CN102944854A - Measuring system for measuring rest field quantity absolute value and measuring method of measuring system - Google Patents

Measuring system for measuring rest field quantity absolute value and measuring method of measuring system Download PDF

Info

Publication number
CN102944854A
CN102944854A CN2012104623888A CN201210462388A CN102944854A CN 102944854 A CN102944854 A CN 102944854A CN 2012104623888 A CN2012104623888 A CN 2012104623888A CN 201210462388 A CN201210462388 A CN 201210462388A CN 102944854 A CN102944854 A CN 102944854A
Authority
CN
China
Prior art keywords
control module
magnetic field
measuring
peak
resonance absorption
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2012104623888A
Other languages
Chinese (zh)
Inventor
雷海东
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jianghan University
Original Assignee
Jianghan University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jianghan University filed Critical Jianghan University
Priority to CN2012104623888A priority Critical patent/CN102944854A/en
Publication of CN102944854A publication Critical patent/CN102944854A/en
Pending legal-status Critical Current

Links

Images

Abstract

The invention discloses a measuring system for measuring the rest field quantity absolute value and a measuring method of the measuring system, wherein the system comprises an optical source, a microprocessor, an optical filtering unit, a resonance absorption module, a photoelectric detection unit, a microwave source, a magnetic field control module and a current control module, wherein the optical source is connected with the optical filtering unit, the optical filtering unit is connected with the resonance absorption module, the resonance absorption module is sequentially connected with the microwave source, the magnetic field control module and the photoelectric detection unit, the microprocessor is sequentially connected with the microwave source, the magnetic field control module and the current control module, and the current control module is connected with the magnetic field control module. The measuring method comprises the steps that the current direction of the magnetic field current in the magnetic field control module is changed through the current control module, in addition, the output signal frequency of the microwave source is controlled through the microprocessor, further, the scanning of the whole atomic spectral line is completed, meanwhile, the optical signal amplitude value V output by the resonance absorption module and the signal frequency value F of the microwave source in the whole process are recorded, and the measurement and the calculation of the rest field quantity absolute value are finally realized.

