CN101147224B - Circuit breaker and thermal trip - Google Patents

Circuit breaker and thermal trip Download PDF

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Publication number
CN101147224B
CN101147224B CN2005800492537A CN200580049253A CN101147224B CN 101147224 B CN101147224 B CN 101147224B CN 2005800492537 A CN2005800492537 A CN 2005800492537A CN 200580049253 A CN200580049253 A CN 200580049253A CN 101147224 B CN101147224 B CN 101147224B
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China
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mentioned
bimetal leaf
temperature
heating element
thermal trip
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CN2005800492537A
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CN101147224A (en
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村井正俊
川村浩司
内藤悟
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H71/00Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
    • H01H71/10Operating or release mechanisms
    • H01H71/12Automatic release mechanisms with or without manual release
    • H01H71/14Electrothermal mechanisms
    • H01H71/16Electrothermal mechanisms with bimetal element
    • H01H71/164Heating elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H69/00Apparatus or processes for the manufacture of emergency protective devices
    • H01H69/01Apparatus or processes for the manufacture of emergency protective devices for calibrating or setting of devices to function under predetermined conditions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H11/00Apparatus or processes specially adapted for the manufacture of electric switches
    • H01H11/0062Testing or measuring non-electrical properties of switches, e.g. contact velocity
    • H01H2011/0068Testing or measuring non-electrical properties of switches, e.g. contact velocity measuring the temperature of the switch or parts thereof

Abstract

A thermal trip comprises a bimetal (2) having one acting end (21) and the other cantilevered fixed end (22) secured to a heater (1) serving as a fixed terminal. The acting end (21) of the bimetal (2) bends as the bimetal is heated when the heater (1) is electrified. The thermal trip is characterized in that a temperature measuring member (7) is coupled integrally with the secured portion (221) of the bimetal (2) secured to the heater (1) and exposed from the bimetal (2) and the heater (1) so that the temperature measuring member (7) can touch a contact temperature sensor (8).

