CN103092864A - Method and system for generating test data report form - Google Patents

Method and system for generating test data report form Download PDF

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Publication number
CN103092864A
CN103092864A CN2011103436536A CN201110343653A CN103092864A CN 103092864 A CN103092864 A CN 103092864A CN 2011103436536 A CN2011103436536 A CN 2011103436536A CN 201110343653 A CN201110343653 A CN 201110343653A CN 103092864 A CN103092864 A CN 103092864A
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test data
silicon chip
test
sheet
user
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CN2011103436536A
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Chinese (zh)
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连晓谦
凌耀君
许文慧
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CSMC Technologies Corp
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CSMC Technologies Corp
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Priority to CN2011103436536A priority Critical patent/CN103092864A/en
Publication of CN103092864A publication Critical patent/CN103092864A/en
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Abstract

The invention discloses a method and a system for generating a test data report form. The method and the system include: providing a user operation interface which is based on a Windows system and comprises a test menu name input box, a batch number input box, a slice number selection area and a report form generating option; obtaining test data corresponding to commands which are input into a test code input box and the batch number input box by a user; displaying a silicon slice number corresponding to the test data on the slice number selection area; and identifying the silicon slice number which is selected from the slice number selection area by the user, receiving a report form generating command sent by the report form generating option when the report form generating option is clicked by the user, and using the test data corresponding to the identified silicon slice number to generate the test data report form. The method for generating the test data report form is simple in operating process, and short in time of generating the test report form, and improves report form generating efficiency.

