CN101271144A - Circuit test device - Google Patents

Circuit test device Download PDF

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Publication number
CN101271144A
CN101271144A CNA2007100882558A CN200710088255A CN101271144A CN 101271144 A CN101271144 A CN 101271144A CN A2007100882558 A CNA2007100882558 A CN A2007100882558A CN 200710088255 A CN200710088255 A CN 200710088255A CN 101271144 A CN101271144 A CN 101271144A
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China
Prior art keywords
tested
coupled
test device
module
circuit test
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CNA2007100882558A
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Chinese (zh)
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CN101271144B (en
Inventor
滕贞勇
陈弘伟
吴永裕
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Princeton Technology Corp
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Princeton Technology Corp
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Abstract

The invention discloses a circuit testing device which is used for testing an element to be tested. The circuit testing device comprises a logic tester and a signal measurement module. The logic tester is coupled with the element to be tested for providing a test signal and a trigger signal, and the test result of the element to be tested is decided on the basis of a digital measurement result. The signal measurement module is coupled with the element to be tested and the logic tester, thus measuring a direct current signal which is generated by the element to be tested according to the test signal after the trigger signal is received and the digital measurement result is generated. The circuit testing device of the invention can effectively save the needed time for the test and further enhance the test efficiency.

Description

Circuit test device
Technical field
The present invention is the test that is relevant to circuit, refers to the circuit test device of a kind of direct current that uses logic tester to come testing integrated circuits (DC) voltage especially.
Background technology
In order to ensure integrated circuit (integrated circuit, IC) quality during shipment, after finishing manufacture process, generally all can carry out test to each IC, manufacturer can be according to the result who IC is carried out test, decide this IC whether qualified, and judge whether this IC to be supplied to the manufacturer in downstream according to this.
See also Fig. 1, Figure 1 shows that known technology is used for carrying out the test structure synoptic diagram of IC volume production test.In this test structure, be to use logic tester (logictester) 10 to be used as testing an element to be tested (Device Under Test, DUT) 22 instrument.Wherein, element 22 to be tested can be an integrated circuit (IC) to be measured, and for convenient test, element 22 to be tested normally is arranged on the element circuitry plate to be tested (DUT board) 20.
When the general DC voltage of using logic tester 10 to carry out element 22 to be tested measures, the initial conditions and the logic level of element 22 to be tested at first must be provided, the mode that the function generation module 12 that utilizes logic tester 10 inside is imported single test patterns (Code) with sequential is sent to the input pin of element 22 to be tested, after element 22 to be tested receives this single test patterns by input pin, can produce corresponding direct current (DC) voltage in its output pin, if desire measures the DC voltage that this output pin is exported, logic tester 10 must interrupt the sequential of internal logic earlier, and utilize it accurately to measure module (Precision Measurement Unit, PMU) 14 do inner setting after, carry out the action that measures DC voltage by accurate measurement module 14 again, come to judge whether element 22 to be tested passes through test by the result who measures at last.According to this kind method of testing, because can only transmit single test patterns at every turn, and the sequential of logic tester 10 inside must be interrupted, just can carry out the measurement of DC voltage, so can cause waste of time, consume the tediously long test duration, and further have influence on the efficient of test element 22 to be tested.
Summary of the invention
Therefore, one of purpose of the present invention is to provide a kind of circuit test device that increases testing efficiency, to solve the problem that known technology was faced.
Embodiments of the invention are to disclose a kind of circuit test device, are used for testing an element to be tested, and circuit test device includes a logic tester and a measuring signal module.Logic tester is coupled to element to be tested, is used to provide a test signal and a trigger pip, and decides the test result of element to be tested according to a digital measurement result.The measuring signal module is coupled to element to be tested and logic tester, after receiving trigger pip, measures element to be tested according to the direct current signal that test signal produced, and produces this digital measurement result.
Circuit test device of the present invention, this logic tester include a function generation module (function generator), in order to produce this test signal and this trigger pip.
Circuit test device of the present invention, this function generation module determines the test result of this element to be tested in order to according to this digital measurement result.