Description

Circuit-breaker and thermal trip
Technical field
The present invention relates to a kind of circuit-breaker, this circuit-breaker has thermal trip, this thermal trip be with an end for the action the other end, end be the said fixing end of the bimetal leaf (bimetal) of anchor portion, be fastened on the fixed terminal with cantilever-shaped, the bending of utilization overheated aforementioned bimetal leaf by the overcurrent that flows through the said fixing terminal, above-mentioned action end make the action of tripping of circuit-breaker main body; In addition, the invention still further relates to a kind of thermal trip, it is becoming on the heating element of fixed terminal, is the said fixing end of the bimetal leaf of anchor portion with an end for action the other end, end, be fastened on the above-mentioned heating element with cantilever-shaped, if above-mentioned heating element is overheated because of energising, then bending is carried out in the above-mentioned action end of above-mentioned bimetal leaf.
Background technology
Thermal trip, it for example is detection of excessive current in circuit-breaker, the device that the main circuit of circuit-breaker main body is tripped, tripping characteristic when above-mentioned overcurrent flows through, define its scope in the JIS standards such as (Japanese Industrial Standard) as Japanese Industrial Standards, product must satisfy this standard.But in thermal trip, because the quality fluctuation of the product of its component parts or the quality fluctuation of material, the fluctuation of tripping characteristic is inevitable.Therefore, usually combination is used for structure that tripping characteristic is adjusted, carries out the adjustment and the inspection of characteristic.
In order to adjust and check tripping characteristic, need measure its characteristic value exactly.In thermal trip, be mostly by connecting rated current to measure tripping characteristic to from beginning to be energized to the time (trip time) that tripping operation finishes or detecting the bi-metal plate deformed amount and measure.On the other hand, because the bending coefficient of bimetal leaf is known, so, can obtain the deflection of bimetal leaf by measuring the temperature of bimetal leaf.Therefore, by measuring the bimetal leaf temperature, can hold tripping characteristic.
When measuring the bimetal leaf temperature, in order not make measurement the bimetal leaf amount of bow is exerted an influence, consider that it is desirable adopting the method for non-contact measurement.Its reason is, when being measured by contact tehermometer, can exert pressure to bimetal leaf from the outside via measuring part, so it is crooked that bimetal leaf is produced, tripping characteristic is changed.
The noncontact temperature-measuring method uses the radiation thermometer of having assembled the infrared ray absorbing element usually.Non-contact type temperature measurement in the thermal trip of existing circuit-breaker, for example as described in the patent documentation 1, in order to measure the bimetal leaf temperature by contactless thermometer, measuring window is set on the heating element that bimetal leaf is heated, by this window, from measuring the temperature of bimetal leaf with radiation thermometer with the rectangular direction in bimetal leaf surface.
List of references 1: United States Patent (USP) 5,317, No. 471 specifications and accompanying drawing
Summary of the invention
Used the noncontact temperature measuring mode of contactless thermometer, consider it is desirable mode, but because so compare with the temperature measuring mode that contacts of using contact tehermometer, there is the problem that is difficult to carry out temperature measuring accurately in bimetal leaf surface metallic luster face normally.In addition, in residual current circuit breaker of having assembled electric-leakage detection circuit or miniature circuit breaker, because the slit around the bimetal leaf is little, so veil is many,, in most cases have difficulties meeting at right angles direction from external measurement bimetal leaf surface temperature by non-contact thermometer with the bimetal leaf surface.
Therefore, the circuit-breaker of wishing to realize a kind of thermal trip and having thermal trip is even it uses contact tehermometer also not influence tripping characteristic.
The present invention is in view of above-mentioned actual conditions, and its purpose is, a kind of circuit-breaker and thermal trip with thermal trip is provided, even it uses contact tehermometer also not influence tripping characteristic.
The circuit-breaker that the present invention relates to, because it has thermal trip, this thermal trip be with an end for the action the other end, end be the said fixing end of the bimetal leaf of anchor portion, be fastened on the fixed terminal with cantilever-shaped, when the overcurrent that in the said fixing terminal, flows through, above-mentioned bimetal leaf is overheated and crooked, utilize the bending of this bimetal leaf, above-mentioned action end makes the action of tripping of circuit-breaker main body, wherein, at above-mentioned bimetal leaf on the fastening fastening part of above-mentioned fixed terminal, directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and said fixing terminal integratedly, thereby can contact with the contact temperature analyzer, so, be not that the contact temperature analyzer is directly contacted with above-mentioned bimetal leaf, but contact, promptly can measure the temperature of above-mentioned bimetal leaf with temperature measurement component, therefore can not exert an influence, and can measure the temperature of above-mentioned bimetal leaf tripping characteristic.
