CN103559857B - A kind of method towards the detection of OLED screen picture element flaw and device - Google Patents
A kind of method towards the detection of OLED screen picture element flaw and device Download PDFInfo
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- CN103559857B CN103559857B CN201310532477.XA CN201310532477A CN103559857B CN 103559857 B CN103559857 B CN 103559857B CN 201310532477 A CN201310532477 A CN 201310532477A CN 103559857 B CN103559857 B CN 103559857B
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Abstract
The present invention relates to display screen pick-up unit, exactly, is a kind of method towards the detection of OLED screen picture element flaw and device.Comprise: OLED screen be placed in detection platform, initialization detection system, obtain the information of detected OLED screen, described packets of information is containing original image; When receiving original image, pre-service is carried out to described original image; When receive carry out pretreated original image time, rotational correction is carried out to described pretreated original image; When receiving the original image of rotational correction, iterative processing is carried out to the original image of described rotational correction; When receiving the original image of iterative processing, Iamge Segmentation is started to the original image of described iterative processing; According to receiving described segmentation image, described segmentation image and complete image being started to contrast whether existing defects, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
Description
Technical field
The present invention relates to display screen pick-up unit, exactly, is a kind of method towards the detection of OLED screen picture element flaw and device.
Background technology
OLED (OrganicLightEmittingDiode) Organic Light Emitting Diode, the new lover as current display circle emerges rapidly.Because it has low-power consumption, wide viewing angle, active illuminating, is easy to realize the advantages such as flexible manufacturing and is subject to people and more and more pays close attention to.Complicated technique makes product inevitably there will be small defect, and the display effect of these tiny defects to OLED impacts, in order to improve display quality and the yield rate of product.A defects detection link must be increased in the manufacture process of OLED.
But due to technique complicated in OLED production run, therefore cannot promote the development of OLED industry, main cause is as follows:
For the pollution of molecule in process for making, cause these defect hiding in the inside of OLED pixel, size is little, is generally tens microns, and seemingly, contrast is low and luminosity is uneven for gray scale and background classes.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of kind of the method detected towards OLED screen picture element flaw, is intended to the point defect that solution OLED causes in the pollution of the tiny microparticle of manufacture process.
Example of the present invention is achieved in that a kind of method detected towards OLED screen picture element flaw, comprising:
OLED screen be placed in detection platform, initialization detection system, obtain the information of detected OLED screen, described packets of information is containing original image;
When receiving original image, pre-service is carried out to described original image;
When receive carry out pretreated original image time, rotational correction is carried out to described pretreated original image;
When receiving the original image of rotational correction, iterative processing is carried out to the original image of described rotational correction;
When receiving the original image of iterative processing, Iamge Segmentation is started to the original image of described iterative processing;
According to receiving described segmentation image, described segmentation image and complete image being started to contrast whether existing defects, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
Another object of the embodiment of the present invention is to provide a kind of method detected towards OLED screen picture element flaw, comprising:
Described original image carries out pre-service, comprise and filtering and image enhaucament are carried out to original image, described filtering is filtered original image noise, and keep the clear and complete of original image edge contour, and described image enhaucament is the enhancing to pixel node brightness and contrast in original image;
Described pretreated original image carries out rotational correction, obtain view picture original image border, head and the tail coordinate is obtained according to described image boundary line, obtain the angle of view picture original image deflection according to coordinate computation, counter deflexion angular setting original image is carried out to described original image and is horizontal;
The original image of described rotational correction carries out iterative processing, comprise and extract template pixel and iteration Defect Search, described template extraction carries out pixel extraction in threshold range according to the original image after rotational correction, and described iteration Defect Search utilizes difference shadow method to carry out iteration to extraction rear pattern plate pixel;
The original image of described iterative processing starts Iamge Segmentation, is to utilize K-mean cluster to Image Segmentation Using after iterative processing, finally gets defect cluster and the background cluster of image.
