CN103278512B - Device and method for online detection on structural damage of solar panel by utilizing microwaves - Google Patents
Device and method for online detection on structural damage of solar panel by utilizing microwaves Download PDFInfo
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- CN103278512B CN103278512B CN201310167499.0A CN201310167499A CN103278512B CN 103278512 B CN103278512 B CN 103278512B CN 201310167499 A CN201310167499 A CN 201310167499A CN 103278512 B CN103278512 B CN 103278512B
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Abstract
The invention relates to a device and a method for online detection on the structural damage of a solar panel by utilizing microwaves. According to the device, an active microwave resonance cavity comprises a vector network analyzer, a frequency scanning source, a first isolator, a first tuner and a resonance cavity body which are connected sequentially; and a microwave signal processing system comprises a coupling probe which is positioned in the resonance cavity body, as well as an attenuator, a second tuner, a second isolator and a signal microprocessor circuit which are sequentially connected with the coupling probe. According to the method, microwave signals are transmitted into the surface of the detected solar panel through the resonance cavity body, one part of the microwave signals are absorbed and reflected while the other part of the microwave signals penetrate through the solar panel to reach a metal background to be transmitted totally; microwave-return signals are collected by the coupling probe and then processed by the signal microprocessor circuit, so that the instant resonance cavity frequency offset (Delta f) is obtained; and therefore, the structural damage of the detected solar panel can be detected. The device and the method provided by the invention can be used for performing the real-time online monitoring on the structural damage condition of the solar panel, so that the requirement of nondestructive detection on the solar panel in a production line is satisfied.
Description
Technical field
The present invention relates to solar panels structural damage detection technical field, be specifically related to a kind of device and method utilizing microwave on-line checkingi solar panels structural damage.
Background technology
Within 2008, China's solar panel output is 2895MW, within 2009, reaches 4382MW, accounts for 40% of global output, and China has become the large solar panel producing country of the first in the world worthy of the name.2010, the output of domestic photovoltaic cell reached 7GW, and wherein more than 90% is outlet.The market trend of the solar panels material that regenerative resource association of China estimates, the demand in the whole world in 2013 will be three times of 2008.China about has 443 in the solar panel produced and assembly production firm, and formed the full industrial chain manufacturing enterprise being prepared into solar components production from silicon, its production capacity leaps into the front ranks of the world.Current green energy resource demand increases just rapidly, and the solar panel output continuous enlargement rapidly and vigorously of China, will cause the demand of enterprise to cell panel structure damage detection device.
Solar cell panel structure damage check is the critical workflow in solar panel or assembly generative process, usually cut into slices by polycrystalline or monocrystal bar due to silicon materials solar panel and form, all likely there is breakage in each link in process of production, produces hiddenly to split, fragment, collapse the defects such as limit, rosin joint, section grid.If slice thickness reduces, the use amount of silicon materials can be reduced, reduce costs, reduce energy consumption.But the thing followed is the increase of breakage rate, and more strict to the control overflow producing each link, otherwise run counter to desire.Most producer silicon wafer thickness is at 200 microns, and Ying Li group has accomplished that thickness is at 180 microns.Preparation technology's general sequence of battery is forming silicon film surface preparation, diffusion, removing back of the body knot, making upper/lower electrode, corrosion periphery, evaporation antireflecting film, finally makes silicon solar cell.Wherein the effect of electrode is used to export electric energy, and antireflective film is the power in order to improve output.Because the technological process link made is many, preparation condition is required strict, so the mass defect of battery is difficult to avoid.Show as: the film 1) be shaped may exist cut, crackle; 2) surface of adherence of silicon fiml and antireflective film has gap; 3) pore may be had to exist in the antireflective film of evaporation.These defects mostly naked eyes are invisible, so need a kind of sensitive accurate, equipment that can detect incipient defect.The defect of solar panel have impact on serviceable life and the efficiency of battery greatly, and the quality improving cell panel just becomes quite important.If breakage can be found after each production link completes, just can adjust the running status of production equipment in time, thus improve qualification rate and the product hierarchy of product, so just need a large amount of online structural damage detection equipment.
At present, infrared scan detection and electroluminescence is had to detect two kinds from Cleaning Principle.Infrared scan detection method adopts the LASER Light Source of certain wavelength, carries out point by point scanning to solar panel, and corresponding light activated element detects defect situation.This method is long for detection time to large scale solar panel, and imaging is coarse, and scanning mechanism is complicated.Electroluminescence detection method, when utilizing solar panel PN junction forward to be energized exactly, electronics and hole-recombination, release energy with the form of launching photon.Simultaneously owing to there is junction resistance, also can produce heat, send infrared radiation.Defective part, without electron transfer, just can make cell panel occur obvious blackening, adopts the method for shooting to obtain the image of solar cell dash-board injury.This method does not need scanning mechanism, and device structure is comparatively simple, but also has that cost is high, color displays is limited, by the shortcoming of ambient light effects, process complexity.And the solar panel defect detection equipment that at present domestic manufacturers produce mostly is off-line type, for sampling observation, can not on-line checkingi, be difficult to meet the day by day harsh requirement of photovoltaic enterprise.The on-line checkingi of solar cell dash-board injury has become the emphasis of research at present.
