CN101764716A - Test configuration method, equipment and system of business chip - Google Patents
Test configuration method, equipment and system of business chip Download PDFInfo
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- CN101764716A CN101764716A CN200810189105A CN200810189105A CN101764716A CN 101764716 A CN101764716 A CN 101764716A CN 200810189105 A CN200810189105 A CN 200810189105A CN 200810189105 A CN200810189105 A CN 200810189105A CN 101764716 A CN101764716 A CN 101764716A
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Abstract
The embodiment of the invention discloses a test configuration method, equipment and a system of a business chip, which relate to the technical field of communication. The invention aims at improving the chip test efficiency and reducing the cost. The method comprises the following steps: mapping register and list item data of the business chip to a memory of a configuration device through a bus converter; and utilizing the register and list item data in the memory to execute the configuration on the business chip by the configuration device according to the stored test program for bringing convenience to the test on the business chip. The system comprises the configuration device, a test single board, a test instrument and a bus converter, wherein the configuration device is used for mapping the register and list item data of the business chip to the memory and utilizing the register and list item data in the memory to execute the configuration on the business chip according to the test program on the configuration device, and the test instrument sends and receives the test data and extracts and records the test results of the business chip after the configuration completion on the business chip by the configuration device.
Description
Technical field
The present invention relates to communication technical field, relate in particular to a kind of test configuration method, equipment and system of business chip.
Background technology
A large amount of ASIC (Application Specific Integrated Circuit, application-specific integrated circuit (ASIC)) business chips that use in the communication equipment are to satisfy two-forty and jumbo business demand.
In the framework that employing is controlled with Business Processing is separated, testing single-board is made up of business chip and embedded type CPU (Central Processing Unit, central processing unit) system.The embedded type CPU system is used for the various complicated service of configuration service chip.Wherein, before business chip comes into the market, need the function and the performance of this business chip of test.The existing chip testing scheme is testing single-board of exploitation, as shown in Figure 1, comprises tested business chip 1 and embedded type CPU system 2 on the testing single-board.PC (Personal Computer, personal computer) machine 3 is connected on the testing single-board by serial ports.Test instrumentation 4 is connected with tested business chip 1.In the test process:
PC 3 is to embedded type CPU system 2 distribution configuration commands;
Running control software is to carry out work such as business configuration, alarm performance collection to tested business chip 1 after the configuration order of embedded type CPU system 2 reception PC3 machines;
Yet there is following shortcoming at least in existing testing scheme:
Use existing scheme, need the engineer to use the various controls of embedded development too development, test, drive software, then under the embedded OS environment, move described software with the configuration service chip, so that the performance of test instrumentation test service chip by the Test Engineer.Therefore, need be (for example: board software, drive software, write BSP (Board Support Package at the software and hardware of the special embedded type CPU system 2 of tested business chip 1 exploitation, plate level support package) program etc.), and all operations in embedded type CPU system 2 of complex control software cause debug difficulties, poor to the versatility of engineer's requirement height, the software and hardware developed; And in the test process embedded type CPU system 2 go wrong can the tested business chip 1 of influence test result, thereby cause that business chip 1 is long from the cycle that is designed into operation, cost is high, testing efficiency is low.
Summary of the invention
The embodiment of the invention provides a kind of test configuration method, equipment and system of business chip, to improve the efficient of chip testing, reduces cost.
For achieving the above object, embodiments of the invention adopt following technical scheme:
On the one hand, provide a kind of test configuration method of business chip, comprising:
The register and the list item data of business chip are mapped to configurator through bus converter internal memory;
Described configurator is according to the test program of its storage, utilizes register in the described internal memory and list item data to carry out configuration to described business chip, so that described business chip is tested.
On the one hand, provide a kind of system of test service chip, comprising: configurator, testing single-board and test instrumentation are equipped with tested business chip and set up the bus converter that is connected between described business chip and the described configurator on this testing single-board; Described configurator is equipped with the test program of described business chip; Wherein,
Described configurator is used for the register and the list item data of described business chip are mapped to internal memory through bus converter, and according to described test program, utilizes register in the described internal memory and list item data to carry out configuration to described business chip;
Described test instrumentation is used for sending and the acceptance test data after described configurator is finished configuration to described business chip, extracts and write down the test result of described business chip.
On the one hand, provide a kind of equipment of test service chip, this equipment is configurator, comprising:
Mapping block is used for the register and the list item data of described business chip are mapped to internal memory through bus converter;
Configuration module is used for according to test program, utilizes register in the described internal memory and list item data to carry out configuration to described business chip, so that test instrumentation is tested described business chip.
