CN103257465B - A kind of pick-up unit and detection method - Google Patents

Abstract

The invention relates to the technical field of detection, and discloses a detection device and a detection method, wherein the detection device includes: an image acquisition module for collecting image information of a liquid crystal panel to be tested; an image processing module connected to the signal of the image acquisition module, and the image processing module The received image information is compared with the defect database to determine the defect level of the liquid crystal panel to be tested. The above detection device, when in use, the image acquisition module can collect image information at any position of the liquid crystal panel to be tested, and the image processing module compares the received image information collected by the image acquisition module with the defect database, and then determines the Measure the defect level of LCD panel. Therefore, the detection device provided by the present invention improves the defect recognition rate and detection efficiency of the liquid crystal panel.

Description

A detection device and detection method

technical field

The invention relates to the technical field of detection, in particular to a detection device and a detection method. The detection device is suitable for the detection of liquid crystal panels.

Background technique

With the continuous provision of liquid crystal display technology, people have higher and higher requirements for the quality and display effect of liquid crystal display products.

In the production process of liquid crystal displays, it is necessary to perform defect detection on the liquid crystal panels that have been produced, so as to improve the good rate of the liquid crystal panels. Under the prior art, it is necessary to manually inspect the cell thickness of the liquid crystal panel, the alignment of the liquid crystal panel, and whether there are foreign objects in the liquid crystal panel.

However, this detection method in the prior art has a low defect recognition rate for liquid crystal panels, is prone to false detection, and has low detection efficiency.

Contents of the invention

The invention provides a detection device and a detection method, which improve the defect recognition rate and detection efficiency of a liquid crystal panel.

To achieve the above object, the present invention provides the following technical solutions:

A detection device, comprising:

An image acquisition module for collecting image information of a liquid crystal panel to be tested;

An image processing module signal-connected with the image acquisition module, the image processing module compares the received image information with the defect database, and determines the defect level of the liquid crystal panel to be tested.

In some optional embodiments, the above detection device also includes:

a casing, the casing encloses a detection chamber;

A machine installed in the detection chamber and supporting the liquid crystal panel to be tested;

A bracket that is located in the detection chamber and can slide relative to the machine table, and the bracket is parallel to the support surface of the machine table, and the image acquisition module is slidably installed on the bracket.

In some optional embodiments, the image acquisition module includes: a first camera tube for collecting bad image information caused by foreign matter and/or air bubbles, a second camera tube for collecting image information of foreign matter positions, The third camera tube used to collect the color difference image information caused by the cell thickness of the liquid crystal panel to be tested, the fourth camera tube used to collect the image information of the alignment film damage of the liquid crystal panel to be tested, and the camera tube used to collect the color difference image information in the liquid crystal panel to be tested The fifth imaging tube for the image information of the alignment status of the two substrates, wherein the first imaging tube, the second imaging tube, the third imaging tube, the fourth imaging tube, and the fifth imaging tube are the same as The collection angle between the supporting surfaces of the machine table is adjustable.

In some optional embodiments, the first imaging tube is an infrared imaging tube, and the second imaging tube, the third imaging tube, the fourth imaging tube and the fifth imaging tube are all charge Coupling element lens.

In some optional embodiments, the image processing module includes: an infrared image sensor that receives image information collected by the image collection module and converts the image information into electrical signals;

An image recognizer connected with the infrared image sensor signal to analyze and compare the electrical signal;

The calculation module is connected with the signal of the image recognizer and judges the defect level of the liquid crystal panel to be tested.

In some optional embodiments, there are installation shafts on opposite sides of the machine table respectively, and the axis of each of the installation shafts is parallel to the support, and the machine table can Rotationally mounted to the housing.

In some optional embodiments, a first chute and a second chute are respectively provided on opposite sides of the housing, and the first chute and the second chute are parallel to each other, and the bracket One end is slidingly matched with the first sliding slot, and the other end is interactively matched with the second sliding slot.