In addition, the thermal trip that the present invention relates to, because it is the said fixing end of the bimetal leaf of anchor portion with an end for action the other end, end, be fastened on the heating element that becomes fixed terminal with cantilever-shaped, under the situation overheated by switching on to above-mentioned heating element, the above-mentioned action end bent of above-mentioned bimetal leaf, wherein, at above-mentioned bimetal leaf on the fastening fastening part of above-mentioned heating element, integratedly directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and above-mentioned heating element, thereby can contact with the contact temperature analyzer, so, be not that the contact temperature analyzer is directly contacted with above-mentioned bimetal leaf, but contact, promptly can measure the temperature of above-mentioned bimetal leaf with temperature measurement component, therefore can not exert an influence, and can measure the temperature of above-mentioned bimetal leaf tripping characteristic.
The invention effect
Because circuit-breaker of the present invention, it has thermal trip, this thermal trip be with an end for the action the other end, end be the said fixing end of the bimetal leaf of anchor portion, be fastened on the fixed terminal with cantilever-shaped, when the overcurrent that in the said fixing terminal, flows through, above-mentioned bimetal leaf is overheated and crooked, utilize the bending of this bimetal leaf, above-mentioned action end makes the action of tripping of circuit-breaker main body, wherein, at above-mentioned bimetal leaf on the fastening fastening part of above-mentioned fixed terminal, integratedly directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and said fixing terminal, thereby can contact with the contact temperature analyzer, so be not that the contact temperature analyzer is directly contacted with above-mentioned bimetal leaf, but contact with temperature measurement component, promptly can measure the temperature of above-mentioned bimetal leaf, therefore can not exert an influence to tripping characteristic, and can measure the temperature of above-mentioned bimetal leaf, and, because adopt contact temperature to measure mode,, can carry out high-precision temperature survey so the temperature measuring mode is compared when having used the noncontact of contactless thermometer with employing.
Because thermal trip of the present invention, it is the said fixing end of the bimetal leaf of anchor portion with an end for action the other end, end, be fastened on the heating element that becomes fixed terminal with cantilever-shaped, under the situation overheated by switching on to above-mentioned heating element, the above-mentioned action end bent of above-mentioned bimetal leaf, wherein, at above-mentioned bimetal leaf on the fastening fastening part of above-mentioned heating element, integratedly directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and above-mentioned heating element, thereby can contact with the contact temperature analyzer, so be not that the contact temperature analyzer is directly contacted with above-mentioned bimetal leaf, but contact with temperature measurement component, promptly can measure the temperature of above-mentioned bimetal leaf, therefore can not exert an influence to tripping characteristic, and can measure the temperature of above-mentioned bimetal leaf, and, measure mode because adopt contact temperature, so the temperature measuring mode is compared when having used the noncontact of contactless thermometer with employing, can carry out high-precision temperature survey.
Description of drawings
Fig. 1 is the figure of expression embodiments of the present invention 1, is the end view of housing inner structure portion with circuit-breaker of thermal trip.
Fig. 2 is the figure of expression embodiments of the present invention 1, is the oblique view that amplifies the thermal trip of presentation graphs 1.
Fig. 3 is the figure of expression embodiments of the present invention 1, is the end view that amplifies the thermal trip of presentation graphs 1.
Fig. 4 is the figure of expression embodiments of the present invention 1, is to be used to illustrate use the contact temperature analyzer to carry out the oblique view of bimetal leaf temperature measuring mode.
Fig. 5 is the figure of expression embodiments of the present invention 1, is the enlarged side view that is used to illustrate the bimetal leaf flexure operation when fixed terminal (being heating element) is switched on.
Fig. 6 is the figure of expression embodiments of the present invention 2, is the oblique view of expression thermal trip.
Fig. 7 is the figure of expression embodiments of the present invention 2, is the end view of expression thermal trip.
