CN102880151B - Double-layer data model-driven plant-level chemical process monitoring method - Google Patents

Double-layer data model-driven plant-level chemical process monitoring method Download PDF

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CN102880151B
CN102880151B CN201210387023.3A CN201210387023A CN102880151B CN 102880151 B CN102880151 B CN 102880151B CN 201210387023 A CN201210387023 A CN 201210387023A CN 102880151 B CN102880151 B CN 102880151B
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葛志强
宋执环
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浙江大学
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

The invention discloses a double-layer data model-driven plant-level chemical process monitoring method. Relationships between sub-modules are modeled by constructing a double-layer data statistical analysis model on the basis of blocking modeling, so that a plant-level process is globally monitored. Compared with the conventional other plant-level process monitoring methods, the method has the advantages that each unit of the process can be monitored in each sub-module, relationship information between the sub-modules of the plant-level process can be effectively combined, and the whole plant-level process is globally monitored by utilizing a second-layer data model, so that the monitoring performance of the plant-level chemical process is greatly improved, and the industrial automation of the plant-level process can be favorably expanded and implemented.

Description

The level of factory Monitoring of Chemical method of dual-layer data model-driven

Technical field

The invention belongs to safety monitoring and the field of quality control of chemical engineering industry production run, particularly a kind of level of factory Monitoring of Chemical method of dual-layer data model-driven.

Background technology

Along with the production-scale expanding day of modern chemical industry process, a kind of novel level of factory process more and more causes the concern of people.Also obtain the extensive concern of academia and industry member for the modeling of level of factory process, monitor and forecast thereupon.A typical level of factory process comprises multiple operating unit, multiple flow path device usually, even includes multiple operation workshop.The large-size chemical process of complexity like this, adopts traditional monitoring method based on mechanism model will be very difficult.By contrast, owing to have accumulated a large amount of data in process, be more applicable to and complex large-sized level of factory process based on the modeling of data and monitoring method.Level of factory process monitoring method conventional is at present all be based upon on the basis of data-driven model mostly, in these large class methods, usually first whole level of factory process is divided into multiple submodule according to operating unit and function, the monitoring model then set up based on data for different submodules respectively carries out piecemeal monitoring to process.But these class methods often have ignored the mutual relationship between submodule, and this relation likely has influence on the Monitoring Performance of whole level of factory process.Therefore, if on the basis of submodule data modeling, then a model can be set up to the mutual relationship between them, the capturing ability of data model to level of factory procedural information will greatly be improved.Meanwhile, based on the monitoring system of a dual-layer data model, will make Real-Time Monitoring to the overall situation of level of factory process and local mode of operation, the robotization being very beneficial for level of factory process is implemented simultaneously.

Summary of the invention

The object of the invention is to the deficiency for existing level of factory process monitoring method, a kind of level of factory Monitoring of Chemical method of dual-layer data model-driven is provided.

The object of the invention is to be achieved through the following technical solutions: a kind of level of factory Monitoring of Chemical method of dual-layer data model-driven, comprises the following steps:

(1) Distributed Control System (DCS) is utilized to collect the training data sample set of the data composition modeling of level of factory chemical process: X ∈ R n × m.Wherein, n is the number of sample data collection, and m is the variable number of sample data collection.

(2) by whole level of factory process data collection X ∈ R n × mbe divided into different submodules wherein b=1,2 ..., B is the sequence number of submodule, and B is total submodule number.By these submodule data sets stored in database backup.

(3) for the data set that each submodule is corresponding, it is normalized, sets up the data statistics monitoring model based on pivot analysis, extract pivot information, set up monitoring and statistics amount and the monitoring limit thereof of submodule.

(4) after obtaining the pivot information of each submodule, arrangement being re-started to it, being combined into new data set for building second layer data statistic analysis model.

(5) for the new data matrix of mixing pivot information, adopt one-class support vector machines to carry out modeling to it, set up the relational model between each submodule, complete Holistic modeling and the monitoring of level of factory process.

(6) collect new process data, and pre-service and normalization are carried out to it.

(7) new process data is divided into multiple submodule, is input in submodule principal component model, calculate corresponding pivot composition.

(8) reconfigure the pivot information of different submodule, new data matrix is input in one-class support vector machines model, calculate corresponding monitoring and statistics value, judge the running status of active procedure.

