CN102646453A - Method and system for testing error correcting code module in NandFlash controller - Google Patents
Method and system for testing error correcting code module in NandFlash controller Download PDFInfo
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- CN102646453A CN102646453A CN2011100408360A CN201110040836A CN102646453A CN 102646453 A CN102646453 A CN 102646453A CN 2011100408360 A CN2011100408360 A CN 2011100408360A CN 201110040836 A CN201110040836 A CN 201110040836A CN 102646453 A CN102646453 A CN 102646453A
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Abstract
The invention relates to the field of chip test technology, and discloses a method and system for testing an error correcting code module in a NandFlash controller, and the method comprises the following steps: generating random data of predetermined numbers; obtaining ECC verification data of random data; generating test data according to the random number; writing the test data and the ECC verification data in the NandFlash in the mode with closed ECC function; reading the test data which are written in the NandFlash in the mode with opened ECC function; if the ECC module is error, the ECC module is determined to function normally; otherwise the ECC module is determined to function abnormally. According to the invention, the verification of the ECC module is realized, and the correctness of the logic function is guarantied.
Description
Technical field
The present invention relates to the chip testing technology field, more particularly, relate to the method for testing and the system of error-correcting code module in a kind of NandFlash controller.
Background technology
Chip checking is the necessary link that guarantees chip functions, and in the chip checking process, some relates to the module of much complex logic, needs special method to cover its included logic.
The Flash storer is claimed flash memory again, is a kind of of storage chip, and it has combined the strong point of ROM and RAM, not only possesses the performance of electronics erasable programmable, the obliterated data reading of data fast simultaneously of also can not cutting off the power supply.The NandFlash internal memory is a kind of of flash internal memory, and it is inner to adopt non-linear macroelement pattern, for the realization of solid-state large-capacity internal memory provides cheap effective solution.The NandFlash storer has advantages such as capacity is big, rewriting speed is fast; Be applicable to the storage of mass data; Thereby in the industry cycle obtained application more and more widely, like USB flash disk of comprising digital camera, MP3 walkman memory card, advantages of small volume in the embedded product etc.
The steering logic more complicated of NandFlash; Sequential is required also very strictness, and the most important thing is to allow among the NandFlash to have certain bad piece, and bad piece in use also possibly increase; This just gives and judges bad piece, makes marks for bad piece and operation such as wipe and bring very big difficulty; So just required a controller, promptly the NandFlash controller makes system user can use NandFlash easily.
In existing NandFlash controller; Usually have ECC (Error Correction Code; Error-correcting code) module is used for the data among the NandFlash are carried out the verification correction, and present most of NandFlash supports the ECC error correction mode of 4bit/8bit/12bit/24bit/32bit.Usually the ECC error correction logic of chip internal is comparatively complicated, thus need at length to verify to the ECC function of chip internal, correct to guarantee its function, and then it is correct to guarantee that NandFlash reads and writes data.But the effective scheme of also whether ECC module error correction logic correctly not being verified in the prior art.
Summary of the invention
The embodiment of the invention provides the method for testing and the system of error-correcting code module in a kind of NandFlash controller, realizes the checking to the ECC module, guarantees the correctness of its logic function.
For this reason, the embodiment of the invention provides following technical scheme:
The method of testing of error-correcting code module in a kind of NandFlash controller comprises:
Produce the random data of predetermined number;
Obtain the ECC checking data of said random data;
Generate test data according to said random data;
Under the pattern of closing the ECC function, said test data and said ECC checking data are write NandFlash;
Under the pattern of opening the ECC function, from said NandFlash, read the test data that writes;
If the ECC module reports an error, confirm that then said ECC functions of modules is normal; Otherwise confirm that said ECC functions of modules is unusual.
Preferably, the said ECC data of obtaining said random data comprise:
Under the pattern of opening the ECC function, said random data is write NandFlash;
Under the pattern of closing the ECC function, from said NandFlash, read the ECC checking data that said ECC module generates.
Preferably, said method also comprises:
When from said NandFlash, reading the ECC check number of said ECC module generation, from said NandFlash, read the random data that writes;
Random data of relatively reading and the random data that writes;
If the random data of reading is identical with the random data that writes, then carry out the said step that generates test data according to said random data.
