CN103618026B - A kind of polysilicon micro-nano processing unit (plant) and method of gridding - Google Patents
A kind of polysilicon micro-nano processing unit (plant) and method of gridding Download PDFInfo
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Abstract
本发明公开了一种网格化的多晶硅微纳加工装置及方法。目前制备多晶硅太阳电池的减反射层效果欠佳。本发明中超声波发生器控制器的输出端通过换能器与变幅杆的尾部螺纹连接,变幅杆的头部与平面超声工具头的尾部螺纹连接;每个平面超声工具头的头部均伸入反应观察室内;反应观察室与每个平面超声工具头相对的内侧壁处分别固定设置有一块声波反射板;反应容器设置在反应观察室内。本发明的多晶硅微纳加工方法步骤为:将混合酸液注入反应容器,驱动平面超声工具头形成超声驻波,将多晶硅材料放入反应容器中进行制备,制备完后置于去离子溶液中清洗,封装。本发明可提高多晶硅表面减反效果,从而提高多晶硅光伏电池光电转化效率。
The invention discloses a gridded polycrystalline silicon micro-nano processing device and method. At present, the effect of preparing anti-reflection layer of polycrystalline silicon solar cells is not good. In the present invention, the output end of the ultrasonic generator controller is threadedly connected with the tail of the horn through the transducer, and the head of the horn is threaded with the tail of the plane ultrasonic tool head; the head of each plane ultrasonic tool head is Extending into the reaction observation chamber; the inner wall of the reaction observation chamber opposite to each planar ultrasonic tool head is respectively fixed with a sound wave reflection plate; the reaction container is arranged in the reaction observation chamber. The steps of the polysilicon micro-nano processing method of the present invention are as follows: inject the mixed acid solution into the reaction container, drive the planar ultrasonic tool head to form an ultrasonic standing wave, put the polysilicon material into the reaction container for preparation, and place it in a deionized solution for cleaning after preparation , encapsulation. The invention can improve the anti-reflection effect on the polysilicon surface, thereby improving the photoelectric conversion efficiency of the polysilicon photovoltaic cell.
Description
技术领域technical field
本发明属于太阳能新能源领域,涉及多晶硅光伏电池板加工生产,具体涉及一种网格化的多晶硅微纳加工装置及方法。The invention belongs to the field of new solar energy and relates to the processing and production of polycrystalline silicon photovoltaic panels, in particular to a gridded polycrystalline silicon micro-nano processing device and method.
背景技术Background technique
新能源成为21世纪研究的重要领域之一,太阳能的应用与普及受到了人们的高度重视。太阳的能量非常丰富,每秒钟照射到地球上的能量相当于500万吨标准煤,如果换算成电能则大约为3.8×1019MW,太阳能不含有害物质,不排放二氧化碳,极富发展前景,是人类解决当前能源危机的一种有效途径。直到20世纪90年代,太阳能光伏材料还主要以单晶硅为主。20世纪80年代多晶硅以相对低成本、高效率的优势应用增长迅速,不断挤占单晶硅的市场,从80年代末期仅占光伏材料的10%左右发展到21世纪初的50%以上,成为最主要的太阳能电池材料。多晶硅太阳电池是目前较为成熟的、成本相对较低的太阳电池技术,由于多晶硅晶粒取向的多样性,不能用传统的单晶硅绒面制备技术,如何廉价可靠地制备多晶硅太阳电池的减反射层是多晶硅太阳电池产业化的关键技术之一。New energy has become one of the important fields of research in the 21st century, and the application and popularization of solar energy has been highly valued by people. The energy of the sun is very rich. The energy irradiated on the earth every second is equivalent to 5 million tons of standard coal. If converted into electrical energy, it is about 3.8×10 19 MW. Solar energy does not contain harmful substances and does not emit carbon dioxide. It has great development prospects , is an effective way for mankind to solve the current energy crisis. Until the 1990s, solar photovoltaic materials were mainly monocrystalline silicon. In the 1980s, the application of polycrystalline silicon grew rapidly due to its advantages of relatively low cost and high efficiency, and it continued to squeeze out the market for monocrystalline silicon. main solar cell material. Polycrystalline silicon solar cells are relatively mature and relatively low-cost solar cell technology at present. Due to the diversity of polycrystalline silicon grain orientations, traditional monocrystalline silicon textured surface preparation techniques cannot be used. How to prepare polycrystalline silicon solar cells for anti-reflection cheaply and reliably? Layer is one of the key technologies for the industrialization of polycrystalline silicon solar cells.
