CN102761816A - Testing circuit, testing device and testing method of Bluetooth earphone Don and Doff function - Google Patents

Testing circuit, testing device and testing method of Bluetooth earphone Don and Doff function Download PDF

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CN102761816A
CN102761816A CN2012102130617A CN201210213061A CN102761816A CN 102761816 A CN102761816 A CN 102761816A CN 2012102130617 A CN2012102130617 A CN 2012102130617A CN 201210213061 A CN201210213061 A CN 201210213061A CN 102761816 A CN102761816 A CN 102761816A
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test
bluetooth headset
doff
don
testing
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CN2012102130617A
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CN102761816B (en
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石灵吉
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歌尔声学股份有限公司
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Abstract

The invention provides a testing circuit, a testing device and a testing method of a Bluetooth earphone Don and Doff function. The testing circuit comprises at least one testing electrode and a same-direction voltage following circuit which is connected with the testing electrode; the same-direction voltage following circuit comprises a variable capacitance diode and an excitation signal generator; and one of the variable capacitance diode is connected with the testing electrode, and the other end of the variable capacitance diode is connected with the excitation signal generator. According to the testing circuit of the Bluetooth earphone Don and Doff function, provided by the invention, an inductive curve of each earphone can be determined by matching corresponding testing software, sample curves and limit can be formulated according to batch testing data, a volume production earphone curve is set between limit curves, and thus the consistency requirements are considered to be met, and the testing method is direct and simple and is convenient to implement.

Description

蓝牙耳机Don&Doff功能测试电路、测试装置及其测试方法 Don & Doff functional Bluetooth headset test circuit, the test device and test method

技术领域 FIELD

[0001] 本发明涉及蓝牙耳机技术领域,更为具体地,涉及一种蓝牙耳机Don&Doff功能测试电路及测试装置及其测试方法。 [0001] The present invention relates to a Bluetooth headset technologies, and more particularly, to a Bluetooth headset Don & Doff functional test circuit and test equipment and test methods.

背景技术 Background technique

[0002] 蓝牙是一种低成本低功耗的短距离无线通信技术。 [0002] Bluetooth is a low-cost low-power, short-range wireless communication technology. 近年来随着蓝牙产品和无线技术应用的普及,蓝牙耳机的成为目前在日常生活中应用最广的蓝牙技术,通过蓝牙耳机,手机用户可以实现无线免提功能,而不必像现在这样从头部垂下一根线到手机上。 In recent years with the popularity of Bluetooth wireless technology products and applications, Bluetooth headset in daily life become the most widely used Bluetooth technology, the Bluetooth headset, hands-free mobile phone users can achieve wireless functionality, without having to head like this from now dropped a line to your phone.

[0003] 目前蓝牙耳机Don/Doff功能(即耳机自动检测是否戴在耳朵上,戴上时进入待机状态,摘下后进入低功耗状态)越来越普遍,可以延长耳机工作时间,简化接听等功能。 [0003] Currently Bluetooth headset Don / Doff function (ie, the headset automatically detects whether worn on the ear, when put into standby mode after off into a low power state) more and more common, the headset can be extended working hours, to simplify the answer and other functions.

[0004] Don/Doff新功能的引入,使得蓝牙耳机在出厂前需要增加对此功能的测试,但是现有测试方法采用金属工装等方法,将耳机靠近工装时判断耳机是否有反应来确认Don/Doff功能是否可用,但对于此功能的灵敏度、一致性等问题却无法衡量。 [0004] Don introduction / Doff new features, such before delivery Bluetooth headset needs to be increased to test this feature, the conventional testing method using a metal tooling or the like, there will judge whether the reaction was confirmed Don the headset when the headset is close tooling / Doff feature is available, but the sensitivity of this feature, consistency and other issues can not be measured. 这种只能简单测试Don/Doff功能的有无、无法保证此功能的一致性的测试方法远远不能满足生产厂商对蓝牙耳机Don/Doff功能测试的需求。 This simple test can only Don / Doff function of the presence or absence of this feature can not guarantee the consistency of test methods can not meet the needs of manufacturers of Bluetooth headsets Don / Doff functional testing.

