CN102435880A - Multichannel scan test and control device - Google Patents
Multichannel scan test and control device Download PDFInfo
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- CN102435880A CN102435880A CN2011102831966A CN201110283196A CN102435880A CN 102435880 A CN102435880 A CN 102435880A CN 2011102831966 A CN2011102831966 A CN 2011102831966A CN 201110283196 A CN201110283196 A CN 201110283196A CN 102435880 A CN102435880 A CN 102435880A
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Abstract
The invention relates to a multichannel scan test and control device, which comprises an electric resistance tester device, an RS232 communication device and a multichannel test probe device, wherein the output end of the RS232 communication device is connected with the input end of the electric resistance tester device; one ends in the test probes of the multichannel test probe device are mutually connected; one ends, which are connected mutually, of the test probes are connected with the output end of the electric resistance tester device; the other ends of the test probes are connected with the output end of a multichannel relay output device; the output end of the multichannel test probe device is connected with a test element; the output end of the electric resistance tester device is connected with the input end of the multichannel relay output device; and the input end of the multichannel relay output device is connected with the output end of a multichannel digital quantity I/O (Input/Output) device. The multichannel relay output device, which is connected between the electric resistance tester device and the multichannel test probe device, is used for controlling the test element in the multichannel relay output device to be communicated and closed with the multichannel test probe device, so that the speed of the test element is improved.
Description
Technical field
The present invention relates to a kind of multi-channel scanning test control device, be used for the electric performance test branch technical field of chips such as pressure-sensitive, PTC, NTC, Leaded Ceramic Disc Capacitor.
Background technology
Existing testing element is to connect one group of probe, and to each element test, but only survey an element at every turn.After primary element was accomplished in every test, test probe need move once, then next element is being tested, and causes testing element speed slow.
Summary of the invention
The objective of the invention is to overcome the deficiency that prior art exists, a kind of multi-channel scanning test control device is provided.
The object of the invention is realized through following technical scheme:
The multi-channel scanning test control device; Comprise resistance test instrument apparatus, RS232 communication device and multi-channel test probe unit; The output terminal of said RS232 communication device links to each other with the input end of resistance test instrument apparatus; It is characterized in that: the end in each test probe of said multi-channel test probe unit interconnects; The interconnective end of said each test probe links to each other with the output terminal of resistance test instrument apparatus, and another input end of said each test probe links to each other with the output terminal of multicircuit relay output unit, and the output terminal of said multi-channel test probe unit links to each other with testing element; The output terminal of said resistance test instrument apparatus links to each other with the input end of multicircuit relay output unit, and the input end of said multicircuit relay output unit links to each other with the output terminal of multi-path digital amount I/O device.
Further, above-mentioned multi-channel scanning test control device, wherein, the input end of multi-path digital amount I/O device and RS232 communication device links to each other with power supply.
The substantive distinguishing features of technical scheme of the present invention is mainly reflected in progressive:
The present invention is improved the speed of its testing element through between resistance test instrument apparatus and multi-channel test probe unit, being connected with the multicircuit relay output unit faster, and has guaranteed the accuracy of testing element.
Description of drawings
Fig. 1: connection synoptic diagram of the present invention.
Embodiment
As shown in Figure 1; The multi-channel scanning test control device; Comprise resistance test instrument apparatus 3, RS232 communication device 2, and multi-channel test probe unit 5, the output terminal of RS232 communication device 2 links to each other with the input end of resistance test instrument apparatus 3; End in each test probe of multi-channel test probe unit 5 interconnects; The interconnective end of each test probe links to each other with the output terminal of resistance test instrument apparatus 3, and another input end of each test probe links to each other with the output terminal of multicircuit relay output unit 4, and the output terminal of multi-channel test probe unit 5 links to each other with testing element 6; The output terminal of resistance test instrument apparatus 3 links to each other with the input end of multicircuit relay output unit 4, and the input end of multicircuit relay output unit 4 links to each other with the output terminal of multi-path digital amount I/O device 1.