Method, equipment and the system of the test service chip that the embodiment of the invention provides, configurator is carried out configuration to this business chip according to being mapped to register in the internal memory and list item data, so that test described business chip; The software and hardware of avoiding developing special embedded type CPU system disposes and the test service chip, has reduced cost.On the other hand, when this configurator during for the PC under the Windows environment, because the PC function is strong, the test script speed of service is fast, the positioning problems means are abundant, fault in positioning service chip configuration exactly and the test process, thus improved testing efficiency.
Description of drawings
The system construction drawing of the test service chip that Fig. 1 provides for prior art of the present invention;
The system construction drawing of the test service chip that Fig. 2 provides for the embodiment of the invention;
The method flow diagram of the test service chip that Fig. 3 provides for the embodiment of the invention.
Embodiment
The scheme of existing test service chip need be at the software and hardware of the special-purpose embedded type CPU system of business chip exploitation, because very difficulty, test execution are slowly, versatility is poor for the exploitation of embedded system and debugging, thus improved the test service chip cost, cause the construction cycle long, testing efficiency is low.
The embodiment of the invention avoids developing and debug the embedded type CPU system that is used for disposing with the testing single-board of test service chip, can directly carry out the configuration to this business chip in non-embedded configurator.Configurator in the present embodiment is that example describes with the PC, therefore, direct required various software and hardwares of development and testing business chip in the PC environment, and the described software and hardware of operation is configured described business chip under the PC environment, so that test described business chip.Method, equipment and system to embodiment of the invention test service chip is described in detail below in conjunction with accompanying drawing.
Embodiment one
Present embodiment at first provides a kind of system of test service chip, as shown in Figure 2, comprising: PC 3, test instrumentation 5 and tested business chip 1; PC 3 is used for the register of tested business chip 1 and list item data map to internal memory, and according to the test program of this locality, utilizes register in the internal memory and list item data to carry out configuration to described business chip 1, so that test described business chip 1.
Wherein, test instrumentation 5 connects with tested business chip 1, by sending and receiving various test datas, checks whether tested business chip 1 meets the requirements.Test instrumentation 5 can separate with PC 3, separate operaton, also can connect with PC 3, sends and receives various test datas according to the scheduling of PC 3, and test result is fed back to the display interface of PC 3.
Wherein, tested business chip 1 places on the veneer, because tested business chip 1 is generally only supported Local Bus bus, PCI (Peripheral Component Interconnect, Peripheral Component Interconnect) parallel bus such as, and the sequential of parallel bus requires height, and transmission range is short, directly is connected relatively difficulty with PC, therefore, PC 3 can not directly be controlled business chip 1.Consider that universal serial bus transmission rate height, the antijamming capability corresponding with parallel bus are strong, long transmission distance, therefore, when the bus of business chip 1 was parallel bus, present embodiment was set up the path of business chip 1 and PC 3 by a bus converter 4.
Wherein, the parallel bus of an end of bus converter 4 and business chip 1 connects, the universal serial bus of the other end and PC 3 connects.When the transmission data, the data penetration transmission that bus converter 4 can transmit parallel bus is to universal serial bus, and also the data penetration transmission that universal serial bus can be transmitted is to parallel bus.
As shown in Figure 2, bus converter 4 comprises:
First interface 41 is used for connecting with the parallel bus of business chip 1;
Second interface 43 is used for connecting with the universal serial bus of PC 3;
Converting unit 45, the data penetration transmission that is used for first interface 41 is received be to the universal serial bus that is connected with second interface 43, and/or the data penetration transmission that second interface 43 is received to parallel bus that first interface 41 is connected on.
Wherein, bus converter 4 can be integrated on the same veneer with tested business chip 1, sets up path between business chip 1 and the PC 3 by bus converter 4, and is easy to use.Because PC 3 is provided with PCIE (PCI Express, high speed peripheral component interlinkage) slot, therefore, the bus between connecting bus transducer 4 and the PC 3 can be the PCIE bus.Simultaneously, at the bandwidth demand of different business chip 1 and PC 3, can further select for use 1X, the 2X of PCIE, the bus of 4X isotype to satisfy different bandwidth demands.Wherein, universal serial bus between connecting bus transducer 4 and the PC 3 also can be USB (Universal Serial Bus, USB) and IEEE1394 universal serial bus such as (The Institute ofElectrical and Electronics Engineers, U.S. electric and Electronic Engineering Associations).