In some optional embodiments, alignment probes for fixing the liquid crystal panel to be tested are arranged on the support surface of the machine.

In some optional embodiments, the detection device further includes an illumination mechanism, and the illumination mechanism is arranged in the machine table to illuminate the liquid crystal panel to be inspected.

In some optional embodiments, the detection chamber is provided with an optical sensor, and the optical sensor is used to collect signals generated when human hands or other objects enter the detection chamber.

The present invention also provides a detection method comprising:

Load the LCD panel to be tested;

The image acquisition module collects the image information of the liquid crystal panel to be tested;

The image processing module compares the received image information with the defect database to determine the defect level of the liquid crystal panel to be tested.

In some optional embodiments, the image acquisition module includes: a first camera tube, a second camera tube, a third camera tube, a fourth camera tube, and a fifth camera tube, and the step: the image capture module collects The image information of the liquid crystal panel to be tested specifically includes:

Using the first camera tube to collect bad image information caused by foreign matter and/or air bubbles on the liquid crystal panel to be tested;

Use the second camera tube to collect the image information of the position of the foreign object on the liquid crystal panel to be tested;

The third camera tube is used to collect the color difference image information caused by the cell thickness of the liquid crystal panel to be tested;

Using the fourth camera tube to collect the damage image information of the alignment film of the liquid crystal panel to be tested;

The fifth camera tube is used to collect the image information of the alignment status of the two substrates in the liquid crystal panel.

In some optional embodiments, the step: the image processing module compares the received image information with the defect database, and determining the defect level of the liquid crystal panel to be tested specifically includes:

Judging the size of the air bubbles caused by the poor sealing of the sealant according to the image information collected by the first camera tube, if the diameter of the air bubbles is greater than 8mm, the air bubbles are large air bubbles; if the diameter of the air bubbles is less than 8mm, the air bubbles are small air bubbles;

Adjusting the acquisition angle of the second camera tube and the liquid crystal panel to be tested, if the image of the foreign object does not move, the foreign object is located in the liquid crystal panel to be tested; if the image of the foreign object moves, the foreign object is located outside the liquid crystal panel to be tested; If the black matrix blocks the image of the foreign matter, the foreign matter is located outside the color filter substrate; if the image of foreign matter bubbles covers the black matrix, the foreign matter is located outside the array substrate;

According to the comparison of the image information collected by the third camera tube with the defect database, by observing whether there is color difference in the liquid crystal panel to be tested, it is judged whether the cell thickness of the liquid crystal panel to be tested is normal;

According to the comparison between the image information collected by the fourth camera tube and the defect database, it is judged whether the alignment film of the liquid crystal panel to be tested is damaged;

According to the comparison between the image information collected by the fifth camera tube and the defect database, if there is an offset between the two substrates in the liquid crystal panel to be tested, the offset is calculated by the calculation module.

The detection device provided by the invention comprises:

An image acquisition module for collecting image information of a liquid crystal panel to be tested;

An image processing module signal-connected with the image acquisition module, the image processing module compares the received image information with the defect database, and determines the defect level of the liquid crystal panel to be tested.

Machine vision defect detection is based on the comparison and matching of the defect library to determine whether the defect exceeds the requirements. The defect detection needs to build the defect library of the inspected item, and quickly compare the physical object with the defect library to replace the human eye to make a qualified judgment. Defect detection requires as large an optical field of view as possible to be able to distinguish the smallest defect and requires a limit resolution standard (since the limit resolution of the human eye is 0.1mm, defect inspection generally only needs to pick out defects larger than 0.1mm , or even defect features of a few millimeters). The machine vision inspection system is based on high-resolution industrial cameras and vision software, which can perform appearance inspection, dimension measurement, angle measurement, character recognition, etc. on products.

The invention point of the present invention is based on the defect detection system of machine vision technology, non-contact detection and measurement, has high accuracy, wide spectral response range, can work stably for a long time, saves a lot of labor resources, and greatly improves work efficiency . It can detect defects such as spots, pits, scratches, color differences, and defects on the surface of the workpiece.

