CN103698334B - The pin hole Defect Detection system of barrier film and detection method thereof - Google Patents
The pin hole Defect Detection system of barrier film and detection method thereof Download PDFInfo
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Abstract
The invention provides a kind of pin hole Defect Detection system for detecting barrier film, it comprises: optical pick-up apparatus captures the detection image corresponding to tested point on the barrier film to be detected comprising tested point; Light source is in order to provide the light of advancing towards optical pick-up apparatus; First polarization elements is arranged between light source and optical pick-up apparatus; Second polarization elements is arranged between the first polarization elements and optical pick-up apparatus; Control module is coupled to optical pick-up apparatus, for the treatment of detection image; Wherein, barrier film to be detected is arranged between the first polarization elements and the second polarization elements, and the angle of the second optical axis of the primary optic axis of the first polarization elements and the second polarization elements is 90 degree, to capture detection image.Pin hole Defect Detection system of the present invention can detect the pin hole flaw on barrier film effectively, to reduce flase drop probability and to avoid causing battery short circuit to set off an explosion.
Description
Technical field
The invention relates to a kind of automatic optics inspection (AutomatedOpticalInspection, AOI) system and detection method, particularly about detection system and the detection method of pin hole flaw on barrier film.
Background technology
Barrier film is a kind of macromolecule membrane, is applied to lithium battery, major function be isolation battery in positive pole and negative pole, produce short circuit to prevent both positive and negative polarity from directly contacting.But barrier film need possess microporous characteristic, make ion in electrolytic solution can free flow with generation current, therefore need to utilize process technique to make barrier film produce many micropores.
At present commercially, the method for making of barrier film can be divided into wet process and dry process.Low-molecular-weight paraffin mainly adds in polypropylene and tygon by wet process, extrudes gel diaphragm, then extends into film through twin shaft, finally extracted by paraffin again with die head, forms micropore.Dry process first by plastic pellet melt after, extrude into film-form, then under low temperature stretch make it produce finedraw, and then further under high temperature stretch obtain microporosity film.
No matter be wet process or dry process, may there is micelle, stretching trace and produce the flaws such as pin hole (pinhole) in barrier film in processing procedure.Once barrier film produces pin hole flaw, then the both positive and negative polarity in battery may cause short circuit because contacting with each other, and causes battery explosion.
As shown in Figure 1, Fig. 1 is the pick-up unit 100 of the pin hole flaw of traditional detection barrier film.The pick-up unit 100 of tradition barrier film is only made up of light source 11 and optical microscope 12, and barrier film to be detected 13 is between light source 11 and optical microscope 12.But the flaw image of the pin hole, micelle and the stretching trace that utilize this penetration detection mode to obtain is all very similar, therefore the pin hole flaw on barrier film also effectively cannot be detected with traditional barrier film pick-up unit, and once pin hole flaw is mistaken for micelle flaw or stretching trace flaw, the delivery quality of barrier film will be had a strong impact on.
Summary of the invention
In view of this, namely namely object of the present invention providing a kind of pin hole Defect Detection system and method for detecting barrier film providing, to solve in prior art the technical matters being difficult to distinguish pin hole flaw and micelle flaw and stretching trace flaw.
The present invention discloses the pin hole Defect Detection system for detecting barrier film, it comprises: optical pick-up apparatus, light source, the first polarization elements, the second polarization elements and controlling diaphragm group, and on the barrier film to be detected that optical pick-up apparatus is used to comprise tested point, acquisition corresponds to the detection image of tested point; Light source is in order to provide the light of advancing towards optical pick-up apparatus; First polarization elements has primary optic axis, on the light path that the light that being positioned at light source provides is formed, and is arranged between light source and optical pick-up apparatus; Second polarization elements has the second optical axis, is positioned on this light path, and is arranged between the first polarization elements and optical pick-up apparatus; Control module is coupled to optical pick-up apparatus, for the treatment of detection image; Wherein, barrier film to be detected is arranged between the first polarization elements and the second polarization elements, and the angle of the second optical axis of the primary optic axis of the first polarization elements and the second polarization elements is 90 degree, to capture detection image.Control module comprises: the detection image that receiving element captures in order to receive optical pick-up apparatus; Grey decision-making computing unit, is coupled to receiving element, and this grey decision-making computing unit is in order to calculate the average gray-scale value of image to be detected; And comparing unit, be coupled to grey decision-making computing unit, this comparing unit is in order to compare the average gray-scale value and threshold value that detect image, by comparison result to judge whether the tested point on barrier film to be detected is pin hole flaw.
In an embodiment, this first polarization elements and this second polarization elements are all Polarizer or metal grating.