Description

A kind of method and system that generates the test data form
Technical field
The present invention relates to the integrated circuit field of measuring technique, relate in particular a kind of method and system that generates the test data form.
Background technology
Integrated circuit (IC, Integrate Circuit) is the core of electronics and information industry.The manufacturing process of IC comprises silicon wafer to manufacture, Qian Dao, detection and four, rear road technique.During road technique, need obtain the online data of front road technique in the road tester table in the past, and utilize the online data that gets to generate corresponding test data form before carrying out, so as to check front road handicraft product whether satisfy specifications of quality standard etc.
The existing test data form that generates generally is based on the unix system making, due in the operation interface of unix system, can't carry out mouse action, it can only be the manually pure command operation of input, and after completing in an operation interface corresponding option input, need to press carriage return and enter next operation interface and carry out the input of order input and option, generally need to after the carrying out instruction and input and complete corresponding option and input of a plurality of such UNIX operation interfaces, could generate the test data form.Referring to Fig. 1, for generating an interface in a plurality of operation interfaces used in test data form process in prior art, when input<technique successively 〉,<type〉etc. after option, enter this operation interface of Fig. 1, input<code name on this operation interface 〉,<Lot ID etc. option, the option input of a plurality of operation interfaces of process that need to generate just can be completed the generation of test data form.Therefore, the efficient of the method complicated operation of prior art generation test data form, generation test data form is lower, consuming time longer.
In the process that generates the test data form, if find mistake in certain operation interface, can't modify at the operation interface of centre simultaneously, can only begin to re-start from first interface the instruction input, the report generation efficient that further reduces.
Summary of the invention
In view of this, the invention provides a kind of method and system that generates the test data form, the operating process that generates the testing journal sheet is simple, and the time that generates the testing journal sheet is shorter, and report generation efficient improves.
For achieving the above object, the invention provides a kind of method that generates the test data form, comprising:
A user interface based on the WINDOWS system is provided, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface;
The test data corresponding with described instruction obtained in the instruction that User is inputted in described Test code input frame and lot number input frame;
Silicon chip sheet that will be corresponding with described test data number is presented at described number and selects the district;
The identification user is at the silicon chip sheet of selecting for described number the district to select number, and receives the report generation instruction that the user sends by clicking described report generation option, utilizes the test data number corresponding with the described silicon chip sheet that identifies, generation test data form.
Preferably, described utilization and the described silicon chip sheet that identifies number corresponding test data generates the test data form, comprising:
With adding in corresponding EXCEL form according to default form with number corresponding test data of the described silicon chip sheet that identifies, obtain the test data form.
Preferably, obtain the test data corresponding with described instruction, comprising:
Obtain the test data that instruction is asked in the road tester table in the past.
Preferably, when generating described test data form, also comprise:
With number corresponding test data of the described silicon chip sheet that identifies in, extract and the corresponding data of counting that lost efficacy generation test data analysis form.
Preferably, described test data form comprises: and parameter coding, test name, inefficacy count/sheet, individual event be qualified/and defective information, the individual event maximum failure is counted and/or the monolithic maximum failure is counted.
Preferably, also comprise in described operation interface:
The data upload option;
Described method also comprises: receive the backup request that the user sends by clicking described data upload option, store described test data form.
Corresponding, the present invention also provides a kind of system that generates the test data form, comprising:
The interface provides the unit, is used for providing a user interface based on the WINDOWS system, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface;
Data capture unit is used for the instruction that User is inputted at described Test code input frame and described lot number input frame, obtains the test data corresponding with described instruction;
Sheet number screening unit, be used for will be corresponding with described test data the silicon chip sheet number be presented at described number and select the district;
Silicon chip sheet recognition unit is used for the identification user at the silicon chip sheet of selecting for described number the district to select number;
The report generation unit is used for receiving the report generation instruction that the user sends by clicking described report generation option, utilizes the silicon chip sheet number corresponding test data that identifies with described silicon chip recognition unit, generates the test data form.
Preferably, described report generation unit comprises: the first report generation unit, the silicon chip sheet number corresponding test data that is used for identifying with described silicon chip recognition unit is added corresponding EXCEL form to according to default form, obtains the test data form.
Preferably, described report generation unit also comprises:
The second report generation unit is used for extracting and the corresponding data of counting that lost efficacy generation test data analysis form in the test data number corresponding with the described silicon chip sheet that identifies.
Preferably, also comprise in described operation interface:
The data upload option;
Described system also comprises: the form storage unit, be used for receiving the backup request that the user sends by clicking described data upload option, and store described test data form.
Via above-mentioned technical scheme as can be known, compared with prior art, the present invention openly provides a kind of method and system that generates the test data form, the method is when generating report forms, only need on a user interface that provides, carry out the input of instruction option, just can get the test data corresponding with the appointment of inputting, and can obtain number also demonstration of corresponding silicon chip sheet according to the data of obtaining, the user only needs to select required silicon chip sheet number in the silicon chip sheet that demonstrates number, just can generate corresponding test data form.Need not to present a plurality of operation interfaces in the process that generates the testing journal sheet, system resources consumption is less, the minimizing consuming time of generating report forms.In the process of generating report forms, instruction or the option number of user's input reduce, and operating process is simple.
Simultaneously, because user input instruction is less, reduced the probability of instruction input error, and if find mistake in the process of generating report forms, only needing to modify in this operation interface to get final product, the efficient of report generation improves.
Description of drawings
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, the below will do to introduce simply to the accompanying drawing of required use in embodiment or description of the Prior Art, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to the accompanying drawing that provides other accompanying drawing.
Fig. 1 is based on the operation interface schematic diagram that be used for to generate the test data form of unix system in prior art;
Fig. 2 is the flow chart of steps of an embodiment of a kind of method that generates the test data form disclosed in this invention;