Machine vision surface defect detection system is now widely used in plastic film, metal, flat panel display, printing, glass, paper making and other industries to accurately analyze various defects and blemishes in the target object. The visual online inspection products used in the field of industrial assembly line quality inspection can perform real-time and accurate surface quality inspections on various high-speed and continuous production products within a 100% range, providing effective solutions for improving production automation and ensuring quality control. solution.

The detection device provided by the present invention, when in use, the image acquisition module can collect image information at any position of the liquid crystal panel to be tested, and the image processing module compares the received image information collected by the image acquisition module with the defect database, Further, the defect level of the liquid crystal panel to be tested is determined.

The detection device provided by the present invention avoids the problems of low defect recognition rate, prone to false detection, and low detection efficiency mentioned in the background art when manually detecting a liquid crystal panel.

Therefore, the detection device provided by the present invention improves the defect recognition rate and detection efficiency of the liquid crystal panel.

The present invention also provides a detection method, comprising:

Load the LCD panel to be tested;

The image acquisition module collects the image information of the liquid crystal panel to be tested;

The image processing module compares the received image information with the defect database to determine the defect level of the liquid crystal panel to be tested.

The above detection method also improves the defect recognition rate and detection efficiency of the liquid crystal panel.

Description of drawings

Fig. 1 is the principle schematic diagram of detection device provided by the present invention;

Fig. 2 is the structural representation of detection device provided by the present invention;

Fig. 3 is a schematic structural diagram of the image acquisition module in the detection device provided by the present invention;

4 is a schematic diagram of the principle of the image processing module in the detection device provided by the present invention;

Fig. 5 is the flow chart of detection method provided by the present invention;

Fig. 6 is a schematic diagram of foreign matter position images in the defect database provided by the present invention;

Fig. 7A is a schematic diagram of the first alignment film damage image in the defect database provided by the present invention;

Fig. 7B is a schematic diagram of the second alignment film damage image in the defect database provided by the present invention;

FIG. 7C is a schematic diagram of a third alignment film damage image in the defect database provided by the present invention.

Reference signs:

1-LCD panel to be tested 11-color film substrate 111-black matrix 12-array substrate 13-liquid crystal molecular layer 14A-foreign matter 14B-foreign matter 14C-foreign matter 3-housing 31-optical sensor 32-first chute 33- Second chute 2-support 21-image acquisition module 211-first camera tube 212-second camera tube 213-third camera tube 214-fourth camera tube 215-fifth camera tube 22-image processing module 221-infrared Image sensor 222-image recognizer 223-calculation module 4-machine 41-installation shaft 42-illumination mechanism 43-alignment probe

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of patent protection of the present invention.

Embodiment one

The principle schematic diagram of the detection device provided by the present invention is shown in Figure 1, and the detection device comprises:

An image acquisition module 21 for collecting the image information of the liquid crystal panel 1 to be tested;

The image processing module 22 is signal-connected with the image acquisition module 21. The image processing module 22 compares the received image information with the defect database to determine the defect level of the liquid crystal panel 1 to be tested.

Machine vision defect detection is based on the comparison and matching of the defect library to determine whether the defect exceeds the requirements. The defect detection needs to build the defect library of the inspected item, and quickly compare the physical object with the defect library to replace the human eye to make a qualified judgment. Defect detection requires as large an optical field of view as possible to be able to distinguish the smallest defect and requires a limit resolution standard (since the limit resolution of the human eye is 0.1mm, defect inspection generally only needs to pick out defects larger than 0.1mm , or even defect features of a few millimeters). The machine vision inspection system is based on high-resolution industrial cameras and vision software, which can perform appearance inspection, dimension measurement, angle measurement, character recognition, etc. on products.

