CN101964319A - Wafer transmission system of ion implantation machine and wafer transmission method thereof - Google Patents
Wafer transmission system of ion implantation machine and wafer transmission method thereof Download PDFInfo
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Abstract
本发明涉及一种离子注入机晶圆传送系统及其晶圆传送方法。一种离子注入机晶圆传送系统,其包括真空靶室、左输片机械手、中输片机械手、右输片机械手、左隔离阀门、右隔离阀门、左片库、右片库及离子注入靶台;左输片机械手、中输片机械手、右输片机械手均固定在真空靶室内;左隔离阀门隔离左片库和真空耙室,右隔离阀门隔离右片库和真空耙室;离子注入靶台位于真空耙室内;左输片机械手的工作位包括左片库和离子注入靶台,中输片机械手的工作位包括左片库、右片库和离子注入靶台,右输片机械手的工作位包括右片库和离子注入靶台。该系统使用了三台机械手来配合传送晶圆,大大提高了晶圆传送的效率。
The invention relates to a wafer delivery system of an ion implanter and a wafer delivery method thereof. A wafer transfer system for an ion implanter, which includes a vacuum target chamber, a left film conveying manipulator, a middle film conveying manipulator, a right film conveying manipulator, a left isolation valve, a right isolation valve, a left film storehouse, a right film storehouse and an ion implantation target The left, middle, and right film conveying manipulators are all fixed in the vacuum target chamber; the left isolation valve isolates the left film warehouse from the vacuum rake chamber, and the right isolation valve isolates the right film warehouse from the vacuum rake chamber; the ion implantation target The table is located in the vacuum rake chamber; the working position of the left film transporting manipulator includes the left film magazine and ion implantation target platform; Bits include the right film library and ion implantation target stage. The system uses three manipulators to cooperate with the transfer of wafers, which greatly improves the efficiency of wafer transfer.
Description
技术领域technical field
本发明涉及集成电路制造装备领域,特别涉及一种离子注入机晶圆传送系统及其晶圆传送方法。The invention relates to the field of integrated circuit manufacturing equipment, in particular to an ion implanter wafer delivery system and a wafer delivery method thereof.
背景技术Background technique
离子注入技术是近30年来在国际上蓬勃发展和广泛应用的一种材料表面改性高新技术。其基本原理是:用能量为100keV量级的离子束入射到材料中去,离子束与材料中的原子或分子将发生一系列物理的和化学的相互作用,入射离子逐渐损失能量,最后停留在材料中,并引起材料表面成分、结构和性能发生变化。离子注入技术已经在半导体材料掺杂上获得了极为广泛的应用。离子注入机晶圆传送系统是离子注入机的一个重要组成部分,它主要完成晶圆在系统中的传输以及与生产线上晶圆的交换。在晶圆传输系统设计中,最为重要的是设计合理的晶圆传输路线方案,以提高晶圆传输效率从而达到较高的生产率以达到降低半导体制造成本的目的。随着集成电路制造行业的高速发展,高传输效率的晶圆传送系统已成为该行业的迫切需要。Ion implantation technology is a high-tech material surface modification technology that has been vigorously developed and widely used internationally in the past 30 years. The basic principle is: use an ion beam with an energy of 100keV to enter the material, a series of physical and chemical interactions will occur between the ion beam and the atoms or molecules in the material, the incident ions will gradually lose energy, and finally stay in the In the material, and cause changes in the surface composition, structure and properties of the material. Ion implantation technology has been widely used in doping semiconductor materials. The ion implanter wafer transfer system is an important part of the ion implanter, which mainly completes the transfer of wafers in the system and the exchange with wafers on the production line. In the design of the wafer transfer system, the most important thing is to design a reasonable wafer transfer route scheme to improve the efficiency of wafer transfer to achieve higher productivity and reduce semiconductor manufacturing costs. With the rapid development of the integrated circuit manufacturing industry, a high-efficiency wafer transfer system has become an urgent need for the industry.
文献号为EP0559360A1的欧洲专利中提出了一种单机械手晶圆传送系统,由于该系统只使用了一台机械手来传送晶圆,无法并行工作,导致了晶圆传送效率低。European Patent No. EP0559360A1 proposes a single-manipulator wafer transfer system. Since the system only uses one manipulator to transfer wafers, it cannot work in parallel, resulting in low wafer transfer efficiency.
