CN102545060B - Preparation method of micro laser diode array - Google Patents
Preparation method of micro laser diode array Download PDFInfo
- Publication number
- CN102545060B CN102545060B CN 201210014194 CN201210014194A CN102545060B CN 102545060 B CN102545060 B CN 102545060B CN 201210014194 CN201210014194 CN 201210014194 CN 201210014194 A CN201210014194 A CN 201210014194A CN 102545060 B CN102545060 B CN 102545060B
- Authority
- CN
- China
- Prior art keywords
- gan
- micron bar
- zno
- preparation
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000002360 preparation method Methods 0.000 title claims abstract description 19
- 239000011521 glass Substances 0.000 claims abstract description 21
- 229920000642 polymer Polymers 0.000 claims abstract description 13
- 229920006254 polymer film Polymers 0.000 claims abstract description 10
- 238000007747 plating Methods 0.000 claims abstract description 7
- 239000004593 Epoxy Substances 0.000 claims abstract description 6
- 229920000301 poly(3-hexylthiophene-2,5-diyl) polymer Polymers 0.000 claims abstract description 5
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 claims abstract 6
- -1 poly(p-phenylenevinylene) Polymers 0.000 claims abstract 2
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 24
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 18
- 239000011159 matrix material Substances 0.000 claims description 12
- 239000000919 ceramic Substances 0.000 claims description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 10
- 239000010703 silicon Substances 0.000 claims description 10
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 9
- 239000008367 deionised water Substances 0.000 claims description 9
- 229910021641 deionized water Inorganic materials 0.000 claims description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims description 9
- 238000004506 ultrasonic cleaning Methods 0.000 claims description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 9
- 238000000137 annealing Methods 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 7
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 claims description 6
- 238000005566 electron beam evaporation Methods 0.000 claims description 5
- 238000004080 punching Methods 0.000 claims description 4
- 239000000243 solution Substances 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- 238000013459 approach Methods 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 239000000428 dust Substances 0.000 claims description 3
- 238000000227 grinding Methods 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 238000001307 laser spectroscopy Methods 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 238000005498 polishing Methods 0.000 claims description 3
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims 2
- 239000002322 conducting polymer Substances 0.000 claims 2
- 229920001940 conductive polymer Polymers 0.000 claims 2
- 150000002220 fluorenes Chemical class 0.000 claims 1
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical compound O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 229910002601 GaN Inorganic materials 0.000 abstract description 29
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 238000004528 spin coating Methods 0.000 abstract description 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 abstract description 3
- 125000004494 ethyl ester group Chemical group 0.000 abstract description 3
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 abstract 3
- 239000010931 gold Substances 0.000 abstract 2
- 229920000553 poly(phenylenevinylene) Polymers 0.000 abstract 2
- 229920002098 polyfluorene Polymers 0.000 abstract 2
- JYMITAMFTJDTAE-UHFFFAOYSA-N aluminum zinc oxygen(2-) Chemical compound [O-2].[Al+3].[Zn+2] JYMITAMFTJDTAE-UHFFFAOYSA-N 0.000 abstract 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 abstract 1
- 229910052737 gold Inorganic materials 0.000 abstract 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 abstract 1
- 239000011787 zinc oxide Substances 0.000 abstract 1
- 239000010408 film Substances 0.000 description 13
- 230000003287 optical effect Effects 0.000 description 7
- 239000013078 crystal Substances 0.000 description 6
- 239000002086 nanomaterial Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- 238000001027 hydrothermal synthesis Methods 0.000 description 3
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002070 nanowire Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000006854 communication Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 230000009024 positive feedback mechanism Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Abstract
The invention relates to a preparation method of a micro laser diode array. The preparation method comprises the steps of: spin-coating a layer of p-type polymer semiconductor film on the surface of a P-type gallium nitride (GaN) film, wherein the p-type polymer semiconductor film can be selected from polyvinylcarbazole (PVK), polyfluorene (PF), poly(p-phenylenevinylene) (PPV), poly-3-alkylthiophene (P3HT) and derivatives thereof and other p-type polymer semiconductors; then integrating with a single zinc oxide (ZnO) microrod on the surface of a p-type polymer film to form a heterojunction; plating a transparent conducting film to transparent glass, wherein the transparent conducting film can be selected from indium tin oxide (ITO), zinc aluminum oxide (ZAO) and the like; then plating a layer of gold (Au) electrode at one end of transparent conductive glass; then buckling the transparent conductive glass on the microrod on which the surface is integrated with ZnO; then injecting epoxy ethyl ester to the gap between the transparent conductive glass and p-GaN; and finally, preparing an electrode with ohmic contact on the surface of p-GaN to form an integral device.