Another object of the present invention is to the detection system of the threshold value providing a kind of pin hole flaw for generation of comparison barrier film, it comprises: optical pick-up apparatus, light source, the first polarization elements, the second polarization elements and control module; The barrier film to be detected that optical pick-up apparatus is used to comprise tested point captures the detection image of corresponding tested point; Light source is in order to provide the light of advancing towards optical pick-up apparatus; First polarization elements has primary optic axis, on the light path that the light that being positioned at light source provides is formed, and be arranged at light source and optical pick-up apparatus it; Second polarization elements has the second optical axis, is positioned on light path, and is arranged between the first polarization elements and optical pick-up apparatus; Control module is coupled to optical pick-up apparatus, for the treatment of detection image; Wherein, barrier film to be detected is arranged between the first polarization elements and the second polarization elements, and the angle of the second optical axis of the primary optic axis of the first polarization elements and the second polarization elements is 90 degree, to capture detection image; Control module comprises: receiving element, in order to receive the detection image that optical pick-up apparatus captures; Grey decision-making computing unit, is coupled to receiving element, and this grey decision-making computing unit detects the average gray-scale value of image in order to calculate; Inspect unit, be coupled to receiving element and grey decision-making computing unit, this inspects unit, and in order to inspect, whether all detection images all produce the average gray-scale value corresponding to and detect image; And choose unit, be coupled to and inspect unit, this is chosen unit and select threshold value from this plurality of average gray-scale value.
In an embodiment, this first polarization elements and this second polarization elements are all Polarizer or metal grating.
Another object of the present invention is to the pin hole flaw detection method that a kind of barrier film is provided, comprise the following steps: that (A) captures the detection image corresponding to tested point on the barrier film to be detected comprising a tested point; (B) average gray-scale value detecting image is calculated; And the average gray-scale value and threshold value that detect image compare, by comparison result to judge whether the tested point on barrier film to be detected is pin hole flaw by (C).
As further alternative technical scheme, in this step (C), prescribe a time limit under this average gray-scale value of this detection image is less than this threshold value, this tested point is pin hole flaw.
As further alternative technical scheme, in this step (C), when this average gray-scale value of this detection image to be greater than on this threshold value in limited time, this tested point is stretching trace flaw or micelle flaw.
Another object of the present invention is to the production method of the threshold value that a kind of pin hole flaw for comparison barrier film is provided, comprise following steps: (A) captures the detection image of the surveyed area corresponding to tested point on the barrier film to be detected comprising tested point; (B) average gray-scale value of image to be detected is calculated; (C) repeat this step (A) and (B), and whether the detection image inspecting the surveyed area of corresponding all tested points all produces the average gray-scale value corresponding to it; And (D) chooses threshold value by this plurality of average gray-scale value.
Effect of the present invention is effectively to detect the pin hole flaw on barrier film, to reduce flase drop probability and to avoid causing battery short circuit to set off an explosion.
Accompanying drawing explanation
Fig. 1 is the pick-up unit 100 of the pin hole flaw of traditional detection barrier film.
Fig. 2 is the schematic diagram of the pin hole Defect Detection system 200 of the barrier film of one embodiment of the invention.
Fig. 3 is the schematic diagram of the control module 36 of the pin hole Defect Detection system of one embodiment of the invention barrier film.
Fig. 4 is the schematic diagram of the control module 46 of the generation threshold value of one embodiment of the invention.
Fig. 5 is the pin hole Defect Detection process flow diagram of the barrier film of one embodiment of the invention.
Fig. 6 is the process flow diagram of the generation threshold value of one embodiment of the invention.
Embodiment
For making there is further understanding to object of the present invention, structure, feature and function thereof, embodiment is hereby coordinated to be described in detail as follows.
Please refer to Fig. 2, Fig. 2 is the schematic diagram of the pin hole Defect Detection system 200 of the barrier film of one embodiment of the invention.Detection system 200 comprises light source 21, first polarization elements 22, second polarization elements 24, optical pick-up apparatus 25 and control module 26.The barrier film to be detected 23 that optical pick-up apparatus 25 is used to comprise tested point captures the detection image of the surveyed area of corresponding tested point; Light source 21 provides the light of advancing towards optical pick-up apparatus 25; First polarization elements 22 has primary optic axis, and it can be Polarizer or metal grating, on the light path that the light that it is positioned at light source 21 provides is formed, and is arranged between light source 21 and optical pick-up apparatus 25.Second polarization elements 24 has the second optical axis, and it can be Polarizer or metal grating, on the light path that the light that it is positioned at light source 21 provides is formed, and is arranged between the first polarization elements 22 and optical pick-up apparatus 25.Wherein, barrier film 23 to be detected is arranged between the first polarization elements 22 and the second polarization elements 24, and the angle of the second optical axis of the primary optic axis of the first polarization elements 22 and the second polarization elements 24 is 90 degree, to capture detection image.