另外,专利号为200520142510的中国专利中提出了一种双传送机构的晶圆传送控制系统,该系统使用两个晶圆定位与传送系统配合传送晶圆,并在真空靶室内完成晶圆的定位过程(即由晶圆定位与传送装置完成定位和传送双重任务)。该系统将晶圆定位过程放到真空靶室内降低了离子注入机晶圆传送的整体效率。另外,该系统虽然有两个盛放晶圆的空间,但在每个空间内都只有一个传送机构工作,传送效率仍有待提高。In addition, Chinese Patent No. 200520142510 proposes a wafer transfer control system with dual transfer mechanisms, which uses two wafer positioning and transfer systems to transfer wafers, and completes the positioning of wafers in the vacuum target chamber process (that is, the dual tasks of positioning and conveying are completed by the wafer positioning and conveying device). This system puts the wafer positioning process in the vacuum target chamber and reduces the overall efficiency of ion implanter wafer transport. In addition, although the system has two spaces for holding wafers, only one transport mechanism works in each space, and the transport efficiency still needs to be improved.
发明内容Contents of the invention
(一)要解决的技术问题(1) Technical problems to be solved
本发明要解决的技术问题是如何提高离子注入机中晶圆的传送效率。The technical problem to be solved by the invention is how to improve the transfer efficiency of the wafer in the ion implanter.
(二)技术方案(2) Technical solutions
为了解决上述技术问题,提供一种离子注入机晶圆传送系统,其包括真空靶室、左输片机械手、中输片机械手、右输片机械手、左隔离阀门、右隔离阀门、左片库、右片库及离子注入靶台;左输片机械手、中输片机械手、右输片机械手均固定在真空靶室内,三者依左中右排布;左隔离阀门隔离所述左片库和真空耙室,右隔离阀门隔离所述右片库和真空耙室;离子注入靶台位于所述真空耙室内;左输片机械手的工作位包括左片库和离子注入靶台,中输片机械手的工作位包括左片库、右片库和离子注入靶台,右输片机械手的工作位包括右片库和离子注入靶台。In order to solve the above-mentioned technical problems, an ion implanter wafer transfer system is provided, which includes a vacuum target chamber, a left film conveying manipulator, a middle film conveying manipulator, a right film conveying manipulator, a left isolation valve, a right isolation valve, a left film warehouse, The right film library and ion implantation target platform; the left film transport manipulator, the middle film transport manipulator and the right film transport manipulator are all fixed in the vacuum target chamber, and the three are arranged according to the left, middle and right; the left isolation valve isolates the left film store and the vacuum Rake chamber, the right isolation valve isolates the right film library and vacuum rake chamber; the ion implantation target platform is located in the vacuum rake chamber; the working position of the left film transport manipulator includes the left film storehouse and ion implantation target platform, The working station includes the left film magazine, the right film magazine and the ion implantation target platform, and the working station of the right film conveying manipulator includes the right film magazine and the ion implantation target platform.
进一步的技术方案是,所述左片库和右片库的晶盒中所盛放的晶圆为已完成定位的晶圆。A further technical solution is that the wafers contained in the cassettes of the left and right magazines are wafers that have been positioned.
再进一步的技术方案是,所述左片库和右片库中均设有气泵。A still further technical solution is that air pumps are provided in the left film storehouse and the right film storehouse.
再进一步的技术方案是,所述左输片机械手、右输片机械手相对于中输片机械手对称设置。A further technical solution is that the left film conveying manipulator and the right film conveying manipulator are arranged symmetrically with respect to the middle film conveying manipulator.
再进一步的技术方案是,所述左片室和右片室相对于所述中输片机械手对称设置。A still further technical solution is that the left film chamber and the right film chamber are arranged symmetrically with respect to the middle film conveying manipulator.
