CN102355594B - The measuring method of a kind of backlight affected areas in liquid crystal television set and device - Google Patents

The measuring method of a kind of backlight affected areas in liquid crystal television set and device Download PDF

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Publication number
CN102355594B
CN102355594B CN201110287542.8A CN201110287542A CN102355594B CN 102355594 B CN102355594 B CN 102355594B CN 201110287542 A CN201110287542 A CN 201110287542A CN 102355594 B CN102355594 B CN 102355594B
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China
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backlight
brightness
point
display screen
measuring
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CN201110287542.8A
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Chinese (zh)
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CN102355594A (en
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杨杰
徐爱臣
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青岛海信电器股份有限公司
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Abstract

The invention discloses measuring method and the device of a kind of backlight affected areas in liquid crystal television set, it is wide that described measuring method has several by design one, the graph card of contour grid, at this graph card of display screen display to be debugged, luminance meter is utilized to measure the brightness of each measurement point selected, then the brightness value measuring point is utilized to calculate each brightness percentage relative to the light-source brightness of the backlight opened measuring point, obtain the brightness percentage measuring point, and then judge the backlight opened influence area on display screen to be debugged according to the brightness percentage measuring point.The present invention determines, with the method for quantization parameter, the liquid crystal display region that single LED backlight is affected, and then lights sequential according to what the liquid crystal response in influence area and this region determined this road backlight.Avoid the error that artificial subjective determination influence area produces, and it is synchronization with what liquid crystal display responded more intuitively to accomplish that LED-backlit lights sequential, improves the debugging efficiency of 3D tv effect.

Description

The measuring method of a kind of backlight affected areas in liquid crystal television set and device

Technical field

The present invention relates to LCD TV backlight technical field, specifically, relate to measuring method and the device of a kind of backlight affected areas in liquid crystal television set.

Background technology

Along with the progress of information technology, 3D LCD TV is increasingly universal, and shutter 3D LCD TV is can keep picture original resolution, can enjoy the advantage of full HD 3D effect, occupies main flow in the market.Shutter 3D LCD TV is by improving picture refreshing rate, again a two field picture is divided into two and forms the two continuous interlaced display in a series of paintings face of corresponding right and left eyes, open right eyeglass when TV display right eye picture, close left eyeglass, and open left eyeglass when showing left eye picture, close right eyeglass, it is ensured that each frame picture can enter correctly into the right and left eyes of people and finally synthesize 3D image at brain.

The most concern is three-dimensional stereo effect during viewing 3D TV, and the main factor affecting shutter 3D tv effect at present is crosstalk, i.e. left eye sees that the image of right eye, right eye see the image of left eye.Occur crosstalk main reason is that the LED backlight as backlight light sequential and liquid crystal display respond, the switch of 3D glasses the most synchronize, wherein, backlight light that sequential responds with liquid crystal display synchronization particularly important.And LED-backlit to be accomplished to light sequential synchronization with what liquid crystal display responded, measure the region of impact when every paths of LEDs backlight is individually lighted and be very important.

At present when debugging the 3D effect of LCD TV, tuner relies primarily on individual and observes the region illuminated when subjective assessment single LED backlight is opened, and it will be seen that the bright region of comparison be defaulted as the region that this paths of LEDs lamp is affected.This method determining single LED backlight influence area lacks accurate, a unified quantization parameter, and subjective judgement is relatively strong, and different tuners can produce different results, and result uniformity is poor, accuracy is relatively low to cause debugging.Although prior art can also use the measuring method of darkroom and instrumentation to determine the region that every paths of LEDs backlight affects, but the method is highly inconvenient for debugging 3D LCD TV at present, because there being multiple 3D liquid crystal display to need to carry out the debugging of backlight sequential, often one display screen of debugging darkroom of arriving is measured once, and debugging efficiency is extremely inefficient.

Summary of the invention

The present invention is directed in prior art the problems referred to above present in LCD TV 3D effect debugging process, propose measuring method and the measurement apparatus of a kind of backlight affected areas in liquid crystal television set, determine, with the method for quantization parameter, the liquid crystal display region that single LED backlight is affected, and then light sequential according to what the liquid crystal response in influence area and this region determined this road backlight.

