CN103185665B - The measuring method of birefringence element optical axis - Google Patents
The measuring method of birefringence element optical axis Download PDFInfo
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- CN103185665B CN103185665B CN201310079741.9A CN201310079741A CN103185665B CN 103185665 B CN103185665 B CN 103185665B CN 201310079741 A CN201310079741 A CN 201310079741A CN 103185665 B CN103185665 B CN 103185665B
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Abstract
The invention provides a kind of measuring method of birefringence element optical axis, comprise the following steps: the continuous Output of laser of half outside gas laser, pattern is single longitudinal mode; Adjust described polaroid, make the polarization direction of described polaroid vertical with the initial polarization direction of described half outside gas laser Output of laser; Described birefringence is arranged between described output cavity mirror and described exocoel plane mirror, described birefringence element has two opposing parallel planes in the light path along half outside gas laser Output of laser, and described laser is incident along the direction perpendicular to described two planes; By described birefringence element with the axis being parallel to half outside gas laser Output of laser direction for turning axle rotates, and drive described exocoel plane mirror along the to-and-fro movement of Output of laser direction; Continue to rotate described birefringence element, make described display device occur delustring state, obtain the optical axis of birefringence element.
Description
Technical field
The present invention relates to a kind of measuring method of birefringence element optical axis.
Background technology
Many materials, as biological tissue, optical fiber, liquid crystal and wave plate etc. all show strong optical birefringence.For these materials, Axis Azimuth affects the performance of material.The instrument system higher to ask for something, precise measuring axle also has urgent demand.
Many methods are applied to the measurement of optical axis, as Polarization-Sensitive optical coherence tomography etc.But the apparatus structure formed based on these measuring methods is complicated, and expensive, measuring accuracy is not high, can not be applied to high precision field.
Summary of the invention
In sum, necessaryly provide a kind of price lower and there is the measuring method of high-precision measurement birefringence element optical axis.
A measuring method for birefringence element optical axis, comprises the following steps: step S10, provides the measurement mechanism of a birefringence element optical axis, comprises a half outside gas laser, laser feedback unit and a polarization state detection system; Described half outside gas laser comprises a high anti-chamber mirror, gain tube, anti-reflection window and output cavity mirror and arranges along the Output of laser light path of half outside gas laser; Described laser feedback unit comprises an exocoel plane mirror, and described exocoel plane mirror is arranged at from the light path of the laser of described output cavity mirror outgoing, and and described output cavity mirror interval arrange; Described polarization state detection system comprises a polaroid, a photodetector and display device and arranges along the laser from the outgoing of described exocoel plane mirror successively interval, described photoelectric detector from the laser of described polaroid outgoing to sense the change of laser intensity, the change of described display device display laser intensity; Step S11, the continuous Output of laser of half outside gas laser, pattern is single longitudinal mode; Step S12, adjusts described polaroid, makes the polarization direction of described polaroid vertical with the initial polarization direction of described half outside gas laser Output of laser; Step S13, birefringence element to be measured is arranged between described output cavity mirror and described exocoel plane mirror, described birefringence element has two opposing parallel planes in the light path along half outside gas laser Output of laser, and described laser is incident along the direction perpendicular to described two planes; Step S14, by described birefringence element with the axis being parallel to half outside gas laser Output of laser direction for turning axle rotates, and drive described exocoel plane mirror along the to-and-fro movement of Output of laser direction, described display device is made to occur delustring state, the optical axis of described birefringence element is identical with the initial polarization direction of described half outside gas laser Output of laser, obtains the optical axis of birefringence element.
The measuring method of birefringence element optical axis provided by the present invention, based on laser feedback and polarization saltus step principle, by rotating described birefringence element, frosting phenomenon is produced when utilizing the optical axis of described birefringence element identical with the polarization direction of half outside gas laser Output of laser, obtain the optical axis of birefringence element, measurement mechanism structure is simple, and cost is lower, and there is higher measuring accuracy, therefore there is more wide application prospect.
Accompanying drawing explanation
Fig. 1 is the measurement mechanism of birefringence element optical axis described in the embodiment of the present invention.
Fig. 2 is the laser intensity change curve in described birefringence element rotary course.