The invention has the beneficial effects as follows: the present invention is by building dual-layer data Statistic analysis models to level of factory process, overcome the defect of traditional piecemeal modeling method, establish the relational model between each submodule in level of factory process, and introduce one-class support vector machines and build a new distance statistics amount for process monitoring.Compare other current level of factory process monitoring method, the present invention not only can monitor the unit of process in each submodule, and can effectively in conjunction with the relation information between each submodule of level of factory process, the overall situation of second layer data model to whole level of factory process is utilized to monitor, substantially increase the Monitoring Performance of level of factory chemical process, be very beneficial for expansion and the enforcement of the robotization of level of factory process industrial.

Accompanying drawing explanation

Fig. 1 is the process flow diagram of level of factory chemical process;

Fig. 2 is the monitoring result to normal data set in level of factory process in the inventive method;

Fig. 3 is the monitoring result to abnormal data set in level of factory process in the inventive method;

Fig. 4 is the monitoring result to abnormal data set in level of factory process in traditional Principal Component Analysis Model.

Embodiment

The present invention is directed to the monitoring problem of level of factory chemical process, first utilize Distributed Control System (DCS) to collect the data of this process, necessary pre-service and normalization are carried out to it, then whole process data collection is divided into different submodules.For the data set that each submodule is corresponding, set up the Principal Component Analysis Model of respectively, and set up the control limit of monitoring and statistics amount.After obtaining pivot information corresponding to each submodule data set, be reassembled into new data set, then adopt one-class support vector machines to carry out modeling to it.Time new process data is monitored, equally these data are divided into different submodules, the average of each submodule modeling data and standard deviation is utilized to be normalized it, after obtaining normal data, the Principal Component Analysis Model recycling each submodule calculates the pivot information of new data in different submodule.The all pivot information obtained in submodule are reconfigured, is input in the one-class support vector machines model of the second layer, calculate the value of distance monitoring and statistics amount, realize monitoring the overall situation of level of factory process.

The key step of the technical solution used in the present invention is as follows respectively:

The first step utilizes Distributed Control System (DCS) to collect the two-dimentional training sample set of the data composition modeling of level of factory chemical process: X ∈ R n × m.Wherein, n is the number of sample data collection, and m is the variable number of sample data collection, and R is real number.

Second step according to the operating unit type of process and relevant functional attributes, the two-dimentional training sample set X ∈ R that step 1 is obtained n × mbe divided into different submodules: wherein b=1,2 ..., B is the sequence number of submodule, and B is total submodule number.By these submodule data sets stored in database backup.

3rd step, for data set corresponding to each submodule, is normalized it, sets up the data statistics monitoring model based on pivot analysis, extracts pivot information, sets up monitoring and statistics amount and the monitoring limit thereof of submodule.

The data set corresponding to each submodule b=1,2 ..., B carries out pre-service and normalization, and namely make the average of each process variable be zero, variance is 1, obtains new data matrix collection.The fundamental purpose of this step is the result in order to make the yardstick of process data can not have influence on monitoring.After normalization, the data of various process variable are just under identical yardstick, can not have influence on follow-up monitoring effect afterwards.Then, pivot analysis is carried out to this data set, former space is divided into principal component space and residual error space, choose suitable pivot number, the loading matrix P obtained bwith score matrix T b, and obtain the residual error of modeling, that is:

X b = T b · P b T + T ~ b · P ~ b T

On the basis of Principal Component Analysis Model, by constructing following two statistic T 2the monitoring to each submodule inside is realized with SPE:

T b 2 = t b T Λ b t b ; SPE b = e b T e b ,

Wherein, t bfor submodule score matrix T bin vector, corresponding to the pivot variable of a sub-module data, for the estimation residual error of these data.In order to monitor the state of data, we need to set up and SPE bthe monitoring and statistics limit of statistic and SPE b, lim, that is:

T b , lim 2 = k b ( n - 1 ) n - k b F k b , ( n - k b ) , α ; SPE b , lim = g b χ n b , α 2 ;

Wherein, F represents the statistical distribution of F form, x 2for x 2the statistical distribution of form, α is statistical confidence, g b=var (SPE b)/[2mean (SPE b)], h b=2 [mean (SPE b)] 2/ var (SPE b), wherein mean (SPE b) and var (SPE b) be respectively SPE bthe average of statistic and variance.Respectively to b=1,2 ..., the different submodules of B carry out modeling, complete the structure of ground floor data model.

4th step obtains the pivot information of each submodule b=1,2 ..., after B, arrangement being re-started to it, being combined into new data set for building second layer data statistic analysis model, that is:

T com=[T 1T 2…T b…T B]。

5th step, for the new data matrix of mixing pivot information, adopts one-class support vector machines to carry out modeling to it, sets up the relational model between each submodule, complete Holistic modeling and the monitoring of level of factory process.