Specifically, when the angle of the primary optic axis of the first polarization elements 22 in detection system 200 and the second optical axis of the second polarization elements 24 is 90 degree, different according to detected flaw type, by optical pick-up apparatus 25 the image brilliance to be detected that captures have notable difference.When the light that light source sends is through the first polarization elements 22, light changes the polarized light with primary optic axis direction into, when polarized light penetrates micelle flaw on barrier film 23 to be detected or stretching trace flaw, the change of polarized direction of polarized light is made because of barrier film 23 refractive index characteristic to be detected, and the primary optic axis of the first polarization elements 22 is vertical with the second optical axis of the second polarization elements 24, therefore, partial poolarized light can penetrate the second polarization elements 24, make optical pick-up apparatus 25 the image to be detected that captures present on state of.Otherwise, if when the surveyed area of barrier film 23 to be detected has pin hole flaw, the polarized light then penetrating the first polarization elements 22 directly will pass pin hole, because its polarization direction is different from the second polarization elements 24, therefore, the second polarization elements 24 cannot be penetrated completely, therefore optical pick-up apparatus 25 the image to be detected that captures present dark-state, therefore, the difference of bright dark state, cause the image average gray-scale value to be detected captured also to have difference, thus different flaw types can be distinguished, namely can distinguish pin hole flaw and micelle flaw (or stretching trace flaw).
Please refer to Fig. 3, Fig. 3 is the schematic diagram of the control module 36 of the pin hole Defect Detection system of one embodiment of the invention barrier film.Control module 36 comprises receiving element 361, grey decision-making computing unit 362 and comparing unit 363.Receiving element 361 receives the detection image that optical pick-up apparatus 25 captures.Grey decision-making computing unit 362 is coupled to receiving element 361, in order to calculate the average gray-scale value detecting image.Whether comparing unit 363 is coupled to grey decision-making computing unit 362, in order to the average gray-scale value and threshold value that detect image to be compared, and be pin hole flaw by the measuring point to be checked that comparison result judges on barrier film 23 to be detected.
In this embodiment, the threshold value of comparing unit 363 can be provided by the built-in memory be stored in advance in comparing unit 363 (figure does not illustrate).Threshold value production method can produce according to the method for following content, also can be that testing staff rule of thumb sets, not be limited with arbitrary ad hoc approach.
In one embodiment of this invention, the detection system for generation of the threshold value of the pin hole flaw of comparison barrier film comprises: light source, the first polarization elements, the second polarization elements, optical pick-up apparatus and control module.Wherein, barrier film to be detected is arranged between the first polarization elements and the second polarization elements, and the angle of the second optical axis of the primary optic axis of the first polarization elements and the second polarization elements is 90 degree, to capture the detection image of barrier film to be detected.
Be same as light source 21, first polarization elements 22, second polarization elements 24 and the optical pick-up apparatus 25 of the detection system 200 of Fig. 2 for generation of the light source of the detection system of the threshold value of the pin hole flaw of comparison barrier film, the first polarization elements, the second polarization elements and optical pick-up apparatus, therefore do not add to repeat.Only the difference of the two is control module, below will describe in detail.
Please refer to Fig. 4, Fig. 4 is the schematic diagram of the control module 46 of the generation threshold value of one embodiment of the invention.Control module 46 comprises: receiving element 461, grey decision-making computing unit 462, inspect unit 463 and choose unit 464.The detection image that receiving element 461 captures in order to receive optical pick-up apparatus; Grey decision-making computing unit 462 is coupled to receiving element 461, in order to calculate the average gray-scale value detecting image; Inspect unit 463 and be coupled to receiving element 461 and grey decision-making computing unit 462, in order to inspect, whether all detection images all produce the average gray-scale value corresponding to and detect image; And choose unit 464 and be coupled to and inspect unit 463, and choose threshold value from all average gray-scale value.
Then, incorporated by reference to consulting Fig. 2, Fig. 3 and Fig. 5, Fig. 5 is the pin hole Defect Detection process flow diagram of the barrier film of one embodiment of the invention.Further illustrate the detection method of barrier film flaw below:
In step S51, optical pick-up apparatus 25 captures the detection image of the surveyed area of corresponding tested point on the barrier film to be detected 23 comprising tested point.In one embodiment of this invention, the size of surveyed area such as can be the square of 100 pixel × 100 pixels, and namely surveyed area has 10,000 picture element.Then, image is processed by control module 26.