Description
Technical field
The present invention's design utilizes Vapor Transport or hydro thermal method to prepare high-quality single crystal ZnO micron bar, isolate single ZnO micron bar and have the p-type gallium nitride of p-type polymer (as: PVK, PF, PPV, P3HT and derivative thereof etc.) film to be combined it and spin coating and form the pn knot, the transparent conducting glass (as: ITO, ZAO etc.) that one end is coated with the Au electrode is buckled on the integrated ZnO micron bar array, then between transparent conducting glass and p-type GaN, pour epoxy ethyl ester, the structure of annealed immobilising device.The electrode that has ohmic contact in the preparation of GaN one end surfaces at last, the device of complete.The luminous micro laser array that said method obtains can obtain the high-quality little laser emission of ultraviolet electric pump echo wall die.
Background technology
Since Japanese scientist and American scientist had been found ultraviolet radiation in ZnO film and the nano wire in succession, ZnO became the ideal material of design ultraviolet laser.Ultraviolet excitation mode in the ZnO micro nano structure can be divided into three kinds: Random Laser, Fabry-Perot laser,, echo wall die laser.In Random Laser, coherent feedback is by the spontaneous formation of backhaul scattering, it results from the disorder distribution nano particle usually, in the nanostructure of polycrystal film and other pattern, the condition that laser produces is that the size of scattering object approaches or less than wavelength, the path of the transmission of laser is in the gap of nanostructure rather than inside, positive feedback mechanism can be explained with Anderson localization theory: when light is propagated in Disordered Media, when if the mean free path of scattered photon in medium is less than or equal to wavelength, light may produce the backhaul scattering, thereby forms a closed annular light path.If light along the gain in the loop communication process greater than loss, and move all phase places and change into
Integral multiple, just may form oscillating laser.Because the crystal boundaries scattering is serious, so the optical loss in the Random Laser light path is large, and lasing threshold is very high at random usually, and excitation mode is unfixing.F-P type laser is by certain nanostructure with parallel crystal face, produces such as nano wire, nanometer rods and nano thin-film etc., and two parallel crystal faces must be comparatively ideal planes.Its operation principle is similar to traditional F-P chamber type laser, and two parallel surfaces are equivalent to two chamber mirrors, yet reflectivity is lower at the interface owing to the ZnO two ends, so the threshold value of F-P module lasing is also higher.Echo Wall module lasing utilize light path in ZnO hexagon micron bar in constantly total reflection form, optical total-reflection can effectively be strapped in light in the cavity, so optical loss and faint, so the laser emission that ZnO echo wall die micron bar can be exported high-quality-factor and low threshold value.
At present, the ultraviolet of above-mentioned three kinds of pattern ZnO swashs to penetrate at optical pumping and can realize that people have all adopted pulse laser pumping ZnO micro nano structure so that population is reversed so that optical gain greater than optical loss with formation laser emission.Existing research work has begun to put forth effort on development ZnO electroluminescence.Because people are difficult to obtain stable p-type ZnO material.Therefore the researcher forms the pn knot at p-type silicon or p-type GaN superficial growth ZnO film usually, and this film pn knot can only form Random Laser at the most owing to lack suitable cavity body structure, existing a plurality of seminars report.ZnO micron bar monocrystalline has the hexagonal Wurzite structure, and a desirable laser cavity configuration is provided, and the Whispering-gallery-mode of formation has lower laser threshold, fixing zlasing mode and outbound course.The preparation of the echo wall die microcavity laser diode of N-shaped ZnO micron bar/ZnO resilient coating/p-type GaN structure has been reported.But this kind structure is because the middle technique that relates to ion beam etching and use the mask plate plated electrode causes the manufacture craft more complicated, and in the course of processing easily with the micron bar shift position, even destroy ZnO monocrystalline micron bar, be unfavorable for industrialization.