For achieving the above object, the measuring method of the backlight affected areas in liquid crystal television set that the present invention proposes uses following technical proposals to be achieved:

The measuring method of a kind of backlight affected areas in liquid crystal television set, described method comprises the steps:

A, one graph card with several grids wide, contour of design, at this graph card of display screen display to be debugged;

B, selection graph card are specified the display screen at grid as measuring point;

C, open a wherein road backlight, utilize luminance meter to measure each brightness measuring point, it is thus achieved that to measure the brightness value of point;

D, the brightness value of utilization measurement point calculate the brightness percentage relative to the light-source brightness of the backlight opened of each measurement, it is thus achieved that the brightness percentage of measurement point;

E, judge the backlight the opened influence area on display screen to be debugged according to the brightness percentage measuring point.

Measuring method as above, in described step e, if the brightness percentage measuring point is more than setting value, then judges the influence area measuring some position as the backlight opened;Otherwise, it is determined that measuring some position is the region not affected by the backlight opened.

Measuring method as above, described setting value is preferably 10%.

Measuring method as above, in described step b, specifically can select the appointment grid in graph card according to the feature that dissipates of the backlight in display screen to be debugged, to ensure the accuracy measured, simplifies measurement process simultaneously.

Measuring method as above, in described step c, when utilizing the brightness that luminance meter measures point, the center specifying grid that the alignment probe of luminance meter measures point corresponding measures.

Measuring method as above, for ease of measuring, width and the height of each grid in described graph card are equal.

For realizing aforementioned invention purpose, the measurement apparatus of the backlight affected areas in liquid crystal television set that the present invention proposes uses following technical proposals to be achieved:

A kind of measurement apparatus of backlight affected areas in liquid crystal television set, including:

Graph card, this graph card is provided with several wide, contour grids, and this graph card shows on display screen to be debugged;

Luminance meter, for measuring the brightness measuring point in display screen, and the light-source brightness of the backlight of display screen to be debugged, wherein, select graph card to be specified the display screen at grid as measuring point;

Computing unit, for the brightness of computation and measurement point relative to the percentage of the light-source brightness of the backlight opened;

Identifying unit, for judging the backlight opened influence area on display screen to be debugged according to the brightness percentage measuring point.

Measurement apparatus as above, first the brightness percentage measuring point compared by described identifying unit with setting value, if the brightness percentage of measurement point is more than setting value, then judges the influence area measuring some position as the backlight opened;Otherwise, it is determined that measuring some position is the region not affected by the backlight opened.

Measurement apparatus as above, described setting value is preferably 10%.

Measurement apparatus as above, the grid of specifying in described graph card selects according to the feature that dissipates of the backlight in display screen to be debugged, to ensure the accuracy measured, simplifies measurement process simultaneously;And when the brightness utilizing described luminance meter to measure point, the center specifying grid that the alignment probe of luminance meter measures point corresponding measures.

Compared with prior art, advantages of the present invention and good effect be: the brightness in each region and calculate each regional luminance brightness percentage relative to backlight light source on liquid crystal display when the present invention opens by measuring single channel backlight, and determine the single channel backlight influence area to LCDs with brightness percentage for quantization parameter, and then the work schedule of backlight can be adjusted according to the liquid crystal response in backlight influence area and this region, thus avoid the error that artificial subjective determination influence area produces, and it is synchronization with what liquid crystal display responded more intuitively to accomplish that LED-backlit lights sequential, improve the debugging efficiency of 3D tv effect.

After reading in conjunction with the accompanying the detailed description of the invention of the present invention, the other features and advantages of the invention will become clearer from.

Accompanying drawing explanation

Fig. 1 is the structural representation of one embodiment of backlight affected areas in liquid crystal television set measurement apparatus of the present invention;

Fig. 2 is the flow chart of one embodiment of backlight affected areas in liquid crystal television set measuring method of the present invention;

Fig. 3 is the structural representation of graph card used by Fig. 2 embodiment;

Fig. 4 be in Fig. 2 embodiment backlight dissipate trend schematic diagram.