为了解决上述技术问题,还提供一种晶圆传送方法,其包括如下步骤:In order to solve the above-mentioned technical problems, a wafer transfer method is also provided, which includes the following steps:
(1)大气机械手将多片已完成定位的晶圆从真空靶室外部的大气环境中放入右片库的片盒中,然后右片库关闭,右片库中的气泵开始工作,气泵将右片库中的空气抽出,直到右片库中的真空度和真空靶室内的真空度相同时,气泵停止工作,右隔离阀门打开;(1) Atmospheric manipulator puts multiple wafers that have been positioned into the cassette of the right film library from the atmospheric environment outside the vacuum target chamber, then the right film library is closed, and the air pump in the right film library starts to work, and the air pump will The air in the right film library is pumped out until the vacuum degree in the right film library is the same as the vacuum degree in the vacuum target chamber, the air pump stops working, and the right isolation valve opens;
(2)右输片机械手伸入右片库的片盒中取晶圆,取到晶圆后,右输片机械手带着晶圆收缩到右机械手的初始位置,同时中输片机械手将离子注入靶台上已完成离子注入的晶圆取走,并收缩到中输片机械手的初始位置;(2) The right film transporting manipulator reaches into the cassette of the right film library to take the wafer. After taking the wafer, the right film transporting manipulator shrinks the wafer to the initial position of the right manipulator, and at the same time, the middle film transporting manipulator implants ions The ion-implanted wafers on the target stage are taken away and retracted to the initial position of the mid-transfer manipulator;
(3)右输片机械手及中输片机械手旋转并分别对准离子注入靶台和右片库;(3) The right film transport manipulator and the middle film transport manipulator rotate and align with the ion implantation target platform and the right film library respectively;
(4)右输片机械手伸出,将晶圆送到离子注入靶台上,然后右输片机械手收缩一段安全距离,等待晶圆完成离子注入过程;同时,中输片机械手伸出,将已完成离子注入的晶圆送到右片库中的片盒中,然后中输片机械手收缩一段安全距离,等待右片库中的片盒完成升降过程;(4) The right wafer transporting manipulator stretches out to send the wafer to the ion implantation target table, then the right film transporting manipulator retracts for a safe distance, and waits for the wafer to complete the ion implantation process; at the same time, the middle film transporting manipulator extends to place the The ion-implanted wafers are sent to the cassettes in the right library, and then the middle transfer manipulator retracts for a safe distance, waiting for the cassettes in the right library to complete the lifting process;
(5)右输片机械手伸出,将完成离子注入的晶圆从离子注入靶台上取走,右输片机械手带着晶圆收缩回到右输片机械手的初始位置;同时,中输片机械手伸入右片库中,取出一片待进行离子注入的晶圆,并收缩到中输片机械手的初始位置;(5) The right film transporting manipulator stretches out to take the ion-implanted wafer away from the ion implantation target table, and the right film transporting manipulator takes the wafer and shrinks back to the initial position of the right film transporting manipulator; at the same time, the middle transporting film The manipulator extends into the right film library, takes out a wafer to be ion-implanted, and shrinks to the initial position of the middle transport manipulator;
(6)右输片机械手及中输片机械手旋转并分别对准右片库及离子注入靶台;(6) The right film feeding manipulator and the middle film transporting manipulator rotate and align with the right film library and ion implantation target platform respectively;
(7)右输片机械手完成离子注入的晶圆送回右片库的片盒中,然后右输片机械手收缩一段安全距离,等待右片库中的片盒完成升降过程;同时,中输片机械手伸出,将待进行离子注入的晶圆送到离子注入靶台上,然后中输片机械手收缩一段安全距离,等待晶圆完成离子注入过程;(7) The ion-implanted wafers completed by the right film transporting manipulator are sent back to the film cassette of the right film warehouse, and then the right film transporting manipulator shrinks for a safe distance, waiting for the film cassette in the right film warehouse to complete the lifting process; at the same time, the middle transporting film The manipulator stretches out, and sends the wafer to be ion-implanted to the ion-implantation target platform, and then retracts the film transport manipulator for a safe distance, waiting for the wafer to complete the ion-implantation process;
(8)整个系统重复上述(2)-(7)的步骤,直到右片库中所有的晶圆完成离子注入;(8) The whole system repeats the above steps (2)-(7) until all the wafers in the right library complete the ion implantation;
在进行上述(2)-(8)的步骤时,左片库也在完成步骤(1)的工作:大气机械手将多片已完成定位的晶圆从靶室外部的大气环境中放入左片库的片盒中,然后左片库关闭,左片库中的气泵开始工作,气泵将左片库中的空气抽出,直到左片库中的真空度和靶室内真空度相同时,气泵停止工作;当右片库中所有的晶圆完成离子注入后,右隔离阀门关闭,左隔离阀门打开;然后左输片机械手和中输片机械手相互配合完成和上述(2)-(8)相同的步骤。When performing the above steps (2)-(8), the left film library is also completing the work of step (1): the atmospheric manipulator puts multiple positioned wafers into the left film from the atmospheric environment outside the target chamber Then the left film library is closed, the air pump in the left film library starts to work, and the air pump pumps out the air in the left film library until the vacuum degree in the left film library is the same as the vacuum degree in the target chamber, and the air pump stops working ; After all the wafers in the right library have completed ion implantation, the right isolation valve is closed, and the left isolation valve is opened; then the left and middle transport manipulators cooperate with each other to complete the same steps as (2)-(8) above .