The invention point of the present invention is based on the defect detection system of machine vision technology, non-contact detection and measurement, has high accuracy, wide spectral response range, can work stably for a long time, saves a lot of labor resources, and greatly improves work efficiency . It can detect spots, pits, scratches, color differences, defects and other defects on the surface of the parts to be tested.

Machine vision surface defect detection system is now widely used in plastic film, metal, flat panel display, printing, glass, paper making and other industries to accurately analyze various defects and blemishes in the target object. The visual online inspection products used in the field of industrial assembly line quality inspection can perform real-time and accurate surface quality inspections on various high-speed and continuous production products within a 100% range, providing effective solutions for improving production automation and ensuring quality control. solution.

In the detection device provided by the present invention, the image acquisition module 21 can collect image information at any position of the liquid crystal panel 1 to be tested, and the image processing module 22 compares the received image information collected by the image acquisition module 21 with the defect database, Further, the defect level of the liquid crystal panel 1 to be tested is determined.

The detection device provided by the present invention avoids the problems of low defect recognition rate, prone to false detection, and low detection efficiency mentioned in the background art when manually detecting a liquid crystal panel.

Therefore, the detection device provided by the present invention improves the defect recognition rate and detection efficiency of the liquid crystal panel.

In order to facilitate detection, the structural schematic diagram of the above-mentioned detection device is shown in Figure 2, and also includes:

Housing 3, which encloses a detection chamber;

A machine 4 installed in the testing room and supporting the liquid crystal panel 1 to be tested;

The bracket 2 is located in the detection chamber and can slide relative to the machine platform 4 , and the bracket 2 is parallel to the support surface of the machine platform 4 , and the image acquisition module 21 is slidably installed on the bracket 2 .

When the above-mentioned detection device is in use, specifically, the liquid crystal panel 1 to be tested is placed on the machine platform 4 in the detection room. Since the support 2 can slide relative to the machine platform 4, the image acquisition module 21 can slide along the support 2, so the image acquisition The module 21 can collect the image information at any position of the liquid crystal panel 1 to be tested, and the image processing module 22 compares the received image information collected by the image collection module 21 with the defect database, and then determines the defect of the liquid crystal panel 1 to be tested grade.

In a preferred embodiment of the present invention, the casing 3 is made of a transparent material so that the operator can observe the operation of the detection chamber.

In some optional embodiments, as shown in FIG. 3 , the image acquisition module includes: a first camera tube 211 for acquiring bad image information caused by foreign objects and/or air bubbles; The second camera tube 212, the third camera tube 213 for collecting the color difference image information caused by the cell thickness of the liquid crystal panel 1 to be tested, the fourth camera tube 214 for collecting the alignment film damage image information of the liquid crystal panel 1 to be tested, And the fifth imaging tube 215 for collecting the alignment status image information of the two substrates in the liquid crystal panel 1 to be tested, wherein the first imaging tube 211, the second imaging tube 212, the third imaging tube 213, The collection angles between the fourth camera tube 214 and the fifth camera tube 215 and the supporting surface of the machine table are adjustable.

Preferably, the first imaging tube 211 is an infrared imaging tube, and the second imaging tube 212 , the third imaging tube 213 , the fourth imaging tube 214 and the fifth imaging tube 215 are all charge-coupled device lenses (CCD, charge-coupled device). CCD is a semiconductor device that converts optical images into digital signals.

It is explained here that when detecting whether there are foreign objects and/or air bubbles in the liquid crystal panel to be tested, the first imaging tube (infrared imaging tube) can judge whether there are foreign objects or air bubbles and bubbles according to the infrared sensing signals sent by the foreign objects or air bubbles respectively. Generally, it is because the sealant coated around the liquid crystal panel to be tested does not have a good sealing effect, so that the outside air enters the liquid crystal panel. The color difference caused by the cell thickness is mainly due to the uneven thickness of the liquid crystal cell. In the previous process, the uneven surface of the liquid crystal cell is pierced by the alignment probe, which makes the color displayed by the liquid crystal panel have color difference. Alignment film damage means that when the liquid crystal panel to be tested is oriented with an alignment roller, there may be sundries between the hairs of the alignment cloth on the alignment roll, and the sundries may scratch the alignment film.