Detailed description of the invention

With detailed description of the invention, technical scheme is described in further detail below in conjunction with the accompanying drawings.

The present invention is directed to prior art when debugging the 3D display effect of TV display screen, use subjective observation and judge TV display screen backlight influence area as adjust backlight light sequential according to and the problem that error is big, accuracy is low that exists, it is proposed that a kind of method and device using concrete quantization parameter measurement backlight influence area.The detailed description of the invention of the method and device refers to illustrating of following embodiment.

Fig. 1 shows the structural representation of one embodiment of backlight affected areas in liquid crystal television set measurement apparatus of the present invention.

As it is shown in figure 1, this embodiment includes following each unit to the measurement apparatus that LCDs 11 carries out the measurement of backlight influence area:

Graph card 12, this graph card is provided with several wide, contour grids, and when carrying out backlight influence area and measuring, this graph card 12 shows on LCDs 11 to be debugged.The structure of graph card 12 refers to Fig. 3 schematic diagram and the following description to Fig. 3.

Luminance meter 13, for measuring the brightness measuring point in LCDs 11, and the light-source brightness of the backlight of LCDs 11 to be debugged.The determination measuring point of LCDs 11 and brightness measurement method refer to after description to Fig. 2 to Fig. 4 embodiment of the method.

Computing unit 14, for the brightness percentage relative to the light-source brightness of the backlight opened measuring some brightness value and light-source brightness computation and measurement point recorded according to luminance meter 13.

Identifying unit 15, the brightness percentage measuring point for obtaining according to computing unit 14 judges the backlight opened influence area on LCDs 11 to be debugged, and then adjusts the work schedule of backlight according to the liquid crystal response in this region.

The operation principle of the measurement apparatus of above-described embodiment and process refer to the description of following embodiment of the method.

Fig. 2 to Fig. 4 show an embodiment of backlight affected areas in liquid crystal television set measuring method of the present invention based on Fig. 1 device embodiment, wherein, Fig. 2 is the flow chart of this embodiment, Fig. 3 is the structural representation of graph card used by this embodiment, and Fig. 4 is that the dispersion of backlight in this embodiment tends to schematic diagram.

The method embodiment is as a example by 42 cun of LCDs, and LCDs has the six paths of LEDs backlights being distributed up and down, and backlight enters light mode for left and right side provides backlight.

As it is shown in figure 1, the process of this examples measure single LED backlight backlight influence area is as follows:

S21: measurement process starts.

S22: design graph card, at this graph card of display screen display to be debugged.

Wherein, the structure of designed graph card is as shown in Figure 3, the big of this graph card matches less than LCDs size, and on this graph card, it is provided with several wide, contour grids, the width of the most all grids and height are equal, during to ensure to show this graph card on a display screen, the pixel that each grid covers is identical.Additionally, for ease of the brightness of display screen at luminance meter examination network, each grid can also be designed as width and height is equal.LCDs for this embodiment 42 cun, the graph card of design is to have 24 row, 43 row 43*24 grid altogether, so the graph card of design is when liquid crystal display screen display, for the display screen that resolution ratio is 1080*1920, the width of each grid and height are equal, i.e. 1080/24=1920/43.After designing graph card, can graph card be shown on LCDs by USB flash disk, play this graph card on a display screen.The six paths of LEDs backlights for LCDs, often row LED backlight correspond to 4 row grids in graph card respectively, i.e. 1-4 row grid correspondence LED1,5-8 row grid correspondence LED2,9-12 row grid correspondence LED3,13-16 row grid correspondence LED4,17-20 row grid correspondence LED5,21-24 row grid correspondence LED6.

S23: select to specify the display screen at grid as measuring point in graph card.

