CN102331410A - 表面等离子共振传感器模块及具有该模块的传感系统 - Google Patents

表面等离子共振传感器模块及具有该模块的传感系统 Download PDF

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Publication number
CN102331410A
CN102331410A CN2011101849322A CN201110184932A CN102331410A CN 102331410 A CN102331410 A CN 102331410A CN 2011101849322 A CN2011101849322 A CN 2011101849322A CN 201110184932 A CN201110184932 A CN 201110184932A CN 102331410 A CN102331410 A CN 102331410A
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CN
China
Prior art keywords
sensor
prism
main frame
sensor chip
light
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Pending
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CN2011101849322A
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English (en)
Chinese (zh)
Inventor
全富一
金龙圭
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Micobiomed Co Ltd
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Micobiomed Co Ltd
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Publication of CN102331410A publication Critical patent/CN102331410A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N2021/258—Surface plasmon spectroscopy, e.g. micro- or nanoparticles in suspension

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  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2011101849322A 2010-06-21 2011-06-21 表面等离子共振传感器模块及具有该模块的传感系统 Pending CN102331410A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20100058672A KR20110138657A (ko) 2010-06-21 2010-06-21 표면 플라즈몬 공명 센서 모듈 및 이를 포함한 센싱 시스템
KR10-2010-0058672 2010-06-21

Publications (1)

Publication Number Publication Date
CN102331410A true CN102331410A (zh) 2012-01-25

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Family Applications (1)

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CN2011101849322A Pending CN102331410A (zh) 2010-06-21 2011-06-21 表面等离子共振传感器模块及具有该模块的传感系统

Country Status (4)

Country Link
JP (1) JP2012002817A (ja)
KR (1) KR20110138657A (ja)
CN (1) CN102331410A (ja)
TW (1) TW201207377A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110100171A (zh) * 2017-01-16 2019-08-06 矢崎总业株式会社 高选择性腐蚀传感器系统

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI552343B (zh) * 2014-11-05 2016-10-01 國立成功大學 光驅動機械式電子元件及其操作方法
KR102544841B1 (ko) * 2021-01-28 2023-06-20 (주)퀀텀테크 프리즘유닛과 이것을 이용한 액상케미컬 농도측정장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000065735A (ja) * 1998-08-24 2000-03-03 Nippon Laser Denshi Kk 表面プラズモン共鳴角検出装置及び試料供給方法
JP2006200931A (ja) * 2005-01-18 2006-08-03 Fuji Photo Film Co Ltd センサユニット
CN101156228A (zh) * 2005-10-21 2008-04-02 韩国生命工学研究院 一种制作纳米间隙和纳米间隙传感器的方法
JP2008209278A (ja) * 2007-02-27 2008-09-11 Aisin Seiki Co Ltd センサチップ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11183372A (ja) * 1997-12-19 1999-07-09 Toto Ltd Ｓｐｒセンサ装置および分析システムとこれを用いた検出方法
JP2005017225A (ja) * 2003-06-27 2005-01-20 Aisin Seiki Co Ltd センサチップ及びセンサチップ収納ユニット並びに表面プラズモン共鳴測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000065735A (ja) * 1998-08-24 2000-03-03 Nippon Laser Denshi Kk 表面プラズモン共鳴角検出装置及び試料供給方法
JP2006200931A (ja) * 2005-01-18 2006-08-03 Fuji Photo Film Co Ltd センサユニット
CN101156228A (zh) * 2005-10-21 2008-04-02 韩国生命工学研究院 一种制作纳米间隙和纳米间隙传感器的方法
JP2008209278A (ja) * 2007-02-27 2008-09-11 Aisin Seiki Co Ltd センサチップ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110100171A (zh) * 2017-01-16 2019-08-06 矢崎总业株式会社 高选择性腐蚀传感器系统

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JP2012002817A (ja) 2012-01-05
KR20110138657A (ko) 2011-12-28
TW201207377A (en) 2012-02-16

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Application publication date: 20120125