Preferably, saidly generate test data according to said random data and comprise:
One or more bits of choosing in the said random data carry out inversion operation, and the random data that will comprise upset back bit is as test data.
Preferably, said one or more bits of choosing in the said random data carry out inversion operation and comprise:
1 to 32 bit in the said random data of picked at random carries out inversion operation.
The test macro of error-correcting code module in a kind of NandFlash controller comprises:
Randomizer is used to produce the random data of predetermined number;
The checking data acquiring unit is used to obtain the ECC checking data of said random data;
Test data generation unit is used for generating test data according to said random data;
Test cell is used under the pattern of closing the ECC function, said test data and said ECC checking data being write NandFlash; Under the pattern of opening the ECC function, from said NandFlash, read the test data that writes;
Whether authentication unit is used for reading the test data process that writes from said NandFlash at said test cell, monitor said ECC module and report an error, if the ECC module reports an error, confirms that then said ECC functions of modules is normal; Otherwise confirm that said ECC functions of modules is unusual.
Preferably, said checking data acquiring unit specifically is used under the pattern of opening the ECC function, said random data being write NandFlash; Under the pattern of closing the ECC function, from said NandFlash, read the ECC checking data of the said random data of said ECC module generation.
Preferably, said checking data acquiring unit also is used for when reading the ECC check number of said ECC module generation from said NandFlash, from said NandFlash, reading the random data that writes;
Correspondingly, said system also comprises:
Comparing unit is used for more said checking data acquiring unit random data of reading and the random data that writes; If the random data of reading is identical with the random data that writes, then notify said test cell to generate test data according to said random data.
Preferably, said test data generation unit comprises:
Bit is chosen subelement, is used for choosing one or more bits of said random data;
The upset subelement is used for that said bit is chosen the bit that subelement chooses and carries out inversion operation, and the random data that will comprise upset back bit is as test data.
Preferably, said bit is chosen subelement, and 1 to 32 bit that specifically is used for the said random data of picked at random carries out inversion operation.
The method of testing of error-correcting code module and system in the embodiment of the invention NandFlash controller; Through producing the random data of predetermined number, and with it as correct raw data, obtain the ECC checking data of these data; And then utilize said random data to generate the test data different with raw data; Like this, just can be with said test data as misdata with respect to correct raw data, the logic function of utilizing the ECC module is carried out verification to said test data and the ECC checking data that generates to correct raw data; If the ECC module reports an error, represent that then the ECC functions of modules is normal; Otherwise expression ECC functions of modules is unusual, thereby can verify the function of ECC module fully, guarantees the correctness of its logic function, and then guarantees the correctness that the NandFlash chip reads and writes data.
Description of drawings
Fig. 1 is the process flow diagram of the method for testing of error-correcting code module in the embodiment of the invention NandFlash controller;
Fig. 2 is the structural representation of the test macro of error-correcting code module in the embodiment of the invention NandFlash controller.
Embodiment
In order to make those skilled in the art person understand the scheme of the embodiment of the invention better, the embodiment of the invention is done further to specify below in conjunction with accompanying drawing and embodiment.
The principle of at first ECC module in the NandFlash controller being carried out verification to data is below carried out simple declaration.
ECC is general, and per 256 byte raw data generate 3 byte ECC checking datas, and this 3 byte is totally 24 bit separated into two parts: the row verification of 6 bits and the capable verification of 16 bits, two unnecessary bits put 1.
When in the page of NandFlash, writing data, per 256 bytes generate an ECC verification with, be referred to as former ECC verification with, be saved in OOB (out-of-band) data field of page.In the time of reading of data from NandFlash, per 256 bytes generate an ECC verification with, be referred to as new ECC verification with.
The former ECC verification that the ECC module will be read from the OOB district and new ECC verification and step-by-step XOR, if the result is 0, then there is not mistake (or the mistake that ECC can't detect having occurred) in expression; If having 11 bits among 3 byte XOR results is 1, there is a bit mistake in expression, and can correct; If only having 1 bit among 3 byte XOR results is 1, expression OOB makes mistakes in the district; Other situation have all represented to occur the mistake that can't correct.For testing result, the ECC module can provide the corresponding error prompting usually, promptly reports an error.