目前生产多晶硅表面的制作技术主要有以下几种:At present, the production technologies for producing polysilicon surfaces mainly include the following types:
1、激光刻槽:用激光刻槽的方法可在多晶硅表面制作倒金字塔结构,在500~900nm光谱范围内,反射率为4~6%,与表面制作双层减反射膜相当。而在(100)面单晶硅化学制作绒面的反射率为11%。用激光制作绒面比在光滑面镀双层减反射膜层(ZnS/MgF2)电池的短路电流要提高4%左右,这主要是长波光(波长大于800nm)斜射进入电池的原因。激光制作绒面存在的问题是,在刻蚀中表面造成损伤同时引入一些杂质,要通过化学处理去除表面损伤层。该方法所做的太阳电池通常短路电流较高,但开路电压不太高,主要原因是电池表面积增加,引起复合电流提高。1. Laser grooving: The method of laser grooving can be used to make an inverted pyramid structure on the surface of polysilicon. In the spectral range of 500-900nm, the reflectivity is 4-6%, which is equivalent to the double-layer anti-reflection coating on the surface. And the reflectance of the (100) surface monocrystalline silicon chemically made suede is 11%. The short-circuit current of the battery made of laser-made suede is about 4% higher than that of the smooth surface coated with double anti-reflection coatings (ZnS/MgF 2 ), which is mainly because long-wave light (wavelength greater than 800nm) obliquely enters the battery. The problem of laser suede production is that the surface is damaged and some impurities are introduced during etching, and the surface damage layer must be removed by chemical treatment. The solar cell made by this method usually has a high short-circuit current, but the open-circuit voltage is not too high, mainly because the surface area of the cell increases, which causes the recombination current to increase.
2、化学刻槽:应用掩膜(Si3N4或SiO2)各向同性腐蚀,腐蚀液可为酸性腐蚀液,也可为浓度较高的氢氧化钠或氢氧化钾溶液,该方法无法形成各向异性腐蚀所形成的那种尖锥状结构。据报道,该方法所形成的绒面对700~1030微米光谱范围有明显的减反射作用。但掩膜层一般要在较高的温度下形成,引起多晶硅材料性能下降,特别对质量较低的多晶材料,少子寿命缩短。应用该工艺在225cm2的多晶硅上所作电池的转换效率达到16.4%。掩膜层也可用丝网印刷的方法形成。2. Chemical grooving: use a mask (Si 3 N 4 or SiO 2 ) for isotropic etching. The etching solution can be acidic etching solution or sodium hydroxide or potassium hydroxide solution with high concentration. This method cannot Formation of the kind of pointed cone-like structure formed by anisotropic etching. According to reports, the suede formed by this method has obvious anti-reflection effect on the spectral range of 700-1030 microns. However, the mask layer is generally formed at a higher temperature, which causes the performance of polycrystalline silicon materials to decline, especially for polycrystalline materials with lower quality, the minority carrier lifetime is shortened. The conversion efficiency of cells made on 225cm 2 polysilicon by using this process reaches 16.4%. The mask layer can also be formed by screen printing.
3、反应离子腐蚀(RIE):该方法为一种无掩膜腐蚀工艺,所形成的绒面反射率特别低,在450~1000微米光谱范围的反射率可小于2%。仅从光学的角度来看,是一种理想的方法,但存在的问题是硅表面损伤严重,电池的开路电压和填充因子出现下降,工艺复杂。3. Reactive ion etching (RIE): This method is a maskless etching process, and the reflectance of the formed suede surface is particularly low, and the reflectance in the spectral range of 450-1000 microns can be less than 2%. From an optical point of view, it is an ideal method, but the problem is that the silicon surface is seriously damaged, the open circuit voltage and fill factor of the battery decrease, and the process is complicated.
