CN102788912A - Capacitor electric test mechanism - Google Patents

Capacitor electric test mechanism Download PDF

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Publication number
CN102788912A
CN102788912A CN2011101251323A CN201110125132A CN102788912A CN 102788912 A CN102788912 A CN 102788912A CN 2011101251323 A CN2011101251323 A CN 2011101251323A CN 201110125132 A CN201110125132 A CN 201110125132A CN 102788912 A CN102788912 A CN 102788912A
Authority
CN
China
Prior art keywords
capacitor
probe
fixation
basin
probes
Prior art date
Application number
CN2011101251323A
Other languages
Chinese (zh)
Inventor
费金华
Original Assignee
吴江华诚复合材料科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 吴江华诚复合材料科技有限公司 filed Critical 吴江华诚复合材料科技有限公司
Priority to CN2011101251323A priority Critical patent/CN102788912A/en
Publication of CN102788912A publication Critical patent/CN102788912A/en

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Abstract

The invention provides a capacitor electric test mechanism, mainly formed by horizontally assembling a rotating basin component and a probe driving component on a side of a power driving machine body. The rotating basin component is provided with a lateral erectly rotating basin structure, and outer edges of the basin's two sides uses a structural design of two groups of probes which are correspondingly involutive, and the two groups of probes cooperate with the basin so that a capacitor can be loaded in plural groups of caulking grooves which are disposed at an equal angle interval on an outer periphery. Thus, end faces of two conductors of the capacitor are respectively exposed out of two sides of the basin so that two groups of laterally corresponding probes combine and contact with each other to perform electric testing operation, thereby forming the capacitor electric test mechanism with erect rotating guide and lateral detection. The capacitor electric test mechanism can be applied in electric tests of various specification high-voltage capacitors, and an electric test work problem of spark-over generated by the probes is settled. The amount of tests, test efficiency, and production efficiency are greatly increased.

Description

A kind of capacitor electrode property testing mechanism

Technical field

The present invention relates to a kind of testing electrical property mechanism, especially a kind of capacitor electrode property testing mechanism.

Background technology

The present invention provides a kind of capacitor electrode property testing mechanism; Mainly be to constitute in a upright rotating support disc assembly of a power drive body one side transverse set and a probe actuation assembly; This rotating support disc assembly is provided with the tray structure of horizontal setting rotation; And in the tray both sides outer rim is adopted with the laterally corresponding involutory structural design of two groups of probes; And cooperate tray can carry in the fixation capacitor caulking groove that plural groups equi-angularly space row are put on outer peripheral edges, and naked respectively to make capacitor two conductor end faces from outside the tray two sides, supply laterally two groups of involutory contacts of probe of correspondence to carry out the testing electrical property operation; Erect the laterally capacitor electrode property testing mechanism of detection of turn delivery to constitute; And then the high voltage capacitor that can be applicable to various different sizes makes testing electrical property, and can get rid of the probe spark-over testing electrical property work problem of deriving, and significantly promotes test dose rate and prouctiveness person.

Summary of the invention

To the problems referred to above, the present invention provides a kind of surperficial structure dress type ceramic capacitor structure of tool high withstand voltage ability.

The present invention provides a kind of capacitor electrode property testing mechanism; Mainly be to constitute in a upright rotating support disc assembly of a power drive body one side transverse set and a probe actuation assembly; This rotating support disc assembly is provided with the tray structure of horizontal setting rotation; And in the tray both sides outer rim is adopted with the laterally corresponding involutory structural design of two groups of probes; And cooperate tray can carry in the fixation capacitor caulking groove that plural groups equi-angularly space row are put on outer peripheral edges, and naked respectively to make capacitor two conductor end faces from outside the tray two sides, supply laterally two groups of involutory contacts of probe of correspondence to carry out the testing electrical property operation; Erect the laterally capacitor electrode property testing mechanism of detection of turn delivery to constitute; And then the high voltage capacitor that can be applicable to various different sizes makes testing electrical property, and can get rid of the probe spark-over testing electrical property work problem of deriving, and significantly promotes test dose rate and prouctiveness person.

Embodiment

The present invention provides a kind of capacitor electrode property testing mechanism; Mainly be to constitute in a upright rotating support disc assembly of a power drive body one side transverse set and a probe actuation assembly; This rotating support disc assembly is provided with the tray structure of horizontal setting rotation; And in the tray both sides outer rim is adopted with the laterally corresponding involutory structural design of two groups of probes; And cooperate tray can carry in the fixation capacitor caulking groove that plural groups equi-angularly space row are put on outer peripheral edges, and naked respectively to make capacitor two conductor end faces from outside the tray two sides, supply laterally two groups of involutory contacts of probe of correspondence to carry out the testing electrical property operation; Erect the laterally capacitor electrode property testing mechanism of detection of turn delivery to constitute; And then the high voltage capacitor that can be applicable to various different sizes makes testing electrical property, and can get rid of the probe spark-over testing electrical property work problem of deriving, and significantly promotes test dose rate and prouctiveness person.