For two dimension mixing main metadata matrix T com, set up one-class support vector machines Data Analysis Model.First nonlinear function is utilized to project in high-dimensional feature space by process data, namely one-class support vector machines is by solving optimal problem Modling model below:

min R , a , ξ R 2 + C Σ i = 1 n ξ i

s . t . | | Φ ( t i ) - a | | 2 ≤ R 2 + ξ i , ξ i ≥ 0 , i = 1,2 , · · · , n

Wherein, R and a is radius and the centre of sphere of suprasphere in high-dimensional feature space respectively, Φ (t i) be non-linear projection function, C is one-class support vector machines parameter, and by this parameter, one-class support vector machines can average out between the volume of suprasphere and the mistake point rate of sample, and ξ is the slack variable of each sample.In the solution procedure of reality, following dual propositions is usually adopted to construct one-class support vector machines, that is:

min α i Σ i = 1 n α i K ( t i , t j ) - Σ i = 1 n Σ j = 1 n α i α j K ( t i , t j ) ;

s . t . 0 ≤ α i ≤ C , Σ i = 1 n α i = 1

Wherein, K (t i, t j)=< Φ (t i), Φ (t j) > is kernel function, be usually chosen for the form of gaussian kernel function, α is the coefficient that each sample is corresponding, i.e. Lagrange multiplier.The modeling result of one-class support vector machines is: the α value that most of sample is corresponding is zero, and only have the α value that the crucial sample of fraction is corresponding non-vanishing, these samples are called as support vector.

In high-dimensional feature space, ask for suprasphere the centre of sphere and radius as follows:

a = &Sigma; i = 1 n &alpha; i &Phi; ( t i ) ,

R = 1 - 2 &Sigma; i = 1 n &alpha; i K ( t 0 , t i ) + &Sigma; i = 1 n &Sigma; j = 1 n &alpha; i &alpha; j K ( t i , t j ) ,

Wherein, t 0for one of them support vector in single class vector machine model.

6th step collects new process data, and carries out pre-service and normalization to it.

New process data is divided into multiple submodule by the 7th step, is input in submodule principal component model, calculates corresponding pivot composition.

First, by new process data x newbe divided into multiple submodule, namely

x new = x 1 new x 2 new &CenterDot; &CenterDot; &CenterDot; x b new &CenterDot; &CenterDot; &CenterDot; x B new

Different submodule data vectors is input in corresponding submodule principal component model, calculates corresponding pivot composition as follows

t 1 new = P 1 T x 1 new , t 2 new = P 2 T x 12 new , ..., t B new = P B T x B new

8th step reconfigures the pivot information of different submodule, is input in one-class support vector machines model by new data matrix, calculates corresponding monitoring and statistics value, judges the running status of active procedure.

By as follows for pivot information combination corresponding for each submodule data vector:

t com new = P 1 T x 1 new P 2 T x 2 new &CenterDot; &CenterDot; &CenterDot; P b T x b new &CenterDot; &CenterDot; &CenterDot; P B T x B new ,

On this basis, the new pivot blended data vector will obtained be input in one-class support vector machines model, in higher dimensional space, calculate the distance of this data vector to the suprasphere centre of sphere, that is:

D new = d ( &Phi; ( t com new ) ) = | | &Phi; ( t com new ) - a | | = 1 - 2 &Sigma; i = 1 n &alpha; i K ( t com new , t i ) + &Sigma; i = 1 n &Sigma; j = 1 n &alpha; i &alpha; j K ( t i , t j ) ,

Work as D new≤ D limduring=R, illustrate that the running status of level of factory process is good, current do not have fault to occur, on the contrary, if D new>D limduring=R, illustrate that this monitoring and statistics amount has surmounted its Statisti-cal control limit, level of factory process likely there occurs certain fault, and needing provides warning message to process.

The validity of the inventive method is described below in conjunction with a concrete level of factory chemical process example.As shown in Figure 1, whole process is made up of 5 different operating units the process flow diagram of this process.Choose the monitoring of 33 primary process variable for this level of factory process, as shown in table 1, according to the corresponding informance of process operation Elementary Function and variable, monitored parameters is divided into 3 different submodules, this is because wherein there is the variable of two operating units very few, and and adjacent operating unit coupling is comparatively strong, therefore they is put under in other operating unit.Collection 960 data points are used for modeling altogether during the course, next set forth in detail implementation step of the present invention in conjunction with this detailed process:

1. collection process data, data prediction, level of factory process piecemeal, submodule Principal Component Analysis Model builds (ground floor data model structure)