When turning on certain paths of LEDs lamp and carrying out brightness measurement, the display screen corresponding to grid each in graph card all can be measured.Although so can measure the brightness of display screen each point comprehensively, but owing to grid is more, measure process complicated.In view of actual diversity and the structure of grid of light, some specific, representative points can be selected as brightness measurement point.Specifically, according to the specific appointment grid selected in graph card that dissipates of the backlight in display screen to be debugged, and display screen that grid is corresponding can will be specified as measuring point.In this embodiment, LED backlight is that left and right enters light mode, and it dissipates trend as shown in Figure 4.In conjunction with the graph card of Fig. 3 structure, the grids being positioned at 2 row, 11 row, 22 row, 32 row and 42 row can be selected as specifying grid, and screen position that grid is corresponding will be specified as pattern measurement point.

S24: open a paths of LEDs backlight, measures each brightness measuring point.

As a example by the 3rd paths of LEDs backlight, open this paths of LEDs backlight, utilize luminance meter 13 to measure each brightness measuring point, to obtain the brightness value measuring point.When utilizing luminance meter 13 to measure, owing to grid is width and the equal square structure of length, the center specifying grid that locating tab assembly point is corresponding is measured by the circular probe of luminance meter, it is possible to obtain measure a some brightness value the most accurately.

S25: calculate each measurement point percentage relative to backlight light-source brightness.

Backlight light-source brightness is also adopted by luminance meter 13 and measures, and after recording light-source brightness, uses computing unit 14 to calculate each measurement point percentage relative to backlight light-source brightness.When calculating brightness percentage, owing to backlight is that left and right sides enters light, in corresponding graph card, the light measuring point of the 2nd row and the 11st row grid mostlys come from left side LED, the light measuring point of corresponding 32nd and 42 row grids mostlys come from right side LED, and the light measuring point of the 22nd row grid is by left side LED and the joint effect of right side LED in the middle of correspondence graph card, so, when calculating brightness percentage, point of measuring at 2nd row and the 11st row grid is the percentage relative to left side LED light source brightness, point of measuring at 32nd and the 42nd row grid is the percentage relative to right side LED light source brightness, and the point of measuring at the 22nd row grid is relative to left side LED brightness and the percentage of right side LED average brightness.

S26: judge the backlight opened influence area on display screen to be debugged according to the brightness percentage measuring point.

After obtaining the brightness percentage of measurement point, brightness percentage and a setting value being compared, this setting value can determine according to backlight sequential Adjustment precision and 3D effect, and in this embodiment, setting value elects 10% as.If the brightness percentage of measurement point is more than 10%, then judge to measure the region that a position is affected by the backlight opened, if the brightness percentage measuring point is not more than 10%, then judge to measure some position as the region not affected by the backlight opened.And, owing to LCDs uses addressing system from top to bottom, then backlight is also to be scanned the most line by line, therefore, have only to the grid line number determining in the graph card that the LED opened is affected according to the position measuring point, without the grid columns considered in graph card.If it is to say, measuring point is backlight influence area, then assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is backlight influence area;If measuring point is the region not affected by backlight, then assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is the region not affected by backlight.

In this embodiment, judging according to brightness percentage, when opening the 3rd paths of LEDs backlight, in graph card 12, the brightness percentage of the display screen area that the 3rd to the 16th row grid is corresponding is more than 10%, and this region is the influence area of the 3rd paths of LEDs backlight.Therefore, liquid crystal response in conjunction with backlight influence area Yu this region, when carrying out 3D effect debugging, before liquid crystal Hold the to be departed from state of the display screen that the opening time of the 3rd paths of LEDs backlight should control after the liquid crystal of display screen corresponding to the 13rd to 16 row grid rises and arrives Hold state and the 3rd row grid is corresponding, so can avoid the generation of crosstalk to greatest extent, it is ensured that preferably 3D display effect.

S27: flow process terminates.

For the LED backlight on other roads, it is also adopted by said method and judges its region affected, and then the liquid crystal response further according to this region determines that it lights sequential.

Although said method embodiment by 42 cun, as a example by left and right sides enters the LCDs of light mode, but be not limited thereto, the LCDs of other sizes or other modes enter the LCDs of light, and said method all can be used to determine its backlight influence area.

