CN102854453A - Probe-type test fixture - Google Patents

Probe-type test fixture Download PDF

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Publication number
CN102854453A
CN102854453A CN 201210292962 CN201210292962A CN102854453A CN 102854453 A CN102854453 A CN 102854453A CN 201210292962 CN201210292962 CN 201210292962 CN 201210292962 A CN201210292962 A CN 201210292962A CN 102854453 A CN102854453 A CN 102854453A
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CN
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Prior art keywords
test
probe
according
provided
test fixture
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CN 201210292962
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Chinese (zh)
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CN102854453B (en )
Inventor
金湖滨
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苏州启智机电技术有限公司
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Abstract

The invention provides a probe-type test fixture which comprises a test bench and a test device, wherein a copper column for fixing a circuit board is arranged on the test bench, a slide rod parallel to the test bench is arranged above the test bench, the two ends of the slide rod are fixed on the test bench through connecting rods, the slide rod is sleeved with at least two lantern rings, the lantern rings can slide on the slide rod, each lantern ring is provided with a lock screw, a telescopic rod perpendicular to the slide rod is fixed on the lantern rings, the other end of the telescopic rod is provided with a test probe, and the test probe is electrically connected with the test device. The probe-type test fixture disclosed by the invention can be used for testing through the test probe in contact with an interface of the circuit board so as to prevent the abrasion of the interface, so that the interface does not have an aging phenomenon.

Description

探针式测试治具 Probe type test fixture

[0001] [0001]

技术领域 FIELD

[0002] 本发明涉及测试工装治具领域,特别地,是一种用于测试主板的测试治具。 [0002] The present invention relates to the field test of the fixture, in particular, a board test fixture for testing.

[0003] [0003]

背景技术 Background technique

[0004] 在社会高速发展的现代,越来越多的电子产品进入千家万户,这些设备一般都含有一块甚至多块或大或小的电路板,这些电路板上焊接了各种各样的接口,特别是微机使 [0004] In the rapid development of modern society, more and more electronic products every household, these devices generally contain one or more boards, large or small circuit board, the circuit board welding a variety of interfaces, in particular that the microcomputer

用的主板接口更多,这些电子产品在出厂时都需要进行一系列的检测。 The board interfaces with more, these electronic products need to be shipped in a series of testing.

[0005] 一般检测都是通过在电路板的接口插接相应的插头,然后进行相关测试,但是这样的测试会将电路板接口的金属触片产生磨损,这种磨损会给挑剔的客户借口使用过而产生退货,更重要的是这种磨损的存在,会加速接口的氧化。 [0005] are generally detected by the corresponding interface circuit board plug connector, and then the relevant test, but the metal contact such a test interface board will wear, such wear will discerning customers use excuse had to produce returns, more important is the existence of such wear, it will accelerate the oxidation interface.

[0006] [0006]

发明内容 SUMMARY

[0007] 为了解决上述问题,本发明的目的在于提供一种探针式测试治具,该探针式测试治具能通过电路板接口的焊点,与电路板电气连接进行测试。 [0007] In order to solve the above problems, an object of the present invention is to provide a probe type test fixture, the test fixture probe type pad on the circuit board through an interface, electrically connected with the circuit board for testing.

[0008] 本发明解决其技术问题所采用的技术方案是: [0008] The aspect of the present invention to solve the technical problem are:

该探针式测试治具包括测试台和测试器,所述测试台上设置有固定电路板的铜柱,所述测试台上方设置有与其平行的滑杆,所述滑杆两端通过连杆固定在所述测试台上,所述滑杆上套接有至少二根套环,所述套环能在所述滑杆上滑动,所述套环上设置有锁定螺杆,所述套环上固定一垂直于所述滑杆的伸缩杆,所述伸缩杆的另一端设置有测试探针,所述测试探针与所述测试器电气连接。 The test fixture comprises probe type testing station and a tester, the test stand is provided with a copper pillar fixing circuit board, the test stand is provided with parallel side slider, both ends of the slider by a connecting rod fixed to the test bench, with at least two of the sleeved collar on the slider, the collar is slidable on the slide bar, the collar is provided with a locking screw, the collar the other end is fixed to a slider perpendicular to the telescopic pole, the telescopic rod is provided with a test probe, the test probe is electrically connected to the tester.