Fig. 3 be birefringence element optical axis consistent with semiconductor laser Output of laser initial polarization direction time laser intensity change curve.
Main element symbol description
| High anti-chamber mirror | 1 |
| Gain tube | 2 |
| Anti-reflection window | 3 |
| Output cavity mirror | 4 |
| Birefringence element | 5 |
| Exocoel plane mirror | 6 |
| Exocoel piezoelectric ceramics | 7 |
| Polaroid | 8 |
| Photodetector | 9 |
| Display device | 10 |
| Half outside gas laser | 20 |
| Laser feedback unit | 30 |
| Polarization state detection system | 40 |
Following specific embodiment will further illustrate the present invention in conjunction with above-mentioned accompanying drawing.
Embodiment
Below in conjunction with Figure of description, the present invention will be further described, and for convenience of description, first the present invention describes the measurement mechanism of described birefringence element optical axis.
As shown in Figure 1, first embodiment of the invention provides a kind of measurement mechanism of birefringence element optical axis, and described measurement mechanism comprises half outside gas laser 20, laser feedback unit 30 and a polarization state detection system 40.
Described half outside gas laser 20 forms laser optical path for Output of laser, described half outside gas laser 20 is not only as light source but also as sensor, to form laser feedback, described half outside gas laser 20 is half outer-cavity structure, and the laser that described half outside gas laser 20 exports is the polarized light of single longitudinal mode.Laser type can be gas laser, semiconductor laser or solid state laser etc.Described half outside gas laser 20 comprises high anti-chamber mirror 1, gain tube 2, anti-reflection window 3 and output cavity mirror 4, and described height anti-chamber mirror 1, gain tube 2, anti-reflection window 3, output cavity mirror 4 set gradually and coaxial setting along the axis of described Output of laser.Described height anti-chamber mirror 1 is fixedly connected with described gain tube 2 one end away from described output cavity mirror 4, and described anti-reflection window 3 is fixedly connected with described gain tube 2 one end near described output cavity mirror 4.Described height anti-chamber mirror 1 and output cavity mirror 4 are all coated with the highly reflecting films (reflectivity more than 98%) of optical maser wavelength, and the former reflectivity is higher than the latter.Described anti-reflection window 3 is coated with the anti-reflection film (not shown) of optical maser wavelength.In the present embodiment, described laser instrument is helium-neon laser, is full of He-Ne gas in described gain tube 2, and to be 9:1, Ne isotope ratio be gas ratio: Ne
20: Ne
22=1:1, the height anti-chamber mirror 1 of laser instrument and the reflectivity of output cavity mirror 4 are respectively 99.8% and 98.8%.
Described laser feedback unit 30 comprises an exocoel plane mirror 6.Described exocoel plane mirror 6 is arranged on the output light path of described half outside gas laser 20, and and described output cavity mirror 4 interval formation one space is set, to hold testing sample.Described exocoel plane mirror 6 returns in described half outside gas laser 20 for the laser reflection exported by half outside gas laser 20, forms laser feedback.Described laser feedback unit 30 can comprise an exocoel piezoelectric ceramics 7 further, and described exocoel piezoelectric ceramics 7 is connected with described exocoel plane mirror 6, for driving described exocoel plane mirror 6 along the direction to-and-fro movement of described Output of laser axis.Be appreciated that described exocoel piezoelectric ceramics 7 also can substitute with other fine motion elements, drive the to-and-fro movement of described exocoel plane mirror 6.
Described polarization state detection system 40, for judging the polarization state of the laser incided in polarization state detection system 40, comprises polaroid 8, photodetector 9 and display device 10.Described polaroid 8 and described photodetector 9 are arranged along the axis at described half outside gas laser 20 Output of laser place.Concrete, described polaroid 8 is arranged at half outside gas laser 20 from the light path of the laser of described exocoel plane mirror outgoing, and and described exocoel plane mirror 6 interval arrange, to receive the laser of described exocoel plane mirror 6 transmission.Described photodetector 9 is arranged at the light path of the laser transmitted from described polaroid 8, in order to receive from the laser of polaroid 8 transmission, and described laser intensity is converted into electric signal and inputs described display device 10.Described laser intensity can show with the form of waveform by described display device 10.In the present embodiment, described display device 10 is an oscillograph.