Fig. 3 is the schematic diagram that the present invention generates the user interface of test data form;
Fig. 4 is the schematic diagram of the test data form that generates of the present invention;
Fig. 5 is the schematic diagram of the test data analysis form that generates of the present invention;
Fig. 6 is a kind of structural representation that generates the system of test data form disclosed in this invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Based on the embodiment in the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
Referring to Fig. 2, the schematic flow sheet for an embodiment of a kind of method that generates the test data form disclosed by the invention comprises:
Step 201 a: user interface based on the WINDOWS system is provided, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface.
In order to reduce the complexity of user input instruction, reduce operation complexity, user interface provided by the invention is based on the interface of Windows system.Comprise the option that generates the required input of testing journal sheet at operation interface, comprise test menu name input frame, lot number input frame, sheet number selection district and report generation option.Certainly, can also add as required other options, can input test menu or Test code in this test menu list input frame, as inputting " SW101 "; Lot number corresponding to test data that input need to be obtained in lot number input Option Box is " C8M43001 " as the input lot number; Sheet number selection comprises possible silicon chip sheet number (wafer ID) in distinguishing, as 01,02,03 ... 25.
Step 202: the instruction that User is inputted in described Test code input frame and described lot number input frame, obtain the test data corresponding with described instruction.
When the user need to generate corresponding test data form, need to be in this Test code input frame input test data menu identity (test data coding), and in the lot number input frame the corresponding complete batch number of input, after completing above two instructions input, the user can press enter key or other cases, to submit the instruction (input option) of input to system, after server system receives user's instruction, obtain test data menu identity and the corresponding test data of batch number inputted with the user.
Wherein, due in the front road of IC product technique manufacturing process, generally online process data can be kept in front road tester table, therefore, obtain the detailed process of the test data corresponding with described instruction and can for test data menu identity and the batch number in the instruction of User submission, obtain the test data corresponding with this test menu name and batch number in front road tester table.Certainly this test data can be kept in the memory headroom of appointment after getting this test data, as preserving the test data that gets setting up temporary folder.
Step 203: silicon chip sheet that will be corresponding with described test data number is presented at described number and selects the district.
After getting test data, the test data that gets is carried out analyzing and processing, determine to comprise in this test data the data message of which silicon chip sheet number, and extract these silicon chip sheets number, and number select in the district silicon chip sheet that will extract number to show at this sheet.
The mode that silicon chip sheet that will be corresponding with test data number shows can have multiple, can be in the silicon chip sheet listed in sheet number is selected the district number, the silicon chip sheet that these are extracted according to test data number is set as option, and remaining silicon chip sheet of listing number is set as unavailable emphasis, or hide all the other silicon chip sheets number.
Step 204: the identification user is at the silicon chip sheet of selecting for described number the district to select number, and receive the user by clicking the report generation instruction of described report generation option transmission, utilize the test data number corresponding with the described silicon chip sheet that identifies, generation test data form.
Selected corresponding silicon chip sheet number in silicon chip sheet corresponding to test data number as the user after, system can identify the silicon chip sheet number of selection, in order to extract the test data number corresponding with the sheet of this selection from the test data that step 203 gets.After the user clicked the report generation option, system received the report generation instruction, utilized with number corresponding test data of the silicon chip sheet that identifies and generated corresponding test data form.
Need to prove, when the user selects required silicon chip sheet in sheet number is selected the silicon chip sheet that demonstrates in the district number, can select a single silicon chip sheet number, also can select simultaneously a plurality of silicon chip sheets number, and then generate the test data form of corresponding single silicon chip sheet number or a plurality of silicon chip sheet number.
Wherein, with generate the test data form detailed process can for, preset a data distribution mode, as the corresponding relation between field name and data etc., according to the form of setting, will generate corresponding test data form with number corresponding test data of the silicon chip sheet that identifies.This test data form can be in Microsoft Excel,, with adding in corresponding EXCEL form according to default form with number corresponding test data of the silicon chip sheet that identifies, obtains the test data form that is.The testing journal sheet who generates based on unix system in prior art exists with text formatting, be not easy to general analyzes in the test data form, and process some mess codes can occur and is unfavorable in reading in message, and the present invention adopts the test data form of EXCEL form with respect to text formatting of the prior art, more be conducive to the reading to the test data form, some functions of expansion that can be convenient, as the data of certain field in the test data form are added up, average etc.
The method of the present embodiment is when generating report forms, only need on a user interface that provides, carry out the input of instruction option, just can get the test data corresponding with the appointment of inputting, and can obtain number also demonstration of corresponding silicon chip sheet according to the data of obtaining, the user only needs to select required silicon chip sheet number in the silicon chip sheet that demonstrates number, just can generate corresponding test data form.Need not to present a plurality of operation interfaces in the process that generates the testing journal sheet, system resources consumption is less, the minimizing consuming time of generating report forms.In the process of generating report forms, instruction or the option number of user's input reduce, and operating process is simple.
Simultaneously, because user input instruction is less, reduced the probability of instruction input error, and if find mistake in the process of generating report forms, only needing to modify in this operation interface to get final product, the efficient of report generation improves.
In order clearly to understand the method for the described generation test data of above embodiment form, below application scenarios of the present invention is described in detail.Referring to Fig. 3, generate the schematic diagram of the user interface of test data form for the present invention.Comprise on this operation interface: " Please Select Wafer ID " and report generation option " SUMMARY REPORT " are distinguished in test menu name input frame " Input CODE ", lot number input frame " Input LOT ID and Push Enter ", sheet number selection.
At first system presents this operation interface to the user.The user can this operation interface 1, input needs test code in input frame after Input CODE, as be " SW0103 " that inputs in figure, this operation interface 2, the sheet lot number is produced in input in input frame after Input LOT ID and Push Enter, as " C8M4301 ", after completing this two steps input, press enter key enter, in order to submit instruction request to.