发明内容 SUMMARY

[0005] 鉴于上述问题,本发明的目的是提供一种蓝牙耳机Don&Doff功能测试电路、测试装置及其测试方法,通过特殊设计的电极,模拟蓝牙耳机戴在耳朵上时人耳及脸部皮肤对蓝牙耳机的影响,从而确定测试limit来确保Don&Doff功能的出货一致性。 [0005] In view of the above problems, an object of the present invention is to provide a functional Bluetooth headset Don & Doff test circuit testing apparatus and testing method, by a special electrode design, simulation Bluetooth headset when worn on the ear, and the ear skin of the face affect Bluetooth headset to determine the test limit shipments to ensure consistency Don & Doff function.

[0006] 为了实现上述目的,本发明提供的蓝牙耳机Don&Doff功能测试电路包括至少一个测试电极和与所述测试电极相连接的同向电压跟随电路;所述同向电压跟随电路包括变容二极管和激励信号发生器;所述变容二极管的一端与所述测试电极相连,另一端与激励信号发生器相连。 [0006] To achieve the above object, the Bluetooth headset Don & Doff functional test circuitry of the present invention comprises at least one test electrode and with the test electrode is connected to a voltage follower circuit; the same comprises a varactor diode and the voltage follower circuit excitation signal generator; connected to one end of the varactor and the test electrode, and the other end is connected to the excitation signal generator.

[0007] 此外,优选的结构是,所述测试电极与所述蓝牙耳机的电容传感器相配合使用,当所述蓝牙耳机为双电容传感器的Don/Doff蓝牙耳机时,所述测试电极为两个,包括一个“U”字形电极和一个“8”字形电极,所述同向电压跟随电路为两路;当所述蓝牙耳机为单电容传感器蓝牙耳机时,所述测试电极为一个,所述同向电压跟随电路为一路。 [0007] Additionally, preferred structures are, the test electrode and the Bluetooth headset using capacitive sensors cooperating, when the Bluetooth headset is a double capacitive sensor Don / Doff Bluetooth headset, the two test electrodes , including a "U" shaped electrodes and a figure "8" electrode, to the voltage follower circuit with two; Bluetooth headset when the Bluetooth headset is a single capacitive sensor, the test electrode is a, the same all the way to the voltage follower circuit.

[0008] 此外,优选的结构是,所述测试电极由PCB铜皮来实现,其中的“8”字形电极用来模拟人脸部皮肤,“U”字形电极用来模拟人耳。 [0008] Additionally, preferred structures are, the test electrode is implemented by a PCB copper, where "8" shaped electrodes to simulate human facial skin, "U" shaped electrodes to simulate the human ear.

[0009] 另一方面,本发明还提供一种包括测试工装和前述蓝牙耳机Don&Doff功能测试电路的蓝牙耳机Don&Doff功能测试装置,其中,所述测试工装用于固定待测试蓝牙耳机,所述蓝牙耳机功能测试电路的测试电极放置在通过所述测试工装上靠近所述蓝牙耳机的电容传感器的位置。 [0009] In another aspect, the present invention also provides a Bluetooth headset Don & Doff function testing apparatus, wherein the test tooling comprising a test fixture and the Bluetooth headset Don & Doff functional test for the circuit to be tested is fixed Bluetooth headset, the Bluetooth headset functional test circuit test electrode is placed on the test fixture position by the close of the Bluetooth headset capacitive sensor.