Present embodiment also provides a kind of PC 3 of test service chip 1, as shown in Figure 2, comprises mapping block 31 and configuration module 33.Mapping block 31 is used for the register of business chip 1 and list item data map are arrived internal memory.Configuration module 33 is used for according to the test program on it, utilizes register in the internal memory and list item data to carry out configuration to business chip 1, so that test instrumentation is tested described business chip.Wherein, configuration module 33 further comprises:
Driver element 331 is used to develop or install the driver of business chip 1, behind the operation driver, trigger mapping block 31 with the register of business chip 1 and list item data map to internal memory;
Dispensing unit 333, be used to develop or install the test program of business chip 1, mapping block 31 with the register of business chip 1 and list item data map behind internal memory, move this test program, to be configured in the register and list item of business chip 1 by mapping relations behind the configuration data write memory in the test program, so that the described business chip 1 of described test instrumentation 5 tests.
Adopt the system and the equipment of the test service chip 1 that present embodiment provides, this equipment comprises the PC 3 of testing usefulness, veneer, test instrumentation 5 etc.; After tested business chip 1 was connected to the PCIE slot of PC 3 by bus converter 4, the input-output equipment that this business chip 1 just is equal to PC 3 (for example: PCIE equipment).After PC 3 powers on, operating system can automatic scan the PCIE bus, and the data of the business chip 1 that scans are preserved, then according to the data message storage allocation space of the business chip that scans, interrupt resource such as number to finish memory-mapped.After finishing mapping, all registers of business chip 1 and list item can both be read and write by the internal memory of PC 3, and the operation of any read-write chip internal memory all writes in business chip 1 relevant register and the list item to finish chip configuration by bus converter 4.
Present embodiment is developed the test program and the driver of business chip 1 under the PC environment, this test program can be according to different business demand organization configurations data with driver, then this configuration data is write the register and the list item of chip, so that the test that test instrumentation 5 is carried out described business chip 1.Wherein, this driver be used for be mounted the back trigger PC 3 with the register of described business chip and list item data map to internal memory.
In the present embodiment, PC is carried out configuration to this business chip according to being mapped to register in the internal memory and list item data, the veneer of test usefulness is owing to avoided the exploitation and the debugging of embedded type CPU system, simplicity of design, device is few, also reduced testing cost in the time of the development cost of having saved the veneer that is used to test, when business chip 1 is tested just often, can be kept under the PC environment driver, the test program of the miscellaneous service chip 1 of exploitation, so that multiplexing this driver and test program, improved the utilance of development.For example: this driver and test program are transplanted in the sale veneer, sell veneer and promptly drop into the veneer of selling market, this sale veneer still adopts the framework of control and service detach, the embedded type CPU system that comprises business chip 1 and this business chip 1 of control, therefore, the driver of the miscellaneous service chip 1 developed under the PC environment, test program etc. can be transplanted in the embedded type CPU system of this business chip 1 of control, avoid the independent exploitation of embedded type CPU system, thereby reduced cost.And in the system of test service chip 1, configuration and test execution activity are carried out under the PC environment all, because PC 3 functions are strong, the test script speed of service is fast, the positioning problems means are abundant, fault in positioning service chip 1 configuration and the test process exactly, thus he has improved testing efficiency.For example: can under the PC environment, develop the test program of various friendly interfaces with further raising testing efficiency.
Embodiment two
Present embodiment provides a kind of method of test service chip, as shown in Figure 3, comprising:
S301 sets up the path of tested business chip and PC by bus converter, and develops or required driver and the test program of installation testing under the PC environment.
When the bus of business chip is parallel bus, set up the path of this business chip and PC by bus converter.One end of bus converter and the parallel bus of business chip connects, the universal serial bus of the other end and PC connects, with the data penetration transmission of parallel bus transmission to universal serial bus, and/or with the data penetration transmission of universal serial bus transmission to parallel bus.This parallel bus can be buses such as LocalBus bus, PCI, and this universal serial bus can be the PCIE bus.
S302, the internal memory that the register and the list item data of business chip are mapped to bus converter PC.
S303, PC is carried out configuration to business chip according to the register of internal memory and list item data, and test instrumentation is carried out the test to this business chip.Comprise:
PC calls and moves test program, to be configured in the register and list item of business chip by mapping relations behind the configuration data write memory in the test program, then, test instrumentation sends and the acceptance test data, extracts and write down the test result of described business chip.Can send and receive various test datas by test instrumentation, check that the corresponding state information of test instrumentation finishes chip testing.Further, can also set up being connected of test instrumentation and PC, test result is presented on the display interface of PC.
S304 after the business chip test is passed through, preserves driver and test program that the PC environment is developed or installed down, so that multiplexing described driver and test program.
The method of the test service chip that present embodiment provides, PC is carried out configuration to business chip according to the register in the internal memory and configuration data, so that test instrumentation is tested described business chip; On the one hand, when business chip test just often, the driver of the miscellaneous service chip developed under the PC environment, test program etc. can be transplanted in the embedded type CPU system that sells this business chip of control in the veneer, to improve the utilance of development; The chip testing process does not rely on the embedded type CPU system, has reduced testing cost; On the other hand, the PC function is strong, the test script speed of service is fast, the positioning problems means are abundant, thereby fault in positioning service chip configuration exactly and the test process has improved testing efficiency.