[0009] 作为优选,所述伸缩杆为气动伸缩杆且分别通过通气管与同一气泵连通。 [0009] Advantageously, the telescoping rod is a pneumatic telescopic rod and each vent pipe communicating through the same pump.

[0010] 作为优选,所述测试器和所述气泵集成在同一壳体中,所述测试器与测试探针之间的导线分别设置在对应的通气管内。 [0010] Advantageously, the test and the air pump integrated in the same housing, the wire between the test and the test probes are disposed within the corresponding snorkel.

[0011] 作为优选,所述测试台上设置有旋转平台,所述铜柱设置在所述旋转平台上。 [0011] Advantageously, the test stand is provided with a rotating platform, the copper pillar is provided on the rotating platform.

[0012] 作为优选,所述连杆为含有锁定环的伸缩柱。 [0012] Advantageously, the lock ring containing link telescopic column.

[0013] 作为优选,所述测试探针的顶部为导电胶或者导电硅胶。 [0013] Advantageously, the top of the test probe is a conductive paste or a conductive silicone.

[0014] 本发明的优点在于: [0014] The advantage of the present invention:

1.通过测试探针接触电路板的接口,进行测试,防止了接口的磨损,使接口不产生老化 1, a test test probe in contact via an interface board, to prevent wear of the interface, the interface so that no aging

2.结构简单,成本低廉。 2. Simple structure and low cost.

[0015] [0015]

附图说明[0016] 图I是本探针式测试治具一实施例立体结构示意图。 BRIEF DESCRIPTION [0016] Figure I is a perspective structural diagram of the present embodiment probe type embodiment of a test fixture.

[0017] 图2是本探针式测试治具图I实施例测试主板的立体结构示意图。 [0017] FIG. 2 is a probe type test fixture schematic perspective view of the structure I were tested motherboard embodiment.

[0018] 图3是本探针式测试治具图I实施例测试探针的结构示意图。 [0018] FIG. 3 is a schematic view of a probe of formula I test fixture of FIG embodiment of a test probe.

具体实施方式 detailed description

[0019] 下面结合附图和实施例对本发明进一步说明: Figures and examples further illustrate the present invention, [0019] in conjunction with the following:

参阅图I、图2,在本实施例中,该探针式测试治具包括测试台100和测试器,所述测试台100上设置有固定电路板500的铜柱120,所述测试台100上方设置有与其平行的滑杆600,所述滑杆600两端通过连杆200固定在所述测试台100上,所述滑杆600上套接有四 Referring to Figure I, Figure 2, in the present embodiment, the probe type test fixture and test 100 includes a test station, said test is provided with a copper pillar 500 is fixed to the circuit board 100 on the table 120 of the test station 100 parallel thereto is arranged above the slider 600, the slider 600 by a connecting rod fixed to the ends 200 on the test station 100, the slider 600 is sleeved on the four

根套环320,所述套环320能在所述滑杆600上滑动,所述套环320上设置有锁定螺杆330,所述套环320上固定一垂直于所述滑杆600的伸缩杆300,所述伸缩杆300的另一端设置有测试探针310,所述测试探针310与所述测试器电气连接。 Root collar 320, the collar 320 can slide on the slide bar 600, the collar 320 is provided with a locking screw 330, the collar 320 is fixed on a telescopic shaft perpendicular to the slide bar 600 300, the other end of the telescopic rod 300 is provided with a test probe 310, the test probe 310 electrically connected to the tester.

[0020] 上述的探针式测试治具,所述伸缩杆300为气动伸缩杆且分别通过一通气管410 [0020] The probe type test fixture, the telescopic rod 300 is a pneumatic telescoping rod and a vent tube 410 respectively

与同一气泵连通。 Communication with the same pump.