4、制作减反射膜层:对于高效太阳电池,最常用和最有效的方法是蒸镀ZnS/MgF2双层减反射膜,其最佳厚度取决于下面氧化层的厚度和电池表面的特征,例如,表面是光滑面还是绒面,减反射工艺也有蒸镀Ta2O5,PECVD沉积Si3N3等。ZnO导电膜也可作为减反材料。但此种技术工艺复杂,当应用于工业化生产时,成本很高,不利于广泛推广应用。4. Making anti-reflection film layer: For high-efficiency solar cells, the most common and effective method is to evaporate ZnS/MgF 2 double-layer anti-reflection film. The optimal thickness depends on the thickness of the underlying oxide layer and the characteristics of the battery surface. For example, whether the surface is smooth or suede, the anti-reflection process also includes evaporation Ta 2 O 5 , PECVD deposition Si 3 N 3 and so on. ZnO conductive film can also be used as anti-reflection material. However, this kind of technical process is complicated, and when it is applied to industrial production, the cost is very high, which is not conducive to widespread application.
发明内容Contents of the invention
本发明的目的是针对现有技术的不足,提供一种网格化的多晶硅微纳加工方法,该方法利用超声和酸腐蚀液的共同作用对多晶硅表面进行加工,优化多晶硅表面微结构,提高多晶硅表面减反效果,从而提高多晶硅光伏电池光电转化效率。本发明的另一个目的是提供该方法所使用的装置。The purpose of the present invention is to address the deficiencies of the prior art, and to provide a gridded polysilicon micro-nano processing method, which uses the joint action of ultrasound and acid etching solution to process the polysilicon surface, optimizes the microstructure of the polysilicon surface, and improves the polysilicon surface. Surface anti-reflection effect, thereby improving the photoelectric conversion efficiency of polycrystalline silicon photovoltaic cells. Another object of the present invention is to provide an apparatus for use in the method.
本发明的多晶硅微纳加工装置包括控制装置、平面超生发生装置和反应装置。The polysilicon micro-nano processing device of the present invention includes a control device, a planar supergene generation device and a reaction device.
所述的控制装置包括多个超声波发生器控制器和摄像机,每个超声波发生器控制器的输入端及摄像机均与电脑连接。摄像机的摄像头朝向反应装置。The control device includes a plurality of ultrasonic generator controllers and cameras, and the input end of each ultrasonic generator controller and the camera are connected to a computer. The camera's camera is directed towards the reaction device.
所述的平面超生发生装置包括换能器、变幅杆、平面超声工具头;每个超声波发生器控制器的输出端与一个换能器的尾部连接,每个换能器的头部与一个变幅杆的尾部螺纹连接,每个变幅杆的头部与一个平面超声工具头的尾部螺纹连接。Described planar ultrasonic generation device comprises transducer, horn, planar ultrasonic tool head; The output end of each ultrasonic generator controller is connected with the afterbody of a transducer, and the head of each transducer is connected with a The tails of the horns are threaded, and the head of each horn is threaded with the tail of a planar ultrasonic tool head.
所述的反应装置包括反应观察室、声波反射板和反应容器;所述的反应观察室为透明的密闭容器,每个平面超声工具头的头部均伸入反应观察室内;反应观察室与每个平面超声工具头相对的内侧壁处分别固定设置有一块声波反射板。所述的反应容器设置在反应观察室内,且设置在平面超声工具头与声波反射板之间。The reaction device includes a reaction observation chamber, a sound wave reflection plate and a reaction container; the reaction observation chamber is a transparent airtight container, and the head of each plane ultrasonic tool head is stretched into the reaction observation chamber; the reaction observation chamber is connected to each A sound wave reflection plate is fixedly arranged on the opposite inner wall of the two planar ultrasonic tool heads. The reaction container is arranged in the reaction observation chamber, and is arranged between the planar ultrasonic tool head and the sound wave reflection plate.
所述声波反射板与平面超声工具头的距离为其中,n为平面超声工具头的个数,取值为2~4,λ为超声在液体中的波长;其中,v为超声在液体中的速度,f为使用的超声频率,取值范围为40KHz~1MHz,超声功率为500~1000W。The distance between the sound wave reflecting plate and the plane ultrasonic tool head is Among them, n is the number of planar ultrasonic tool heads, and the value is 2 to 4, and λ is the wavelength of ultrasonic in liquid; Wherein, v is the velocity of ultrasound in the liquid, f is the frequency of ultrasound used, the range of values is 40KHz-1MHz, and the power of ultrasound is 500-1000W.
所述平面超声工具头的头部为方柱形。The head of the planar ultrasonic tool head is square column.
