CN103207488B - A kind of array base palte and method for maintaining, display device - Google Patents
A kind of array base palte and method for maintaining, display device Download PDFInfo
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- CN103207488B CN103207488B CN201310102232.3A CN201310102232A CN103207488B CN 103207488 B CN103207488 B CN 103207488B CN 201310102232 A CN201310102232 A CN 201310102232A CN 103207488 B CN103207488 B CN 103207488B
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- metal bridge
- data line
- broken string
- maintenance thread
- via hole
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
- G02F1/136263—Line defects
Abstract
The embodiment of the present invention provides a kind of array base palte and method for maintaining thereof, relate to lcd technology, in array base palte inside, the peripheral maintenance thread and metal bridge that the inner data line layer existed itself insulate with array base palte is set, when there is broken string in the peripheral maintenance thread data line be used in data line layer, access the data line that peripheral maintenance thread replaces occurring broken string, when there is broken string in the metal bridge data line be used in data line layer, connect the data line and peripheral maintenance thread that occur broken string, by peripheral maintenance thread, connection between metal bridge and the inner data line existed of array base palte itself, the data line occurring broken string is replaced with peripheral maintenance thread, realize the broken string maintenance after array base palte completes.Peripheral maintenance thread is arranged on array base palte inside, is connected by via hole with data line and metal bridge, improves the convenience of the broken string maintenance after array base palte completes and the stability of the rear circuit of maintenance.
Description
Technical field
The present invention relates to lcd technology, particularly relate to a kind of array base palte and method for maintaining, display device.
Background technology
Current thin film transistor liquid crystal display (TFT-LCD) (ThinFilmTransistor-LiquidCrystalDisplay, TFT-LCD) maintenance of broken data wire, morely occurs in array(array) stage, by carrying out cut to broken position, conductive site deposits, by normal for broken string maintenance.After color film (CF) is to box, array base palte (MDL) completes, and laser deposition conductive materials cannot reach array surface, cannot keep in repair the data line of broken string, and peripheral wiring can only be relied on to carry out the conducting of breaking.Therefore, at present after array base palte completes, broken string method for maintaining is more inconvenient, if carry out periphery wiring, peripheral wiring makes wiring area be exposed to outside unavoidably, has a certain impact to the stability of circuit.
Summary of the invention
The embodiment of the present invention provides a kind of array base palte and method for maintaining, display device, with the stability of the convenience and the rear circuit of maintenance that improve the broken string maintenance after array base palte completes.
A kind of array base palte, comprise at least one data line, described array base palte also comprises:
At least one peripheral maintenance thread, be arranged on the circuit layer that insulate with the data line layer at described data line place, and, its projection in described data line layer, with every bar data line, there are at least two intersection points, when broken string appears in the described at least one peripheral maintenance thread data line be used in described data line layer, access described peripheral maintenance thread and connect the described data line occurring broken string;
The metal bridge identical with described intersection point number, be arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at described data line layer and described peripheral maintenance thread place, when broken string appears in the described metal bridge data line be used in described data line layer, connect the data line of described appearance broken string and described peripheral maintenance thread.
A kind of display device, comprises the array base palte that the embodiment of the present invention provides.
A kind of array base palte method for maintaining, comprising:
Determine the data line occurring in array base palte to break;
The described both sides, broken data wire place that broken string occurs are connected to the peripheral maintenance thread of same respectively by metal bridge, described peripheral maintenance thread is arranged on the circuit layer that insulate with the data line layer at described data line place, and, its projection in described data line layer, has at least two intersection points with every bar data line; Described metal bridge is arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at described data line layer and described peripheral maintenance thread place.
The embodiment of the present invention provides a kind of array base palte and method for maintaining thereof, display device, in array base palte inside, the peripheral maintenance thread and metal bridge that the inner data line layer existed itself insulate with array base palte is set, when there is broken string in the peripheral maintenance thread data line be used in data line layer, access the data line that peripheral maintenance thread replaces occurring broken string, when there is broken string in the metal bridge data line be used in data line layer, connect the data line and peripheral maintenance thread that occur broken string, by peripheral maintenance thread, connection between metal bridge and the inner data line existed of array base palte itself, the data line occurring broken string is replaced with peripheral maintenance thread, realize the broken string maintenance after array base palte completes.Peripheral maintenance thread is arranged on array base palte inside, is connected by via hole with data line and metal bridge, improves the convenience of the broken string maintenance after array base palte completes and the stability of the rear circuit of maintenance.