Fig. 8 is the figure of expression embodiments of the present invention 2, is the enlarged side view of the flexure operation of the bimetal leaf when being used to illustrate fixed terminal (being heating element) energising.
Fig. 9 is the figure of expression embodiments of the present invention 3, is the end view of expression thermal trip.
Figure 10 is the figure of expression embodiments of the present invention 4, is the end view of expression thermal trip.
Embodiment
Execution mode 1
Below by Fig. 1~Fig. 5 embodiments of the present invention 1 are described.Fig. 1 is the end view that expression has portion of mechanism in the housing of circuit-breaker of thermal trip, Fig. 2 is the oblique view that amplifies the thermal trip of presentation graphs 1, Fig. 3 is the end view that amplifies the thermal trip of presentation graphs 1, Fig. 4 is used to illustrate the oblique view of being measured the assay method of bimetal leaf temperature by the contact temperature analyzer, and Fig. 5 is the enlarged side view that is used to illustrate the bimetal leaf flexure operation when fixed terminal (being heating element) is switched on.In addition, among Fig. 1~Fig. 5, to the identical identical label of part mark.
In Fig. 1, the action when flowing through the overcurrent more than or equal to rated current in circuit-breaker is as described below.
(1) owing to flow through overcurrent in heating element 1 or bimetal leaf 2, the temperature of heating element 1 or bimetal leaf 2 rises.
(2) follow the temperature of bimetal leaf 2 to rise, bimetal leaf 2 produces crooked.
(3) amount of bow of bimetal leaf 2 increases, pushing trip(ping) bar 3.
(4) portion of mechanism 4 action and cut off main circuit 5 (tripping operation) instantaneously.
From beginning to flow through the time of overcurrent to tripping operation, determine scope by standards such as JIS, the trip time of product must be satisfied this scope.But, the start point of tripping mechanism, it is the position of bimetal leaf 2 pushing trip(ping) bars 3, can produce fluctuation owing to constitute the adding up of manufacturing such as fluctuation fluctuation of the processing of each parts of tripping mechanism and assembly error, material behavior, so can generation fluctuate from the time (trip time) that begins to be energized to tripping operation.So, make fluctuation in order to eliminate these, on bimetal leaf 2 front ends and trip(ping) bar 3, adjusting mechanism 6 is set, in assembling procedure, adjust, check operation.
Adjusting, checking in the operation, need measure the tripping characteristic of each workpiece exactly.Usually the deflection of bimetal leaf is measured tripping characteristic during mostly being to measure the trip time or measure this by connection predetermined electric current value.But, the deflection of trip time and bimetal leaf, switched on when beginning workpiece temperature and to measure the influence of ambient temperature very big, so must measure being controlled to be under the state of steady temperature, perhaps measured value is proofreaied and correct based on workpiece temperature and environment temperature.
On the other hand, bimetal leaf decides its amount of bow (deflection) by its temperature and bending coefficient, but because bending coefficient is known, so can obtain deflection by the temperature of measuring bimetal leaf.Therefore, can measure tripping characteristic by the temperature of measuring bimetal leaf.
In order to measure the temperature of bimetal leaf, as previously mentioned, generally adopt contactless radiation thermometer.This is because if adopt contact tehermometer, it is crooked that bimetal leaf is produced, and changes tripping characteristic, can not measure tripping characteristic accurately.
Contactless thermometer by the ultrared emittance that detection is gone out by object radiation, is measured the temperature of object.From the ultrared amount of radiation of object radiation, different because of material and surface state, even same temperature, the infrared energy of radiation (radiance) is also inequality.Contactless thermometer is the benchmark accounting temperature with ideal black-body (radiance is 100% theoretic object), for other object, and must be corresponding to separately radiance and proofread and correct.
Radiance can be obtained by experiment usually, but tries to achieve the radiance of measuring thing owing to be difficult to the short time, so can not obtain radiance to each workpiece in the volume production operation.Therefore, under the situation that the radiance generation of bimetal leaf is fluctuateed, its fluctuation can become thermometric fluctuation.And, because the bimetal leaf surface generally is the metallic luster face, thus be positioned near the infrared ray of the thermal source radiation of the object the bimetal leaf from heating element etc., easily by the surface reflection of bimetal leaf.If being incident to radiation thermometer, this reverberation can produce evaluated error.
Therefore, in embodiments of the present invention 1, can carry out temperature survey at crooked part, the position of promptly moving beyond the end 21 in order to push trip(ping) bar 3 of bimetal leaf 2.Like this, owing to can not bring influence, and can carry out temperature survey,, can stably carry out temperature survey with high accuracy more so compare with existing contactless thermometer by contact tehermometer to the bending of the action end 21 of bimetal leaf 2.