Based on the problems referred to above, here we have proposed a kind of new structure n-ZnO micron bar/film/p-GaN of p-type polymer semiconductor, single ZnO micron bar is integrated in spin coating has the p-GaN surface conjunction of p-type thin polymer film to form the pn knot, the p-type polymer buffer layer that adds links together upper strata ZnO micron bar and the p-GaN of lower floor effectively, guaranteed good electricity contact, improved the total reflection condition in the micron bar cavity, loss is reduced, gain improves.Transparent conducting glass (as: ITO, ZAO) etc. directly covers on integrated ZnO micron bar, has avoided the technique of etching more complicated, has reached again good electricity contact simultaneously.Pour epoxy ethyl ester between transparent conducting glass and p-GaN, the internal structure of immobilising device makes device stable, and increase useful life.
Summary of the invention
Technical problem:The preparation method who the purpose of this invention is to provide a kind of little diode laser matrix.Its laser output wavelength is regulated by regulating ZnO micron bar diameter.
Technical scheme:In the present invention, utilize Vapor Transport or hydro thermal method making ZnO micron bar array, choose single ZnO micron bar and it is combined with the p-type GaN of spin coating p-type polymer (as: PVK, PF, PPV, P3HT and derivative thereof etc.) film and forms pn and tie, next the transparent conducting glass (as: ITO, ZAO etc.) that an end is coated with the Au electrode is buckled in above the p-GaN that the surface is integrated with the ZnO micron bar, then injection ring 2-ethoxyethyl acetate between transparent conducting glass and p-GaN is by annealing immobilising device internal structure.The electrode that has ohmic contact in the preparation of p-GaN surface at last finally obtains N-shaped ZnO micron bar/p-type polymer/p-GaN micro laser array.
The present invention is by the following technical solutions:
The first step: purity is 99.99% ZnO powder and carbon dust according to mass ratio 1:1 mixed grinding, gets
0.3~0.5Restraining this mixture inserts in the ceramic boat.The silicon chip that will approach with ceramic boat aperture area size is done with the nitrogen punching behind acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, and silicon wafer polishing is faced down covers the ceramic boat top.Subsequently ceramic boat being pushed temperature is
1000~1200 ° of CTube furnace in.Process
30~60Minute the reaction, ZnO micron bar array grows in silicon chip surface (seeing accompanying drawing 1), the crystal structure of single ZnO micron bar is hexagonal Wurzite structure (seeing accompanying drawing 2).Also can adopt hydro thermal method making ZnO micron bar array.
Second step: with the p-type gallium nitride of 2 centimetres of sizes of 1 cm x through acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning after, dry up preparation with nitrogen
0.1~0.4Mg/mL p-type polymer (as: PVK, PF, PPV, P3HT and derivative thereof etc.) chloroformic solution is spun on the sample surfaces for preparing with it.Spin speed accelerates to the setting rotating speed by inactive state within 2 seconds
2000~4000Rev/min, keep subsequently this rotating speed
15~25In second, form thickness approximately
20~30The p-type thin polymer film of nanometer.
The 3rd step: from ZnO micron bar array, select single ZnO micron bar, it is kept flat be integrated into p-type thin polymer film surface.This layer film has been joined together to form pn knot (seeing accompanying drawing 3a) effectively with upper strata ZnO micron bar and the p-type GaN of lower floor.
The 4th step: behind 2 centimetres of big or small transparent conducting glass of 1 cm x (as: ITO, ZAO etc.) process acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, dry up with nitrogen, utilize electron beam evaporation plating, plate at the one end surfaces
20~30Nanometer thickness Au electrode.