Based on above-mentioned principle, the method for testing of error-correcting code module and system in the embodiment of the invention NandFlash controller are through producing the random data of predetermined number; And with it as correct raw data; Obtain the ECC checking data of these data, and then utilize said random data to generate the test data different, like this with raw data; Just can be with said test data as misdata with respect to correct raw data; The logic function of utilizing the ECC module is carried out verification to said test data and the ECC checking data that generates to correct raw data, if the ECC module reports an error, representes that then the ECC functions of modules is normal; Otherwise expression ECC functions of modules is unusual, thereby can verify the function of ECC module fully, guarantees the correctness of its logic function, and then guarantees the correctness that the NandFlash chip reads and writes data.
Before ECC module logic function is tested in to the NandFlash controller; Need to accomplish driver to NandFlash; So that to NandFlash wipe normally, operation such as read-write; Also to accomplish to ECC modules driver, so that drive the function that the ECC module is carried out error correction.These drivers can be provided by NandFlash and ECC developer; NandFlash and ECC pattern for different model; Different application programs can be arranged, this embodiment of the invention is not done qualification, NandFlash and ECC module operated normally as long as guarantee.
As shown in Figure 1, be the process flow diagram of the method for testing of ECC module in the embodiment of the invention NandFlash controller, may further comprise the steps:
The concrete implementation that produces random data can adopt more existing randomizers to produce the random data of said predetermined number.
In embodiments of the present invention, need therefore, also need obtain the ECC checking data of these random data with said random data as correct raw data.
The front is mentioned, and the logic function of ECC is when in the page of NandFlash, writing data, per 256 bytes generate an ECC verification with, be referred to as former ECC verification with, be saved in OOB (out-of-band) data field of page.In the time of reading of data from NandFlash, per 256 bytes generate an ECC verification with, be referred to as new ECC verification with.
Therefore, can obtain said ECC checking data by following mode:
At first, under the pattern of opening the ECC function, said random data is write NandFlash, then, under the pattern of closing the ECC function, just can read the ECC checking data of said ECC module generation from the OOB data field of said NandFlashA.
Certainly, the embodiment of the invention is not limited in aforesaid way, can also adopt other modes to obtain the ECC checking data of said random data, such as, directly calculate the ECC checking data of said random data according to the ECC function logic.
In embodiments of the present invention, need to utilize wrong data and correct ECC checking data, if the ECC module is logically true, then the ECC module should identify error in data, and then reports an error; If the ECC module does not report an error to it, explain that then ECC module logic is unusual.
The data of described mistake can be produced by correct raw data; In embodiments of the present invention, can carry out the turning operation of random bit to the random data of said predetermined number, such as random data for above-mentioned 1K; One or more bit of picked at random carries out inversion operation; Such as, for the ECC module of supporting 4 bit ECC error correction modes, data that can 1 to 4 bit position of picked at random are carried out inversion operation; For the ECC module of supporting 8 bit ECC error correction modes, data that can 1 to 8 bit position of picked at random are carried out inversion operation; The rest may be inferred, and the embodiment of the invention can be verified to the ECC module of supporting different mode.
Through behind the above-mentioned turning operation, the random data of 1K will be changed, then with this 1K random data that comprises upset back bit as test data.
Certainly, also can adopt other modes to generate test data, only need to guarantee get final product different of test data of generation, this embodiment of the invention is not done qualification with original random data.
Step 104 writes NandFlash with said test data and said ECC checking data under the pattern of closing the ECC function.
Like this, just store wrong data and correct ECC checking data among the NandFlash, and can not produce new ECC checking data.Certainly, said ECC checking data need write the OOB data field of page.That is to say; With opening the process that generates the ECC checking data automatically when in NandFlash, writing data under the ECC pattern and be saved in the OOB data field of page; Transfer manual control to, to reach the purpose that in NandFlash, has write wrong data and the correct ECC checking data corresponding with it.
Step 105 reads the test data that writes from said NandFlash under the pattern of opening the ECC function.
Step 106 judges whether ECC reports an error; If then execution in step 107; Otherwise execution in step 108.
Step 107 confirms that said ECC functions of modules is normal.
Step 108 confirms that said ECC functions of modules is unusual.
The front is mentioned, and the principle of ECC logic function is: when in the page of NandFlash, writing data, per 256 bytes generate an ECC verification with, be referred to as former ECC verification with, be saved in the OOB data field of page.In the time of reading of data from NandFlash, per 256 bytes generate an ECC verification with, be referred to as new ECC verification with.