Accompanying drawing explanation
Fig. 1 a for the embodiment of the present invention provide array base-plate structure schematic diagram;
The T-shaped metal bridge structure schematic diagram that Fig. 1 b provides for the embodiment of the present invention;
The cruciform metal bridge structure schematic diagram that Fig. 1 c provides for the embodiment of the present invention;
The in-line metal bridge structure schematic diagram that Fig. 1 d provides for the embodiment of the present invention;
The one preferably metal bridge structure schematic diagram that Fig. 1 e provides for the embodiment of the present invention;
A-A ' direction sectional view in Fig. 1 e that Fig. 1 f provides for the embodiment of the present invention;
A-A ' direction sectional view in Fig. 1 e after the maintenance that Fig. 1 g provides for the embodiment of the present invention;
The array base palte method for maintaining process flow diagram that Fig. 2 a provides for the embodiment of the present invention;
The data line that Fig. 2 b provides for the embodiment of the present invention is connected to one of peripheral maintenance thread process flow diagram by metal bridge;
The data line that Fig. 2 c provides for the embodiment of the present invention is connected to peripheral maintenance thread process flow diagram two by metal bridge;
The data line that Fig. 2 d provides for the embodiment of the present invention is connected to peripheral maintenance thread process flow diagram three by metal bridge;
There is the residual via hole cross section structure schematic diagram of silicon nitride (SiNx) for the one that the embodiment of the present invention provides in Fig. 3 a;
The data line that Fig. 3 b provides for the embodiment of the present invention is connected to peripheral maintenance thread process flow diagram four by metal bridge;
The data line that Fig. 3 c provides for the embodiment of the present invention is connected to peripheral maintenance thread process flow diagram five by metal bridge;
The data line that Fig. 3 d provides for the embodiment of the present invention is connected to peripheral maintenance thread process flow diagram six by metal bridge;
Fig. 3 e for the embodiment of the present invention provide a kind of maintenance after array base-plate structure schematic diagram.
Embodiment
The embodiment of the present invention provides a kind of array base palte and method for maintaining thereof, display device, in array base palte inside, the peripheral maintenance thread and metal bridge that the inner data line layer existed itself insulate with array base palte is set, when there is broken string in the peripheral maintenance thread data line be used in data line layer, access the data line that peripheral maintenance thread replaces occurring broken string, when there is broken string in the metal bridge data line be used in data line layer, connect the data line and peripheral maintenance thread that occur broken string, by peripheral maintenance thread, connection between metal bridge and the inner data line existed of array base palte itself, the data line occurring broken string is replaced with peripheral maintenance thread, realize the broken string maintenance after array base palte completes.Peripheral maintenance thread is arranged on array base palte inside, is connected by via hole with data line and metal bridge, improves the convenience of the broken string maintenance after array base palte completes and the stability of the rear circuit of maintenance.
As shown in Figure 1a, the array base palte that the embodiment of the present invention provides, comprising: at least one data line 101, also comprises:
At least one peripheral maintenance thread 102, be arranged on the circuit layer that insulate with the data line layer at data line 101 place, and, its projection in data line layer, with every bar data line 101, there are at least two intersection points, when at least one peripheral maintenance thread 102 occurs broken string for the data line 101 in data line layer, access peripheral maintenance thread 102 and connect the data line 101 occurring broken string;
The metal bridge 103 identical with intersection point number, be arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at data line layer and peripheral maintenance thread 102 place, when metal bridge 103 occurs broken string for the data line 101 in data line layer, connect the data line 101 and peripheral maintenance thread 102 that occur broken string.