Summary of the invention
In order to solve above-mentioned prior art Problems existing, the object of the present invention is to provide a kind of device and method utilizing microwave on-line checkingi solar panels structural damage, pick-up unit of the present invention and method can realize the monitoring of the real-time online to solar panel degree of impairment, meet the requirement to the cell panel Non-Destructive Testing on production line.
Principle of the present invention is: the Microwave emission power that detection system adopts, generally between a few milliwatt to tens milliwatts, all can be ignored the intensification effect of different materials microwave, therefore can think that Microwave emission power and received power are substantially identical, i.e. no power waste.On the other hand, the relative dielectric constant of solar panel (silicon materials) is about 11.9, and fault location is air, and relative dielectric constant is 1.When relative dielectric constant is large, reflectivity is just little, and absorptivity is large; Relative dielectric constant hour, in contrast.Microwave is when dielectric substance internal communication, and material polarization phenomena will occur.But the magnetic permeability of silicon and air is all 1, and loss tangent is 0, so only have the difference of relative dielectric constant.In microwave frequency band, the specific inductive capacity of cracks with do not have compared with cracks low, a small amount of change in measurand will cause its compound dielectric, and great changes will take place, therefore can determine that it damages according to the change of the relative dielectric constant of measured matter.
For reaching above object, the present invention adopts following technical scheme:
Utilize a device for microwave on-line checkingi solar panels structural damage, comprise active microwave cavity, microwave signal process system and degree of impairment LED light 13; Described active microwave cavity comprises the vector network analyzer 1, frequency sweeping source 2, first isolator 3-1, the first tuner 4-1 resonant cavity body 6 that connect successively; Described microwave signal process system comprises the coupling probe 7 be placed in resonant cavity 6, with attenuator 11, second tuner 4-2, the second isolator 3-2 and signal microprocessor circuit 12 that coupling probe 7 is connected successively.
Described first tuner 4-1 resonant cavity body 6 is connected by concentric cable 5.
The described above detection method utilizing the device of microwave on-line checkingi solar panels structural damage, first the resonant cavity 6 of device is fixed on above tested solar panel, then by vector network analyzer 1 controlled frequency scan source 2, first isolator 3-1, first tuner 4-1 resonant cavity body 6 transmission frequency is the microwave signal 8 of 3 ~ 20GHz enters tested solar panel 9 surface by resonant cavity opening, a part is by absorption reflection, a part penetrate tested solar panel 9 to metal background 10 surface and be totally reflected, then echoed signal is picked up by coupling probe 7, this echoed signal is via attenuator 11, second tuner 4-2 and the second isolator 3-2 process, and compared by the resonator cavity frequency under signal microprocessor circuit 12 and the zero defect situation of demarcating in advance and obtain instant resonator cavity frequency offset Δ f, the structural damage degree of tested solar panel can be learnt by instant resonator cavity frequency offset Δ f, and the degree of impairment LED light 13 that display is corresponding.
Active microwave cavity applies in solar panel damage check by the present invention, and this resonator cavity is sensor, and be again an ingredient of oscillator, this device can be fixed on a production line, allows cell panel to be detected pass through.When have under resonator cavity the cell panel of existing defects by time, only need measure instant resonator cavity frequency offset Δ f, just can record respective battery plate has zero defect.Utilize microcontroller circuit, can higher accuracy of detection be obtained.The Microwave emission power of this system is about 10mW, scattering microwave during work to environment and human body pollution-free, security is higher and not by ambient light effects, cost is low.And microwave measurement defect technology has rapidly, continuously, does not contact, the advantages such as resolving power is high, safe and simple with measured object.
Accompanying drawing explanation
Accompanying drawing is pick-up unit schematic diagram of the present invention.
Embodiment
Below in conjunction with drawings and the specific embodiments, the present invention is described in further detail.
As shown in drawings, a kind of device utilizing microwave on-line checkingi solar panels structural damage of the present invention, comprises active microwave cavity, microwave signal process system and degree of impairment LED light 13; Described active microwave cavity comprises the vector network analyzer 1, frequency sweeping source 2, first isolator 3-1, the first tuner 4-1 resonant cavity body 6 that connect successively; Described microwave signal process system comprises the coupling probe 7 be placed in resonant cavity 6, with attenuator 11, second tuner 4-2, the second isolator 3-2 and signal microprocessor circuit 12 that coupling probe 7 is connected successively.Described first tuner 4-1 resonant cavity body 6 is connected by concentric cable 5.Solar panel 9 is detected object, and arranging metal background 10 is to allow microwave be totally reflected, and not so picks up less than echoed signal.