本发明的多晶硅微纳加工方法,步骤如下:The micro-nano processing method of polysilicon of the present invention, the steps are as follows:
步骤1.将分析纯氢氟酸溶液、分析纯硝酸溶液和去离子水调配成混合酸液,混合酸液中分析纯氢氟酸溶液与分析纯硝酸溶液的体积比为0.1~0.9:1、分析纯氢氟酸溶液与去离子水的体积比为0.1~0.4:1,将混合酸液注入反应容器中。Step 1. Mix the analytically pure hydrofluoric acid solution, the analytically pure nitric acid solution and deionized water into a mixed acid solution, and the volume ratio of the analytically pure hydrofluoric acid solution to the analytically pure nitric acid solution in the mixed acid solution is 0.1-0.9:1, The volume ratio of analytically pure hydrofluoric acid solution to deionized water is 0.1-0.4:1, and the mixed acid solution is injected into the reaction vessel.
步骤2.由电脑程序驱动平面超声工具头,在混合酸液中形成超声驻波,待混合酸液的液面平静形成稳定的超声驻波网格后,将经过洗净预处理的多晶硅材料放入反应容器中进行制备,时间为1~10分钟。Step 2. The planar ultrasonic tool head is driven by a computer program to form an ultrasonic standing wave in the mixed acid solution. After the liquid level of the mixed acid solution is calm and a stable ultrasonic standing wave grid is formed, the cleaned and pretreated polysilicon material is placed Put it into a reaction container for preparation, and the time is 1 to 10 minutes.
步骤3.将经过步骤2制备的硅片置于去离子溶液中清洗1~2分钟,去除硅片的表面酸液残留。Step 3. Cleaning the silicon chip prepared in step 2 in a deionized solution for 1 to 2 minutes to remove acid residue on the surface of the silicon chip.
步骤4.将清洗加工好的硅片,进行封装,完成硅片制作。Step 4. The cleaned and processed silicon wafers are packaged to complete the production of silicon wafers.
本发明的有益效果:Beneficial effects of the present invention:
1、本发明中平面超声工具头的头部为方柱形,可形成规则的驻波网格;1. The head of the plane ultrasonic tool head in the present invention is a square column, which can form a regular standing wave grid;
2、本发明利用超声控制无规则运动的离子在硅表面腐蚀反应形成较为均匀的结构,优化多晶硅表面微结构,提高多晶硅表面减反效果,从而提高多晶硅光伏电池光电转化效率;2. The present invention uses ultrasound to control irregularly moving ions to corrode the silicon surface to form a relatively uniform structure, optimize the microstructure of the polysilicon surface, improve the anti-reflection effect of the polysilicon surface, and thereby improve the photoelectric conversion efficiency of polysilicon photovoltaic cells;
3、超声波的存在加剧溶液中离子的运动,使反应较为快速地进行;3. The existence of ultrasonic waves intensifies the movement of ions in the solution, making the reaction proceed more quickly;
4、采用超声波装置相对于激光刻蚀成本低。4. Compared with laser etching, the cost of ultrasonic device is lower.
附图说明Description of drawings
图1为本发明的系统结构原理图;Fig. 1 is a schematic diagram of the system structure of the present invention;
图2-1为本发明中平面超声工具头的主视图;Fig. 2-1 is the front view of the plane ultrasonic tool head in the present invention;
图2-2为图2-1的俯视图;Figure 2-2 is a top view of Figure 2-1;
图3为本发明的反应机理图;Fig. 3 is a reaction mechanism diagram of the present invention;
图4为无超声试验后在电镜下10微米尺度观察到的多晶硅绒面微结构;Fig. 4 is the microstructure of the polysilicon textured surface observed under the electron microscope at the scale of 10 microns after the ultrasonic test;
图5为采用本发明方法进行正交超声试验后在电镜下10微米尺度观察到的多晶硅绒面微结构;Fig. 5 adopts the method of the present invention to carry out the microstructure of the polysilicon textured surface observed under the 10 micron scale after the orthogonal ultrasonic test;
图6为采用本发明方法进行正交超声试验后在电镜下50微米尺度观察到的多晶硅绒面微结构。Fig. 6 is the microstructure of the polysilicon textured surface observed under the electron microscope at the scale of 50 micrometers after the orthogonal ultrasonic test is carried out by the method of the present invention.
具体实施方式detailed description
下面结合附图及实施例对本发明作进一步说明。The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
如图1所示,一种网格化的多晶硅微纳加工装置包括控制装置、平面超生发生装置和反应装置。As shown in Figure 1, a gridded polysilicon micro-nano processing device includes a control device, a planar supersonic generation device and a reaction device.