[0010] 再一方面,本发明还提供一种蓝牙耳机Don&Doff功能测试方法,包括: [0010] In another aspect, the present invention also provides a functional Bluetooth headset Don & Doff testing method, comprising:

[0011] 将所述蓝牙耳机的电容传感器贴近蓝牙耳机Don&Doff功能测试电路的测试电极,其中,所述测试电路还包括与所述测试电极相连接的同向电压跟随电路,所述同向电压跟随电路包括变容二极管和激励信号发生器,所述变容二极管的一端与所述测试电极相连,另一端与激励信号发生器相连; [0011] The capacitive sensor proximate Bluetooth headset Bluetooth headset Don & Doff functional test electrodes of a test circuit, wherein the circuit further comprises a test with the test electrode is connected to the voltage follower circuit, the voltage follower to the same circuit includes a varactor diode and an excitation signal generator, said varactor diode and one end is connected to the test electrode, and the other end connected to the excitation signal generator;

[0012] 通过所述激励信号发生器对所述变容二极管的同向端施加锯齿激励信号; [0012] The excitation signal is applied to the sawtooth signal generator for the excitation varactor to the same end;

[0013] 记录所述蓝牙耳机的电容传感器的测试曲线; [0013] The capacitive sensor of the recording test curve of the Bluetooth headset;

[0014] 通过比对所述测试曲线和标样曲线获得所述蓝牙耳机的Don&Doff功能测试结 [0014] The Bluetooth headset is obtained by comparing the standard curve and test curve Don & Doff functional test results

果O If O

[0015] 其中,优选的方案是,在通过所述激励信号发生器对所述变容二极管的同向端施加锯齿激励信号后, [0015] Among them, preferred embodiment, the excitation signal after the sawtooth generator by applying the excitation signal to the varactor to the same end,

[0016] 所述变容二极管两端电压跟随激励信号的变化而变化,使得与所述变容二极管一端相连的测试电极上的电荷发生变化,当蓝牙耳机电容传感器贴近电极时,蓝牙耳机电容传感器的感应曲线发生变化。 [0016] The voltage across the varactor diode changes following the excitation signal changes, so that the charge on the varactor diode is connected to one end of the test electrode is changed, when the Bluetooth headset close capacitive sensor electrode, a capacitive sensor Bluetooth headset sensing a change in the curve.

[0017] 采用本发明提供的蓝牙耳机Don&Doff功能测试电路及测试装置后,配合相应测试软件,即可确定每只耳机感应曲线,根据批量测试数据制定标样曲线及limit,量产耳机测试曲线介于limit曲线之间,即认为满足一致性要求。 [0017] After the Bluetooth headset Don & Doff functional test circuit and a testing device provided by the invention, with the corresponding test software to determine each headset induction curve to develop standard curves and limit according to the batch test data, production headset test curve mediated in between the limit curves, i.e. that satisfy the consistency requirement. 测试方法直观简便,便于实施。 Test Method easy and intuitive, easy to implement.

附图说明 BRIEF DESCRIPTION

[0018] 通过参考以下结合附图的说明及权利要求书的内容,并且随着对本发明的更全面理解,本发明的其它目的及结果将更加明白及易于理解。 [0018] The contents of the book claims by reference to the following description and the appended drawings in conjunction with the present invention and as more fully understood, other objects and results of the present invention will become more apparent and easy to understand. 在附图中: In the drawings:

[0019] 图I为根据本发明实施例的测试电路示意图; [0019] Figure I is a test circuit in accordance with an embodiment of the present invention, a schematic view;

[0020] 图2为根据本发明实施例的“U”字形电极示意图; [0020] FIG. 2 is a schematic shaped "U" electrodes according to embodiments of the present invention;

[0021] 图3为根据本发明实施例的“8”字形电极示意图; [0021] FIG. 3 is a figure "8" is a schematic diagram of the embodiment of the electrode according to the present invention;

[0022] 图4为根据本发明提供的测试电路进行蓝牙耳机Don&Doff功能测试的方法流程示意图。 [0022] FIG. 4 is a functional test performed Don & Doff schematic flow diagram of a method according to the Bluetooth headset of the present invention provides a test circuit.

[0023] 在所有附图中相同的标号指示相似或相应的特征或功能。 [0023] Similar or corresponding features or functions throughout the drawings the same reference numerals.

具体实施方式 Detailed ways

[0024] 以下将结合附图对本发明的具体实施例进行详细描述。 [0024] The following specific embodiments in conjunction with the accompanying drawings of embodiments of the present invention will be described in detail.