Another object of the embodiment of the present invention is to provide a kind of device detected towards OLED screen picture element flaw, comprising:
Acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
Pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and image enhaucament to original image;
Rotational correction unit, for carrying out rotational correction according to receiving pre-service original image;
Iteration unit, for carrying out iteration according to receiving the original image after rotational correction, described iteration comprises extracts template pixel and iteration Defect Search;
Cutting unit, for splitting according to receiving the original image after iteration;
Decision unit, for starting to contrast whether existing defects according to receiving the original image after segmentation and complete image, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
Another object of the embodiment of the present invention is to provide a kind of device detected towards OLED screen picture element flaw, comprising:
Described pretreatment unit also comprises filtering subelement and image enhaucament subelement, described filtering subelement is used for filtering original image noise, and keeping the clear and complete of original image edge contour, described image enhaucament subelement is used for the enhancing to pixel node brightness and contrast in original image after filtering;
Described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, described extraction template pixel subelement is used for carrying out pixel extraction in threshold range to original image after rectification, and described iteration Defect Search subelement is used for carrying out falling finding out defect image for difference shadow method according to extraction template pixel.
The invention has the beneficial effects as follows: decrease human factor, detect automatically, easily and efficiently and the point defect that OLED causes in the pollution of the tiny microparticle of manufacture process improve product quality, reduce the cost of following process.
Accompanying drawing explanation
A kind of realization flow figure towards OLED screen picture element flaw detection method that Fig. 1 provides for the embodiment of the present invention;
A kind of realization flow figure towards OLED screen picture element flaw pick-up unit that Fig. 2 provides for the embodiment of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
As shown in Figure 1, be a kind of realization flow figure towards OLED screen picture element flaw detection method that the embodiment of the present invention provides, be implemented as follows:
In step S101, OLED screen be placed in detection platform, initialization detection system, obtain the information of detected OLED screen, described packets of information is containing original image;
In this example, OLED screen be placed in detection platform, after clamping is fixing, energising is lighted, initialization detection system, and start the collection that CCD carries out information, described packets of information, containing original image, is transferred in computing machine.
In step s 102, when receiving original image, pre-service is carried out to described original image.
In this example, due to illumination condition, information loss and noise in CCD photo-sensitive cell conversion accuracy and transmitting procedure, the original image that capital impact obtains, particularly, when carrying out pre-service, adopt median filtering method, described method is nonlinear filtering method, the noise of original image can be removed, and keep the clear and complete of image border profile, then, IMAQBCGLookup node is adopted to carry out original image enhancing, preferably, node control condition is by brightness location 128, contrast location 53.7, gamma factor location 1, the pixel profile of described image enhaucament to each original image is more clear.
In step s 103, when receive carry out pretreated original image time, rotational correction is carried out to described pretreated original image;
In this example, preferably, select IMAQFindHorizontalEdge node, in order to improve the precision of detection boundaries, the step-length of sampling is set to 1 pixel, obtains view picture original image border, obtains head and the tail coordinate according to described image boundary line, obtain the angle of view picture original image deflection according to coordinate computation, counter deflexion angular setting original image is carried out to described original image and is horizontal.
In step S104, when receiving the original image of rotational correction, iterative processing is carried out to the original image of described rotational correction;
In this example, owing to having carried out rotational correction to original image before, therefore image has now been in complete level, and so every one-row pixels is all level, and each row pixel is also vertical simultaneously.Wherein rectangle frame represents pixel, and stain represents the border of pixel, and red point represents the pixel upper left corner, empty wire frame representation pixel coverage, and the algorithm model extracting template pixel is particularly specific as follows:
The middle part horizontal line of the first row pixel extracts horizontal boundary, then on the middle part of a certain row pixel is vertical, extracts border.
Adopt horizontal boundary and add up the mean breadth that the method be averaging tries to achieve pixel, same method tries to achieve the average height of pixel.