Pre-service is carried out to 960 that collect effective normal data samples, removes average and variance, and be divided into three different submodules, respectively corresponding 16,10 and 7 process variable.Like this, the submodule data set obtained is respectively X 1∈ R 960 × 16, X 2∈ R 960 × 10and X 3∈ R 960 × 7.Then, respectively for each submodule data set, set up its Principal Component Statistics analytical model, utilize cumulative proportion in ANOVA principle, namely the cumulative data of pivot explains that degree is more than 85%, the pivot number chosen is respectively 11,5 and 3, and cumulative proportion in ANOVA is respectively 88.72%, 91.64% and 90.54%.In addition, the T that obtains of each Principal Component Analysis Model 2with SPE add up quantitative statistics limit be respectively 25.1908 and 8.3297(first submodule), 15.2452 and 4.9734(second submodule), 11.4300 and 5.6033(the 3rd submodule).

2. based on the level of factory process global modeling (second layer data model structure) of one-class support vector machines

The pivot information obtained by each submodule re-starts combination, obtains following new main metadata matrix, utilizes one-class support vector machines to carry out modeling to it, determine the position of the centre of sphere of suprasphere and the size of radius in higher dimensional space.When Selecting All Parameters, make a wrong point rate control about 1%, the monitoring and statistics amount of such gained just represents the confidence limit of 99%.In high-dimensional feature space, the radius size of the suprasphere finally obtained is 0.7059.

3. obtain current Monitoring Data information, and pre-service and normalization are carried out to it

In order to test the validity of new method, respectively normal data set and abnormal data set are tested, wherein, normal data set comprises 500 data points, abnormal data set comprises 960 data points, and (wherein, 160 is normal data, 800 is abnormal data afterwards), be first utilize the average in model bank and variance to be normalized it, make this test data and modeling data have identical yardstick.

4. the on-line monitoring of level of factory chemical process

First each test data normal data concentrated is divided into three different submodule data vectors, utilizes the Principal Component Analysis Model that each submodule is corresponding to carry out pivot information extraction to it.After obtaining the pivot information of each submodule, combination is re-started to it, be input in one-class support vector machines model, in high-dimensional feature space, calculate the distance of itself and the suprasphere centre of sphere, i.e. the value of distance statistics amount, and compared with radius, obtain Real-Time Monitoring result, as shown in Figure 2.As can be seen from this figure, dual-layer data model is to the monitoring result of normal data or satisfied, and the data volume of wrong report, substantially about 1%, meets the hypothesis of modeling.Next monitor abnormal data set, as shown in Figure 3, as can be seen from Figure, after 160 sampled points, dual-layer data model has successfully monitored the exception of level of factory process to result, and continues to provide warning message afterwards.By contrast, if we adopt traditional Principal Component Analysis Model to monitor, Monitoring Performance will reduce greatly, as shown in Figure 4.This also illustrates us, to introduce one-class support vector machines when second layer data modeling be suitable, is also effective.

Table 1: level of factory process monitoring variable list

Above-described embodiment is used for explaining and the present invention is described, instead of limits the invention, and in the protection domain of spirit of the present invention and claim, any amendment make the present invention and change, all fall into protection scope of the present invention.

Claims (6)