As shown in Figure 4, the image processing module includes: an infrared image sensor 221 that receives the image information collected by the image acquisition module and converts the image information into electrical signals;

An image recognizer 222 connected to the infrared image sensor 221 for signal analysis and comparison of the electrical signals;

The calculation module 223 is connected with the image recognition device 222 and determines the defect level of the liquid crystal panel 1 to be tested.

The above computing module is preferably a computer.

In order to prevent the operator from being injured during the operation of the detection device, preferably, as shown in Figure 2, an optical sensor 31 is provided in the detection room surrounded by the housing 3, and the optical sensor 31 is used to collect human hands or other objects into the detection chamber. signal generated in the room. During the operation of the detection device, if people or other objects enter the detection room, the optical sensor will collect these signals and transmit the signal to the control module of the detection device, so that the detection device will stop running urgently.

In order to detect the defects produced when the liquid crystal panel is subjected to gravity, as shown in Figure 1, there are mounting shafts 41 on the opposite two sides of the machine 4, and the axis of each mounting shaft 41 is parallel to the support 2, and the machine 4 Each mounting shaft 41 is rotatably mounted on the casing 3 . When detecting the defect that occurs when the liquid crystal panel is subject to gravity, the machine base 4 is rotated 90 degrees downwards around the installation shaft 41 (or the installation shaft 41 is relatively fixed with the machine table 4, and the installation shaft 41 is rotated 90 degrees downwards to drive the motor table rotation), the bracket 2 also rotates 90 degrees at the same time, at this time, the liquid crystal panel 1 to be tested will be affected by its own gravity, and the image information of the liquid crystal panel 1 to be tested at this time will be collected by the image acquisition module 21, and the collected image information will be Compare with the defect database to determine the defect level of the liquid crystal panel to be tested.

Preferably, as shown in FIG. 2 , a first chute 32 and a second chute 33 are respectively provided on opposite sides of the housing 3 , and the first chute 32 and the second chute 33 are parallel to each other, and one end of the bracket 2 It is slidingly matched with the first sliding slot 32 , and the other end is slidingly matching with the second sliding slot 33 . The support 2 can slide relative to the machine table 4 .

In order to better carry the liquid crystal panel to be tested, as shown in Figure 2, the support surface of the machine 4 is provided with an alignment probe 43 that fixes the liquid crystal panel to be tested 1, and the design of the machine here can adopt the existing technology. Machine design method with alignment probes.

Preferably, as shown in FIG. 2 , the detection device includes an illumination mechanism 42 , which is arranged in the machine 4 and illuminates the liquid crystal surface 1 to be detected. The lighting mechanism 42 should cooperate with the camera tube of the image acquisition module to provide different types of light. The camera tube is a polarized camera, and the light emitted by the lighting mechanism 42 is polarized light; the camera tube is a CCD lens, and the lighting mechanism 42 provides a common backlight. Further, the lighting mechanism 42 may include: LED backlights, and polarizers on multiple backlights. LED lights have the advantages of strong color rendering, strong luminescence, low power consumption, small heat dissipation, high spectral range and long life.

Embodiment two

The present invention also provides a detection method, the flow chart of the detection method is as shown in Figure 5, including:

Step S501: loading the liquid crystal panel to be tested;

Step S502: the image acquisition module collects the image information of the liquid crystal panel to be tested;

Step S503: The image processing module compares the received image information with the defect database to determine the defect level of the liquid crystal panel to be tested.

