, computing machine are controlled the sampling of microcontroller on the one hand by communication interface, on the other hand sampled data is processed, and by data processing, draw test result output.
2. the linear nonlinear detection method of electronic apparatus parts according to claim 1, is characterized in that, the quantity of described step 1 Plays analog quantity channel is 1, and the quantity of analog quantity channel to be measured is n (n is positive integer).
3. the linear nonlinear detection method of electronic apparatus parts according to claim 1, is characterized in that, described step 3 Computer data handling procedure, comprises the following steps;
Step 1, sampled data is formed to f 0_ f mtwo dimension point set, establishes T constantly i(i=1,2,3 ... n), f 0and f (t) m(t) sampled value is respectively f 0(T i) and f m(T i), point (f 0(T i), f m(T i)) be f 0and f ma point in the two dimensional surface forming, all point (f 0(T i), f m(T i)) (n=1,2,3 ...) formed a point set f 0_ f m={ (f 0(T 1), f m(T 1)), (f 0(T 2), f m(T 2)) ... (f 0(T n), f m(T n));
Step 2, point set f0_fM is carried out to linear regression analysis and nonlinear analysis, calculate linear error (proportional error A and zero point drift amount B), linearly dependent coefficient and nonlinearity erron;
Proportional error A:
A = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2
Zero point drift amount B:
B = y ‾ - A x ‾
Linearly dependent coefficient R:
R = Σ i = 1 n ( x i - x ‾ ) ( y i - y ‾ ) Σ i = 1 n ( x i - x ‾ ) 2 Σ i = 1 n ( y i - y ‾ ) 2
Nonlinearity erron δ:
δ=(max(|f M(T 1)‐f 0(T 1)|,|f M(T 2)‐f 0(T 2)|…|f M(T n)‐f 0(T n)|)/f R)*100%
Wherein:
xi=f0(Ti),yi=fM(Ti)
x ‾ = 1 n Σ i = 1 n x i
y ‾ = 1 n Σ i = 1 n y i ;
F r: be the specified input range of analog quantity channel;
Step 3, according to point set f 0_ f mdescribe input, the output characteristic curve of analog quantity channel to be measured, describe f 0_ f mstraight line f under coordinate system m(t)=f 0(t);
Step 4, according to predefined index request, and the measured value of each index comprehensively draw testing result and output.
4. the linear nonlinear detection method of electronic apparatus parts according to claim 3, is characterized in that, in described step 1 to two-dimentional point set f 0and f (t) m(t) data sampling frequency is 50~100KHz, and the time span of data sampling is that the signal with low frequency signal source repeatedly changes 5 to 10 times in regulation variation range.
5. according to the linear nonlinear detection method of the electronic apparatus parts described in claim 1 or 2 or 3, it is characterized in that, the frequency of described low frequency signal source is with interior alternating signal G0 (t) at 50Hz; Standard analog amount passage, the electronic apparatus parts identical with analog quantity channel 26S Proteasome Structure and Function to be measured, passed through a reference channel of high precision inspection and calibration, as the basis of reference of check tunnels analogy amount to be measured, its linear characteristic and nonlinear characteristic must be very good; Analog quantity sense channel to be measured, possesses the 26S Proteasome Structure and Function electronic apparatus parts identical with standard analog amount passage, and linear nonlinear characteristic needs to detect.
6. the linear nonlinear detection method of electronic apparatus parts according to claim 5, is characterized in that, the output signal of described low frequency signal source is continually varying low frequency signal F in the specified input range of analog quantity sense channel 0(t), to signal, whether be periodic signal, whether be sinusoidal signal, whether amplitude is accurate, and whether amplitude fluctuates does not all require.
CN201410230446.3A 2014-05-28 2014-05-28 Electronic and electrical appliance part linearity and non-linearity detection method CN103983294A (en)

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Cited By (1)

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CN108592977A (en) * 2017-12-15 2018-09-28 中国航空工业集团公司北京长城计量测试技术研究所 Dynamic calibration analog signal and digital signal synchronous collection analysis method and system

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Publication number Priority date Publication date Assignee Title
US3740645A (en) * 1970-10-19 1973-06-19 Teletype Corp Circuit testing by comparison with a standard circuit
CN1975343A (en) * 2006-12-14 2007-06-06 天津大学 Digital capacitance corner sensor calibrating system and calibrating method
CN103018699A (en) * 2012-12-14 2013-04-03 天津瑞能电气有限公司 Device and method for calibrating and detecting sensor and AD convertor of multiple devices

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
US3740645A (en) * 1970-10-19 1973-06-19 Teletype Corp Circuit testing by comparison with a standard circuit
CN1975343A (en) * 2006-12-14 2007-06-06 天津大学 Digital capacitance corner sensor calibrating system and calibrating method
CN103018699A (en) * 2012-12-14 2013-04-03 天津瑞能电气有限公司 Device and method for calibrating and detecting sensor and AD convertor of multiple devices

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108592977A (en) * 2017-12-15 2018-09-28 中国航空工业集团公司北京长城计量测试技术研究所 Dynamic calibration analog signal and digital signal synchronous collection analysis method and system

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Application publication date: 20140813