System receives the instruction of user's input, identifies test code and batch number, and obtain the test data corresponding with this test code and batch number in front road tester table.After getting test data, the test data that gets is analyzed, determined the test data that comprises which silicon chip sheet correspondence in this test data, and be presented at sheet number and select the district.In Fig. 3, sheet number listed 25 in sheet number is selected district Please Select Wafer ID in, number be the test data of 20,21,23 and 24 correspondences owing to only comprising the silicon chip sheet in the test data that gets, therefore only selecting in the district sheet at this silicon chip number is 20,21,23 and 24 to be set as option, and all the other sheets number are the unavailable emphasis of grey.The user more needs the own test data form that needs generation for which or which silicon chip sheet number, and selects in the above sheet that demonstrates number.Determined to press report generation option " SUMMARY REPORT " after silicon chip sheet number, just can complete the generation of test data form.
After front road tester table gets test data, when determining to comprise the test data of which silicon chip sheet correspondence in this test data, errorless in order to ensure analyzing, set up sheet and number read option, can select the district to demonstrate corresponding silicon chip sheet number at sheet number as " LOAD WAFER ID " in Fig. 3, and after the user has selected silicon chip sheet number, press this sheet and number read option, so that whether system verification is selected in the selected silicon chip sheet of this user number.Afterwards in the generation of carrying out the test data form.
The test data form that generates is present in Excel, but the field name that comprises in the test data form and data message are identical with the test data form that prior art generates, and the testing journal sheet of printing is also identical.But test data form of the present invention but can mess code not occur with electrical form as text formatting of the prior art when client shows, referring to Fig. 4, for the present invention is A40722 for batch number, test menu name CODE is the test data form that NF0084 generates, in this test data form, comprise title, comprised batch number A40722 in title, test menu name CODE:NF0084 builds the information such as table date; Parameter code T #; Test name Testname; The units of unit; Upper and lower limit, the part of LC1 as by name in field in table and UC1; Mean value Ave; Standard value Dev, and 5 average value information are as the data division of the Related fields such as 01E, 02E.This test data form below also comprise summary or conclusion to this test data, as partial contents such as FOR LABELLED PARAMETERS.
Further, in order to carry out express-analysis to the product abnormal conditions, the present invention in the testing journal sheet, can also with number corresponding test data of the silicon chip sheet that identifies in, extract and the corresponding data of counting that lost efficacy generation test data analysis form.Can comprise in this test data analysis form: parameter coding, test name, individual event be qualified/and defective information, lost efficacy and counted/sheet; , the individual event maximum failure is counted and/or the monolithic maximum failure is counted.In order to guarantee the homogeneity of whole disk, can test as required the parameter of at least 5 somes during actual production.The mean value that data point is only all test points in the test data form.The test data form is only the slice function, so judge that failpoint judges subsequent treatment if also need the technician to inquire about all test points to data server after the exception in the middle of finding.Increased a test data analysis form in the present invention and counted for generating to lose efficacy, reduced technician's analysis time, enhanced productivity.The test data analysis form schematic diagram that generates referring to Fig. 5, for the present invention, this testing journal sheet comprise parameter coding T#, test name test, the units of unit,, data message as corresponding in 01E, 02E, 03E, 22E, 23E and 24E, wherein, " 0 " expression does not exist to lose efficacy and counts.The monolithic maximum failure that the defective FALL information of the qualified PASS/ of individual event, individual event maximum failure are counted MAX and/or the be positioned at form below MAX that counts, and final analysis RESULT as a result.
For test data form and/or the test data analysis form of preserving generation, also comprised data upload option UPLOAD DATA in operation interface, the user can click this data upload option, system receives the backup request that the user sends by clicking described data upload option, stores described test data form.
Certainly, also can set as required some other option on user interface, in order to reduce the command operating of user's input.
Corresponding method of the present invention, referring to Fig. 6, the present invention also provides a kind of system that generates the test data form, comprising:
The interface provides unit 601, is used for providing a user interface based on the WINDOWS system, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface;
Data capture unit 602 is used for the instruction that User is inputted at described Test code input frame and described lot number input frame, obtains the test data corresponding with described instruction;
Sheet number screening unit 603, be used for will be corresponding with described test data the silicon chip sheet number be presented at described number and select the district;
Silicon chip sheet recognition unit 604 is used for the identification user at the silicon chip sheet of selecting for described number the district to select number;
Report generation unit 605 is used for receiving the report generation instruction that the user sends by clicking described report generation option, utilizes the silicon chip sheet number corresponding test data that identifies with described silicon chip recognition unit, generates the test data form.
Concrete this report generation unit comprises: the first report generation unit, the silicon chip sheet number corresponding test data that is used for identifying with the silicon chip recognition unit is added corresponding EXCEl form to according to default form, obtains the test data form.
In order to analyze the product abnormal conditions more easily, this report generation unit also comprises:
The second report generation unit is used for extracting and the corresponding data of counting that lost efficacy generation test data analysis form in the test data number corresponding with the silicon chip sheet that identifies.
Can comprise in this test data analysis form: parameter coding, test name, individual event be qualified/and defective information, lost efficacy and counted/sheet; , the individual event maximum failure is counted and/or the monolithic maximum failure is counted.In order to guarantee the homogeneity of whole disk, can test as required the parameter of at least 5 somes during actual production.The mean value that data point is only all test points in the test data form.The test data form is only the slice function, so judge that failpoint judges subsequent treatment if also need the technician to inquire about all test points to data server after the exception in the middle of finding.
Further, also comprise in user interface: the data upload option.
System of the present invention also comprises: the form storage unit, be used for receiving the backup request that the user sends by clicking described data upload option, and store described test data form.
In this instructions, each embodiment adopts the mode of going forward one by one to describe, and what each embodiment stressed is and the difference of other embodiment that between each embodiment, identical similar part is mutually referring to getting final product.For embodiment disclosed system, because it is corresponding with the disclosed method of embodiment, so describe fairly simple, relevant part partly illustrates referring to method and gets final product.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the present invention.Multiple modification to these embodiment will be apparent concerning those skilled in the art, and General Principle as defined herein can be in the situation that do not break away from the spirit or scope of the present invention, realization in other embodiments.Therefore, the present invention will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.