The former ECC verification that the ECC module will be read from the OOB district and new ECC verification and step-by-step XOR, if the result is 0, then there is not mistake (or the mistake that ECC can't detect having occurred) in expression; If the result is 1, then the ECC module can report an error.
Therefore; When under the pattern of opening the ECC function, from said NandFlash, reading the test data that writes; Can produce new ECC checking data, this new ECC checking data is corresponding said test data, and the ECC checking data of storing among the NandFlash is corresponding original random number certificate.The ECC checking data of from NandFlash, reading should be different with said new ECC checking data.Therefore, if the ECC module reports an error, show that then said ECC module has detected this mistake, can confirm that its function is normal; Otherwise, show that said ECC module does not detect this mistake, in this case, said ECC functions of modules must be abnormal.
Utilize the method for testing of ECC module in the embodiment of the invention NandFlash controller, can fully verify the function of ECC module, guarantee the correctness of its logic function, and then guarantee the correctness that the NandFlash chip reads and writes data.
Need to prove, in embodiments of the present invention,, between above-mentioned steps 102 and step 103, also can may further comprise the steps in order further to guarantee checking result's reliability:
When from said NandFlash, reading the ECC check number of said ECC module generation, from said NandFlash, read the random data that writes;
Random data of relatively reading and the random data that writes;
If the random data of reading is identical with the random data that writes, then execution in step 103; Otherwise show that there is the read-write mistake in NandFlash.
One of ordinary skill in the art will appreciate that all or part of step that realizes in the foregoing description method is to instruct relevant hardware to accomplish through program; Described program can be stored in the computer read/write memory medium; Described storage medium, as: ROM/RAM, magnetic disc, CD etc.
Correspondingly, the embodiment of the invention also provides the test macro of error-correcting code module in a kind of NandFlash controller, and is as shown in Figure 2, is a kind of structural representation of this system.
In this embodiment, said system comprises:
Checking data acquiring unit 202 is used to obtain the ECC checking data of said random data;
Test data generation unit 203 is used for generating test data according to said random data;
Whether authentication unit 205 is used for reading the test data process that writes from said NandFlash at said test cell 204, monitor said ECC module and report an error, if the ECC module reports an error, confirms that then said ECC functions of modules is normal; Otherwise confirm that said ECC functions of modules is unusual.
In embodiments of the present invention, said checking data acquiring unit 202 can obtain the ECC checking data of said random data by following mode: under the pattern of opening the ECC function, said random data is write NandFlash; Under the pattern of closing the ECC function, from said NandFlash, read the ECC checking data of the said random data of said ECC module generation.
Certainly, said checking data acquiring unit 202 can also adopt other modes to obtain the ECC checking data of said random data, such as, directly calculate the ECC checking data of said random data according to the ECC function logic.This embodiment of the invention is not done qualification.
In embodiments of the present invention, a kind of preferred implementation of said test data generation unit 203 comprises: bit is chosen subelement and upset subelement, wherein:
Said bit is chosen subelement, is used for choosing one or more bits of said random data, such as, 1 to 32 bit in can the said random data of picked at random carries out inversion operation;
Said upset subelement is used for that said bit is chosen the bit that subelement chooses and carries out inversion operation, and the random data that will comprise upset back bit is as test data.
Certainly, said test data generation unit 203 also can adopt other modes to generate test data, only needs to guarantee get final product different with original random data of test data of generation.
Utilize the test macro of ECC module in the embodiment of the invention NandFlash controller, can fully verify the function of ECC module, guarantee the correctness of its logic function, and then guarantee the correctness that the NandFlash chip reads and writes data.
Need to prove that in embodiments of the present invention, said checking data acquiring unit 202 also can be further used for when from said NandFlash, reading the ECC check number of said ECC module generation, from said NandFlash, reading the random data that writes.Correspondingly, said system also comprises: comparing unit (not shown) is used for more said checking data acquiring unit 202 random data of reading and the random data that writes; If the random data of reading is identical with the random data that writes, then notify said test cell 204 to generate test data according to said random data.If the random data of reading is different with the random data that writes, show that then there is the read-write mistake in NandFlash, at this moment, can directly provide miscue by said comparing unit.Like this, can further guarantee reliability to ECC functional verification result.