[0021] 上述的探针式测试治具,所述测试器和所述气泵集成在同一壳体400中,所述测试器与测试探针310之间的导线分别设置在对应的通气管410内,简化整个装置的结构。 [0021] The probe type test fixture, the test and the air pump integrated in the same housing 400, the wire between the tester and test probe 310 are disposed within the corresponding snorkel 410 to simplify the structure of the entire apparatus.

[0022] 上述的探针式测试治具,所述测试台100上设置有旋转平台110,所述铜柱120设置在所述旋转平台110上,旋转平台能够使测试探针310减少因为电路板500本身的元件阻挡而产生死角。 [0022] The probe type test fixture, the test platform 110 is provided with a rotary table 100, the copper pillar 120 provided on the rotating platform 110, rotation of the platform so that the test probe can be reduced since the circuit board 310 the barrier member 500 itself generates a blind spot.

[0023] 上述的探针式测试治具,所述连杆200为含有锁定环210的伸缩柱,通过调整连杆200的高低,可以调整测试探针310的最佳接触角度。 [0023] The probe type test fixture, the link 200 is a telescopic column comprising a locking ring 210, connecting rod 200 by adjusting the height can be adjusted, the angle of contact test probe 310 is optimal.

[0024] 参阅图3,上述的探针式测试治具,所述测试探针310的顶部为导电胶或者导电硅胶,导电胶或者导电硅胶能够使测试探针310不划伤电路板500的焊点。 [0024] Referring to Figure 3, the above-mentioned probe type test fixture, the top of the test probe 310 is a conductive paste or a conductive silicone, conductive glue or conductive silicone test probe 310 can be made without scratching welding circuit board 500 point.

[0025] 上述的探针式测试治具的使用方式: [0025] The probe type of test fixture used:

将电路板500固定在所述旋转平台110的铜柱120上,然后调整旋转平台110和连杆200,使所述测试探针310避免所述电路板500上元器件的阻挡,将测试探针310调整至对应接口的焊点上,锁定所述锁定螺杆330固定所述伸缩杆300,驱动所述气泵,所述伸缩杆300将所述测试探针310送至对应接口的焊点上,所述测试器对所述电路板500进行测试。 The circuit board 500 is fixed to the rotating platform 110 of the copper pillar 120, and then adjust the rotating platform 110 and connecting rod 200, the test probe 310 prevent the barrier components of the circuit board 500, the test probe 310 to a corresponding interface pad adjustment, locking the locking screw 300 is fixed to the telescopic rod 330, the air pump drive, the telescopic rod 300 to the test probes 310 to a corresponding interface pad, the said tester to test the circuit board 500.

[0026] 以上所述仅为本发明的较佳实施例,并不用以限制本发明,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。 [0026] The foregoing is only preferred embodiments of the present invention, not intended to limit the present invention within the spirit and principle of the present invention, any modification, equivalent replacement, or improvement, it should be included in the present within the scope of the invention.

Claims (6)