Circuit test device of the present invention, this measuring signal module includes: an analog-digital converter, be used to receive this trigger pip after, produce this digital measurement result according to this direct current signal; And a memory storage, be coupled to this analog-digital converter, in order to store this digital measurement result.
Circuit test device of the present invention, this measuring signal module includes an adjuster in addition, is coupled to this element to be tested and this analog-digital converter, in order to this direct current signal of decaying to the receptible voltage range of analog-digital converter.
Circuit test device of the present invention, this measuring signal module includes a selftest module in addition, is coupled to this analog-digital converter, in order to produce a selftest signal, to carry out the selftest of measuring signal module.
Circuit test device of the present invention, this measuring signal module includes a counter in addition, be coupled to this logic tester and this memory storage, be used to receive and begin counting after this trigger pip, be stored in the position of this memory storage to dispose this digital measurement result.
Circuit test device of the present invention, this measuring signal module comprises a noise cancellation module in addition, be coupled between this analog-digital converter and this memory storage, when this memory storage transmits this digital measurement result to this logic tester, in order to eliminate noise.
Circuit test device of the present invention, this noise cancellation module are to be a switch.
Circuit test device of the present invention, this measuring signal module comprises an impact damper (Buffer) in addition, is coupled between this analog-digital converter and this memory storage, in order to strengthen this direct current signal.
Circuit test device of the present invention, this memory storage be for a static RAM (Static Random Access Memory, SRAM).
Circuit test device of the present invention, this measuring signal module comprises a plurality of gauge tap in addition, one first gauge tap is coupled between this element to be tested and this analog-digital converter, one second gauge tap is coupled between this element to be tested and this adjuster, one the 3rd gauge tap is coupled between this adjuster and this analog-digital converter, one the 4th gauge tap is coupled between this element to be tested and this selftest module, in order to this element to be tested of control, this analog-digital converter, whether conducting or open circuit between this adjuster and this selftest module.
Circuit test device of the present invention, this measuring signal module are to produce this digital measurement result in order to the voltage level that measures this direct current signal.
Circuit test device of the present invention can effectively be saved the required time of test, more can promote testing efficiency.
Description of drawings
Fig. 1 is used for carrying out the test structure synoptic diagram of IC volume production test for known technology.
Fig. 2 is the test structure synoptic diagram of circuit test proposed by the invention.
Fig. 3 is an embodiment synoptic diagram of signal conversion module used in the present invention.
Embodiment
See also Fig. 2, Figure 2 shows that the test structure synoptic diagram of circuit test proposed by the invention.The circuit test device 30 of present embodiment is to be used for testing an element 52 to be tested, and element 52 to be tested normally is arranged on the element circuitry plate 50 to be tested.Circuit test device 30 includes a logic tester 40 and a measuring signal module 60.Logic tester 40 is coupled to element 52 to be tested, is used to provide a test signal S INAn and trigger pip S T, and according to a digital measurement as a result DMR decide the test result of element 52 to be tested.But logic tester 40 is the tester tables for the combine digital computing.Measuring signal module 60 is coupled to element 52 to be tested and logic tester 40, in receiving trigger pip S TAfter, measure element 52 to be tested according to test signal S INA direct current signal S who is produced DC, produce digital measurement DMR as a result.
The logic tester 40 of present embodiment includes a function generation module (function generator) 42, and function generation module 42 is in order to produce test signal S INAnd trigger pip S T, function generation module 42 is further in receiving digital measurement as a result during DMR in addition, according to digital measurement as a result DMR decide the test result of element 52 to be tested.
See also Fig. 3, Fig. 3 is an embodiment synoptic diagram of measuring signal module of the present invention.Wherein, measuring signal module 60 comprises an analog-digital converter 62 and a memory storage 64.Analog-digital converter 62 is used to receive this trigger pip S TAfter, according to direct current signal S DCProduce digital measurement DMR as a result.For instance, digital measurement as a result DMR can be direct current signal S DCVoltage level, show with digital form.40 of logic testers can be according to digital measurement DMR as a result, decide treat testing element 52 test result why.Memory storage 64 is coupled to analog-digital converter 62, in order to store digital measurement DMR.In an embodiment, memory storage 64 be for a static RAM (Static Random Access Memory, SRAM).