Preferably, the image acquisition module includes: a first camera tube, a second camera tube, a third camera tube, a fourth camera tube, and a fifth camera tube. Step S502: the image acquisition module collects the image information of the liquid crystal panel to be tested, which specifically includes :

Use the first camera tube to collect bad image information caused by foreign matter and/or air bubbles of the liquid crystal panel to be tested;

Use the second camera tube to collect the image information of the position of the foreign object on the liquid crystal panel to be tested;

The third camera tube is used to collect the color difference image information caused by the cell thickness of the liquid crystal panel to be tested;

Using the fourth camera tube to collect the damage image information of the alignment film of the liquid crystal panel to be tested;

The fifth camera tube is used to collect the image information of the alignment status of the two substrates in the liquid crystal panel.

Further, step S503: the image processing module compares the received image information with the defect database, and determines the defect level of the liquid crystal panel to be tested, which specifically includes:

Judging the size of the air bubbles caused by the poor sealing of the sealant according to the image information collected by the first camera tube, if the diameter of the air bubbles is greater than 8mm, the air bubbles are large air bubbles; if the diameter of the air bubbles is less than 8mm, the air bubbles are small air bubbles;

As shown in FIG. 6 , a schematic diagram of foreign object position images in the defect database provided by the present invention, a liquid crystal panel generally includes a color filter substrate 11 , an array substrate 12 and a liquid crystal molecule layer 13 between the array substrate 12 and the color filter substrate 11 . When the liquid crystal panel is tested, generally the array substrate 12 is on top, and the image acquisition module 21 is on the side of the array substrate 12 of the liquid crystal panel 1 . Adjust the acquisition angle of the second camera tube and the liquid crystal panel to be tested in the image acquisition module 21, if the image of the foreign object 14 does not move, then the foreign object 14A is located in the liquid crystal panel to be tested 1; if the image of the foreign object 14 moves, the foreign object 14 is located Measure the outside of the liquid crystal panel 1; if the black matrix 111 blocks the image of the foreign object 14, the foreign object 14B is located outside the color filter substrate 12; if the image of the foreign object 14 covers the black matrix 111, the foreign object 14C is located outside the array substrate 11.

According to comparing the image information collected by the third camera tube with the defect database, by observing whether there is color difference in the liquid crystal panel to be tested, it is judged whether the cell thickness of the liquid crystal panel to be tested is normal.

According to the image information collected by the fourth camera tube compared with the defect database, it is judged whether the alignment film of the liquid crystal panel to be tested is damaged; Fig. 7A, Fig. 7B and Fig. 7C are respectively a kind of alignment film damage images in the defect database provided by the present invention schematic diagram.

According to the comparison between the image information collected by the fifth camera tube and the defect database, if there is an offset between the two substrates in the liquid crystal panel to be tested, the offset is calculated by the calculation module.

Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and variations.

Claims (10)