In step S52, receiving element 361 in control module 36 be received from optical pick-up apparatus 25 the detection image that captures, then calculate the average gray-scale value detecting image by grey decision-making computing unit 362, namely the grey decision-making of each pixel detected in image is done mean value computing.
In step S53, the average gray-scale value and the threshold value that detect image are compared by comparing unit 363, when the average gray-scale value of detection image is less than this threshold value lower limit, then judge that tested point on barrier film 23 to be detected is as pin hole flaw.Otherwise, when detection image average gray-scale value is greater than the threshold value upper limit, then judge that tested point on barrier film 23 to be detected is as micelle flaw or stretching trace flaw; If detect image average gray-scale value to be positioned at threshold value scope, then represent the indefectible existence of this tested point on barrier film 23 to be detected.
Thus, the detection system of barrier film flaw proposed by the invention and detection method can detect whether the tested point on barrier film is pin hole flaw exactly, thus avoid causing battery short circuit and blast because of flase drop.
Below please refer to Fig. 4 and Fig. 6, Fig. 6 is the process flow diagram of the generation threshold value of one embodiment of the invention.Next the method how producing the threshold value of the pin hole flaw of barrier film will be described in detail.
First, in step S61, optical pick-up apparatus (figure do not illustrate) captures should the detection image of surveyed area of tested point on the barrier film to be detected comprising tested point.
In step S62, the receiving element 461 in control module 46, by receiving the detection image that captures of optical pick-up apparatus institute, then calculates the average gray-scale value of detection image by grey decision-making computing unit 462.
In step S63, repeated execution of steps S61 and S62, and inspected whether all detection images and all produced by the unit 463 of inspecting in control module 46 average gray-scale value corresponding to and detect image.Inspect unit 463 and inspect discovery, detect image if still have and not yet produce the average gray-scale value corresponding to and detect image, then repeated execution of steps S62, the average gray-scale value of the detection image not yet producing average gray-scale value is calculated, until the detection image of the surveyed area of corresponding all tested points all produces average gray-scale value by grey decision-making computing unit 462; Otherwise, perform next step, i.e. step S64.
In step S64, the unit 464 of choosing in control module 46 chooses threshold value from all average gray-scale value.Threshold value can be used for the average gray-scale value of the detection image that comparison barrier film to be detected captures, and whether the tested point on detection and isolation film is pin hole flaw.
According to a preferred embodiment of the present invention, threshold value is set as 80 to 150, when the average gray-scale value of the detection image of the surveyed area of corresponding tested point is less than 80, then judges that tested point on barrier film to be detected is as pin hole flaw.Be greater than 150 when detecting the average gray-scale value of image, then judge that tested point on barrier film to be detected is as stretching trace flaw or micelle flaw.If the average gray-scale value detecting image between 80 to 150, then represents the indefectible existence in tested point place on barrier film to be detected.
Prove by experiment, the present invention utilizes the detection method of above-mentioned barrier film flaw and the detected barrier film containing pin hole flaw of detection system to carry out high-tension electricity test, and experimental result as shown in Table 1.
This tests the barrier film used is individual layer barrier film, and thickness is 20 μm.Voltage range is set as 800V to 1, between 110V.Table one is 10 groups of test sample experimental results after high tension voltage punctures containing pin hole flaw, and experimental result shows that pin hole flaw punctures back aperture through high tension voltage and can become large.
Table one
If the flaw type on barrier film to be measured is micelle flaw or stretching trace flaw, after high-tension electricity test, those flaws can't be punctured by high-tension electricity, therefore thus flaw size also can not change.
Utilize above-mentioned high-tension electricity flash test to prove, the detection system of the barrier film flaw that the present invention proposes and detection method can detect the pin hole flaw on barrier film really effectively, be short-circuited and explode to prevent battery.
In sum, although the present invention with preferred embodiment disclose as above, so itself and be not used to limit the present invention.Persond having ordinary knowledge in the technical field of the present invention, without departing from the spirit and scope of the present invention, when being used for a variety of modifications and variations.Therefore, the scope that protection scope of the present invention ought define depending on claims is as the criterion.