(三)有益效果(3) Beneficial effects
本发明离子注入机晶圆传送系统使用了三台机械手来配合传送晶圆。在传送任意一个片库中的晶圆时,两个机械手之间可以并行传送,只不过他们的传送顺序正好错开,以避免在实际工作中两机械手运送晶圆时发生干涉。这样大大提高了晶圆传送的效率。此外,本发明离子注入机晶圆传送系统为了更进一步提高晶圆的传送效率,将晶圆定位过程放到了真空耙室外,即左片库和右片库的晶盒中所盛放的晶圆为已完成定位的晶圆。The wafer transfer system of the ion implanter of the present invention uses three manipulators to coordinately transfer the wafer. When transferring the wafers in any library, the two manipulators can be transferred in parallel, but their transfer order is just staggered to avoid interference when the two manipulators transport the wafers in actual work. This greatly improves the efficiency of wafer transfer. In addition, in order to further improve the wafer transfer efficiency of the ion implanter wafer transfer system of the present invention, the wafer positioning process is placed outside the vacuum rake room, that is, the wafers contained in the wafer boxes of the left and right wafer magazines is a wafer that has been positioned.
附图说明Description of drawings
图1是本发明离子注入机晶圆传送系统结构示意图;Fig. 1 is a schematic structural view of the wafer delivery system of the ion implanter of the present invention;
图2是本发明晶圆传送方法流程简图。FIG. 2 is a schematic flowchart of the wafer transfer method of the present invention.
下面结合附图和具体实施例对本发明离子注入机晶圆传送系统及晶圆传送方法进行详细介绍。The wafer transfer system and wafer transfer method of the ion implanter of the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
具体实施方式Detailed ways
参见图1,离子注入机晶圆传送系统包括真空靶室1、左输片机械手2、中输片机械手3、右输片机械手4、左隔离阀门5、右隔离阀门6、左片库7、右片库8及离子注入靶台9。左输片机械手2、中输片机械手3、右输片机械手4均固定在真空靶室1内,三者依左中右排布。左输片机械手2、右输片机械手4相对于中输片机械手3对称设置。左隔离阀门5隔离左片库7和真空耙室9;右隔离阀门6隔离右片库8和真空耙室9。左片库7和右片库8的晶盒中所盛放的晶圆为已完成定位的晶圆。左片室7和右片室8相对于中输片机械手3对称设置。离子注入靶台9位于真空耙室1内。左输片机械手2的工作位包括左片库7和离子注入靶台9,中输片机械手3的工作位包括左片库7、右片库8和离子注入靶台9,右输片机械手4的工作位包括右片库8和离子注入靶台9。图1中的虚线分别表示各个机械手的工作路线。当然,各个机械手还有其工作初始位置。在左片库7和右片库8中均设有用于抽真空的气泵(图未示)。Referring to Fig. 1, the ion implanter wafer transfer system includes a
参见图2,图2是晶圆传送的流程简图,图中每个虚线框内的上下两部分流程为同步进行,具体地说,右边的虚线框表示:“右隔离门打开,然后右输片机械手和中输片机械手配合传送右片库中所有晶圆,使其完成离子注入”,与此同时,“耙室外部的大气输片机械手将已完成定位的晶圆送入左片库的片盒中,然后左片库抽真空”。左边的虚线框表示:“耙室外部的大气输片机械手将已完成定位的晶圆送入右片库的片盒中,然后右片库抽真空”,与此同时,“左隔离门打开,然后左输片机械手和中输片机械手配合传送左片库中所有晶圆,使其完成离子注入”。上述晶圆传送过程循环重复进行。Refer to Fig. 2, Fig. 2 is a simplified flow chart of wafer transfer. The upper and lower parts of each dotted box in the figure are carried out synchronously. Specifically, the dotted box on the right indicates: "The right isolation gate is opened, and then the right output The wafer manipulator and the middle conveying manipulator cooperate to transport all the wafers in the right magazine to complete the ion implantation.” At the same time, “the atmosphere conveying manipulator outside the rake chamber sends the wafers that have been positioned into the left warehouse. into the film cassette, and then the left film library is vacuumed”. The dotted line box on the left indicates: "The atmospheric transport manipulator outside the rake chamber sends the positioned wafers into the cassette of the right film library, and then the right film library is evacuated." At the same time, "the left isolation door is opened, Then the left film transport manipulator and the middle film transport manipulator cooperate to transport all the wafers in the left film library to complete the ion implantation". The above-mentioned wafer transfer process is repeated cyclically.