The present invention further provides the measuring method that birefringence element measured by a kind of measurement mechanism applying described birefringence element optical axis, specifically comprise the following steps:
Step S11, half outside gas laser 20 is Output of laser continuously, and pattern is single longitudinal mode;
Step S12, adjusts described polaroid 8, makes the polarization direction of described polaroid 8 vertical with the initial polarization direction of described half outside gas laser 20 Output of laser;
Step S13, is arranged at birefringence element 5 to be measured between described output cavity mirror 4 and described exocoel plane mirror 6, and described birefringence element 5 is along the light path of Output of laser having two opposing parallel planes;
Step S14, by described birefringence element 5 to be parallel to the axis in Output of laser direction for turning axle, rotates to an angle, and drives described exocoel plane mirror along the direction to-and-fro movement of half outside gas laser 20 Output of laser;
Step S15, continue to rotate described birefringence element 5, make described display device 10 occur delustring state, now the optical axis of described birefringence element is identical with the initial polarization direction of described half outside gas laser 20 Output of laser, obtains the optical axis of birefringence element 5.
In step s 13, described birefringence element 5 has two opposing parallel planes on the direction of half outside gas laser 20 Output of laser.The laser vertical that described half outside gas laser 20 exports is incident in the described plane of described birefringence element 5, the optical axis of described birefringence element 5 is parallel to described plane, according to the difference of birefringence element 5 material, described optical axis can be fast axle or the slow axis of birefringence element 5.Further, two planes of described birefringence element 5 can be coated with anti-reflection film or index-matching fluid, to reduce or eliminate the interference on birefringence element 5 surface.
In step S14, by described birefringence element 5 with the axis being parallel to Output of laser direction for axle rotates.The laser vertical exported due to described half outside gas laser 20 is incident in the surface of described birefringence element 5, can be therefore that turning axle rotates with Output of laser by described birefringence element 5.In the process rotated, input triangle wave voltage to described exocoel piezoelectric ceramics 7 simultaneously, make the to-and-fro movement of described exocoel plane mirror 6.Described photodetector 9 detects and changes from the laser intensity of polaroid 8 outgoing, is then shown with waveform by display device 10.
In step S15, continue to rotate described birefringence element 5, drive the to-and-fro movement of described exocoel plane mirror 6 simultaneously, observe the change of waveform described in display device 10.As shown in Figure 2, in the process rotated, as long as there is an angle in the initial polarization direction of the laser that the optical axis of described birefringence element 5 and described half outside gas laser 20 export, then in the reciprocating process of exocoel plane mirror 6, all the time there is laser emitting in the laser that half outside gas laser 20 exports, and can not complete extinction after polaroid 8.Now, would not there is zero point in the voltage that described photodetector 9 exports, and that is the laser intensity that receives of described photodetector 9 is non-vanishing all the time.As shown in Figure 3, when there is zero point in the waveform that described display device 10 shows, the laser intensity that then known described photodetector 9 receives also is zero, that is there is delustring state in display device 10, namely the voltage that display device 10 receives is zero, then can judge that the optical axis of now described birefringence element 5 is consistent with the initial polarization direction of described half outside gas laser 20 Output of laser, and then the optical axis of described birefringence element 5 can be obtained.
The measuring method of described birefringence element optical axis provided by the invention, based on polarization saltus step principle, by rotating described birefringence element, produce frosting phenomenon when utilizing the optical axis of described birefringence element identical with the polarization direction of half outside gas laser Output of laser, obtain the optical axis of described birefringence element, the equipment without the need to complexity can be measured, measurement mechanism structure is simple, price is lower, and has very high measuring accuracy, therefore has broad application prospects.
In addition, those skilled in the art also can do other change in spirit of the present invention, and these changes done according to the present invention's spirit, all should be included in the present invention's scope required for protection certainly.