  1. 1.一种探针式测试治具,包括测试台(100)和测试器,其特征在于:所述测试台(100)上设置有固定电路板(500)的铜柱(120),所述测试台(100)上方设置有与其平行的滑杆(600),所述滑杆(600)两端通过连杆(200)固定在所述测试台(100)上,所述滑杆(600)上套接有至少ニ根套环(320 ),所述套环(320 )能在所述滑杆(600 )上滑动,所述套环(320 )上设置有锁定螺杆(330),所述套环(320)上固定一垂直于所述滑杆(600)的伸缩杆(300),所述伸缩杆(300)的另一端设置有测试探针(310),所述测试探针(310)与所述测试器电气连接。 1. A probe-type test fixture, including a test station (100) and a tester, comprising: a circuit board provided with a fixed copper pillar (500) (120) (100) of the test bench, the test station (100) is arranged above the slide bar (600) parallel thereto, said slide bar (600) fixed at both ends on the test stand (100), said slider (600) via the link (200) Ni on at least the root sleeved collar (320), said collar (320) slidable in said slide bar (600), the collar is provided with a locking screw (330) on the (320), the the other end of the collar (320) fixed to a perpendicular to the slide bar (600) of the telescopic rod (300), said telescopic rod (300) is provided with a test probe (310), said test probe (310 ) electrically connected to the tester.
  2. 2.根据权利要求1所述的探针式测试治具,其特征在于:所述伸缩杆(300)为气动伸縮杆且分别通过一通气管(410)与同一气泵连通。 The probe type test fixture according to claim 1, characterized in that: said telescopic rod (300) is a pneumatic telescopic rods and respectively communicated with the same air pump through a vent tube (410).
  3. 3.根据权利要求I或权利要求2所述的探针式测试治具,其特征在于:所述测试器和所述气泵集成在同一壳体(400)中,所述测试器与测试探针(310)之间的导线分别设置在对应的通气管(410)内。 According to claim I or claim probe type test fixture of claim 2, wherein: said test and said pump integrated in the same housing (400), the test probe and the test between conductors (310) are disposed within the corresponding vent pipe (410).
  4. 4.根据权利要求I所述的探针式测试治具,其特征在于:所述测试台(100)上设置有旋转平台(110 ),所述铜柱(120 )设置在所述旋转平台(110 )上。 Probe according to claim of formula I according to the test fixture, comprising: a rotating platform is provided (110) (100) of the test station, the copper pillar (120) disposed on said rotating platform ( 110).
  5. 5.根据权利要求I所述的探针式测试治具,其特征在于:所述连杆(200)为含有锁定环(210)的伸缩柱。 The probe as claimed in claim 5 of formula I according to the test fixture, wherein: the link (200) containing a locking ring (210) of the telescopic column.
  6. 6.根据权利要求I所述的探针式测试治具,其特征在于:所述测试探针(310)的顶部为导电胶或者导电硅胶。 The probe test fixture of formula I according to claim, wherein: the top of the test probe (310) is a conductive paste or a conductive silicone.
CN 201210292962 2012-08-17 2012-08-17 Probe-type test fixture CN102854453B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106154138A (en) * 2016-06-20 2016-11-23 东莞市联洲知识产权运营管理有限公司 Positioning connecting device applied to integrated-circuit detection
CN106291326A (en) * 2016-08-23 2017-01-04 王文庆 Fixed point detection mechanism for integrated circuit

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05251145A (en) * 1992-03-06 1993-09-28 Nec Corp Soj type ic socket
US5263775A (en) * 1991-02-01 1993-11-23 Aetrium, Inc. Apparatus for handling devices under varying temperatures
CN2804873Y (en) * 2005-05-20 2006-08-09 郭红建 Simple measuring means
CN101078737A (en) * 2006-05-24 2007-11-28 捷智科技股份有限公司 Testing fixture and machine station combination device
CN101975908A (en) * 2010-10-21 2011-02-16 昆山德力康电子科技有限公司 Connector electric property test jig

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5263775A (en) * 1991-02-01 1993-11-23 Aetrium, Inc. Apparatus for handling devices under varying temperatures
JPH05251145A (en) * 1992-03-06 1993-09-28 Nec Corp Soj type ic socket
CN2804873Y (en) * 2005-05-20 2006-08-09 郭红建 Simple measuring means
CN101078737A (en) * 2006-05-24 2007-11-28 捷智科技股份有限公司 Testing fixture and machine station combination device
CN101975908A (en) * 2010-10-21 2011-02-16 昆山德力康电子科技有限公司 Connector electric property test jig

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106154138A (en) * 2016-06-20 2016-11-23 东莞市联洲知识产权运营管理有限公司 Positioning connecting device applied to integrated-circuit detection
CN106154138B (en) * 2016-06-20 2018-08-17 东莞市联洲知识产权运营管理有限公司 Positioning an integrated circuit applied to seed connection detecting means
CN106291326A (en) * 2016-08-23 2017-01-04 王文庆 Fixed point detection mechanism for integrated circuit
CN106291326B (en) * 2016-08-23 2018-10-12 台州贝蕾丝电子商务有限公司 One kind of point detection mechanism for an integrated circuit

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Free format text: CORRECT: INVENTOR; FROM: JIN HUBIN TO: LIN MINGCHUAN

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