The technical scheme that the embodiment of the invention provides can be widely used in the systems such as the chip testing of business chip manufacturer, professional demonstration, chip diagnosis.
The above; only be the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily changing or replacing, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection range of claim.
Claims (10)
1. the test configuration method of a business chip is characterized in that, comprising:
The register and the list item data of business chip are mapped to configurator through bus converter internal memory;
Described configurator is according to the test program of its storage, utilizes register in the described internal memory and list item data to carry out configuration to described business chip, so that described business chip is tested.
2. according to the test configuration method of the described business chip of claim 1, it is characterized in that described register and list item data with business chip also comprise through the internal memory that bus converter is mapped to configurator before:
Set up the connection between described business chip, bus converter, the configurator.
3. according to the test configuration method of the described business chip of claim 2, it is characterized in that described connection of setting up between described business chip, bus converter, the configurator comprises:
The parallel bus of described bus converter one end and described business chip connects, the universal serial bus of the other end and described configurator connects;
Transmission is during data, described bus converter with the data penetration transmission of described parallel bus transmission to described universal serial bus, and/or with the data penetration transmission of described universal serial bus transmission to described parallel bus.
4. according to the test configuration method of the described business chip of claim 1, it is characterized in that described register and list item data with business chip also comprise through the internal memory that bus converter is mapped to configurator before:
Exploitation or the driver of described business chip is installed on described configurator, wherein said driver be used for be mounted the back trigger described configurator with the register of described business chip and list item data map to internal memory.
5. according to the test configuration method of the described business chip of claim 4, it is characterized in that the configuration that described configurator is carried out described business chip according to the register in the described internal memory and list item data comprises:
Described configurator moves described test program;
Described configurator writes described internal memory with the configuration data in the described test program;
Described configurator is configured to the configuration data of described internal memory in the register and list item of described business chip by mapping relations.
6. according to the test configuration method of the described business chip of claim 5, it is characterized in that, also comprise:
Execute after the configuration to described business chip, utilize test instrumentation to extract and write down the test result of described business chip.
7. according to the test configuration method of the described business chip of claim 1, it is characterized in that the described test result of utilizing test instrumentation to extract and writing down described business chip also comprises:
When described test instrumentation and described configurator connected, described test instrumentation was presented at described test result on the display interface of described configurator.
8. the system of a test service chip is characterized in that, comprising: configurator, testing single-board and test instrumentation are equipped with tested business chip and set up the bus converter that is connected between described business chip and the described configurator on this testing single-board; Described configurator is equipped with the test program of described business chip; Wherein,
Described configurator is used for the register and the list item data of described business chip are mapped to internal memory through bus converter, and according to described test program, utilizes register in the described internal memory and list item data to carry out configuration to described business chip;
Described test instrumentation is used for sending and the acceptance test data after described configurator is finished configuration to described business chip, extracts and write down the test result of described business chip.
9. a configurator is characterized in that, comprising:
Mapping block is used for the register and the list item data of described business chip are mapped to internal memory through bus converter;
Configuration module is used for according to test program, utilizes register in the described internal memory and list item data to carry out configuration to described business chip, so that test instrumentation is tested described business chip.
10. configurator according to claim 9 is characterized in that, described configuration module comprises:
Driver element is used to develop or install the driver of described business chip, move described driver after, trigger described mapping block with the register of described business chip and list item data map to internal memory;
Dispensing unit, be used to develop or install the test program of described business chip, described mapping block with the register of described business chip and list item data map behind internal memory, move described test program, be configured in the register and list item of described business chip by mapping relations after configuration data in the described test program write described internal memory, so that described test instrumentation is tested described business chip.
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| CN103500091A (en) * | 2013-09-23 | 2014-01-08 | 福建星网锐捷网络有限公司 | Exchange chip dominant frequency adjustment method, device and network equipment |
| CN105227390A (en) * | 2014-06-27 | 2016-01-06 | 中兴通讯股份有限公司 | The method of quick test CPU forwarding performance and device |
| CN106371995A (en) * | 2016-09-05 | 2017-02-01 | 芯海科技（深圳）股份有限公司 | Method for realizing rapid automated testing through MCU (Microprogrammed Control Unit) simulator |
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| CN103500091A (en) * | 2013-09-23 | 2014-01-08 | 福建星网锐捷网络有限公司 | Exchange chip dominant frequency adjustment method, device and network equipment |
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