Above example is only in order to illustrate technical scheme, rather than is limited;Although the present invention being described in detail with reference to previous embodiment, for the person of ordinary skill of the art, still the technical scheme described in previous embodiment can be modified, or wherein portion of techniques feature is carried out equivalent;And these amendments or replacement, do not make the essence of appropriate technical solution depart from the spirit and scope of claimed technical solution of the invention.

Claims (7)

1. the measuring method of a backlight affected areas in liquid crystal television set, it is characterised in that described method comprises the steps:
A, one graph card with several grids wide, contour of design, at this graph card of display screen display to be debugged;
Specifying the display screen at grid as measuring point in b, selection graph card, described measurement point is representative point;
C, open a wherein road backlight, utilize luminance meter to measure each brightness measuring point, it is thus achieved that to measure the brightness value of point;
D, the brightness value of utilization measurement point calculate the brightness percentage relative to the light-source brightness of the backlight opened of each measurement, it is thus achieved that the brightness percentage of measurement point;
If the brightness percentage that e measures point is more than setting value, then judges the influence area measuring some position as the backlight opened, and assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is backlight influence area;Otherwise, it is determined that measuring some position is the region not affected by the backlight opened, and assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is not by backlight influence area.
Measuring method the most according to claim 1, it is characterised in that described setting value is 10%.
Measuring method the most according to claim 1, it is characterised in that in described step c, when utilizing the brightness that luminance meter measures point, the center specifying grid that the alignment probe of luminance meter measures point corresponding measures.
Measuring method the most according to any one of claim 1 to 3, it is characterised in that width and the height of each grid in described graph card are equal.
5. the measurement apparatus of a backlight affected areas in liquid crystal television set, it is characterised in that described device includes:
Graph card, this graph card is provided with several wide, contour grids, and this graph card shows on display screen to be debugged;
Luminance meter, for measuring the brightness measuring point in display screen, and the light-source brightness of the backlight of display screen to be debugged, wherein, selecting graph card to be specified the display screen at grid as measuring point, described measurement point is representative point;
Computing unit, for the brightness of computation and measurement point relative to the percentage of the light-source brightness of the backlight opened;
Identifying unit, for judging the backlight opened influence area on display screen to be debugged according to the brightness percentage measuring point;First the brightness percentage measuring point compared by identifying unit with setting value, if measuring the brightness percentage of point more than setting value, then judge the influence area measuring some position as the backlight opened, and assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is backlight influence area;Otherwise, it is determined that measuring some position is the region not affected by the backlight opened, and assert that the display screen area that the mesh row measured in the graph card of some place is corresponding is not by backlight influence area.
Measurement apparatus the most according to claim 5, it is characterised in that described setting value is 10%.
Measurement apparatus the most according to claim 5, it is characterised in that the grid of specifying in described graph card selects according to the feature that dissipates of the backlight in display screen to be debugged;And when the brightness utilizing described luminance meter to measure point, the center specifying grid that the alignment probe of luminance meter measures point corresponding measures.
CN201110287542.8A 2011-09-26 2011-09-26 The measuring method of a kind of backlight affected areas in liquid crystal television set and device CN102355594B (en)

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CN103792066A (en) * 2012-11-01 2014-05-14 南京灿华光电设备有限公司 An optical detection method for vehicles
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CN102098830A (en) * 2009-12-14 2011-06-15 乐金显示有限公司 Method for analyzing light profile of light source and device for driving local dimming of liquid crystal display device by using the same
CN102122492A (en) * 2010-01-07 2011-07-13 唐瑞春 Region switch controlling method for luminous bodies of liquid crystal screen backlight component

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CN102122492A (en) * 2010-01-07 2011-07-13 唐瑞春 Region switch controlling method for luminous bodies of liquid crystal screen backlight component

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Address after: 266100 Zhuzhou Road, Laoshan District, Shandong, No. 151, No.

Patentee after: Hisense Video Technology Co., Ltd

Address before: 266100 Zhuzhou Road, Laoshan District, Shandong, No. 151, No.

Patentee before: HISENSE ELECTRIC Co.,Ltd.