Claims (9)
1., for detecting a pin hole Defect Detection system for barrier film, it is characterized in that this pin hole Defect Detection system comprises:
Optical pick-up apparatus, the barrier film to be detected being used to comprise tested point captures to should the detection image of surveyed area of tested point;
Light source, in order to provide the light of advancing towards this optical pick-up apparatus;
First polarization elements, it has primary optic axis, and on the light path that the light that this first polarization elements is positioned at this light source to be provided is formed, and this first polarization elements is arranged between this light source and this optical pick-up apparatus;
Second polarization elements, it has the second optical axis, this second polarization elements is positioned on this light path, and this second polarization elements is arranged between this first polarization elements and this optical pick-up apparatus, wherein, this barrier film to be detected is arranged between this first polarization elements and this second polarization elements, and the angle of this second optical axis of this primary optic axis of this first polarization elements and this second polarization elements is 90 degree, to capture this detection image; And
Control module, is coupled to this optical pick-up apparatus, for the treatment of this detection image, comprising:
Receiving element, in order to receive this detection image that this optical pick-up apparatus captures;
Grey decision-making computing unit, is coupled to this receiving element, and this grey decision-making computing unit is in order to calculate the average gray-scale value of this image to be detected; And
Comparing unit, is coupled to this grey decision-making computing unit, and this comparing unit is in order to compare the average gray-scale value of this image to be detected and threshold value, and whether this tested point judged on this barrier film to be detected by comparison result is pin hole flaw.
2. pin hole Defect Detection system as claimed in claim 1, is characterized in that this first polarization elements and this second polarization elements are all Polarizer or metal grating.
3., for generation of a detection system for the threshold value of the pin hole flaw of comparison barrier film, it is characterized in that this detection system comprises:
Optical pick-up apparatus, the barrier film to be detected being used to comprise tested point captures to should the detection image of surveyed area of tested point;
Light source, in order to provide the light of advancing towards this optical pick-up apparatus;
First polarization elements, it has primary optic axis, and on the light path that the light that this first polarization elements is positioned at this light source to be provided is formed, and this first polarization elements is arranged between this light source and this optical pick-up apparatus;
Second polarization elements, it has the second optical axis, this second polarization elements is positioned on this light path, and this second polarization elements is arranged between this first polarization elements and this optical pick-up apparatus, wherein this barrier film to be detected is arranged between this first polarization elements and this second polarization elements, and the angle of this second optical axis of this primary optic axis of this first polarization elements and this second polarization elements is 90 degree, to capture this image to be detected; And
Control module, is coupled to this optical pick-up apparatus, and for the treatment of this detection image, it comprises:
Receiving element, in order to receive this detection image that this optical pick-up apparatus captures;
Grey decision-making computing unit, is coupled to this receiving element, and this grey decision-making computing unit is in order to calculate the average gray-scale value of this detection image; And
Inspect unit, be coupled to this receiving element and this grey decision-making computing unit, this is inspected unit and all produces average gray-scale value corresponding to this detection image in order to inspect whether this detection images all; And
Choose unit, be coupled to this and inspect unit, this is chosen unit and select threshold value from all average gray-scale value.
4. detection system as claimed in claim 3, is characterized in that this first polarization elements and this second polarization elements are all Polarizer or metal grating.
5. a pin hole flaw detection method for barrier film, is characterized in that this pin hole flaw detection method comprises the following steps:
(A) utilize the detection system described in claim 1, capture should the detection image of surveyed area of tested point on the barrier film to be detected comprising tested point;
(B) average gray-scale value of this detection image is calculated; And
(C) this average gray-scale value of this detection image and threshold value are compared, judged by comparison result whether this tested point of this barrier film to be detected is pin hole flaw.
6. pin hole flaw detection method as claimed in claim 5, is characterized in that in this step (C), and prescribe a time limit under this average gray-scale value of this detection image is less than this threshold value, this tested point is pin hole flaw.
7. pin hole flaw detection method as claimed in claim 5, is characterized in that in this step (C), and when this average gray-scale value of this detection image to be greater than on this threshold value in limited time, this tested point is stretching trace flaw or micelle flaw.
8. pin hole flaw detection method as claimed in claim 5, it is characterized in that in this step (C), when this average gray-scale value of this detection image is positioned at this threshold value scope, then this tested point is indefectible.
9., for a production method for the threshold value of the pin hole flaw of comparison barrier film, it is characterized in that the production method of this threshold value comprises:
(A) utilize the detection system described in claim 3, on the barrier film to be detected comprising tested point, acquisition corresponds to the detection image of the surveyed area of this tested point;
(B) average gray-scale value of this detection image is calculated;
(C) repeat this step (A) and (B), and whether the detection image inspecting the surveyed area of corresponding all tested points all produces the average gray-scale value corresponding to it; And
(D) threshold value is chosen by all average gray-scale value.
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| CN107064155A (en) * | 2017-03-10 | 2017-08-18 | 深圳中兴创新材料技术有限公司 | The detection method and device of a kind of lithium ion battery separator |
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