Owing to pine in adding of bimetal leaf 2, be difficult to the integral body of bimetal leaf 2 is heated equably, so in bimetal leaf 2, have Temperature Distribution.Promptly, at one end portion is action the end 21 and other end is the bimetal leaf of anchor portion 22, its said fixing end 22 is with under the cantilever-shaped situation about being fastened on the fixed terminal (being heating element) 1, compare with the temperature of anchor portion 22 on being fastened to fixed terminal (being heating element) 1, the temperature of action end 21 will be hanged down.But, because the relation between the amount of bow of the Temperature Distribution in the bimetal leaf 2 and the action end 21 of bimetal leaf 2, can obtain according to the material and the size of bimetal leaf 2, so, can obtain the amount of bow of expectation of the action end 21 of the bimetal leaf 2 under this temperature by measuring the temperature of anchor portion 22.In addition, on the contrary, also can obtain when the action end 21 of bimetal leaf 2 reaches desired amount of bow the temperature of standard of the anchor portion 22 of (, when reaching the amount of bow that makes the circuit-breaker tripping operation).In other words, when if the action end 21 of bimetal leaf 2 reaches the amount of bow of expectation (, when reaching the amount of bow that makes the circuit-breaker tripping operation, the measurement temperature of anchor portion 22 perhaps circuit-breaker when tripping operation) is identical with above-mentioned normal temperature, and then the tripping characteristic of thermal trip can be described as the tripping characteristic of regulation.
Therefore, in embodiments of the present invention 1, by increase with the temperature of the anchor portion 22 of bimetal leaf 2 become equivalent temperature parts, be temperature measurement component 7, measure the temperature of the temperature measurement component 7 of this increase by contact tehermometer, the temperature of the anchor portion 22 of direct measurement bimetal leaf 2 can be replaced, and the temperature of the anchor portion 22 of bimetal leaf 2 can be measured.That is, as shown in Figure 4, contact with said temperature components of assays 7, can measure the temperature of said temperature components of assays 7, thereby can measure the temperature of bimetal leaf 2 indirectly by the mensuration part 81 that makes contact tehermometer 8.
In addition, said temperature components of assays 7 is as Fig. 2~shown in Figure 4, at above-mentioned bimetal leaf 2 to fastening 221 places, above-mentioned fastening part of above-mentioned fixed terminal (being heating element) 1, integratedly directly in conjunction with said temperature components of assays 7, this temperature measurement component 7 exposes from above-mentioned bimetal leaf 2 and said fixing terminal (being heating element) 1, thereby can contact with the said determination spare 81 of above-mentioned contact temperature analyzer 8.That is, as shown in the figure, the entire area of said temperature components of assays 7 is greater than the area of the part relative with said fixing terminal (being heating element) 1 of said temperature components of assays 7.
In addition, this temperature measurement component 7 is present between above-mentioned bimetal leaf 2 and the said fixing terminal (being heating element) 1, and and above-mentioned bimetal leaf 2 together by fastening being securely fixed on the said fixing terminal (being heating element) 1 of many places riveted joints, form an integral body.That is, the anchor portion 22 of above-mentioned bimetal leaf 2, said temperature components of assays 7 and said fixing terminal (being heating element) 1, fastening and closely be combined into one by above-mentioned riveted joint, keep conductivity of heat good binding state.
The inspection of above-mentioned tripping characteristic, can be undertaken by Fig. 2~thermal trip monomer shown in Figure 5, perhaps as shown in Figure 1, under the state that thermal trip is assembled in the circuit-breaker, carry out, under this situation, if with the electric current of the overcurrent that is equivalent to stipulate to above-mentioned fixed terminal (being heating element) 1 energising, then as shown in Figure 5, the above-mentioned action end 21 of above-mentioned bimetal leaf 2 is crooked shown in chain-dotted line, said temperature components of assays 7 is also shown in chain-dotted line, to the direction bending identical with the above-mentioned action end 21 of above-mentioned bimetal leaf 2.