Metal bridge 103, data line 101, peripheral maintenance thread 102 are all set to mutually insulated, ensure that again peripheral maintenance thread 102 has two intersection points at least in the projection of data line layer and every bar data line 101, can when there is broken string in any data line 101, two ends, data line 101 broken string place are connected to peripheral maintenance thread 102 by metal bridge 103, replace data line 101 with peripheral maintenance thread 102, reach the object of broken string maintenance.
Wherein, as long as metal bridge 103 can realize the connection by data line 101 and peripheral maintenance thread 102, in order to the connection of data line 101 and peripheral maintenance thread 102 can be realized preferably, metal bridge 103 can be set to yi word pattern, T-shaped or cruciform, and data line 101 and peripheral maintenance thread 102 metal bridge 103 projection in the plane, covering metal bridge 103, as Fig. 1 b, shown in Fig. 1 c and Fig. 1 d, metal bridge 103 all has lap with data line 101 and peripheral maintenance thread 102, and then be convenient to metal bridge 103 and be connected with data line 101 and peripheral maintenance thread 102 respectively.
Metal bridge 103 can use ITO(tin indium oxide) make, adopt the ITO metal that fusing point is lower, after metal bridge 103 melting can be facilitated, connect the data line 101 and peripheral maintenance thread 102 that occur broken string.
Certainly, those skilled in the art also can adopt other shapes that can reach connection request and material to arrange metal bridge 103.
Concrete, the embodiment of the present invention provides one preferably peripheral maintenance thread 102 and metal bridge 103 set-up mode, as shown in Figure 1a, peripheral maintenance thread 102 all has two intersection points in the projection of data line layer and all data lines 101, and form a loop, when broken string appears in any data line 101, be all connected to peripheral maintenance thread 102 by metal bridge 103, reach the object of broken string maintenance.Certainly, those skilled in the art also can adopt it to arrange peripheral maintenance thread 102 with his feasible pattern; Certainly, those skilled in the art also can adopt other feasible patterns to arrange metal bridge 103.
When metal bridge 103 occurs broken string for the data line 101 in data line layer, connect the data line 101 and peripheral maintenance thread 102 that occur broken string, specifically comprise:
When metal bridge 103, for the data line 101 in data line layer, broken string occurs, connected the data line 101 and peripheral maintenance thread 102 that occur broken string by via hole.
Wherein via hole can be: the connection via hole formed by duotone mask.Described duotone mask comprises intermediate tone mask (halftonemask) and gray tone mask (graytonemask).
Certainly, those skilled in the art also can adopt other feasible pattern connection metal bridge 103, data line 101 and the peripheral maintenance thread 102 beyond via hole.
Concrete, the embodiment of the present invention provides one preferably via hole set-up mode, as shown in fig. le, metal bridge 103 is yi word pattern metal bridge, via hole on data line 101 is for connect via hole 111, via hole on peripheral maintenance thread 102 is not for connect via hole 112, Fig. 1 e along A-A ' direction sectional view as shown in Figure 1 f, gate insulation layer 104 and passivation layer 105 are for ensureing the insulativity between metal bridge 103 and peripheral maintenance thread 102, when there is broken string in data line 101, metal bridge 103 is irradiated with a laser to melting and flow in the via hole 112 do not connected, after Fig. 1 e keeps in repair along the sectional view in A-A ' direction as shown in Figure 1 g, now, the metal flow of metal bridge 103 melting is to peripheral maintenance thread 102, realize the connection of metal bridge 103 and peripheral maintenance thread 102.
Certainly, those skilled in the art also can adopt other feasible pattern to arrange via hole.
The embodiment of the present invention also provides a kind of array base palte method for maintaining, and as shown in Figure 2 a, the method for maintaining that the embodiment of the present invention provides comprises:
S201, determine to occur in array base palte the data line 101 that breaks;
S202, the both sides, data line 101 broken string place of generation being broken are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, peripheral maintenance thread 102 is arranged on the circuit layer that insulate with the data line layer at data line 101 place, and, its projection in data line layer, has at least two intersection points with every bar data line 101; Metal bridge 103 is arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at data line layer and peripheral maintenance thread 102 place.