Description

Be used for measuring measuring system and the measuring method thereof of surplus amount absolute value
Technical field
The invention belongs to the design of measuring system technical field, particularly a kind of measuring system and measuring method thereof for measuring surplus amount absolute value.
Background technology
In existing atomic spectral line detection application field (such as atomic clock), physical system provides a frequency stabilization, the narrower atomic resonance Absorption Line of live width, and atomic clock is locked in by the output frequency with VCXO just and obtains high frequency stabilization rate output on the atomic resonance absorption peak.Fill in physical system the element atom at ordinary times energy level be degeneracy, want to realize above-mentioned application function, need to apply corresponding magnetic field to whole system, be referred to as the C field.The effect of C field coil is to produce a weak static magnetic field that parallels with the microwave magnetic field direction, make atomic ground state hyperfine structure generation Zeeman splitting, and for atomic transition provides the quantization axle, simultaneously by regulating the size of C field current, change the intensity in magnetic field, the output frequency of micro-tensioning system.
The C field of more than referring to is the people for being added in the system, but system itself exists various forms of interference, and they produce a certain amount of remnant field by closed circuit electromagnetism exchanging form.The existence in these magnetic fields is very complexes, is that " Zeeman splitting " reaches the complementary field outside " quantization axle " usefulness C field.Under surplus field action, because Zeeman effect, atomic energy level is moved, and finally causes output frequency to change.
Summary of the invention
Technical matters to be solved by this invention provide a kind of can accurate measuring systems surplus amount absolute value measuring system and the measuring method thereof of inner remnant field intensity.
For solving the problems of the technologies described above, the invention provides a kind of can accurate measuring systems surplus amount absolute value measuring system and the measuring method thereof of inner remnant field intensity.For its measuring system, comprise light source, microprocessor, be used for the filter unit that the light beam to described radiation of light source filters, be used to the light beam of processing through described filter unit optical filtering to finish the resonance absorption module of resonant transition, be used for the photodetector unit that the light signal to described resonance absorption module output detects, be used to described resonance absorption module that the microwave source of energy is provided, be used to described resonance absorption module to finish the current control module that former quantum splitting and quantization axle provide the magnetic field control module in magnetic field and be used for regulating the described magnetic field of control control module; Described light source is connected with described filter unit, described filter unit is connected with described resonance absorption module, described resonance absorption module is connected with described microwave source, described magnetic field control module, described photodetector unit successively, described microprocessor is connected with described microwave source, described magnetic field control module, described current control module successively, and described current control module is connected with described magnetic field control module.
Further, described filter unit is the blister cavity body structure, and the element that described light source is used for radiation laser beam is M, and operation material is the isotope N element of described M element in the described filter unit; The light beam of described radiation of light source is by the processing that filters of described filter unit, and is sent to described resonance absorption module by described filter unit.
Further, described resonance absorption unit is the blister cavity body structure, the cylindrical cavity body structure of described resonator cavity, and described resonance absorption unit places described intra resonant cavity, is used to the light beam after described filter unit filters to finish resonant transition.
Further, described magnetic field control module comprises: enameled wire, current switch; Described enameled wire is wrapped on the described resonator cavity outer wall, and is connected with described current control module by described current switch.
Further, described current control module output current is constant current, and described microprocessor is regulated the described magnetic field of control control module magnetic field intensity by described current control module.
Further, described microwave source output signal frequency is regulated control by described microprocessor, and described microwave source output signal frequency is controlled near the described M element atomic ground state hyperfine structure transition centre frequency.
Further, described M element is 87Rb, described N element is 85Rb.
For its measuring method:
Step S1: the field supply of regulating the controlling magnetic field control module by current control module and current switch is positive dirction, and then a magnetic field intensity to be provided for resonance absorption module for " former quantum splitting and quantization axle " by the magnetic field control module be the magnetic field of C;
Step S2: by microprocessor control microwave source output signal frequency, and then control resonance absorption module is finished the photoresonance absorption process one time;
Step S3: detect the optical signal magnitude value V of resonance absorption module output by photodetector unit, and described V value is transferred to microprocessor store, microprocessor records at this moment microwave source 204 output signal frequency value F simultaneously;
Step S4: regulate control microwave source output signal frequency by microprocessor, finish the atomic spectral line frequency sweep, and draw V-F relation curve according to record numerical value, find out peak F 1, F2, F3;
Step S5: the field supply of regulating the controlling magnetic field control module by current control module and current switch is negative direction, obtains peak F 4, F5, F6 according to above-mentioned steps S2-step S4 operation;
Step S6: calculate successively peak F 1, peak F 2 frequency difference F21=F2-F1; Peak F 2, peak F 3 frequency difference F32=F3-F2; Peak F 5, peak F 4 frequency difference F54=F5-F4; Peak F 5, peak F 6 frequency difference F65=F6-F5;
Step S7: calculate successively the two mean value F7 of F21, F32; Calculate the two mean value F8 of F54, F65; And then calculate the field supply direction change before and after the signal frequency variable quantity △ F=│ F8-F7 │ of microwave source 204 outputs;
Step S8: according to the frequency relation numerical value A at amount Atomic absorption peak, traditional magnetic field, calculate surplus amount absolute value B=△ F/A.