Because said temperature components of assays 7 is by forming (promptly with above-mentioned bimetal leaf 2 identical materials, under the situation of the laminated material that above-mentioned bimetal leaf 2 is iron and copper, said temperature components of assays 7 also is the laminated material of iron and copper), and the length of comparing said temperature components of assays 7 with the length of above-mentioned bimetal leaf 2 is short, so even the above-mentioned action end 21 of above-mentioned bimetal leaf 2 and said temperature components of assays 7 are crooked shown in chain-dotted line, the amount of bow of said temperature components of assays 7 is crooked little than the above-mentioned action end 21 of above-mentioned bimetal leaf 2 also, so can produce very little gap g between the above-mentioned action end 21 of the leading section of said temperature components of assays 7 and above-mentioned bimetal leaf 2.Therefore, said temperature components of assays 7 can not contact and push the above-mentioned action end 21 of above-mentioned bimetal leaf 2 because of it is crooked, can the amount of bow of the above-mentioned action end 21 of above-mentioned bimetal leaf 2 not had a negative impact.
Said temperature components of assays 7, with the crooked on the contrary situation of the chain-dotted line of Fig. 5 under, because it can push the above-mentioned action end 21 of above-mentioned bimetal leaf 2 when crooked, can the amount of bow of the above-mentioned action end 21 of above-mentioned bimetal leaf 2 be had a negative impact, so must avoid to install with the crooked on the contrary mode of the chain-dotted line of Fig. 5.
Execution mode 2
Below, by Fig. 6~Fig. 8 embodiments of the present invention 2 are described.Fig. 6 is the oblique view of expression thermal trip, and Fig. 7 is the end view of thermal trip, and Fig. 8 is the enlarged side view that is used to illustrate the bimetal leaf flexure operation when fixed terminal (being heating element) is switched on.
Embodiments of the present invention 2 are as Fig. 6~shown in Figure 8, are temperature measurement components 7 from the said fixing end 221 of above-mentioned bimetal leaf 2 to the example of the situation of extending with above-mentioned action end 21 opposite sides of above-mentioned bimetal leaf.
Under this situation, temperature measurement component 7 is to make above-mentioned bimetal leaf 2 self to extending and form with an opposite side of above-mentioned action end 21.In other words, temperature measurement component 7, with from above-mentioned bimetal leaf 2 and said fixing terminal (being heating element) 1 state that exposes, directly combine to the fastening fastening part 221 of above-mentioned fixed terminal (being heating element) 1 with above-mentioned bimetal leaf 2 integratedly, thereby can contact with contact temperature analyzer 8, and, from the above-mentioned fastening part 221 of above-mentioned bimetal leaf 2 to extending with above-mentioned action end 21 opposite sides of above-mentioned bimetal leaf.
Under the situation of embodiments of the present invention 2, as shown in Figure 7 and Figure 8, the front end of the mensuration part 81 by making contact temperature analyzer 8 and the lower surface butt of temperature measurement component 7 are measured the temperature of temperature measurement component 7, measure the temperature of bimetal leaf 2 indirectly.
Under the situation of embodiments of the present invention 2, electric current by the overcurrent that will be equivalent to stipulate is to above-mentioned fixed terminal (being heating element) 1 energising, said temperature components of assays 7 is crooked shown in chain-dotted line, can produce small clearance G between the leading section of said temperature components of assays 7 and said fixing terminal (being heating element) 1.Therefore, can be by said temperature components of assays 7 because of this bending and said fixing terminal (being heating element) 1 butt, and the said fixing end 22 of above-mentioned bimetal leaf 2 is applied power, thereby can the amount of bow of the above-mentioned action end 21 of above-mentioned bimetal leaf 2 not had a negative impact.
Execution mode 3
In embodiments of the present invention 3, as shown in Figure 9, the big mensuration part insertion through hole 12a of diameter than the said determination spare 81 of above-mentioned contact temperature analyzer 8 is set on said fixing terminal 1, said determination spare 81 is inserted this to be measured among the part insertion through hole 12a, so that it can not contact with said fixing terminal (being heating element) 1, the front end by said determination spare 81 and the lower surface butt of said temperature components of assays 7 are measured the temperature of temperature measurement component 7, measure the temperature of bimetal leaf 2 indirectly.By such formation, can realize the effect identical with above-mentioned execution mode of the present invention 2.
In addition, in embodiments of the present invention 3, specifically, as shown in the figure, said determination spare is set in the internal terminal portion 12 in circuit-breaker inserts through hole 12a, this internal terminal portion 12 is positioned at the end with the external terminal portions 11 opposite sides with connecting hole 11a.
Execution mode 4
Embodiments of the present invention 3 as shown in figure 10, it is the structure that internal terminal portion 12 is extended more longways to the private side of circuit-breaker main body, from measure part insert through hole 12a to the private side of circuit-breaker main body on the position of predetermined distance, the connecting hole 12b that is connected with the splicing ear (diagram is omitted) of circuit-breaker body interior is set, to be connected with the splicing ear (diagram is omitted) of circuit-breaker body interior easily.