Connect peripheral maintenance thread 102 and data line 101 by metal bridge 103, the data line 101 that broken string occurs is replaced with peripheral maintenance thread 102, makes maintenance process convenient.
In S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, are specially:
The both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same by via hole by metal bridge 103.
Wherein via hole can be: the connection via hole formed by duotone mask.
Certainly, those skilled in the art also can adopt other feasible pattern connection metal bridge 103, data line 101 and the peripheral maintenance threads 102 beyond via hole.
In S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
When the via hole on peripheral maintenance thread 102 is connected with metal bridge 103, when the via hole of the both sides, data line 101 broken string place of generation broken string is not connected with metal bridge 103:
As shown in Figure 2 b, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S211, determine that the via hole on peripheral maintenance thread 102 is connected with metal bridge 103, the via hole that the both sides, data line 101 broken string place of broken string occur is not connected with metal bridge 103;
S212, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
Via hole when the both sides, data line 101 broken string place that broken string occurs is connected with metal bridge 103, when the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103:
As shown in Figure 2 c, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S221, determine that the via hole of both sides, data line 101 broken string place that broken string occurs is connected with metal bridge 103, the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103;
S222, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
When the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103, when the via hole of the both sides, data line 101 broken string place of generation broken string is not connected with metal bridge 103:
As shown in Figure 2 d, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S231, determine that the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103, the via hole that the both sides, data line 101 broken string place of broken string occur is not connected with metal bridge 103;
S232, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
Be irradiated with a laser to melting by metal bridge 103 and flow to the connection realizing data line 101, metal bridge 103 and peripheral maintenance thread 102 in the via hole that data line 101 or peripheral maintenance thread 102 do not connect; the object of maintenance can be reached simply and easily; and the wiring after maintenance is all in array base palte inside, can make wiring protected.
Because via hole is formed by duotone mask, after crossing aperture mask (mask) and development, if photoresist is not completely removed, follow-up etching technics can be had influence on, make in the via hole be not connected, to there are some insulation courses (as silicon nitride (SiNx)) to remain, as shown in Figure 3 a, metal bridge 103 is yi word pattern metal bridge, via hole on data line 101 is for connect via hole 111, via hole on peripheral maintenance thread 102 is not for connect via hole 112, there are some silicon nitride residues 113 in the via hole 112 be not connected, when metal flow after metal bridge 103 melting is in via hole, well can not realize the connection of metal bridge 103 and peripheral maintenance thread 102, when there is this situation, first can irradiate with laser the via hole 112 do not connected, puncture the silicon nitride residue 113 of residual thinner thickness.
Concrete, in S212, S222 and S232 before laser irradiates described metal bridge 103, the via hole be not connected with described metal bridge 103 described in irradiating with laser, concrete:
When the via hole on peripheral maintenance thread 102 is connected with metal bridge 103, when the via hole of the both sides, data line 101 broken string place of generation broken string is not connected with metal bridge 103:
As shown in Figure 3 b, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S311, determine that the via hole on peripheral maintenance thread 102 is connected with metal bridge 103, the via hole that the both sides, data line 101 broken string place of broken string occur is not connected with metal bridge 103;
S312, the insulation course irradiated with laser in the via hole that is not connected with metal bridge 103, until puncture insulation course;
S313, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
Via hole when the both sides, data line 101 broken string place that broken string occurs is connected with metal bridge 103, when the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103:
As shown in Figure 3 c, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S321, determine that the via hole of both sides, data line 101 broken string place that broken string occurs is connected with metal bridge 103, the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103;
S322, the insulation course irradiated with laser in the via hole that is not connected with metal bridge 103, until puncture insulation course;
S323, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
When the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103, when the via hole of the both sides, data line 101 broken string place of generation broken string is not connected with metal bridge 103:
As shown in Figure 3 d, in S202, the both sides, data line 101 broken string place that broken string occurs are connected to the peripheral maintenance thread 102 of same respectively by metal bridge 103, specifically comprise:
S331, determine that the via hole on peripheral maintenance thread 102 is not connected with metal bridge 103, the via hole that the both sides, data line 101 broken string place of broken string occur is not connected with metal bridge 103;
S332, the insulation course irradiated with laser in the via hole that is not connected with metal bridge 103, until puncture insulation course;
S333, laser irradiate the metal bridge 103 around the via hole be not connected with metal bridge 103 of the both sides, data line 101 broken string place that broken string occurs, until in the via hole that is not connected with metal bridge 103 of metal melting in metal bridge 103 flowing to.