1. A detection device, characterized in that, comprising: An image acquisition module that collects image information of the liquid crystal panel to be tested; An image processing module connected to the signal of the image acquisition module, the image processing module compares the received image information with the defect database, and determines the defect level of the liquid crystal panel to be tested; The lighting mechanism is used to illuminate the liquid crystal panel to be tested. The lighting mechanism should cooperate with the camera tube of the image acquisition module to provide different types of light; a casing, the casing encloses a detection chamber; A machine installed in the detection chamber and supporting the liquid crystal panel to be tested; A bracket located in the detection chamber and relatively slidable with the machine platform, and the bracket is parallel to the support surface of the machine platform, and the image acquisition module is slidably installed on the bracket; There are mounting shafts on opposite sides of the machine table respectively, and the axis of each of the mounting shafts is parallel to the bracket, and the machine table is rotatably mounted on the housing through each of the mounting shafts. 2. The detection device according to claim 1, wherein the image acquisition module comprises: a first camera tube for collecting bad image information caused by foreign matter and/or air bubbles, and a first camera tube for collecting foreign matter position images information, the third camera tube used to collect the color difference image information caused by the cell thickness of the liquid crystal panel to be tested, the fourth camera tube used to collect the alignment film damage image information of the liquid crystal panel to be tested, and the A fifth camera tube that collects image information on the alignment status of the two substrates in the liquid crystal panel to be tested, wherein the first camera tube, the second camera tube, the third camera tube, and the fourth camera tube The collection angle between the tube and the fifth camera tube and the supporting surface of the machine table is adjustable. 3. The detection device according to claim 2, wherein the first imaging tube is an infrared imaging tube, the second imaging tube, the third imaging tube, the fourth imaging tube and the The fifth camera tubes are all CCD lenses. 4. The detection device according to claim 1, wherein the image processing module comprises: an infrared image sensor that receives the image information collected by the image acquisition module and converts the image information into electrical signals; An image recognizer connected with the infrared image sensor signal to analyze and compare the electrical signal; The calculation module is connected with the signal of the image recognizer and judges the defect level of the liquid crystal panel to be tested. 5. The detection device according to any one of claims 1-4, characterized in that a first chute and a second chute are respectively provided on opposite sides of the housing, and the first chute and the second chute The second sliding slots are parallel to each other, one end of the support is slidingly fitted with the first sliding slot, and the other end is slidingly fitted with the second sliding slot. 6 . The detection device according to claim 5 , wherein alignment probes for fixing the liquid crystal panel to be tested are provided on the supporting surface of the machine. 7 . 7 . The detection device according to claim 6 , wherein an optical sensor is provided in the detection chamber, and the optical sensor is used to collect signals generated when human hands or other objects enter the detection chamber. 8 . 8. A detection method applied to the detection device according to claim 1, characterized in that, comprising: Load the LCD panel to be tested; The image acquisition module collects the image information of the liquid crystal panel to be tested; The image processing module compares the received image information with the defect database to determine the defect level of the liquid crystal panel to be tested; The lighting mechanism is used to illuminate the liquid crystal panel to be tested. The lighting mechanism should cooperate with the camera tube of the image acquisition module to provide different types of light. 9. The detection method according to claim 8, wherein the image acquisition module comprises: a first camera tube, a second camera tube, a third camera tube, a fourth camera tube, and a fifth camera tube, the The above steps: the image acquisition module collects the image information of the liquid crystal panel to be tested and specifically includes: Using the first camera tube to collect bad image information caused by foreign matter and/or air bubbles on the liquid crystal panel to be tested; Use the second camera tube to collect the image information of the position of the foreign object on the liquid crystal panel to be tested; The third camera tube is used to collect the color difference image information caused by the cell thickness of the liquid crystal panel to be tested; Using the fourth camera tube to collect the damage image information of the alignment film of the liquid crystal panel to be tested; The fifth camera tube is used to collect the image information of the alignment status of the two substrates in the liquid crystal panel to be tested. 10. The detection method according to claim 9, wherein the step: the image processing module compares the received image information with the defect database, and determines the defect level of the liquid crystal panel to be tested specifically includes: Judging the size of the air bubbles caused by the poor sealing of the sealant according to the image information collected by the first camera tube, if the diameter of the air bubbles is greater than 8mm, the air bubbles are large air bubbles; if the diameter of the air bubbles is less than 8mm, the air bubbles are small air bubbles; Adjusting the acquisition angle of the second camera tube and the liquid crystal panel to be tested, if the image of the foreign object does not move, the foreign object is located in the liquid crystal panel to be tested; if the image of the foreign object moves, the foreign object is located outside the liquid crystal panel to be tested; If the black matrix blocks the image of the foreign matter, the foreign matter is located outside the color filter substrate; if the image of foreign matter bubbles covers the black matrix, the foreign matter is located outside the array substrate; According to the comparison of the image information collected by the third camera tube with the defect database, by observing whether there is color difference in the liquid crystal panel to be tested, it is judged whether the cell thickness of the liquid crystal panel to be tested is normal; According to the comparison between the image information collected by the fourth camera tube and the defect database, it is judged whether the alignment film of the liquid crystal panel to be tested is damaged; According to the comparison between the image information collected by the fifth camera tube and the defect database, if there is an offset between the two substrates in the liquid crystal panel to be tested, the offset is calculated by the calculation module.