[0025] 本发明采用的技术方案是,通过特殊设计的电极并配合变容二极管模拟人耳及脸部皮肤,通过测试电路对电极进行循环充放电来模拟耳机戴上与摘下的状态。 [0025] aspect of the present invention is employed, and by an electrode with a specially designed analog varactor facial skin and the human ear, a pair of electrodes to charge and discharge cycles of simulated wear headphones and off state by the test circuit. 本发明提供的测试电路包括至少一个测试电极和与测试电极相连接的同向电压跟随电路,同向电压跟随电路主要包括变容二极管和激励信号发生器,其中,变容二极管的一端与所述测试电极相连,另一端与激励信号发生器相连。 The test circuit according to the present invention comprises at least one test electrode and the test electrode is connected with the voltage follower circuit, with the voltage follower circuit includes a varactor diode and an excitation signal generator, wherein one end of the varactor diode and the test electrodes are connected, is connected to the other end of the excitation signal generator.

[0026] 图I为根据本发明实施例的测试电路示意图。 [0026] Figure I is a schematic diagram of a test circuit according to the present invention. 图I所示的测试电路为针对双电容传感器蓝牙耳机设计的具有两个测试电极和两路同向电压跟随电路的测试电路,以测试双电容传感器蓝牙耳机中的两个电容传感器的感应曲线。 Figure I is a test circuit for a capacitive sensor bis Bluetooth headset designed to test the test circuit having two electrodes and two with the voltage follower circuit, to test the induction curve of two dual capacitive sensor capacitive sensor Bluetooth headset.

[0027] 其中,在本发明的一个具体实施方式中,两个测试电极为如图2和图3所示的具有特殊形状设计的测试电极。 [0027] wherein in one embodiment of the present invention, two test electrodes to test electrodes having a particular shape of the design shown in FIG. 2 and FIG.

[0028] 利用图I所示的测试电路,将双电容传感器蓝牙耳机的两个电容传感器分别靠近两个测试电极,两个测试电极分别与两路同向电压跟随电路的变容二极管相连。 I test circuit shown in [0028] FIG using the Bluetooth headset bis capacitive sensor capacitive sensor two electrodes are close to the two tests, two test electrodes respectively two varactor follower circuit are connected to the same voltage. 通过激励信号发生器对变容二极管的同向端施加锯齿激励信号,变容二极管两端电压跟随激励信号变化,使得二极管体电容相应变化,由于特殊设计的电极与变容二极管的一端直接相连,因此电极上的电荷也跟随二极管的容值发生变化。 Excited by excitation signal generator is applied to the end of a sawtooth signal having the same varactor diode, the voltage across the varactor diode changes following the excitation signal, so that a corresponding change in the capacitance diode body, since the end of the electrode of the varactor is connected directly to a specially designed, Thus charges on the electrodes also follow changes in capacitance of the diode occurs. 当蓝牙耳机电容传感器贴近电极时,电容传感器的感应曲线发生变化,从而获得蓝牙耳机的感应曲线。 When the Bluetooth headset close capacitive sensor electrode, the capacitive sensor sensing a change in the curve, so as to obtain induction Bluetooth headset profile.

[0029] 上述测试电路的核心在于变容二极管的使用及其与电极的配合,本领域技术人员应当知晓,其它形式的运算电路在配合变容二极管与合适的电极后也可实现此功能。 Core [0029] in that the test circuit and the varactor diode with the electrode, those skilled in the art should be aware that other forms of the arithmetic circuit in the diode with a suitable electrode can be achieved with the varactor this feature.

[0030] 图2和图3分别为根据本发明实施例的“U”字形和“8”字形电极示意图。 [0030] FIGS. 2 and 3 are a "U" shape and "8" shaped electrodes schematic of an embodiment of the present invention.