As shown in Figure 3 e, peripheral maintenance thread 102 is the maintenance thread for subsequent use of data line 101, for making full use of peripheral maintenance thread 102, when data line 101 breaks down, first with peripheral maintenance thread 102 cut-out point 106 of laser cutting, then metal bridge 103 can be irradiated with laser, realize the connection of data line 101 and peripheral maintenance thread 102, like this, when other data line 101 breaks down, the part be not access in peripheral maintenance thread 102 can also be reused and realize maintenance.Certainly, for simplifying maintenance operation process, those skilled in the art also can not cut off cut-out point 106.
The embodiment of the present invention also provides a kind of display device, and it comprises any one array base palte above-mentioned.Described display device can be: any product or parts with Presentation Function such as liquid crystal panel, Electronic Paper, Organic Light Emitting Diode (OrganicLightEmittingDiode, OLED) panel, mobile phone, panel computer, televisor, display, notebook computer, digital album (digital photo frame), navigating instrument.
The embodiment of the present invention provides a kind of array base palte and method for maintaining thereof, display device, in array base palte inside, the peripheral maintenance thread and metal bridge that the inner data line layer existed itself insulate with array base palte is set, when there is broken string in the peripheral maintenance thread data line be used in data line layer, access the data line that peripheral maintenance thread replaces occurring broken string, when there is broken string in the metal bridge data line be used in data line layer, connect the data line and peripheral maintenance thread that occur broken string, by peripheral maintenance thread, connection between metal bridge and the inner data line existed of array base palte itself, the data line occurring broken string is replaced with peripheral maintenance thread, realize the broken string maintenance after array base palte completes.Peripheral maintenance thread is arranged on array base palte inside, is connected by via hole with data line and metal bridge, improves the convenience of the broken string maintenance after array base palte completes and the stability of the rear circuit of maintenance.
Those skilled in the art should understand, embodiments of the invention can be provided as method, system or computer program.Therefore, the present invention can adopt the form of complete hardware embodiment, completely software implementation or the embodiment in conjunction with software and hardware aspect.And the present invention can adopt in one or more form wherein including the upper computer program implemented of computer-usable storage medium (including but not limited to magnetic disk memory, CD-ROM, optical memory etc.) of computer usable program code.
The present invention describes with reference to according to the process flow diagram of the method for the embodiment of the present invention, equipment (system) and computer program and/or block scheme.Should understand can by the combination of the flow process in each flow process in computer program instructions realization flow figure and/or block scheme and/or square frame and process flow diagram and/or block scheme and/or square frame.These computer program instructions can being provided to the processor of multi-purpose computer, special purpose computer, Embedded Processor or other programmable data processing device to produce a machine, making the instruction performed by the processor of computing machine or other programmable data processing device produce device for realizing the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
These computer program instructions also can be stored in can in the computer-readable memory that works in a specific way of vectoring computer or other programmable data processing device, the instruction making to be stored in this computer-readable memory produces the manufacture comprising command device, and this command device realizes the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
These computer program instructions also can be loaded in computing machine or other programmable data processing device, make on computing machine or other programmable devices, to perform sequence of operations step to produce computer implemented process, thus the instruction performed on computing machine or other programmable devices is provided for the step realizing the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
Although describe the preferred embodiments of the present invention, those skilled in the art once obtain the basic creative concept of cicada, then can make other change and amendment to these embodiments.So claims are intended to be interpreted as comprising preferred embodiment and falling into all changes and the amendment of the scope of the invention.
Obviously, those skilled in the art can carry out various change and modification to the present invention and not depart from the spirit and scope of the present invention.Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.