Wherein the input end of multi-path digital amount I/O device 1 and RS232 communication device 2 links to each other with power supply.
Wherein on the device another identical multi-channel scanning test control device is installed, this device can guarantee after testing for the first time, to utilize identical device once more testing element 6 to be tested, and the data that the assurance test draws are more accurate.
During concrete the application; After device starts; At first RS232 communication device 2 makes 5 declines of multi-channel test probe unit contact with testing element 6 through resistance test instrument apparatus 3, and the back multi-channel test probe unit 5 that contacts stops, multi-path digital amount I/O device 1 startup this moment; Multi-path digital amount I/O device 1 control multicircuit relay output unit 4 is opened; Cause a test probe of multi-channel test probe unit 5 to communicate, test out through multicircuit relay output unit 4 and the size of resistance test instrument apparatus 3 again, then turn-off the path that multicircuit relay output unit 4 is opened through program with element with a element in the testing element 6; And then open another multicircuit relay output unit 4 and its corresponding elements path again and record the size of component values through program, accomplish until element test.The size that wherein records element is saved in the resistance test device 3, tests the back again through the software contrast with its same apparatus again, guarantees that the component values that records is more accurate.
In sum; Through being installed in the multicircuit relay output unit between resistance test instrument apparatus and the multi-channel test probe unit; Communicate with the multi-channel test probe unit in the control multicircuit relay output unit and close, improved the speed of testing element, and improved production efficiency.
It is emphasized that: above only is preferred embodiment of the present invention; Be not that the present invention is done any pro forma restriction; Every foundation technical spirit of the present invention all still belongs in the scope of technical scheme of the present invention any simple modification, equivalent variations and modification that above embodiment did.
Claims (2)
1. multi-channel scanning test control device; Comprise resistance test instrument apparatus, RS232 communication device and multi-channel test probe unit; The output terminal of said RS232 communication device links to each other with the input end of resistance test instrument apparatus; It is characterized in that: the end in each test probe of said multi-channel test probe unit interconnects; The interconnective end of said each test probe links to each other with the output terminal of resistance test instrument apparatus, and another input end of said each test probe links to each other with the output terminal of multicircuit relay output unit, and the output terminal of said multi-channel test probe unit links to each other with testing element; The output terminal of said resistance test instrument apparatus links to each other with the input end of multicircuit relay output unit, and the input end of said multicircuit relay output unit links to each other with the output terminal of multi-path digital amount I/O device.
2. multi-channel scanning test control device according to claim 1 is characterized in that: the input end of said multi-path digital amount I/O device and RS232 communication device links to each other with power supply.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2011102831966A CN102435880A (en) | 2011-09-22 | 2011-09-22 | Multichannel scan test and control device |
Applications Claiming Priority (1)
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CN2011102831966A CN102435880A (en) | 2011-09-22 | 2011-09-22 | Multichannel scan test and control device |
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CN102435880A true CN102435880A (en) | 2012-05-02 |
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CN2011102831966A Pending CN102435880A (en) | 2011-09-22 | 2011-09-22 | Multichannel scan test and control device |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4746855A (en) * | 1984-03-14 | 1988-05-24 | Teradyne, Inc. | Relay multiplexing for circuit testers |
CN2521613Y (en) * | 2002-01-18 | 2002-11-20 | 华东理工大学 | Array type scanning probe conductivity measuring instrument |
CN202256528U (en) * | 2011-09-22 | 2012-05-30 | 苏州慧捷自动化科技有限公司 | Multichannel scanning test control device |
-
2011
- 2011-09-22 CN CN2011102831966A patent/CN102435880A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4746855A (en) * | 1984-03-14 | 1988-05-24 | Teradyne, Inc. | Relay multiplexing for circuit testers |
CN2521613Y (en) * | 2002-01-18 | 2002-11-20 | 华东理工大学 | Array type scanning probe conductivity measuring instrument |
CN202256528U (en) * | 2011-09-22 | 2012-05-30 | 苏州慧捷自动化科技有限公司 | Multichannel scanning test control device |
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Application publication date: 20120502 |