The horizontal left margin of each pixel is combined with the coordinate of vertical coboundary, obtains the border, the upper left corner of pixel, take the upper left corner as basic point, extend the mean breadth of pixel to the right, to the average height of downward-extension pixel, just can obtain the scope of a pixel.
Continue to continue to use the method and mark all pixel coverages, the pixel coverage that accumulative interpolation is all, then try to achieve mean value and obtain template pixel.
In step S105, when receiving the original image of iterative processing, Iamge Segmentation is started to the original image of described iterative processing;
In this example, the original image of described rotational correction carries out iterative processing, comprise and extract template pixel and iteration Defect Search, described template extraction carries out pixel extraction in threshold range according to the original image after rotational correction, and described iteration Defect Search utilizes difference shadow method to carry out iteration to extraction rear pattern plate pixel.
In step s 106, according to receiving described segmentation image, described segmentation image and complete image being started to contrast whether existing defects, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
In this example, the original image of described iterative processing starts Iamge Segmentation, utilize K-mean cluster to Image Segmentation Using after iterative processing, image is divided into K class, K belongs to the integer being greater than 1, choose the initial cluster center of K pixel as each class, calculate the distance of each pixel to cluster centre, they are included into the class at that nearest cluster centre place.Recalculate its average to the new class produced, upgrade cluster centre by this average, repeatedly, until be that following criterion function reaches minimum, then declarative procedure convergence, segmentation completes iteration like this, finally gets defect cluster and the background cluster of image.
Fig. 2 shows a kind of realization flow figure towards OLED screen picture element flaw pick-up unit for the embodiment of the present invention provides, and is implemented as follows:
In step s 201, acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
In step S202, pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and image enhaucament to original image;
In step S2021, described pretreatment unit also comprises filtering subelement and image enhaucament subelement, and described filtering subelement is used for filtering original image noise, and keeps the clear and complete of original image edge contour,
In step S2022, described image enhaucament subelement is used for the enhancing to pixel node brightness and contrast in original image after filtering.
In step S203, rotational correction unit, for carrying out rotational correction according to receiving pre-service original image;
In step S204, iteration unit, for carrying out iteration according to receiving the original image after rotational correction, described iteration comprises extracts template pixel and iteration Defect Search;
In step S2041, described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, and described extraction template pixel subelement is used for carrying out pixel extraction in threshold range to original image after rectification,
In step S2042, described iteration Defect Search subelement is used for carrying out falling finding out defect image for difference shadow method according to extraction template pixel.
In step S205, cutting unit, for splitting according to receiving the original image after iteration.
In step S206, decision unit, for starting to contrast whether existing defects according to receiving the original image after segmentation and complete image, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1., towards the method that OLED screen picture element flaw detects, it is characterized in that, described method comprises:
OLED screen be placed in detection platform, initialization detection system, obtain the information of detected OLED screen, described packets of information is containing original image;
When receiving original image, pre-service is carried out to described original image;
When receive carry out pretreated original image time, rotational correction is carried out to described pretreated original image;
When receiving the original image of rotational correction, iterative processing is carried out to the original image of described rotational correction;
When receiving the original image of iterative processing, Iamge Segmentation is started to the original image of described iterative processing;
According to receiving described segmentation image, described segmentation image and complete image being started to contrast whether existing defects, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
2. a kind of method detected towards OLED screen picture element flaw according to claim 1, it is characterized in that, described original image carries out pre-service, comprise and filtering and image enhaucament are carried out to original image, described filtering is filtered original image noise, and keeping the clear and complete of original image edge contour, described image enhaucament is the enhancing to pixel node brightness and contrast in original image.
3. a kind of method detected towards OLED screen picture element flaw according to claim 1, it is characterized in that, described pretreated original image carries out rotational correction, obtain view picture original image border, head and the tail coordinate is obtained according to described image boundary line, obtain the angle of view picture original image deflection according to coordinate computation, counter deflexion angular setting original image is carried out to described original image and is horizontal.