The 5th step: transparent conducting glass is buckled in keeps flat the upper of integrated good ZnO micron bar, then between transparent conducting glass and p-type GaN, inject epoxy second fat, compress annealing about one hour, annealing temperature
120~150Degree centigrade (seeing accompanying drawing 3b).
The 6th step: with chloroform or acetone solvent the p-type thin polymer film on the end of p-type GaN is washed off, then utilized electron beam evaporation plating, plate two-layer electrode, form the Ni/Au electrode (seeing accompanying drawing 3c) of 30~40 nano thickness.
The 7th step: the pn junction device that makes is carried out electrical properties measure, and measure the electric pump laser spectroscopy.
Beneficial effect:Compared with prior art, the present invention has the following advantages:
1, the present invention utilizes the smooth monocrystalline micron ZnO micron bar in border to form the Echo Wall microcavity of nature, and the p-type thin polymer film has improved the total reflection condition in the microcavity as resilient coating simultaneously, makes its optical loss little, and gain improves, and more is conducive to the formation of little laser.
2, the present invention adopts transparent conducting glass (as: ITO, ZAO etc.) to cover on integrated ZnO micron bar, has evaded the complicated technology of ion beam etching, mask plated electrode, has greatly simplified technical process, is conducive to industrialization.
3, the package curing of the present invention by injection ring 2-ethoxyethyl acetate annealing the internal structure of device, it is stable, firm to be conducive to device, has improved useful life.
4, the ZnO micron bar diameter of the present invention preparation is adjustable, so the zlasing mode of micro laser and wavelength are adjustable, have more practical value.
Description of drawings
Fig. 1 gas phase transmission is sent out the ZnO micron bar array of preparation.
The single ZnO micron bar of Fig. 2 SEM figure.
Fig. 3 (a-c) transparent conducting glass/N-shaped ZnO micron bar/little laser two of PVK polymer/p-type GaN
Utmost point pipe array prepares schematic diagram.
The little diode laser matrix preparation of Fig. 4 (a-c) ITO/n type ZnO micron bar/PVK/p type GaN signal
Figure.
Fig. 5 ITO/n type ZnO micron bar/little diode laser matrix electric pump of PVK/p type GaN spectrum.
Embodiment(take the ZnO micron bar of preparation cavity diameter as 14 microns, ITO/n-ZnO micron bar/little diode laser matrix of PVK film/p-GaN is example)
The first step: purity is 99.99% ZnO powder and carbon dust according to mass ratio 1:1 mixed grinding, gets 0.5 this mixture of gram and insert in the ceramic boat.The silicon chip of 3 centimetres of 2 cm x behind acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, is done with the nitrogen punching, and silicon wafer polishing is faced down to be covered and the ceramic boat top.Ceramic boat is pushed in the tube furnace that temperature is 1150 ° of C subsequently.Through reaction in 40 minutes, ZnO micron bar array grew in silicon chip surface (seeing accompanying drawing 1), and the crystal structure of single ZnO micron bar is hexagonal Wurzite structure (seeing accompanying drawing 2).
Second step: with the p-GaN of 2 centimetres of 1 cm x through acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning after, dry up with nitrogen, prepare 0.1 mg/mL PVK chloroformic solution, it is spun on p-type GaN surface.Spin speed is accelerated to by inactive state within 2 seconds and sets 2900 rev/mins of rotating speeds, keeps subsequently 20 seconds of this rotating speed, forms the PVK film of about 20 nanometers of thickness.
The 3rd step: from ZnO micron bar array, select single ZnO micron bar, it is kept flat be integrated into the PVK film surface.This layer film has been joined together to form the pn knot effectively with upper strata ZnO micron bar and the p-GaN of lower floor.(seeing accompanying drawing 4a)
The 4th step: with the ITO transparent conducting glass of 2 centimetres of 1 cm x through acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning after, dry up with nitrogen, a surperficial end plates the thick Au electrode of 30nm.