Claims (8)
1. a measuring method for birefringence element optical axis, comprises the following steps:
Step S10, provides the measurement mechanism of a birefringence element optical axis, comprises a half outside gas laser, laser feedback unit and a polarization state detection system;
Described half outside gas laser comprises a high anti-chamber mirror, gain tube, anti-reflection window and output cavity mirror, described height anti-chamber mirror, gain tube, anti-reflection window and output cavity mirror along half outside gas laser Output of laser light path successively and coaxial setting;
Described laser feedback unit comprises an exocoel plane mirror, and described exocoel plane mirror is arranged at from the light path of the laser of described output cavity mirror outgoing, and and described output cavity mirror interval arrange;
It is characterized in that:
Described polarization state detection system comprises a polaroid, a photodetector and display device, described polaroid, photodetector and display device are arranged along the laser from the outgoing of described exocoel plane mirror successively interval, described photoelectric detector from the laser of described polaroid outgoing to sense the change of laser intensity, the change of described display device display laser intensity;
Step S11, the continuous Output of laser of half outside gas laser, pattern is single longitudinal mode;
Step S12, adjusts described polaroid, makes the polarization direction of described polaroid vertical with the initial polarization direction of described half outside gas laser Output of laser;
Step S13, birefringence element to be measured is arranged between described output cavity mirror and described exocoel plane mirror, described birefringence element has two opposing parallel planes in the light path along half outside gas laser Output of laser, and described laser is incident along the direction perpendicular to described two planes;
Step S14, by described birefringence element with the axis being parallel to half outside gas laser Output of laser direction for turning axle rotates, and drive described exocoel plane mirror along the to-and-fro movement of Output of laser direction, described display device is made to occur delustring state, the optical axis of described birefringence element is identical with the initial polarization direction of described half outside gas laser Output of laser, obtains the optical axis of birefringence element.
2. the measuring method of birefringence element optical axis as claimed in claim 1, is characterized in that, the laser that described laser instrument exports incides described birefringence element along the direction perpendicular to described two planes.
3. the measuring method of birefringence element optical axis as claimed in claim 1, it is characterized in that, described birefringence element is that turning axle rotates with Output of laser.
4. the measuring method of birefringence element optical axis as claimed in claim 1, it is characterized in that, be connected with described exocoel plane mirror by an exocoel piezoelectric ceramics, and drive described exocoel plane mirror along the direction to-and-fro movement of described half outside gas laser Output of laser.
5. the measuring method of birefringence element optical axis as claimed in claim 4, is characterized in that, the voltage of described exocoel piezoelectric ceramics input is triangle wave voltage, drives the to-and-fro movement of described exocoel plane mirror.
6. the measuring method of birefringence element optical axis as claimed in claim 1, it is characterized in that, when there is delustring state in the waveform of described display device display, then described photoelectric detector to laser intensity be also zero, namely the voltage that display device receives is zero, then now the optical axis of described birefringence element is consistent with the initial polarization direction of described half outside gas laser Output of laser.
7. the measuring method of birefringence element optical axis as claimed in claim 1, it is characterized in that, described birefringence element two planes are coated with anti-reflection film or index-matching fluid.
8. the measuring method of birefringence element optical axis as claimed in claim 1, it is characterized in that, described height anti-chamber mirror, gain tube, anti-reflection window, output cavity mirror set gradually and coaxial setting along the axis of described Output of laser.
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| CN201310079741.9A CN103185665B (en) | 2013-03-13 | 2013-03-13 | The measuring method of birefringence element optical axis |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103712781B (en) * | 2013-12-25 | 2016-03-30 | 天津大学 | The multiple angles of incidence polarization interference measurement mechanism of birefringent wedge optical axis direction and method |
| CN104833485B (en) * | 2015-05-12 | 2017-09-01 | 山东大学 | It is a kind of to detect the device and method of two birefringence device optical axis directions simultaneously |
| CN107817094B (en) * | 2017-09-14 | 2019-12-20 | 西安科佳光电科技有限公司 | High-precision homodromous double-optical-axis and multi-optical-axis parallelism adjusting method |
| CN107817095B (en) * | 2017-09-14 | 2019-12-20 | 西安科佳光电科技有限公司 | High-precision homodromous double-optical-axis and multi-optical-axis parallelism adjusting method |
| CN107843413B (en) * | 2017-09-14 | 2020-01-10 | 西安科佳光电科技有限公司 | High-precision reverse double-optical-axis and multi-optical-axis parallelism adjusting method |
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