1. a level of factory Monitoring of Chemical method for dual-layer data model-driven, is characterized in that, comprise the following steps:
(1) Distributed Control System (DCS) is utilized to collect the training data sample set of the data composition modeling of level of factory chemical process: X ∈ R n × m, wherein, n is the number of sample data collection, and m is the variable number of sample data collection;
(2) by whole level of factory process data collection X ∈ R n × mbe divided into different submodules wherein b=1,2 ..., B is the sequence number of submodule, and B is total submodule number, by these submodule data sets stored in database backup;
(3) for the data set that each submodule is corresponding, it is normalized, sets up the data statistics monitoring model based on pivot analysis, extract pivot information, set up monitoring and statistics amount and the monitoring limit thereof of submodule;
(4) after obtaining the pivot information of each submodule, arrangement being re-started to it, being combined into new data set for building second layer data statistic analysis model;
(5) for the new data matrix of mixing pivot information, adopt one-class support vector machines to carry out modeling to it, set up the relational model between each submodule, complete Holistic modeling and the monitoring of level of factory process;
(6) collect new process data, and pre-service and normalization are carried out to it;
(7) new process data is divided into multiple submodule, is input in submodule principal component model, calculate corresponding pivot composition;
(8) reconfigure the pivot information of different submodule, new data matrix is input in one-class support vector machines model, calculate corresponding monitoring and statistics value, judge the running status of active procedure.
2. the level of factory Monitoring of Chemical method of dual-layer data model-driven according to claim 1, it is characterized in that, described step (2) is specially: by whole data set X ∈ R n × maccording to different operating units and functional attributes, be divided into each submodule, that is:
X=[X 1X 2… X b… X B],
Wherein b=1,2 ..., B is the sequence number of submodule, and B is total submodule number.
3. the level of factory Monitoring of Chemical method of dual-layer data model-driven according to claim 1, it is characterized in that, described step (3) is specially: for the data set that each submodule is corresponding, first it is normalized, namely average and the variance of each data variable is removed, then set up Principal Component Analysis Model, specifically can pass through covariance matrix carry out Eigenvalues Decomposition realization; By pivot analysis, former space can be divided into principal component space and residual error space, the loading matrix obtained and score matrix T b &Element; n &times; k b As follows:
&Sigma; b = X b T X b / ( n - 1 ) = [ P b P ~ b ] &Lambda; b [ P b P ~ b ] T ,
T b = X b &CenterDot; P b ; T ~ b = X b &CenterDot; P ~ b ,
Wherein, k bfor the pivot number chosen, T bfor the score matrix of principal component space, for the score matrix in residual error space, for pivot decomposes the eigenvalue matrix obtained, and meet following relation such Principal Component Analysis Model is just divided into two sub spaces original process operation space, i.e. principal component space with residual error space
4. the level of factory Monitoring of Chemical method of dual-layer data model-driven according to claim 1, it is characterized in that, described step (4) is specially: the pivot information obtaining each submodule afterwards, arrangement is re-started to it, be combined into new data set T comfor building second layer data statistic analysis model, that is:
T com=[T 1T 2… T b… T B]。
5. the level of factory Monitoring of Chemical method of dual-layer data model-driven according to claim 1, it is characterized in that, described step (5) is specially: for the new data matrix T of mixing pivot information com, adopt one-class support vector machines to carry out modeling to it, set up the relational model between each submodule, complete Holistic modeling and the monitoring of level of factory process; First utilize nonlinear function by T comin each data projection in high-dimensional feature space, namely wherein, t ifor T comin a data vector, one-class support vector machines is by solving optimal problem Modling model below:
min R , a , &xi; R 2 + C &Sigma; i = 1 n &xi; i s . t . | | &Phi; ( t i ) - a | | 2 &le; R 2 + &xi; i , &xi; i &GreaterEqual; 0 , i = 1,2 , . . . , n ;
Wherein, R and a is radius and the centre of sphere of suprasphere in high-dimensional feature space respectively, Φ (t i) be non-linear projection function, C is one-class support vector machines parameter, and by this parameter, one-class support vector machines can average out between the volume of suprasphere and the mistake point rate of sample, and ξ is the slack variable of each sample; In the solution procedure of reality, following dual propositions is usually adopted to construct one-class support vector machines, namely
min &alpha; i &Sigma; i = 1 n &alpha; i K ( t i , t j ) - &Sigma; i = 1 n &Sigma; j = 1 n &alpha; i &alpha; j K ( t i , t j ) s . t . 0 &le; &alpha; i &le; C , &Sigma; i = 1 n &alpha; i = 1 ;
Wherein, K (t i, t j)=< Φ (t i), Φ (t j) > is kernel function, be usually chosen for the form of gaussian kernel, α is the Lagrange multiplier that each sample is corresponding; The modeling result of one-class support vector machines is: the α value that most of sample is corresponding is zero, and only have the α value that the crucial sample of fraction is corresponding non-vanishing, these samples are called as support vector.
6. the level of factory Monitoring of Chemical method of dual-layer data model-driven according to claim 1, it is characterized in that, described step (7) and (8) are specially: by new process data x newbe divided into multiple submodule, be input in submodule principal component model, calculate corresponding pivot composition, that is:
x new = x 1 new x 2 new . . . x b new . . . x B new ,
t com new = P 1 T x 1 new P 2 T x 2 new . . . P b T x b new . . . P B T x B new ,
On this basis, the new pivot blended data vector will obtained be input in one-class support vector machines model, the distance factor be defined as follows is as the statistic of process monitoring:
D new = d ( &Phi; ( t com new ) ) = | | &Phi; ( t com new ) - a | | = 1 - 2 &Sigma; i = 1 n &alpha; i K ( t com new , t i ) + &Sigma; i = 1 n &Sigma; j = 1 n &alpha; i &alpha; j K ( t i , t j ) &le; D lim = R ,
Wherein, D limfor the statistics of monitoring and statistics amount D is limit, equal with the radius of suprasphere.
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