控制装置包括超声波发生器控制器1和摄像机2,两个超声波发生器控制器1的输入端及摄像机2均与电脑3连接。摄像机2的摄像头朝向反应装置。The control device includes an ultrasonic generator controller 1 and a camera 2 , and the input ends of the two ultrasonic generator controllers 1 and the camera 2 are connected to a computer 3 . The camera head of camera 2 faces the reaction device.
如图1、2-1和2-2所示,平面超生发生装置包括换能器4、变幅杆5、平面超声工具头6;每个超声波发生器控制器1的输出端与一个换能器4的尾部连接,每个换能器4的头部与一个变幅杆5的尾部螺纹连接,每个变幅杆5的头部与一个平面超声工具头6的尾部螺纹连接。As shown in Figures 1, 2-1 and 2-2, the planar ultrasonic generating device includes a transducer 4, a horn 5, and a planar ultrasonic tool head 6; the output end of each ultrasonic generator controller 1 is connected to a transducer The tail of the transducer 4 is connected, the head of each transducer 4 is threaded with the tail of a horn 5, and the head of each horn 5 is threaded with the tail of a planar ultrasonic tool head 6.
反应装置包括反应观察室7、声波反射板8和反应容器9;反应观察室7为透明的密闭容器,两个平面超声工具头6的头部均伸入反应观察室7内,且两个平面超声工具头6沿水平方向垂直设置,平面超声工具头6的头部为方柱形;反应观察室7与每个平面超声工具头6相对的内侧壁处分别固定设置有一块声波反射板8。反应容器9设置在反应观察室7内,且设置在平面超声工具头6与声波反射板8之间。The reaction device comprises a reaction observation chamber 7, a sound wave reflection plate 8 and a reaction container 9; the reaction observation chamber 7 is a transparent airtight container, and the heads of the two plane ultrasonic tool heads 6 all extend into the reaction observation chamber 7, and the two planes The ultrasonic tool head 6 is vertically arranged along the horizontal direction, and the head of the planar ultrasonic tool head 6 is a square column; the inner wall of the reaction observation room 7 opposite to each planar ultrasonic tool head 6 is respectively fixed with a sound wave reflection plate 8 . The reaction container 9 is arranged in the reaction observation chamber 7 and is arranged between the planar ultrasonic tool head 6 and the sound wave reflection plate 8 .
平面超声工具头的个数n=2,超声在液体中的速度v取1500m/s,电脑程序控制平面超声工具头6产生超声,超声频率f为40KHz,功率为750W;根据计算可得,声波反射板8与对应平面超声工具头6的距离为37.5mm。The number n=2 of the planar ultrasonic tool heads, the velocity v of the ultrasonic wave in the liquid is 1500m/s, the computer program controls the planar ultrasonic tool head 6 to generate ultrasonic waves, the ultrasonic frequency f is 40KHz, and the power is 750W; It can be calculated that the distance between the sound wave reflection plate 8 and the corresponding planar ultrasonic tool head 6 is 37.5 mm.
一种网格化的多晶硅微纳加工方法的步骤如下:The steps of a gridded polysilicon micro-nano processing method are as follows:
步骤1.将分析纯氢氟酸溶液、分析纯硝酸溶液和去离子水按比例进行调配,形成混合酸液注入反应容器5中。Step 1. Prepare analytically pure hydrofluoric acid solution, analytically pure nitric acid solution and deionized water in proportion to form a mixed acid solution and inject it into the reaction vessel 5 .
调配混合酸液可以采用以下方式中的任何一种:The mixed acid solution can be prepared in any of the following ways:
(1)0.1L分析纯氢氟酸溶液、1L分析纯硝酸溶液和1L去离子水混合;(1) Mix 0.1L analytical pure hydrofluoric acid solution, 1L analytical pure nitric acid solution and 1L deionized water;
(2)0.9L分析纯氢氟酸溶液、1L分析纯硝酸溶液和2.25L去离子水混合;(2) Mix 0.9L analytical pure hydrofluoric acid solution, 1L analytical pure nitric acid solution and 2.25L deionized water;
(3)0.5L分析纯氢氟酸溶液、1L分析纯硝酸溶液和2.5L去离子水。(3) 0.5L of analytically pure hydrofluoric acid solution, 1L of analytically pure nitric acid solution and 2.5L of deionized water.