Claims (11)
1. an array base palte, comprises at least one data line, it is characterized in that, described array base palte also comprises:
At least one peripheral maintenance thread, be arranged on the circuit layer that insulate with the data line layer at described data line place, and, its projection in described data line layer, with every bar data line, there are at least two intersection points, and form a loop, when broken string appears in the described at least one peripheral maintenance thread data line be used in described data line layer, access described peripheral maintenance thread and connect the described data line occurring broken string;
The metal bridge identical with described intersection point number, be arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at described data line layer and described peripheral maintenance thread place, when broken string appears in the described metal bridge data line be used in described data line layer, connect the data line of described appearance broken string and described peripheral maintenance thread.
2. array base palte as claimed in claim 1, it is characterized in that, described metal bridge is specially:
Yi word pattern, T-shaped or cruciform metal bridge;
Described data line and described peripheral maintenance thread described metal bridge projection in the plane, cover described metal bridge.
3. array base palte as claimed in claim 1, is characterized in that, described metal bridge adopts tin indium oxide to make.
4. array base palte as claimed in claim 1, is characterized in that, when broken string appears in the described metal bridge data line be used in described data line layer, connects the data line of described appearance broken string and described peripheral maintenance thread, specifically comprises:
When broken string occurs the described metal bridge data line be used in described data line layer, connect the data line of described appearance broken string and described peripheral maintenance thread by via hole.
5. a display device, is characterized in that, described display device comprises the arbitrary described array base palte of Claims 1-4.
6. an array base palte method for maintaining, is characterized in that, comprising:
Determine the data line occurring in array base palte to break;
The described both sides, broken data wire place that broken string occurs are connected to the peripheral maintenance thread of same respectively by metal bridge, described peripheral maintenance thread is arranged on the circuit layer that insulate with the data line layer at described data line place, and, its projection in described data line layer, with every bar data line, there are at least two intersection points, and form a loop; Described metal bridge is arranged on the circuit layer that all insulate with the peripheral maintenance thread layer at described data line layer and described peripheral maintenance thread place.
7. method for maintaining as claimed in claim 6, it is characterized in that, described metal bridge is specially:
Yi word pattern, T-shaped or cruciform metal bridge;
Described data line and described peripheral maintenance thread described metal bridge projection in the plane, cover described metal bridge.
8. method for maintaining as claimed in claim 6, is characterized in that, described metal bridge adopts tin indium oxide to make.
9. method for maintaining as claimed in claim 6, is characterized in that, described both sides, broken data wire place of described generation being broken are connected to the peripheral maintenance thread of same respectively by metal bridge, are specially:
By via hole, the described broken data wire both sides that broken string occurs are connected to the peripheral maintenance thread of same by described metal bridge.
10. method for maintaining as claimed in claim 9, it is characterized in that, when determining that the via hole on described peripheral maintenance thread is connected with described metal bridge, when the described via hole that the both sides, broken data wire place of broken string occur is not connected with described metal bridge, describedly by via hole, the described broken data wire both sides that broken string occurs are connected to the peripheral maintenance thread of same by described metal bridge, specifically comprise:
Laser irradiates the metal bridge around the described via hole be not connected with metal bridge that the both sides, broken data wire place of broken string occur, until metal melting in described metal bridge in the via hole be not connected with metal bridge described in flowing to;
When determining that the described via hole that the both sides, broken data wire place of broken string occur is connected with described metal bridge, when via hole on described peripheral maintenance thread is not connected with described metal bridge, describedly by via hole, the described broken data wire both sides that broken string occurs are connected to the peripheral maintenance thread of same by described metal bridge, specifically comprise:
Laser irradiates the metal bridge around the described via hole be not connected with metal bridge that the both sides, broken data wire place of broken string occur, until metal melting in described metal bridge in the via hole be not connected with metal bridge described in flowing to;
When determining that the via hole on described peripheral maintenance thread is not connected with described metal bridge, when the described via hole that the both sides, broken data wire place of broken string occur is not connected with described metal bridge, describedly by via hole, the described broken data wire both sides that broken string occurs are connected to the peripheral maintenance thread of same by described metal bridge, specifically comprise:
Laser irradiates the metal bridge around the described via hole be not connected with metal bridge that the both sides, broken data wire place of broken string occur, until metal melting in described metal bridge in the via hole be not connected with metal bridge described in flowing to.