Further, peak F 1, F2, F3 are when the field supply direction is positive dirction, three peak values picking out from 7 jump frequency peak values; Peak F 4, F5, F6 are when the field supply direction is negative direction, three peak values picking out from 7 jump frequency peak values.
A kind of measuring system and measuring method thereof for measuring surplus amount absolute value provided by the invention.Wherein, system comprises light source, microprocessor, filter unit, resonance absorption module, photodetector unit, microwave source, magnetic field control module and current control module.Light source is connected with filter unit, filter unit is connected with the resonance absorption module, the resonance absorption module is connected with microwave source, magnetic field control module, photodetector unit successively, microprocessor is connected with microwave source, magnetic field control module, current control module successively, and current control module is connected with the magnetic field control module.Its measuring method is the direction of current that changes field supply in the control module of magnetic field by current control module, and by microprocessor control microwave source output signal frequency, and then finish the frequency sweep of whole atomic spectral line, record simultaneously the optical signal magnitude value V of resonance absorption module output in the whole process and the signal frequency value F of microwave source, the final realization calculated the measurement of surplus amount absolute value.The characteristics that the present invention has is simple in structure, easy to operate, measuring accuracy is high.
Description of drawings
The measuring system structural principle block diagram that is used for measuring surplus amount absolute value that Fig. 1 provides for the embodiment of the invention.
The principle of work structural representation that is used for measuring the measuring system magnetic field control module that remains field amount absolute value that Fig. 2 provides for the embodiment of the invention.
Fig. 3 is 87Rb atomic energy level schematic diagram.
7 jump frequency peak curves of the measuring method measuring process schematic diagram that is used for measuring surplus amount absolute value that Fig. 4 provides for the embodiment of the invention.
Wherein, 1-resonator cavity, 2-enameled wire, 201-light source, 202-filter unit, 203-resonance absorption module, 204-microwave source, 205-magnetic field control module, 206-photodetector unit, 207-microcontroller, 208-current control module.
Embodiment
Below in conjunction with specific embodiment, embodiment provided by the invention is described in further detail.
A kind of measuring system and measuring method thereof for measuring surplus amount absolute value that the embodiment of the invention provides.Wherein, measuring system comprises: light source 201, microprocessor 207, be used for the filter unit 202 that the light beam to described light source 201 radiation filters, be used to the light beam that filters processing through described filter unit 202 to finish the resonance absorption module 203 of resonant transition, be used for the photodetector unit 206 that the light signal to described resonance absorption module 203 outputs detects, be used to described resonance absorption module 203 that the microwave source 204 of energy is provided, be used to described resonance absorption module 203 to finish the current control module 208 that former quantum splitting and quantization axle provide the magnetic field control module 205 in magnetic field and be used for regulating the described magnetic field of control control module 205.Wherein, light source 201 is connected with filter unit 202, filter unit 202 is connected with resonance absorption module 203, resonance absorption module 203 is connected with microwave source 204, magnetic field control module 205, photodetector unit 206 successively, microprocessor 207 is connected with microwave source 204, magnetic field control module 205, current control module 208 successively, and current control module 208 is connected with magnetic field control module 205.
In the measuring system that the present embodiment provides, preferred, filter unit 202 is the blister cavity body structure.The element that light source 201 is used for radiation laser beam is M, and operation material is the isotope N element of described M element in the filter unit.Wherein, the light beam of light source 201 radiation is by filter unit 202 processing that filters, and the light beam after the processing is sent to resonance absorption module 203.
In the measuring system that the present embodiment provides, resonance absorption module 203 comprises: resonance absorption unit, resonator cavity.Preferably, the resonance absorption unit is the blister cavity body structure, the cylindrical cavity body structure of resonator cavity.Simultaneously, the resonance absorption unit places intra resonant cavity, is used to the light beam after described filter unit filters to finish resonant transition.
In the measuring system that the present embodiment provides, preferred, magnetic field control module 205 comprises: enameled wire, current switch 209.Wherein, enameled wire is wrapped on the resonator cavity outer wall, and is connected with current control module 208 by current switch 209.
In the measuring system that the present embodiment provides, current control module 208 output currents are constant current, and microprocessor 207 is by regulating control current control module 208 output current intensities and then regulating controlling magnetic field control module 205 magnetic field intensitys.
In the measuring system that the present embodiment provides, microwave source 204 output signal frequencies are regulated control by microprocessor 207, microwave source 204 output signal frequencies are controlled near the M element atomic ground state hyperfine structure transition centre frequency, finish the frequency sweep of whole atomic spectral line.
Preferably, the M element is 87Rb, the N element is 85Rb.
The measuring method that the present embodiment provides is before measuring surplus amount absolute value, and the concise and to the point design theory of setting forth the measuring method that the embodiment of the invention provides is according to so that the Comprehension and Implementation of the measuring method that the embodiment of the invention provides first.
Magnetic frequency shift is because the Zeeman effect of atomic energy level causes, for 87Its Zeeman splitting of the hyperfine energy level of the ground state of Rb atom is:
E(F,M F)=E 0(f)+A 1H+A 2H 2+A 3H 3+…(1)
Referring to shown in Figure 3 87Rb atomic energy level figure is carrying out 87When the resonant transition of Rb atomic ground state hyperfine structure is surveyed, 7 transition are arranged, comprising a 0-0 transition, be in the ground state level<F=2, mF=0〉and<F=1, mF=0〉exact value of jump frequency is 6834.68XXXX MHz (external magnetic field H=0) between these two energy levels, rear 4-digit number is determined by the perturbation of magnetic field and buffer gas.This is so-called quantum frequency discrimination frequency values namely.