Identical similar part is mutually referring to getting final product between each embodiment in this instructions, and each embodiment stresses all is the difference with other embodiment.Especially, for system embodiment, because it is basically similar in appearance to method embodiment, so describe fairly simplely, relevant part gets final product referring to the part explanation of method embodiment.System embodiment described above only is schematic; Wherein said unit as the separating component explanation can or can not be physically to separate also; The parts that show as the unit can be or can not be physical locations also; Promptly can be positioned at a place, perhaps also can be distributed on a plurality of NEs.Can realize the purpose of present embodiment scheme according to the needs selection some or all of module wherein of reality.Those of ordinary skills promptly can understand and implement under the situation of not paying creative work.
More than disclosedly be merely preferred implementation of the present invention; But the present invention is not limited thereto; Any those skilled in the art can think do not have a creationary variation, and, all should drop in protection scope of the present invention not breaking away from some improvement and the retouching of being done under the principle of the invention prerequisite.
Claims (10)
1. the method for testing of error-correcting code module in the NandFlash controller is characterized in that, comprising:
Produce the random data of predetermined number;
Obtain the ECC checking data of said random data;
Generate test data according to said random data;
Under the pattern of closing the ECC function, said test data and said ECC checking data are write NandFlash;
Under the pattern of opening the ECC function, from said NandFlash, read the test data that writes;
If the ECC module reports an error, confirm that then said ECC functions of modules is normal; Otherwise confirm that said ECC functions of modules is unusual.
2. the method for claim 1 is characterized in that, the said ECC data of obtaining said random data comprise:
Under the pattern of opening the ECC function, said random data is write NandFlash;
Under the pattern of closing the ECC function, from said NandFlash, read the ECC checking data that said ECC module generates.
3. method as claimed in claim 2 is characterized in that, said method also comprises:
When from said NandFlash, reading the ECC check number of said ECC module generation, from said NandFlash, read the random data that writes;
Random data of relatively reading and the random data that writes;
If the random data of reading is identical with the random data that writes, then carry out the said step that generates test data according to said random data.
4. the method for claim 1 is characterized in that, saidly generates test data according to said random data and comprises:
One or more bits of choosing in the said random data carry out inversion operation, and the random data that will comprise upset back bit is as test data.
5. method as claimed in claim 4 is characterized in that, said one or more bits of choosing in the said random data carry out inversion operation and comprise:
1 to 32 bit in the said random data of picked at random carries out inversion operation.
6. the test macro of error-correcting code module in the NandFlash controller is characterized in that, comprising:
Randomizer is used to produce the random data of predetermined number;
The checking data acquiring unit is used to obtain the ECC checking data of said random data;
Test data generation unit is used for generating test data according to said random data;
Test cell is used under the pattern of closing the ECC function, said test data and said ECC checking data being write NandFlash; Under the pattern of opening the ECC function, from said NandFlash, read the test data that writes;
Whether authentication unit is used for reading the test data process that writes from said NandFlash at said test cell, monitor said ECC module and report an error, if the ECC module reports an error, confirms that then said ECC functions of modules is normal; Otherwise confirm that said ECC functions of modules is unusual.
7. system as claimed in claim 6 is characterized in that,
Said checking data acquiring unit specifically is used under the pattern of opening the ECC function, said random data being write NandFlash; Under the pattern of closing the ECC function, from said NandFlash, read the ECC checking data of the said random data of said ECC module generation.
8. system as claimed in claim 7 is characterized in that,
Said checking data acquiring unit also is used for when reading the ECC check number of said ECC module generation from said NandFlash, from said NandFlash, reading the random data that writes;
Said system also comprises:
Comparing unit is used for more said checking data acquiring unit random data of reading and the random data that writes; If the random data of reading is identical with the random data that writes, then notify said test cell to generate test data according to said random data.
9. system as claimed in claim 6 is characterized in that, said test data generation unit comprises:
Bit is chosen subelement, is used for choosing one or more bits of said random data;
The upset subelement is used for that said bit is chosen the bit that subelement chooses and carries out inversion operation, and the random data that will comprise upset back bit is as test data.
10. system as claimed in claim 9 is characterized in that,
Said bit is chosen subelement, and 1 to 32 bit that specifically is used for the said random data of picked at random carries out inversion operation.
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Application publication date: 20120822 |