The 5th step:, the ITO transparent conducting glass is buckled on the p-GaN substrate of integrated good ZnO micron bar, then with injecting epoxy second fat, compress annealing one hour, 150 degrees centigrade of annealing temperatures (seeing accompanying drawing 4b).
The 6th step: with chloroform or acetone organic solvent the PVK film of p-GaN one end is washed off, then utilized electron beam evaporation plating, show the two-layer electrode of preparation at p-GaN, obtaining thickness is the Ni/Au electrode (seeing accompanying drawing 4c) of 30 nanometers.
The 7th step: the pn junction device that makes is carried out electrical properties measure, and measure electric pump laser spectroscopy (seeing accompanying drawing 5).
Claims (3)
1. the preparation method of a little diode laser matrix is characterized in that this little diode laser matrix is N-shaped ZnO micron bar/p-type polymer/little diode laser matrix of p-type GaN, and this preparation method is:
The first step: purity is 99.99% ZnO end and carbon dust according to mass ratio 1:1 mixed grinding, gets an amount of mixture and insert in the ceramic boat; The silicon chip that will approach with ceramic boat aperture area size is done with the nitrogen punching behind acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, and silicon wafer polishing is faced down to be covered and the ceramic boat top; Subsequently ceramic boat is pushed in the tube furnace that temperature is 1000~1200 ° of C, through reaction in 30~60 minutes, ZnO micron bar array grew in silicon chip surface;
Second step: behind p-GaN substrate process acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, dry up with nitrogen, the chloroformic solution of preparation 0.1~0.4mg/mL p-type semi-conducting polymer, it is spun on the p-GaN surface, spin speed accelerates to 2000~4000 rev/mins of setting rotating speeds by inactive state within 2 seconds, keep subsequently 15~25 seconds of this rotating speed, forming thickness is the p-type thin polymer film of 20~30 nanometers;
The 3rd step: select single ZnO micron bar from ZnO micron bar array, it is kept flat be integrated into p-type thin polymer film surface, this layer p-type thin polymer film has been joined together to form the pn knot effectively with upper strata ZnO micron bar and the p-GaN of lower floor;
The 4th step: transparent conducting glass is behind acetone, absolute ethyl alcohol and deionized water successively ultrasonic cleaning, do with the nitrogen punching, utilize electron beam evaporation plating, plate 20~30 nanometer thickness Au electrodes at its surperficial end, form good ohmic contact, to guarantee the carrier injection of high concentration;
The 5th step: transparent conducting glass is buckled on the integrated good ZnO micron bar array, then injects transparent epoxy second fat between transparent conducting glass and p-GaN, compress annealing, annealing temperature is 120~150 degrees centigrade;
The 6th step: with chloroform or acetone the p-type thin polymer film on the end of p-GaN is washed off, then utilized electron beam evaporation plating, plate two-layer electrode, form the Ni/Au electrode of 30~40 nano thickness; Form at last N-shaped ZnO micron bar/PVK polymer/little diode laser matrix of p-type GaN heterojunction;
The 7th step: last N-shaped ZnO micron bar/PVK polymer/little diode laser matrix of p-type GaN heterojunction that forms of the 6th step is carried out the electrical properties measurement, and measure the electric pump laser spectroscopy.
2. the preparation method of little diode laser matrix according to claim 1 is characterized in that described p-type semi-conducting polymer is: Polyvinyl carbazole PVK, poly-fluorenes PF, poly-to styrene support PPV or poly--3 alkylthrophene P3HT and derivatives thereof.