By formula (1) as can be known: for non-zero-0 transition of atomic ground state hyperfine structure, its frequency is comparatively responsive to magnetic field H, and for the 0-0 transition, its frequency only is directly proportional with the quadratic power of H, and irrelevant with the first power of H, magnetic field is more insensitive to external world.So magnetic field changes in system, what stand in the breach is to cause that non-zero-0 jump frequency significantly changes.But for using better the present invention, improve measuring accuracy, therefore also will study the 0-0 transition.
87The Rb atom 0-0 jump frequency to external world susceptibility in magnetic field is low more than other transition, but magnetic field is still very important on the impact of 0-0 jump frequency.
The experience formula is arranged:
f=f 0+574H 2(2)
F in the formula 0Frequency when being zero for external magnetic field, f is the frequency of external magnetic field when being H.H(magnetic field in the formula (2)) unit is " Gauss ", the f(resonant frequency) unit be " hertz ".Can be got the relation of Δ f and Δ H by formula (2):
Δf=1148.28HΔH (3)
Formula (3) both sides are divided by atomic resonance centre frequency f 0(get f 0=6834.6875MHz) have:
Δf/f 0=1.68*10 -7HΔH (4)
Formula (4) shows changes of magnetic field and atom 0-0 transition relation.
Based on above-mentioned theory, design a kind of measuring method for measuring surplus amount absolute value provided by the invention.
In the actual measurement process, measure in accordance with the following steps operation by an a kind of measuring method for surplus amount absolute value of measurement provided by the invention:
Step S1: the field supply of regulating controlling magnetic field control modules 205 by current control module 208 and current switch 209 is positive dirction, and then a magnetic field intensity to be provided for resonance absorption module 203 for " former quantum splitting and quantization axle " by magnetic field control module 205 be the magnetic field of C;
Step S2: by microprocessor 207 control microwave sources 204 output signal frequencies, and then control resonance absorption module 203 is finished the photoresonance absorption process one time;
Step S3: detect the optical signal magnitude value V of resonance absorption modules 203 outputs by photodetector unit 206, and described V value is transferred to microprocessor 207 store, microprocessor 207 records at this moment microwave source 204 output signal frequency value F simultaneously;
Step S4: regulate control microwave source 204 output signal frequencies by microprocessor 207, finish the atomic spectral line frequency sweep, and draw V-F relation curve according to record numerical value, as shown in Figure 4, find out peak F 1, F2, F3;
Step S5: the field supply of regulating controlling magnetic field control module 205 by current control module 208 and current switch 209 is negative direction, obtains peak F 4, F5, F6 according to above-mentioned steps S2-step S4 operation;
Step S6: calculate successively peak F 1, peak F 2 frequency difference F21=F2-F1; Peak F 2, peak F 3 frequency difference F32=F3-F2; Peak F 5, peak F 4 frequency difference F54=F5-F4; Peak F 5, peak F 6 frequency difference F65=F6-F5; And the definition frequency difference is the Zeeman frequency;
Step S7: calculate successively the two mean value F7 of F21, F32; Calculate the two mean value F8 of F54, F65; And then calculate the field supply direction change before and after the signal frequency variable quantity △ F=│ F8-F7 │ of microwave source 204 outputs;
Step S8: according to the frequency relation numerical value A at amount Atomic absorption peak, traditional magnetic field, calculate surplus amount absolute value B=△ F/A.
Wherein, peak F 1, F2, F3 are when the field supply direction is positive dirction, three peak values picking out from 7 jump frequency peak values; Peak F 4, F5, F6 are when the field supply direction is negative direction, three peak values picking out from 7 jump frequency peak values.Preferably, obtain one group of measurement data according to above-mentioned measuring process:
Figure BDA00002415969100101
Therefore obtain field supply direction Zeeman frequency before and after changing and be respectively (F21=73.27KHz, F32=73.41KHz), (F54=71.30KHz, F65=71.32KHz), the two is averaged and F54, F65 after the two averages to F21, F32 respectively, and obtaining field supply direction Zeeman frequency variation before and after changing is △ F=2.03KHz.
Because measuring system provided by the invention is in measuring process, do not change the sizes values of field supply, just field supply has been carried out reverse process, that is to say that the former quantum splitting of artificial generation and the magnetic field intensity that the quantization axle is used can not change, be that size variation should be unable to occur for Zeeman frequency in the accompanying drawing 4, but by embodiment provided by the invention, the Zeeman frequency that reverse fore-and-aft survey acquisition occurs at field supply but differs △ F=2.03KHz, this difference is exactly the contribution of surplus field in the system, according to the frequency relation numerical value A(magnetic strength intensity at amount Atomic absorption peak, traditional magnetic field and the relation between the Zeeman frequency), preferably, A=0.7KHz/1mG, relatively the Zeeman frequency changes the value of front and back in the field supply direction, and the big or small absolute value that just can estimate surplus is 2.03KHz/ (0.7KHz/1mG)=2.9mG.
A kind of measuring system and measuring method thereof for measuring surplus amount absolute value provided by the invention.Wherein, system comprises light source, microprocessor, filter unit, resonance absorption module, photodetector unit, microwave source, magnetic field control module and current control module.Light source is connected with filter unit, filter unit is connected with the resonance absorption module, the resonance absorption module is connected with microwave source, magnetic field control module, photodetector unit successively, microprocessor is connected with microwave source, magnetic field control module, current control module successively, and current control module is connected with the magnetic field control module.Its measuring method is the direction of current that changes field supply in the control module of magnetic field by current control module, and by microprocessor control microwave source output signal frequency, and then finish the frequency sweep of whole atomic spectral line, record simultaneously the optical signal magnitude value V of resonance absorption module output in the whole process and the signal frequency value F of microwave source, the final realization calculated the measurement of surplus amount absolute value.The characteristics that the present invention has is simple in structure, easy to operate, measuring accuracy is high.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although with reference to example the present invention is had been described in detail, those of ordinary skill in the art is to be understood that, can make amendment or be equal to replacement technical scheme of the present invention, and not breaking away from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of the claim scope of the present invention.