Claims (10)

1. circuit-breaker, it has thermal trip, this thermal trip be with an end for the action the other end, end be the said fixing end of the bimetal leaf of anchor portion, be fastened on the fixed terminal with cantilever-shaped, when flowing through overcurrent in the said fixing terminal, above-mentioned bimetal leaf is overheated and crooked, utilize the bending of this bimetal leaf, above-mentioned action end makes the action of tripping of circuit-breaker main body, it is characterized in that
On the fastening fastening part of above-mentioned fixed terminal, integratedly directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and said fixing terminal, thereby can contact with the contact temperature analyzer at above-mentioned bimetal leaf.
2. circuit-breaker as claimed in claim 1 is characterized in that,
The said temperature components of assays is present between above-mentioned bimetal leaf and the said fixing terminal, is fastened on the said fixing terminal with above-mentioned bimetal leaf.
3. circuit-breaker as claimed in claim 1 is characterized in that,
The said temperature components of assays from the above-mentioned fastening part of above-mentioned bimetal leaf, is extended to a side opposite with the above-mentioned action end of above-mentioned bimetal leaf.
4. as any described circuit-breaker in the claim 1 to 3, it is characterized in that,
The said temperature components of assays is formed by the bimetal leaf with the identical material of above-mentioned bimetal leaf, under the situation overheated owing to the overcurrent that flows through the said fixing terminal, to the direction bending away from the said fixing terminal.
5. thermal trip, it is the said fixing end of the bimetal leaf of anchor portion with an end for action the other end, end, be fastened on the heating element that becomes fixed terminal with cantilever-shaped, under the situation overheated by switching on to above-mentioned heating element, the above-mentioned action end bent of above-mentioned bimetal leaf, it is characterized in that
On the fastening fastening part of above-mentioned heating element, integratedly directly in conjunction with temperature measurement component, this temperature measurement component exposes from above-mentioned bimetal leaf and above-mentioned heating element, thereby can contact with the contact temperature analyzer at above-mentioned bimetal leaf.
6. thermal trip as claimed in claim 5 is characterized in that,
The said temperature components of assays is present between above-mentioned bimetal leaf and the above-mentioned heating element, is fastened on the above-mentioned heating element with above-mentioned bimetal leaf.
7. thermal trip as claimed in claim 6 is characterized in that,
The area of said temperature components of assays, the area of the part more relative with above-mentioned heating element than said temperature components of assays is big.
8. thermal trip as claimed in claim 5 is characterized in that,
The said temperature components of assays from the above-mentioned fastening part of above-mentioned bimetal leaf, is extended to a side opposite with the above-mentioned action end of above-mentioned bimetal leaf.
9. thermal trip as claimed in claim 8 is characterized in that,
On above-mentioned heating element, the big mensuration part insertion through hole of diameter than the mensuration part of contact temperature analyzer is set.
10. as any described thermal trip in the claim 5 to 9, it is characterized in that,
The said temperature components of assays is formed by the bimetal leaf with the identical material of above-mentioned bimetal leaf, under the situation overheated owing to switching on to above-mentioned heating element, to the direction bending away from above-mentioned heating element.
CN2005800492537A 2005-03-25 2005-03-25 Circuit breaker and thermal trip Expired - Fee Related CN101147224B (en)

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PCT/JP2005/005562 WO2006103722A1 (en) 2005-03-25 2005-03-25 Circuit breaker and thermal trip

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CN101147224A CN101147224A (en) 2008-03-19
CN101147224B true CN101147224B (en) 2010-06-16

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CN109148230A (en) * 2018-10-15 2019-01-04 浙江天正电气股份有限公司 A kind of omnipotent breaker

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JP特开2002-324473A 2002.11.08

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JPWO2006103722A1 (en) 2008-09-04
EP1863057A4 (en) 2009-10-21
EP1863057B1 (en) 2011-09-14
CN101147224A (en) 2008-03-19
WO2006103722A1 (en) 2006-10-05
JP4399498B2 (en) 2010-01-13

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