步骤2.由电脑程序驱动平面超声工具头6,在混合酸液中形成超声驻波,待混合酸液的液面平静形成稳定的正交超声驻波网格后,将经过洗净预处理的多晶硅材料放入反应容器9中进行制备,制备时间为4分钟。Step 2. The planar ultrasonic tool head 6 is driven by a computer program to form ultrasonic standing waves in the mixed acid solution. After the liquid level of the mixed acid solution is calm and a stable orthogonal ultrasonic standing wave grid is formed, the cleaned and pretreated The polysilicon material is put into the reaction vessel 9 for preparation, and the preparation time is 4 minutes.
步骤3.将经过步骤2制备的硅片置于去离子溶液中清洗2分钟,去除硅片的表面酸液残留。Step 3. Place the silicon chip prepared in step 2 into a deionized solution and clean it for 2 minutes to remove the acid residue on the surface of the silicon chip.
步骤4.将清洗加工好的硅片,进行封装,完成硅片制作。Step 4. The cleaned and processed silicon wafers are packaged to complete the production of silicon wafers.
该网格化的多晶硅微纳加工装置的具体工作过程为:The specific working process of the gridded polysilicon micro-nano processing device is as follows:
打开电脑3,将适量混合酸液注入反应容器9中,然后打开超声波发生器控制器1,调整电脑程序,使两个平面超声工具头6发出超声,每个平面超声工具头6发出的超声与对应声波反射板8反射后的超声叠加,从而形成两组互相垂直的驻波,等在混合酸液的液面上形成稳定的驻波网格时,取合适大小的硅片放置于混合酸液中,反应过程中可通过摄像机2观察反应的强烈程度,继而控制反应完全结束的时间。Turn on the computer 3, inject an appropriate amount of mixed acid into the reaction container 9, then turn on the ultrasonic generator controller 1, and adjust the computer program so that the two planar ultrasonic tool heads 6 emit ultrasonic waves, and the ultrasonic waves emitted by each planar ultrasonic tool head 6 are consistent with the Corresponding to the superimposition of the ultrasound reflected by the sound wave reflecting plate 8, thereby forming two sets of standing waves perpendicular to each other, and when a stable standing wave grid is formed on the liquid surface of the mixed acid solution, a silicon chip of an appropriate size is placed in the mixed acid solution During the reaction, the intensity of the reaction can be observed through the camera 2, and then the time for the reaction to be completely completed can be controlled.
反应观察室9为密闭容器,避免空气中的声波和空气流动干扰试验的进行。The reaction observation chamber 9 is an airtight container to avoid the interference of the sound waves and air flow in the air to the test.
如图3所示,该网格化的多晶硅微纳加工方法的反应机理如下:As shown in Figure 3, the reaction mechanism of the gridded polysilicon micro-nano processing method is as follows:
在酸腐蚀法制作多晶硅表面绒面结构时,主要是氟离子的参与,氟离子属于纳米粒子,通常情况下,氟离子在水中随机碰撞,做自由运动。超声波是一种高频纵向机械波,机械波对纳米粒子、微米离子气泡的作用可用牛顿第二定律描述:FA为溶液中离子在二维正交超声场中所受的力,v为离子在超声场的速度,箭头表示速度方向,利用正交的两组平面超生发生装置产生正交的驻波场,氟离子在声场驻波作用下将部分地受控于声场分布形式和化学作用环境,从而改变氟离子的微腐蚀加工位置,完成对多晶硅表面的纹理构造。When fabricating the suede structure on the surface of polysilicon by acid etching, it is mainly the participation of fluoride ions, which belong to nanoparticles. Usually, fluoride ions collide randomly in water and move freely. Ultrasound is a high-frequency longitudinal mechanical wave. The effect of mechanical waves on nanoparticles and micron ion bubbles can be described by Newton’s second law: F A is the force on ions in solution in a two-dimensional orthogonal ultrasonic field, and v is the force on ions in ultrasonic waves. The speed of the field, the arrow indicates the direction of the speed, and the orthogonal standing wave field is generated by two sets of orthogonal planar ultrasonic generating devices. The fluorine ion will be partially controlled by the sound field distribution form and the chemical action environment under the action of the standing wave of the sound field, so that Change the micro-etching processing position of fluorine ions to complete the texture structure on the polysilicon surface.