Claims (10)

1. one kind is used for measuring surplus the measuring system of measuring absolute value, comprise light source (201), microprocessor (207), it is characterized in that, also comprise: be used for the filter unit (202) that the light beam to described light source (201) radiation filters, be used to the resonance absorption module (203) of finishing resonant transition through the light beam of described filter unit (202) optical filtering processing, be used for the photodetector unit (206) that the light signal to described resonance absorption module (203) output detects, be used to described resonance absorption module (203) that the microwave source (204) of energy is provided, be used to described resonance absorption module (203) to finish the current control module (208) that former quantum splitting and quantization axle provide the magnetic field control module (205) in magnetic field and be used for regulating control described magnetic field control module (205);
Described light source (201) is connected with described filter unit (202), described filter unit (202) is connected with described resonance absorption module (203), described resonance absorption module (203) is connected with described microwave source (204), described magnetic field control module (205), described photodetector unit (206) successively, described microprocessor (207) is connected with described microwave source (204), described magnetic field control module (205), described current control module (208) successively, and described current control module (208) is connected with described magnetic field control module (205).
2. described for measuring surplus the measuring system of measuring absolute value according to claim 1, it is characterized in that:
Described filter unit (202) is the blister cavity body structure, and the element that described light source (201) is used for radiation laser beam is M, and operation material is the isotope N element of described M element in the described filter unit (202);
The light beam of described light source (201) radiation is by described filter unit (202) processing that filters, and is sent to described resonance absorption module (203) by described filter unit (202).
3. a described measuring system for measuring surplus amount absolute value according to claim 2 is characterized in that, described resonance absorption module (203) comprising: resonance absorption unit, resonator cavity (1);
Described resonance absorption unit is the blister cavity body structure, and the cylindrical cavity body structure of described resonator cavity (1), described resonance absorption unit place described resonator cavity (1) inside, is used to the light beam after described filter unit (202) filters to finish resonant transition.
4. a described measuring system for measuring surplus amount absolute value according to claim 3 is characterized in that, described magnetic field control module (205) comprising: enameled wire (2), current switch (209);
Described enameled wire (2) is wrapped on described resonator cavity (1) outer wall, and is connected with described current control module (208) by described current switch (209).
5. described for measuring surplus the measuring system of measuring absolute value according to claim 4, it is characterized in that:
Described current control module (208) output current is constant current, and described microprocessor (207) is regulated control described magnetic field control module (205) magnetic field intensity by described current control module (208).
6. described for measuring surplus the measuring system of measuring absolute value according to claim 5, it is characterized in that:
Described microwave source (204) output signal frequency is regulated control by described microprocessor (207), and described microwave source (204) output signal frequency is controlled near the described M element atomic ground state hyperfine structure transition centre frequency.
7. each is described for measuring surplus measuring system of measuring absolute value according to claim 2-6, it is characterized in that:
Described M element is 87Rb, described N element is 85Rb.
8. one kind is used for the according to claim 1 measuring method of surplus amount absolute value of described measuring system measurement, it is characterized in that:
Step S 1: the field supply of regulating control described magnetic field control module (205) by described current control module (208) and described current switch (209) is positive dirction, and then a magnetic field intensity to be provided for resonance absorption module (203) for " former quantum splitting and quantization axle " by described magnetic field control module (205) be the magnetic field of C;
Step S2: control described microwave source (204) output signal frequency by described microprocessor (207), and then control described resonance absorption module (203) and finish the photoresonance absorption process one time;
Step S3: the optical signal magnitude value V that detects described resonance absorption module (203) output by described photodetector unit (206), and described V value is transferred to described microprocessor (207) store, described microprocessor (207) records described microwave source (204) output signal frequency value F this moment simultaneously;
Step S4: regulate control described microwave source (204) output signal frequency by described microprocessor (207), finish the atomic spectral line frequency sweep, and draw V-F relation curve according to record numerical value, find out peak F 1, F2, F3;
Step S5: the field supply of regulating control described magnetic field control module (205) by described current control module (208) and described current switch (209) is negative direction, obtains peak F 4, F5, F6 according to described step S2-step S4 operation;
Step S6: calculate successively peak F 1, peak F 2 frequency difference F21=F2-F1; Peak F 2, peak F 3 frequency difference F32=F3-F2; Peak F 5, peak F 4 frequency difference F54=F5-F4; Peak F 5, peak F 6 frequency difference F65=F6-F5;
Step S7: calculate successively the two mean value F7 of F21, F32; Calculate the two mean value F8 of F54, F65; And then calculate the field supply direction change before and after the signal frequency variable quantity △ F=│ F8-F7 │ of microwave source 204 outputs;
Step S8: according to the frequency relation numerical value A at amount Atomic absorption peak, traditional magnetic field, calculate surplus amount absolute value B=△ F/A.
9. described measurement remains a measuring method of amount absolute value according to claim 8, it is characterized in that:
Described A=0.7KHz/1mG.
10. the measuring method of absolute value is measured in the surplus field of each described measurement according to claim 8-9, it is characterized in that:
Described peak F 1, F2, F3 are when the field supply direction is positive dirction, three peak values picking out from 7 jump frequency peak values;
Described peak F 4, F5, F6 are when the field supply direction is negative direction, three peak values picking out from 7 jump frequency peak values.
CN2012104623888A 2012-11-16 2012-11-16 Measuring system for measuring rest field quantity absolute value and measuring method of measuring system Pending CN102944854A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012104623888A CN102944854A (en) 2012-11-16 2012-11-16 Measuring system for measuring rest field quantity absolute value and measuring method of measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012104623888A CN102944854A (en) 2012-11-16 2012-11-16 Measuring system for measuring rest field quantity absolute value and measuring method of measuring system