A kind of capacitor electrode property testing mechanism, it includes: a power drive body is to have protruded out rotating shaft in a side, and at least one group of above probe of fixation that stretch through on the carrier ring body periphery of rotating shaft front end sleeve pivot; One rotating support disc assembly is that transverse set is stood on power drive body one side, its by one be assembled in above-mentioned rotating shaft tray; Be nested with a retaining edge ring in outer peripheral edges; Coil the structure that bezel ring, is organized that locks on the lateral surface and form, this tray is provided with the caulking groove that plural groups is put with the equi-angularly space row in outer peripheral edges, is provided with capacitor and imports wherein carrying conveying; And it is spacing to make its nested lateral surface kept off within the edge ring ring block resistance, and two conductor end faces are naked respectively from outside the tray two sides; One probe actuation assembly; Be that transverse set is stood on power drive body one side; It is made structure that transversal displacement is organized by a displacement drive element front group frame one bolster and forms, and at least one group of above probe of fixation that stretch through on this bolster supplies to do corresponding at interval with the probe of above-mentioned carrier ring fixation that body stretches through; By this; Carry delivery and stagnate in this two probe corresponding at interval the time in two conductor end faces of capacitor; Must make the probe of carrier ring fixation that body stretches through fix with the conductor end face of capacitor side contacts; And the horizontal drive displacement of fixation probe on bolster that stretches through contacts with the conductor end face of another side of capacitor, to carry out the capacitor electrode property testing operator of the horizontal involutory contact of two probes.

Claims (1)

1. capacitor electrode property testing mechanism, it includes: a power drive body, lie in a side and protruded out rotating shaft, and at least one group of above probe of fixation that stretch through on the carrier ring body periphery of rotating shaft front end sleeve pivot; One rotating support disc assembly is that transverse set is stood on power drive body one side, its by one be assembled in above-mentioned rotating shaft tray; Be nested with a retaining edge ring in outer peripheral edges; Coil the structure that bezel ring, is organized that locks on the lateral surface and form, this tray is provided with the caulking groove that plural groups is put with the equi-angularly space row in outer peripheral edges, is provided with capacitor and imports wherein carrying conveying; And it is spacing to make its nested lateral surface kept off within the edge ring ring block resistance, and two conductor end faces are naked respectively from outside the tray two sides; One probe actuation assembly; Be that transverse set is stood on power drive body one side; It is made structure that transversal displacement is organized by a displacement drive element front group frame one bolster and forms, and at least one group of above probe of fixation that stretch through on this bolster supplies to do corresponding at interval with the probe of above-mentioned carrier ring fixation that body stretches through; By this; Carry delivery and stagnate in this two probe corresponding at interval the time in two conductor end faces of capacitor; Must make the probe of carrier ring fixation that body stretches through fix with the conductor end face of capacitor side contacts; And the horizontal drive displacement of fixation probe on bolster that stretches through contacts with the conductor end face of another side of capacitor, to carry out the capacitor electrode property testing operator of the horizontal involutory contact of two probes.
CN2011101251323A 2011-05-16 2011-05-16 Capacitor electric test mechanism CN102788912A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011101251323A CN102788912A (en) 2011-05-16 2011-05-16 Capacitor electric test mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011101251323A CN102788912A (en) 2011-05-16 2011-05-16 Capacitor electric test mechanism

Publications (1)

Publication Number Publication Date
CN102788912A true CN102788912A (en) 2012-11-21

Family

ID=47154368

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011101251323A CN102788912A (en) 2011-05-16 2011-05-16 Capacitor electric test mechanism

Country Status (1)

Country Link
CN (1) CN102788912A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2603401Y (en) * 2003-01-29 2004-02-11 纬典股份有限公司 Automatic electronic component detection equipment
CN1527062A (en) * 2003-03-04 2004-09-08 友达光电股份有限公司 Test device
CN1591032A (en) * 2003-09-04 2005-03-09 系新科技股份有限公司 Method and apparatus for testing capacitor of printed circuitboard
CN2729716Y (en) * 2004-04-15 2005-09-28 万兆麟 Probe structure for investigating performance of electronic part
CN101943708A (en) * 2010-09-01 2011-01-12 王少波 Automatic tester

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2603401Y (en) * 2003-01-29 2004-02-11 纬典股份有限公司 Automatic electronic component detection equipment
CN1527062A (en) * 2003-03-04 2004-09-08 友达光电股份有限公司 Test device
CN1591032A (en) * 2003-09-04 2005-03-09 系新科技股份有限公司 Method and apparatus for testing capacitor of printed circuitboard
CN2729716Y (en) * 2004-04-15 2005-09-28 万兆麟 Probe structure for investigating performance of electronic part
CN101943708A (en) * 2010-09-01 2011-01-12 王少波 Automatic tester

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WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20121121