11. method for maintaining as claimed in claim 10, is characterized in that, before laser irradiates described metal bridge, the insulation course in the via hole be not connected with described metal bridge described in irradiating with laser, until puncture described insulation course.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
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| CN201310102232.3A CN103207488B (en) | 2013-03-27 | 2013-03-27 | A kind of array base palte and method for maintaining, display device |
| PCT/CN2013/077589 WO2014153869A1 (en) | 2013-03-27 | 2013-06-20 | Array substrate and maintenance method therefor, and display device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310102232.3A CN103207488B (en) | 2013-03-27 | 2013-03-27 | A kind of array base palte and method for maintaining, display device |
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| CN103207488A CN103207488A (en) | 2013-07-17 |
| CN103207488B true CN103207488B (en) | 2015-11-11 |
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| CN201310102232.3A Active CN103207488B (en) | 2013-03-27 | 2013-03-27 | A kind of array base palte and method for maintaining, display device |
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| WO (1) | WO2014153869A1 (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09101539A (en) * | 1995-10-04 | 1997-04-15 | Fujitsu Ltd | Disconnection correction method for thin film transistor matrix |
| TW200801656A (en) * | 2006-06-19 | 2008-01-01 | Au Optronics Corp | Repair structure and active device array substrate |
| CN101295083A (en) * | 2008-05-30 | 2008-10-29 | 京东方科技集团股份有限公司 | Wire-break repairing circuit and method for flat panel display |
| CN102023429A (en) * | 2009-09-17 | 2011-04-20 | 北京京东方光电科技有限公司 | TFT-LCK array substrate and method for manufacturing same and method for repairing broken lines |
| CN102213846A (en) * | 2010-04-01 | 2011-10-12 | 北京京东方光电科技有限公司 | Liquid crystal display panel, manufacturing method thereof and liquid crystal display |
| CN102326192A (en) * | 2009-02-26 | 2012-01-18 | 株式会社理光 | Display device and method of repairing display device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100896950B1 (en) * | 2002-12-31 | 2009-05-14 | 엘지디스플레이 주식회사 | Liquid crystal display device and manufacturing method of the same |
| US7193664B2 (en) * | 2004-10-08 | 2007-03-20 | Chunghwa Picture Tubes, Ltd. | Pixel structure and method of repairing the same |
| CN101533188A (en) * | 2008-03-12 | 2009-09-16 | 上海广电Nec液晶显示器有限公司 | Array substrate of a liquid crystal display device and broken wire restoration method |
| CN102221752A (en) * | 2010-04-19 | 2011-10-19 | 北京京东方光电科技有限公司 | Liquid crystal panel and manufacturing and maintenance method of liquid crystal panel |
-
2013
- 2013-03-27 CN CN201310102232.3A patent/CN103207488B/en active Active
- 2013-06-20 WO PCT/CN2013/077589 patent/WO2014153869A1/en active Application Filing
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09101539A (en) * | 1995-10-04 | 1997-04-15 | Fujitsu Ltd | Disconnection correction method for thin film transistor matrix |
| TW200801656A (en) * | 2006-06-19 | 2008-01-01 | Au Optronics Corp | Repair structure and active device array substrate |
| CN101295083A (en) * | 2008-05-30 | 2008-10-29 | 京东方科技集团股份有限公司 | Wire-break repairing circuit and method for flat panel display |
| CN102326192A (en) * | 2009-02-26 | 2012-01-18 | 株式会社理光 | Display device and method of repairing display device |
| CN102023429A (en) * | 2009-09-17 | 2011-04-20 | 北京京东方光电科技有限公司 | TFT-LCK array substrate and method for manufacturing same and method for repairing broken lines |
| CN102213846A (en) * | 2010-04-01 | 2011-10-12 | 北京京东方光电科技有限公司 | Liquid crystal display panel, manufacturing method thereof and liquid crystal display |
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| WO2014153869A1 (en) | 2014-10-02 |
| CN103207488A (en) | 2013-07-17 |
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