Publications (1)

Publication Number Publication Date
CN102944854A true CN102944854A (en) 2013-02-27

Family

ID=47727815

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012104623888A Pending CN102944854A (en) 2012-11-16 2012-11-16 Measuring system for measuring rest field quantity absolute value and measuring method of measuring system

Country Status (1)

Country Link
CN (1) CN102944854A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105403845A (en) * 2015-11-19 2016-03-16 江汉大学 Electromagnetic induction measure apparatus
CN105446121A (en) * 2015-12-10 2016-03-30 江汉大学 Physical system
CN106405457A (en) * 2016-08-29 2017-02-15 中国科学院武汉物理与数学研究所 Device used for material ferromagnetism and magnetization performance detection and method thereof
CN107015172A (en) * 2017-04-24 2017-08-04 兰州空间技术物理研究所 A kind of rubidium atom magnetometer and its Measurement Method for Magnetic Field
CN107666355A (en) * 2016-07-27 2018-02-06 傅南匡 Quantizing resonance energy transform device and its transmission method
CN110850349A (en) * 2019-11-08 2020-02-28 中国科学技术大学 Method for aligning ground state spin energy levels
CN112702060A (en) * 2020-12-11 2021-04-23 兰州空间技术物理研究所 Microwave amplitude control method for cesium atomic clock