As shown in drawings, the present invention utilizes the device detection method of microwave on-line checkingi solar panels structural damage, first the resonant cavity 6 of device is fixed on above tested solar panel, then by vector network analyzer 1 controlled frequency scan source 2, first isolator 3-1, first tuner 4-1 resonant cavity body 6 transmission frequency is the microwave signal 8 of 3 ~ 20GHz enters tested solar panel 9 surface by resonant cavity opening, a part is by absorption reflection, a part penetrate tested solar panel 9 to metal background 10 surface and be totally reflected, then echoed signal is picked up by coupling probe 7, this echoed signal is via attenuator 11, second tuner 4-2 and the second isolator 3-2 process, and compared by the resonator cavity frequency under signal microprocessor circuit 12 and the zero defect situation of demarcating in advance and obtain instant resonator cavity frequency offset Δ f, the structural damage degree of tested solar panel can be learnt by instant resonator cavity frequency offset Δ f, and the degree of impairment LED light 13 that display is corresponding.
Embodiment
Choose the intact solar silicon wafers six of 125*125mm specification, make following defect respectively by wire cutting machine: the silicon chip that (1) is intact; (2) duck eye of diameter 1mm; (3) hole of diameter 1.5mm; (4) hole of diameter 2mm; (5) cut of length 5mm; (6) crackle of length 5mm.
Utilize the sample measurement resonance frequency shift amount evaluation result of said apparatus to six kinds of different degree of impairments as shown in table 1:
Table 1
In table 1, pilot lamp 1 is green light; Pilot lamp 2 is red light, represents that solar silicon wafers has damage.
From experimental result, the threshold value of this measurement device defect is 1mm.The defect being less than or equal to 1mm not easily causes the skew of resonance frequency, cannot measure; And the skew being greater than the defect resonance frequency of 1mm is obvious, be easy to measure.
Claims (2)
1. utilize a detection method for the device of microwave on-line checkingi solar panels structural damage, described device comprises active microwave cavity, microwave signal process system and degree of impairment LED light (13); Described active microwave cavity comprise connect successively vector network analyzer (1), frequency sweeping source (2), the first isolator (3-1), the first tuner (4-1) resonant cavity body (6); Described microwave signal process system comprises the coupling probe (7) be placed in resonant cavity (6), with attenuator (11), the second tuner (4-2), the second isolator (3-2) and signal microprocessor circuit (12) that coupling probe (7) is connected successively; it is characterized in that: described detection method is: first the resonant cavity (6) of device is fixed on above tested solar panel, then by vector network analyzer (1) controlled frequency scan source (2), first isolator (3-1), first tuner (4-1) resonant cavity body (6) transmission frequency is the microwave signal (8) of 3 ~ 20GHz enters tested solar panel (9) surface by resonant cavity opening, a part is by absorption reflection, a part penetrate tested solar panel (9) to metal background (10) surface and be totally reflected, then by coupling probe (7) pickup echoed signal, this echoed signal is via attenuator (11), second tuner (4-2) and the second isolator (3-2) process, and compared by the resonator cavity frequency under signal microprocessor circuit (12) and the zero defect situation of demarcating in advance and obtain instant resonator cavity frequency offset Δ f, the structural damage degree of tested solar panel can be learnt by instant resonator cavity frequency offset Δ f, and the degree of impairment LED light (13) that display is corresponding.
2. detection method according to claim 1, is characterized in that: described first tuner (4-1) resonant cavity body (6) is connected by concentric cable (5).
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| CN104713883B (en) * | 2013-12-11 | 2017-08-25 | 上海空间电源研究所 | Large area space solar battery array defect quick detection and automatic identifying method |
| CN104965004B (en) * | 2015-06-11 | 2017-11-03 | 四川大学 | The one-dimensional concrete health monitor method of reinforcing bar coaxial cable structure and step test instrument |
| CN108459306B (en) * | 2017-12-30 | 2021-11-26 | 湖北航天技术研究院总体设计所 | Method and device for testing laser damage effect of radar hood in real time |
| CN108918555A (en) * | 2018-05-15 | 2018-11-30 | 苏州伟尼特美智能科技有限公司 | Monitoring Corrosion system and corrosion monitoring process based on HF RFID |
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| CN202548071U (en) * | 2012-04-20 | 2012-11-21 | 上海浔科自动化设备有限公司 | On-line microwave detection and elimination system for combined filter stick |
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