下面介绍上述离子注入机晶圆传送系统进行晶圆传送的详细流程:The following describes the detailed process of wafer transfer by the above-mentioned ion implanter wafer transfer system:
晶圆传送方法,其包括如下步骤:Wafer transmission method, it comprises the steps:
(1)大气机械手(图未示)将多片已完成定位的晶圆从真空靶室1外部的大气环境中放入右片库8的片盒中,然后右片库8关闭,右片库8中的气泵开始工作,气泵将右片库8中的空气抽出,直到右片库8中的真空度和真空靶室1内的真空度相同时,气泵停止工作,右隔离阀门6打开。(1) Atmospheric manipulator (not shown in the figure) puts multiple wafers that have been positioned into the cassette of the
(2)右输片机械手4伸入右片库8的片盒中取晶圆,取到晶圆后,右输片机械手4带着晶圆收缩到右机械手4的初始位置,同时中输片机械手3将离子注入靶台9上已完成离子注入的晶圆取走,并收缩到中输片机械手3的初始位置。(2) The right film transporting manipulator 4 extends into the cassette of the
(3)右输片机械手4及中输片机械手3旋转并分别对准离子注入靶台9和右片库8。(3) The right film transporting manipulator 4 and the middle
(4)右输片机械手4伸出,将晶圆送到离子注入靶台9上,然后右输片机械手4收缩一段安全距离,等待晶圆完成离子注入过程;同时,中输片机械手3伸出,将已完成离子注入的晶圆送到右片库8中的片盒中,然后中输片机械手3收缩一段安全距离,等待右片库8中的片盒完成升降过程。(4) The right sheet transporting manipulator 4 stretches out to send the wafer to the ion
(5)右输片机械手4伸出,将完成离子注入的晶圆从离子注入靶台9上取走,右输片机械手4带着晶圆收缩回到右输片机械手4的初始位置;同时,中输片机械手3伸入右片库8中,取出一片待进行离子注入的晶圆,并收缩到中输片机械手3的初始位置。(5) The right transporting manipulator 4 stretches out, and the wafer that has completed the ion implantation is taken away from the ion implantation target table 9, and the right transporting manipulator 4 shrinks back to the initial position of the right transporting manipulator 4 with the wafer; at the same time , the
(6)右输片机械手4及中输片机械手3旋转并分别对准右片库8及离子注入靶台9。(6) The right film transporting manipulator 4 and the middle
(7)右输片机械手4完成离子注入的晶圆送回右片库8的片盒中,然后右输片机械手4收缩一段安全距离,等待右片库8中的片盒完成升降过程;同时,中输片机械手3伸出,将待进行离子注入的晶圆送到离子注入靶台9上,然后中输片机械手3收缩一段安全距离,等待晶圆完成离子注入过程。(7) The wafer that the right transporting manipulator 4 completes the ion implantation is sent back in the cassette of the
(8)整个系统重复上述(2)-(7)的步骤,直到右片库中所有的晶圆完成离子注入。(8) The whole system repeats the above steps (2)-(7) until all the wafers in the right library complete the ion implantation.
在进行上述(2)-(8)的步骤时,左片库也在完成步骤(1)的工作:即,大气机械手将多片已完成定位的晶圆从靶室外部的大气环境中放入左片库7的片盒中,然后左片库7关闭。左片库7中的气泵开始工作,气泵将左片库7中的空气抽出,直到左片库中的真空度和靶室内真空度相同时,气泵停止工作。当右片库8中所有的晶圆完成离子注入后,右隔离阀门6关闭,左隔离阀门5打开;然后左输片机械手2和中输片机械手3相互配合完成和上述(2)-(8)相同的步骤。这样依次反复,实现对左片库和右片库中晶圆的循环离子注入处理。When performing the above steps (2)-(8), the left film library is also completing the work of step (1): that is, the atmospheric manipulator puts multiple wafers that have been positioned into the atmospheric environment outside the target chamber. In the film box of
以上实施方式仅用于说明本发明,而并非对本发明的限制,有关技术领域的普通技术人员,在不脱离本发明的精神和范围的情况下,还可以做出各种变化和变型,因此所有等同的技术方案也属于本发明的范畴,本发明的专利保护范围应由权利要求限定。The above embodiments are only used to illustrate the present invention, but not to limit the present invention. Those of ordinary skill in the relevant technical field can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, all Equivalent technical solutions also belong to the category of the present invention, and the scope of patent protection of the present invention should be defined by the claims.
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| CN113984275A (en) * | 2021-12-24 | 2022-01-28 | 北京凯世通半导体有限公司 | Method for monitoring ultralow temperature ion implantation equipment by measuring vacuum degree |
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