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4591786A (en) * 1984-08-17 1986-05-27 The United States Of America As Represented By The Secretary Of The Navy Fiber-optic magnetic gradiometer with variable magnetic biasing fields
WO2009098686A2 (en) * 2008-02-07 2009-08-13 Lahav Gan Device, system, and method of frequency generation using an atomic resonator
CN101839965A (en) * 2010-05-11 2010-09-22 江汉大学 Measuring method for quantity of driven rubidium atom frequency standard residual magnetic field

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4591786A (en) * 1984-08-17 1986-05-27 The United States Of America As Represented By The Secretary Of The Navy Fiber-optic magnetic gradiometer with variable magnetic biasing fields
WO2009098686A2 (en) * 2008-02-07 2009-08-13 Lahav Gan Device, system, and method of frequency generation using an atomic resonator
CN101839965A (en) * 2010-05-11 2010-09-22 江汉大学 Measuring method for quantity of driven rubidium atom frequency standard residual magnetic field

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105403845A (en) * 2015-11-19 2016-03-16 江汉大学 Electromagnetic induction measure apparatus
CN105446121A (en) * 2015-12-10 2016-03-30 江汉大学 Physical system
CN107666355A (en) * 2016-07-27 2018-02-06 傅南匡 Quantizing resonance energy transform device and its transmission method
CN106405457A (en) * 2016-08-29 2017-02-15 中国科学院武汉物理与数学研究所 Device used for material ferromagnetism and magnetization performance detection and method thereof
CN106405457B (en) * 2016-08-29 2018-11-13 中国科学院武汉物理与数学研究所 A kind of device and method detected for material ferromagnetism and magnetization property
CN107015172A (en) * 2017-04-24 2017-08-04 兰州空间技术物理研究所 A kind of rubidium atom magnetometer and its Measurement Method for Magnetic Field
CN107015172B (en) * 2017-04-24 2019-09-10 兰州空间技术物理研究所 A kind of rubidium atom magnetometer and its Measurement Method for Magnetic Field
CN110850349A (en) * 2019-11-08 2020-02-28 中国科学技术大学 Method for aligning ground state spin energy levels
CN110850349B (en) * 2019-11-08 2021-10-01 中国科学技术大学 Method for aligning ground state spin energy levels
CN112702060A (en) * 2020-12-11 2021-04-23 兰州空间技术物理研究所 Microwave amplitude control method for cesium atomic clock

Similar Documents

Publication Publication Date Title
CN102944854A (en) Measuring system for measuring rest field quantity absolute value and measuring method of measuring system
CN104833690A (en) Method for measuring alkali metal atomic polarizability of nuclear magnetic resonance gyro in real time
CN103023496A (en) Quantum interference device, atomic oscillator and magnetic sensor
CN203950025U (en) A kind of magnetic field measuring device based on relevant population trapping effect
CN103954354B (en) Quantum standard laser power takes into account laser power measurement method
CN102104382B (en) Method for reducing optical frequency shift of rubidium atomic frequency standard
CN101984559B (en) Method for improving accuracy of standard frequency of rubidium atoms
CN101839965B (en) Measuring method for quantity of driven rubidium atom frequency standard residual magnetic field
CN102799103A (en) Rubidium atomic clock with high contrast ratio frequency discrimination signal
CN102788900B (en) Atomic ground state hyperfine Zeeman frequency measuring device and method
Yuan et al. Lepton-number violating four-body decays of heavy mesons
CN103152041B (en) The system of a kind of fine-structure constant variation measuring method and application the method
CN202995014U (en) Residual field quantity measuring system based on Zeeman frequency
CN102967366B (en) For improving the system of microwave power frenquency in atomic spectral line detection process
Xu et al. Precision measurement of the mg+ 25 ground-state hyperfine constant
CN105446121A (en) Physical system
Shi et al. Transverse azimuthal dephasing of a vortex spin wave in a hot atomic gas
CN202998067U (en) Frequency standard based on two microwave detection systems
CN201548326U (en) Double-channel atom filtering full-disk solar imager
CN111373885B (en) Rubidium clock circuit structure for temperature coefficient compensation by utilizing step frequency multiplier
CN202757998U (en) Atom Zeeman frequency measuring instrument
Gwinner Experimental tests of time dilation in special relativity
CN104410416A (en) Coherent population trapping atomic frequency standard and method for improving short-term stability thereof
CN202994291U (en) Atom spectral line detection device
Bozman et al. An intersystem transition in the first spectrum of beryllium

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C12 Rejection of a patent application after its publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20130227