[0031] 如图2和图3所示,“U”字形和“8”字形电极由PCB铜皮来实现。 [0031] As shown in FIG. 2 and FIG. 3, "U" shaped and "8" shape is achieved by the PCB copper electrode. 对于双电容传感器的Don/Doff蓝牙耳机而言,往往一个传感器放置于MIC端,贴近人脸部皮肤,另一个传感器置于人耳处,因此,在测试电路中,对应的“8”字形电极用来模拟人脸部皮肤,“U”字形电极用来模拟人耳。 For Don / Doff Bluetooth headset bis capacitance sensor, the sensor is placed in the MIC is often a side, close to the human facial skin, the other sensor is placed at the ear, and therefore, in the test circuit, the corresponding figure "8" electrode to simulate the human facial skin, "U" shaped electrodes to simulate the human ear.

[0032] 双电容传感器的蓝牙耳机可有效避免Don/Doff功能误操作,为目前常用的蓝牙耳机。 [0032] bis capacitance sensor Bluetooth headset can effectively avoid Don / Doff erroneous function, Bluetooth headset is currently used. 对于单电容传感器或多电容传感器蓝牙耳机而言,其Don/Doff功能测试电路也类似,只需要采用图I中一路或多路电压跟随电路即可,PCB铜皮测试电极也可以根据耳机传感器位置选用图I中的某个测试电极,单电容传感器耳机可在保留Don/Doff功能的基础上降低成本,多电容传感器可最小化误操作概率。 For a single capacitive sensor or a capacitive sensor Bluetooth headset, its Don / Doff test circuit function is similar, only the use of one or more channels to the voltage follower circuit in FIG. I, PCB copper test electrode may also be a position sensor in accordance with the earphone a test electrode to reduce the cost basis of FIG. I is selected, a single capacitive sensor headset retaining Don / Doff functions on the multi-capacitance sensor may minimize the probability of erroneous operation.

[0033] 对应地,利用上述测试电路进行蓝牙耳机Don&Doff功能测试的方法流程如图4所示,包括如下步骤: [0033] Correspondingly, by using the test circuit Bluetooth headset Don & Doff functional test flow of the method shown in Figure 4, comprising the steps of:

[0034] S410 :将待测试蓝牙耳机的电容传感器贴近测试电路的测试电极; [0034] S410: Bluetooth headset to be tested test electrode capacitive sensor close a test circuit;

[0035] S420 :通过激励信号发生器对变容二极管的同向端施加锯齿激励信号; [0035] S420: applying a sawtooth signal generator excitation by the excitation signal to the varactor diode to the same end;

[0036] S430 :记录待测试蓝牙耳机的电容传感器的测试曲线; [0036] S430: recording test curve capacitive sensor Bluetooth headset to be tested;

[0037] S440 :通过比对测试曲线和标样曲线获得待测试蓝牙耳机的Don&Doff功能测试结果。 [0037] S440: Bluetooth headset to be tested is obtained by comparing the standard curve and test curve Don & Doff function test results.

[0038] 其中,在通过述激励信号发生器对变容二极管的同向端施加锯齿激励信号后,变容二极管两端电压跟随激励信号的变化而变化,使得与变容二极管一端相连的测试电极上的电荷发生变化,当蓝牙耳机电容传感器贴近电极时,蓝牙耳机电容传感器的感应曲线发生变化。 After [0038] wherein, by said excitation signal generator excitation signal is applied to the sawtooth end of the same varactor diode, the voltage across the varactor diode is changed to follow the change of the excitation signal, so that the test electrode is connected to one end of the varactor the charge on the change, the Bluetooth headset when the close capacitive sensor electrode, the capacitive sensor sensing the Bluetooth headset profile changes.