In addition, measuring signal module 60 includes an adjuster 66 in addition, is coupled to element 52 to be tested and analog-digital converter 62, in order to decaying dc signal S DCTo 62 receptible voltage ranges of analog-digital converter.In an embodiment, adjuster 66 is to be an attenuator.As if the direct current signal S that is imported from element 52 to be tested DCMagnitude of voltage when surpassing the maximum input level of analog-digital converter 62, measuring signal module 60 can utilize adjuster 66 with direct current signal S DCCarry out signal attenuation, after meeting 62 receptible voltage ranges of analog-digital converter, the direct current signal S after will decaying again DCInput analog-digital converter 62 carries out follow-up measurement action, can strengthen measuring signal module 60 scalable scopes whereby.
And in another embodiment, measuring signal module 60 includes a counter 68 in addition, is coupled to logic tester 40 and memory storage 64, is used to receive trigger pip S TAfter begin the counting, be stored in the position of memory storage 64 to dispose digital measurement DMR, in addition, the location transmission that memory storage 64 can store the digital measurement DMR of configuration is to logic tester 40, so, the storage location that 40 of logic testers can be disposed according to memory storage 64 carries out in the memory storage 64 digital measurements reading of DMR as a result.
Measuring signal module 60 comprises a noise cancellation module 70 in addition, is coupled between memory storage 64 and the analog-digital converter 62, in memory storage 64 transmission of digital measurement result DMR during to logic tester 40, in order to eliminate noise.In an embodiment, noise cancellation module 70 is to be a switch, when 40 pairs of logic testers are stored in digital measurement in the memory storage 64 DMR reads as a result, is that this switch of may command opens circuit, and can eliminate and prevent whereby to disturb.In addition, measuring signal module 60 more comprises an impact damper (Buffer) 72, is coupled between analog-digital converter 62 and the memory storage 64, and impact damper 72 is in order to strengthen direct current signal.
In another embodiment, measuring signal module 60 more can comprise a selftest module 74, is coupled to analog-digital converter 62, in order to produce a selftest signal, to carry out the selftest of measuring signal module 60.Below explanation measuring signal module 60 is carried out the motion flow of selftest, when carrying out the selftest of measuring signal module 60, selftest module 74 can be sent a selftest signal, the selftest signal is to be a fixing and known voltage value, action by whole measuring signal module 60, last the same by logic tester 40 read test result in memory module 64, judge whereby whether measuring signal module 60 exists error, and carry out error correction, so can be in order to promote the fiduciary level that IC measures.
Measuring signal module 60 comprises a plurality of gauge tap (SW1～SW4) in addition, the first gauge tap SW1 is coupled between element 52 to be tested and the analog-digital converter 62, the second gauge tap SW2 is coupled between element 52 to be tested and the adjuster 66, the 3rd gauge tap SW3 is coupled between adjuster 66 and the analog-digital converter 62, the 4th gauge tap SW4 is coupled between element 52 to be tested and the selftest module 74, in order to control element 52 to be tested, analog-digital converter 62, whether conducting or open circuit between adjuster 66 and the selftest module 74 whereby can control signal measures module 60 and carries out different functions.Not necessarily to include all circuit components shown in Figure 3 in the measuring signal module 60.In addition, measuring signal module 60 can also be looked testing requirement (for instance, according to the control of logic tester 40), and (SW1～SW4) is bypass (Bypass) one or more circuit components shown in Figure 3 optionally to utilize gauge tap.
In each embodiment of the present invention, owing to used the measuring signal module to measure direct current signal, can transmit a series of test signal, after producing a plurality of corresponding digital test results, earlier it is stored in the memory storage of measuring signal module, read this a plurality of digital test results by logic tester more at last, carry out the interpretation of test result by the function generation module.Compared to the test structure of known technology, the test structure of various embodiments of the present invention can effectively be saved the required time of test, more can promote testing efficiency, and these all are the characteristics that the present invention is better than known technology.
The above only is preferred embodiment of the present invention; so it is not in order to limit scope of the present invention; any personnel that are familiar with this technology; without departing from the spirit and scope of the present invention; can do further improvement and variation on this basis, so the scope that claims were defined that protection scope of the present invention is worked as with the application is as the criterion.
Being simply described as follows of symbol in the accompanying drawing:
10,40: logic tester
12,42: the function generation module
14: accurate measurement module
20,50: element circuitry plate to be tested
22,52: element to be tested
30: circuit test device
60: the measuring signal module
62: analog-digital converter
64: memory storage
66: adjuster
68: counter
70: noise cancellation module
72: impact damper
74: the selftest module
S IN: test signal
S DC: direct current signal
S T: trigger pip
DMR: digital measurement result
SW1～SW4: gauge tap