如图4、5和6为试验结果对比:Figures 4, 5 and 6 are comparisons of test results:
图4为硅片在分析纯氢氟酸溶液(HF):分析纯硝酸溶液(HNO3):去离子水(H2O)的体积比为2:15:5时经过4分钟无超声波试验,并且在电镜下10微米尺度观察到的多晶硅绒面微结构。Figure 4 shows that the silicon wafer has passed through 4 minutes of no ultrasonic test when the volume ratio of analytical pure hydrofluoric acid solution (HF): analytical pure nitric acid solution (HNO3): deionized water (H2O) is 2:15:5, and the electron microscope The textured microstructure of polysilicon observed at the scale of 10 microns.
图5为硅片在分析纯氢氟酸溶液(HF):分析纯硝酸溶液(HNO3):去离子水(H2O)的体积比为2:15:5时经过4分钟正交超声试验,并且在电镜下10微米尺度观察到的多晶硅绒面微结构。Figure 5 shows the 4-minute orthogonal ultrasonic test of silicon wafers when the volume ratio of analytical pure hydrofluoric acid solution (HF): analytical pure nitric acid solution (HNO 3 ): deionized water (H 2 O) is 2:15:5 , and the polysilicon textured microstructure observed at the scale of 10 microns under the electron microscope.
图6为硅片在分析纯氢氟酸溶液(HF):分析纯硝酸溶液(HNO3):去离子水(H2O)的体积比为2:15:5时经过4分钟正交超声试验,并且在电镜下50微米尺度观察到的多晶硅绒面微结构。Figure 6 shows the 4-minute orthogonal ultrasonic test of silicon wafers when the volume ratio of analytically pure hydrofluoric acid solution (HF): analytically pure nitric acid solution (HNO 3 ): deionized water (H 2 O) is 2:15:5 , and the polysilicon textured microstructure observed at the scale of 50 microns under the electron microscope.
可见采用该网格化的多晶硅微纳加工方法的正交超声试验,在硅表面形成的微结构较为均匀,可提高多晶硅表面减反效果,从而提高多晶硅光伏电池光电转化效率。It can be seen that the orthogonal ultrasonic test using the gridded polysilicon micro-nano processing method can form a relatively uniform microstructure on the silicon surface, which can improve the anti-reflection effect of the polysilicon surface, thereby improving the photoelectric conversion efficiency of polysilicon photovoltaic cells.
该方法步骤2中将经过洗净预处理的多晶硅材料放入反应容器中制备的时间在1~10分钟的范围内都可以选择;步骤3中将硅片置于去离子溶液中清洗时间在1~2分钟的范围内都可以选择。In step 2 of the method, the preparation time of putting the cleaned and pretreated polysilicon material into the reaction vessel can be selected within the range of 1 to 10 minutes; You can choose within the range of ~2 minutes.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6124214A (en) * | 1998-08-27 | 2000-09-26 | Micron Technology, Inc. | Method and apparatus for ultrasonic wet etching of silicon |
| CN101673785A (en) * | 2009-09-25 | 2010-03-17 | 上海大学 | Method for preparing reflection reduction film with surface embedded type porous silicon structure of silicon base solar battery |
| CN102168315A (en) * | 2011-03-14 | 2011-08-31 | 中节能太阳能科技(镇江)有限公司 | Method for texturing surface of monocrystalline silicon solar battery |
| CN203617322U (en) * | 2013-11-11 | 2014-05-28 | 杭州电子科技大学 | Gridding polycrystalline silicon micro-nano processing device |
-
2013
- 2013-11-11 CN CN201310558211.2A patent/CN103618026B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6124214A (en) * | 1998-08-27 | 2000-09-26 | Micron Technology, Inc. | Method and apparatus for ultrasonic wet etching of silicon |
| CN101673785A (en) * | 2009-09-25 | 2010-03-17 | 上海大学 | Method for preparing reflection reduction film with surface embedded type porous silicon structure of silicon base solar battery |
| CN102168315A (en) * | 2011-03-14 | 2011-08-31 | 中节能太阳能科技(镇江)有限公司 | Method for texturing surface of monocrystalline silicon solar battery |
| CN203617322U (en) * | 2013-11-11 | 2014-05-28 | 杭州电子科技大学 | Gridding polycrystalline silicon micro-nano processing device |
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