[0039] 另外,为了测试的方便,最好在蓝牙耳机测试前制作与待测试蓝牙耳机形状吻合的简易工装来固定耳机,工装相当于耳机支架,预留两个靠近耳机传感器的位置来放置PCB电极(单传感器或多传感器蓝牙耳机工装只需预留相应数量电极位置),使得在耳机放在工装上后,MIC处传感器靠近“8”字形电极,SPK处传感器靠近“U”字形电极。 [0039] Further, in order to facilitate testing, a Bluetooth headset is preferably made before testing the test simple tooling to be consistent with the shape of the Bluetooth headset to secure a headset, headphones equivalent tooling holder, reserving two positions to place the sensor near the headset PCB an electrode (single-sensor or multiple sensors tooling Bluetooth headset only reserve the appropriate number of electrode position), so that after the headset on the tooling, the MIC of the sensor close to "8" shaped electrodes, the sensor SPK near "U" shaped electrodes.

[0040] 相应的,本发明还提供一种包括上述测试工装和前述蓝牙耳机Don&Doff功能测试电路的蓝牙耳机Don&Doff功能测试装置,其中,所测试工装用于固定待测试蓝牙耳机,蓝牙耳机功能测试电路的测试电极放置在通过所述测试工装上靠近蓝牙耳机的电容传感器的位置。 [0040] Accordingly, the present invention also provides a said test fixture and the Bluetooth headset Don & Doff functional test circuit Bluetooth headset Don & Doff function testing apparatus, wherein the test fixture for fixing to be tested Bluetooth headset, Bluetooth headset functional test circuit the test electrode is placed at a position close to the capacitive sensor of the Bluetooth headset through the test fixture.

[0041] 在将待测试蓝牙耳机放置到测试工装对应的位置后,就可以通过激励信号发生器对测试电路施加激励信号,测试软件读取蓝牙耳机的电容传感器的感应曲线,即可获得耳机Don/Doff功能曲线,对照标样耳机Don/Doff功能曲线确定的limit,从而判定此Don/Doff功能的一致性。 [0041] After the Bluetooth headset to be tested is placed in a position corresponding to the test fixture, can be applied to the excitation signal, the test software reads the Bluetooth headset profile inductive capacitive sensor by the test excitation signal generator circuit, the headset can be obtained Don / Doff function curves, control standard headphone Don / Doff function curve determined limit, thereby determining the consistency of this Don / Doff function.

[0042] 如上参照附图以示例的方式描述根据本发明的Don&Doff功能测试电路、测试装置及其测试方法。 [0042] As described with reference by way of example with reference to the present invention according to Don & Doff functional test circuit, the test device and a test method. 但是,本领域技术人员应当理解,对于上述本发明所提出的Don&Doff功能测试电路、测试装置及其测试方法,还可以在不脱离本发明内容的基础上做出各种改进。 However, one skilled in the art will appreciate, Don proposed for the present invention & Doff functional test circuit testing apparatus and testing method, various modifications may be made without departing from the present invention. 因此,本发明的保护范围应当由所附的权利要求书的内容确定。 Thus, the contents of the book scope of the invention should be determined by the appended claims.

Claims (6)