4. a kind of method detected towards OLED screen picture element flaw according to claim 1, it is characterized in that, the original image of described rotational correction carries out iterative processing, comprise and extract template pixel and iteration Defect Search, described template extraction carries out pixel extraction in threshold range according to the original image after rotational correction, and described iteration Defect Search utilizes difference shadow method to carry out iteration to extraction rear pattern plate pixel.
5. a kind of method detected towards OLED screen picture element flaw according to claim 1, it is characterized in that, the original image of described iterative processing starts Iamge Segmentation, is to utilize K-mean cluster to Image Segmentation Using after iterative processing, finally gets defect cluster and the background cluster of image.
6., towards the device that OLED screen picture element flaw detects, it is characterized in that, described device comprises:
Acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
Pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and image enhaucament to original image;
Rotational correction unit, for carrying out rotational correction according to receiving pre-service original image;
Iteration unit, for carrying out iteration according to receiving the original image after rotational correction, described iteration comprises extracts template pixel and iteration Defect Search;
Cutting unit, for splitting according to receiving the original image after iteration;
Decision unit, for starting to contrast whether existing defects according to receiving the original image after segmentation and complete image, if not, then continues the detection of next block OLED screen; If so, then report to the police and location defect position.
7. a kind of device detected towards OLED screen picture element flaw according to claim 6, it is characterized in that, described pretreatment unit also comprises filtering subelement and image enhaucament subelement, described filtering subelement is used for filtering original image noise, and keeping the clear and complete of original image edge contour, described image enhaucament subelement is used for the enhancing to pixel node brightness and contrast in original image after filtering.
8. a kind of device detected towards OLED screen picture element flaw according to claim 6, it is characterized in that, described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, described extraction template pixel subelement is used for carrying out pixel extraction in threshold range to original image after rectification, and described iteration Defect Search subelement is used for carrying out falling finding out defect image for difference shadow method according to extraction template pixel.
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Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104484878B (en) * | 2014-12-16 | 2017-10-17 | 深圳市华星光电技术有限公司 | The automatic testing method of defects of display panel |
| CN106782233B (en) * | 2015-11-20 | 2020-12-18 | 宁波舜宇光电信息有限公司 | OLED display screen detection system and application thereof |
| CN108107611B (en) * | 2016-11-24 | 2021-01-12 | 研祥智能科技股份有限公司 | Self-adaptive defect detection method and device and electronic equipment |
| CN107103865B (en) * | 2017-04-10 | 2020-12-15 | 海信视像科技股份有限公司 | Method and device for detecting display area in display screen |
| CN107516482B (en) * | 2017-08-29 | 2020-11-13 | 苏州佳智彩光电科技有限公司 | ARM-based OLED screen detection compensation method |
| CN109743565B (en) * | 2018-12-14 | 2021-02-12 | 华南智能机器人创新研究院 | Method for automatically acquiring stable image by cooperation of multiple devices |
| CN109765245B (en) * | 2019-02-25 | 2021-08-13 | 武汉精立电子技术有限公司 | Large-size display screen defect detection and positioning method |
| CN110174414A (en) * | 2019-07-03 | 2019-08-27 | 厦门特仪科技有限公司 | A kind of Micro-OLED product optical detection apparatus and wafer chip detection method |
| CN110517231B (en) * | 2019-08-13 | 2023-12-22 | 云谷（固安）科技有限公司 | Method and device for detecting display edge of screen body |
| CN110517616B (en) * | 2019-09-10 | 2022-08-23 | 重庆汉朗精工科技有限公司 | Dead pixel mask positioning system of OLED display screen |
| CN113469944A (en) * | 2021-06-03 | 2021-10-01 | 厦门宏泰智能制造有限公司 | Product quality inspection method and device and electronic equipment |
| CN113724652B (en) * | 2021-08-25 | 2022-11-15 | 深圳贝尔信息科技有限公司 | Compensation method and device for Mura of OLED display panel and readable medium |
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