3. the preparation method of little diode laser matrix according to claim 1 is characterized in that described transparent conducting glass is tin indium oxide ITO, oxygen zinc-aluminium ZAO.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201210014194 CN102545060B (en) | 2012-01-17 | 2012-01-17 | Preparation method of micro laser diode array |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201210014194 CN102545060B (en) | 2012-01-17 | 2012-01-17 | Preparation method of micro laser diode array |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102545060A CN102545060A (en) | 2012-07-04 |
CN102545060B true CN102545060B (en) | 2013-03-20 |
Family
ID=46351300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 201210014194 Expired - Fee Related CN102545060B (en) | 2012-01-17 | 2012-01-17 | Preparation method of micro laser diode array |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102545060B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CZ2012916A3 (en) * | 2012-12-18 | 2014-04-09 | Univerzita Tomáše Bati ve Zlíně | Active layer for electroluminescent foils |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4451371B2 (en) * | 2004-12-20 | 2010-04-14 | シャープ株式会社 | Nitride semiconductor laser device |
CN100383049C (en) * | 2005-11-02 | 2008-04-23 | 东南大学 | Method of growing nano-rod shaped zinc oxide by hydrothermal decomposition |
CN100494070C (en) * | 2007-03-12 | 2009-06-03 | 东南大学 | Preparation method of echo wall die laser cavity based on zinc oxide single crystal micronano dish |
CN101505035B (en) * | 2009-03-09 | 2011-05-18 | 武汉大学 | P-zinc oxide/N- nickel oxide heterogeneous PN junction ultraviolet laser diode and method for production |
-
2012
- 2012-01-17 CN CN 201210014194 patent/CN102545060B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN102545060A (en) | 2012-07-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102545046B (en) | Method for manufacturing Whispering-gallery mode micro-cavity laser diode | |
US20210305452A1 (en) | Thin-film semiconductor optoelectronic device with textured front and/or back surface prepared from etching | |
US8932940B2 (en) | Vertical group III-V nanowires on si, heterostructures, flexible arrays and fabrication | |
US20120006390A1 (en) | Nano-wire solar cell or detector | |
US8787416B2 (en) | Laser diode using zinc oxide nanorods and manufacturing method thereof | |
US8551558B2 (en) | Techniques for enhancing efficiency of photovoltaic devices using high-aspect-ratio nanostructures | |
Xu et al. | Recent progress on infrared photodetectors based on InAs and InAsSb nanowires | |
US9537025B1 (en) | Texturing a layer in an optoelectronic device for improved angle randomization of light | |
Gu et al. | Design and growth of III–V nanowire solar cell arrays on low cost substrates | |
CN102570304A (en) | Preparation method for micro-nano laser diode | |
CN102904158B (en) | Preparation method of WGM (whispering gallery mode) ZnO ultraviolet micro-laser for constructing electric pump | |
US20140000713A1 (en) | Mechanically stable device based on nano/micro wires and having improved optical properties and process for producing it | |
KR101957801B1 (en) | Flexible Double Junction Solar Cell Device | |
CN102623891A (en) | Method for preparing micro-laser array | |
CN102545060B (en) | Preparation method of micro laser diode array | |
JP2005064246A (en) | Photoelectric conversion element and manufacturing method thereof, and solar cell | |
Lam et al. | Improved optical absorption and photocurrent of GaAs solar cells with hexagonal micro-hole array surface texturing | |
Chen et al. | Improved performance of a back-illuminated GaN-based metal-semiconductor-metal ultraviolet photodetector by in-situ modification of one-dimensional ZnO nanorods on its screw dislocations | |
Hagar et al. | Multi-junction solar cells by Intermetallic Bonding and interconnect of Dissimilar Materials: GaAs/Si | |
Goodnick et al. | Solar cells | |
CN100454585C (en) | Gallium nitride-base ultraviolet detector with PIN structure and production thereof | |
CN113471340A (en) | Local surface plasmon coupling enhancement based ultra-fast micro-LED of MIS structure and preparation method thereof | |
Zhai et al. | Enhanced electroluminescence from Si quantum dots-based light-emitting devices with Si nanowire structures and hydrogen passivation | |
Pylypova et al. | Influence of Si Nanowires Parameters and Ag Nanoparticles on Light Trapping in Solar Cells | |
CN102496854A (en) | Preparation method of hexagonal zinc oxide whispering gallery mode micro laser diode |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130320 |