Claims (13)

1. a circuit test device is characterized in that, is used for testing an element to be tested, and this circuit test device includes:
One logic tester is coupled to this element to be tested, is used to provide a test signal and a trigger pip, and decides the test result of this element to be tested according to a digital measurement result; And
One measuring signal module is coupled to this element to be tested and this logic tester, after receiving this trigger pip, measures this element to be tested according to the direct current signal that this test signal produced, and produces this digital measurement result.
2. circuit test device according to claim 1 is characterized in that, this logic tester includes a function generation module, and this function generation module produces this test signal and this trigger pip.
3. circuit test device according to claim 2 is characterized in that, this function generation module determines the test result of this element to be tested according to this digital measurement result.
4. circuit test device according to claim 1 is characterized in that, this measuring signal module includes:
One analog-digital converter, it produces this digital measurement result according to this direct current signal after receiving this trigger pip; And
One memory storage is coupled to this analog-digital converter, this digital measurement of this storing device for storing result.
5. circuit test device according to claim 4, it is characterized in that, this measuring signal module includes an adjuster in addition, is coupled to this element to be tested and this analog-digital converter, and this adjuster is decayed this direct current signal to the receptible voltage range of this analog-digital converter.
6. circuit test device according to claim 5, it is characterized in that this measuring signal module includes a selftest module in addition, is coupled to this analog-digital converter, this selftest module produces a selftest signal, to carry out the selftest of this measuring signal module.
7. circuit test device according to claim 4, it is characterized in that, this measuring signal module includes a counter in addition, be coupled to this logic tester and this memory storage, this counter begins counting after receiving this trigger pip, be stored in the position of this memory storage to dispose this digital measurement result.
8. circuit test device according to claim 4, it is characterized in that, this measuring signal module comprises a noise cancellation module in addition, is coupled between this analog-digital converter and this memory storage, eliminates noise when this memory storage transmits this digital measurement result to this logic tester.
9. circuit test device according to claim 8 is characterized in that, this noise cancellation module is to be a switch.
10. circuit test device according to claim 4 is characterized in that, this measuring signal module comprises an impact damper in addition, is coupled between this analog-digital converter and this memory storage, to strengthen this direct current signal.
11. circuit test device according to claim 4 is characterized in that, this memory storage is to be a static RAM.
12. circuit test device according to claim 6, it is characterized in that, this measuring signal module comprises a plurality of gauge tap in addition, one first gauge tap is coupled between this element to be tested and this analog-digital converter, one second gauge tap is coupled between this element to be tested and this adjuster, one the 3rd gauge tap is coupled between this adjuster and this analog-digital converter, one the 4th gauge tap is coupled between this element to be tested and this selftest module, with this element to be tested of control, this analog-digital converter, whether conducting or open circuit between this adjuster and this selftest module.
13. circuit test device according to claim 1 is characterized in that, this measuring signal module is to measure the voltage level of this direct current signal to produce this digital measurement result.
CN200710088255A 2007-03-20 2007-03-20 Circuit test device Expired - Fee Related CN101271144B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN200710088255A CN101271144B (en) 2007-03-20 2007-03-20 Circuit test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN200710088255A CN101271144B (en) 2007-03-20 2007-03-20 Circuit test device

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CN101271144A true CN101271144A (en) 2008-09-24
CN101271144B CN101271144B (en) 2010-05-26

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101840876B (en) * 2009-03-20 2012-02-15 普诚科技股份有限公司 Product verification system
CN104237830A (en) * 2014-10-08 2014-12-24 洪明 Circuit detection and verification signal simulating device with control interfaces
CN113884863A (en) * 2021-12-03 2022-01-04 北京壁仞科技开发有限公司 Chip and chip testing method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103700392A (en) * 2013-04-26 2014-04-02 深圳市隆科电子有限公司 Automatically tested decoding board and test method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101840876B (en) * 2009-03-20 2012-02-15 普诚科技股份有限公司 Product verification system
CN104237830A (en) * 2014-10-08 2014-12-24 洪明 Circuit detection and verification signal simulating device with control interfaces
CN113884863A (en) * 2021-12-03 2022-01-04 北京壁仞科技开发有限公司 Chip and chip testing method
CN113884863B (en) * 2021-12-03 2022-02-22 北京壁仞科技开发有限公司 Chip and chip testing method

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