1. 一种蓝牙耳机Don&Doff功能测试电路,其中, 所述测试电路包括至少一个测试电极和与所述测试电极相连接的同向电压跟随电路; 所述同向电压跟随电路包括变容二极管和激励信号发生器; 所述变容二极管的一端与所述测试电极相连,另一端与激励信号发生器相连。 A Bluetooth headset Don & Doff functional test circuitry, wherein said test circuit comprises at least one test to the test electrode and with electrodes connected to a voltage follower circuit; the same to the voltage follower circuit comprises a varactor diode and incentives a signal generator; of the varactor is connected to one end of the test electrode, and the other end is connected to the excitation signal generator.
2.如权利要求I所述的蓝牙耳机Don&Doff功能测试装置,其中, 所述测试电极与所述蓝牙耳机的电容传感器相配合使用,当所述蓝牙耳机为双电容传感器的Don/Doff蓝牙耳机时,所述测试电极为两个,包括一个“U”字形电极和一个“8”字形电极,所述同向电压跟随电路为两路;当所述蓝牙耳机为单电容传感器蓝牙耳机时,所述测试电极为一个,所述同向电压跟随电路为一路。 2. I claim the Bluetooth headset Don & Doff function testing apparatus, wherein the test electrode and the Bluetooth headset using capacitive sensors cooperating, when the Bluetooth headset is a double capacitive sensor Don / Doff Bluetooth headset when the two electrodes are tested, including a "U" shaped electrodes and a figure "8" electrode, to the voltage follower circuit with two; Bluetooth headset when the Bluetooth headset is a single capacitive sensor, the a test electrode, to the voltage follower circuit is the same way.
3.如权利要求2所述的蓝牙耳机Don&Doff功能测试装置,其中, 所述测试电极由PCB铜皮来实现,其中的“8”字形电极用来模拟人脸部皮肤,“U”字形电极用来模拟人耳。 Don & Doff Bluetooth headset function testing apparatus, wherein the test electrode as claimed in claim 2 implemented by PCB copper, where "8" shaped electrodes to simulate human facial skin, "U" shaped electrodes to simulate the human ear.
4. 一种蓝牙耳机Don&Doff功能测试装置,包括测试工装和如权利要求I〜3中任一项所述的蓝牙耳机Don&Doff功能测试电路,其中, 所述测试工装用于固定待测试蓝牙耳机,所述蓝牙耳机功能测试电路的测试电极放置在通过所述测试工装上靠近所述蓝牙耳机的电容传感器的位置。 A Bluetooth headset Don & Doff function testing apparatus comprising a test fixture and I~3 as claimed in any one of the Bluetooth headset Don & Doff functional test circuit, wherein the test fixture for fixing a Bluetooth headset to be tested, the said functional Bluetooth headset test electrode is placed in a test circuit through a position close to the test fixture of the Bluetooth headset capacitive sensor.
5. 一种蓝牙耳机Don&Doff功能测试方法,包括: 将所述蓝牙耳机的电容传感器贴近蓝牙耳机Don&Doff功能测试电路的测试电极,其中,所述测试电路还包括与所述测试电极相连接的同向电压跟随电路,所述同向电压跟随电路包括变容二极管和激励信号发生器,所述变容二极管的一端与所述测试电极相连,另一端与激励信号发生器相连; 通过所述激励信号发生器对所述变容二极管的同向端施加锯齿激励信号; 记录所述蓝牙耳机的电容传感器的测试曲线; 通过比对所述测试曲线和标样曲线获得所述蓝牙耳机的Don&Doff功能测试结果。 A Bluetooth headset Don & Doff function testing method, comprising: the capacitive sensor proximate Bluetooth headset Bluetooth headset Don & Doff functional test electrodes of a test circuit, wherein the circuit further comprises a test to the same test electrode connected a voltage follower circuit, the same follower circuit comprises a varactor diode and an excitation signal generator, the one end of the varactor diode is connected to the test electrode voltage, and the other end connected to the excitation signal generator; by the excitation signal generating applies the same to the varactor end sawtooth excitation signal; recording the test curve capacitive sensor Bluetooth headset; Don obtained by aligning the Bluetooth headset to the test standard curve and the curve & Doff function test results.
6.如权利要求5所述的蓝牙耳机Don&Doff功能测试方法,其中,在通过所述激励信号发生器对所述变容二极管的同向端施加锯齿激励信号后, 所述变容二极管两端电压跟随激励信号的变化而变化,使得与所述变容二极管一端相连的测试电极上的电荷发生变化,当蓝牙耳机电容传感器贴近电极时,蓝牙耳机电容传感器的感应曲线发生变化。 As claimed in claim 5, wherein the Bluetooth headset Don & Doff function testing method in which, after excitation by the excitation signal is a sawtooth signal generator is applied to the end of the varactor with the voltage across the varactor diode following the change in the excitation signal is changed, so that the charge on the varactor diode is connected to one end of the test electrode is changed, when the Bluetooth headset close capacitive sensor electrode, the capacitive sensor sensing the Bluetooth headset profile changes.
CN 201210213061 2012-06-26 2012-06-26 Testing circuit, testing device and testing method of Bluetooth earphone Don and Doff function CN102761816B (en)

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