Claims (10)

1. a method that generates the test data form, is characterized in that, comprising:
A user interface based on the WINDOWS system is provided, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface;
The test data corresponding with described instruction obtained in the instruction that User is inputted in described Test code input frame and lot number input frame;
Silicon chip sheet that will be corresponding with described test data number is presented at described number and selects the district;
The identification user is at the silicon chip sheet of selecting for described number the district to select number, and receives the report generation instruction that the user sends by clicking described report generation option, utilizes the test data number corresponding with the described silicon chip sheet that identifies, generation test data form.
2. method according to claim 1, is characterized in that, described utilization and the described silicon chip sheet that identifies number corresponding test data generates the test data form, comprising:
With adding in corresponding EXCEL form according to default form with number corresponding test data of the described silicon chip sheet that identifies, obtain the test data form.
3. method according to claim 1, is characterized in that, obtains the test data corresponding with described instruction, comprising:
Obtain the test data that instruction is asked in the road tester table in the past.
4. method according to claim 1, is characterized in that, when generating described test data form, also comprises:
With number corresponding test data of the described silicon chip sheet that identifies in, extract and the corresponding data of counting that lost efficacy generation test data analysis form.
5. method according to claim 4, is characterized in that, described test data form comprises: and parameter coding, test name, inefficacy count/sheet, individual event be qualified/and defective information, the individual event maximum failure is counted and/or the monolithic maximum failure is counted.
6. method according to claim 1, is characterized in that, also comprises in described operation interface:
The data upload option;
Described method also comprises: receive the backup request that the user sends by clicking described data upload option, store described test data form.
7. a system that generates the test data form, is characterized in that, comprising:
The interface provides the unit, is used for providing a user interface based on the WINDOWS system, comprises test menu name input frame, lot number input frame, sheet number selection district and report generation option in described operation interface;
Data capture unit is used for the instruction that User is inputted at described Test code input frame and described lot number input frame, obtains the test data corresponding with described instruction;
Sheet number screening unit, be used for will be corresponding with described test data the silicon chip sheet number be presented at described number and select the district;
Silicon chip sheet recognition unit is used for the identification user at the silicon chip sheet of selecting for described number the district to select number;
The report generation unit is used for receiving the report generation instruction that the user sends by clicking described report generation option, utilizes the silicon chip sheet number corresponding test data that identifies with described silicon chip recognition unit, generates the test data form.
8. system according to claim 7, it is characterized in that, described report generation unit, comprise: the first report generation unit, the silicon chip sheet number corresponding test data that is used for identifying with described silicon chip recognition unit is added corresponding EXCEL form to according to default form, obtains the test data form.
9. system according to claim 7, is characterized in that, described report generation unit also comprises:
The second report generation unit is used for extracting and the corresponding data of counting that lost efficacy generation test data analysis form in the test data number corresponding with the described silicon chip sheet that identifies.
10. system according to claim 7, is characterized in that, also comprises in described operation interface:
The data upload option;
Described system also comprises: the form storage unit, be used for receiving the backup request that the user sends by clicking described data upload option, and store described test data form.
CN2011103436536A 2011-11-03 2011-11-03 Method and system for generating test data report form Pending CN103092864A (en)

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CN103617118B (en) * 2013-11-28 2016-06-29 北京奇虎科技有限公司 The method that is uniformly processed of test result, Apparatus and system
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CN112526317A (en) * 2020-11-13 2021-03-19 上海华岭集成电路技术股份有限公司 Integrated circuit test data recording method
CN112380140A (en) * 2020-12-08 2021-02-19 安徽江淮汽车集团股份有限公司 Intelligent cabin data testing method and system

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Application publication date: 20130508