CN101023329B - 辐射测量设备、辐射控制系统及辐射测量方法 - Google Patents

辐射测量设备、辐射控制系统及辐射测量方法 Download PDF

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Publication number
CN101023329B
CN101023329B CN2005800311279A CN200580031127A CN101023329B CN 101023329 B CN101023329 B CN 101023329B CN 2005800311279 A CN2005800311279 A CN 2005800311279A CN 200580031127 A CN200580031127 A CN 200580031127A CN 101023329 B CN101023329 B CN 101023329B
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CN
China
Prior art keywords
radiation
sensor
equipment
dust
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2005800311279A
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English (en)
Chinese (zh)
Other versions
CN101023329A (zh
Inventor
C.J.默滕斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
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Publication date
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Publication of CN101023329A publication Critical patent/CN101023329A/zh
Application granted granted Critical
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Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B39/00—Circuit arrangements or apparatus for operating incandescent light sources
    • H05B39/04—Controlling
    • H05B39/041—Controlling the light-intensity of the source
    • H05B39/042—Controlling the light-intensity of the source by measuring the incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN2005800311279A 2004-09-15 2005-09-06 辐射测量设备、辐射控制系统及辐射测量方法 Expired - Fee Related CN101023329B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP04104452 2004-09-15
EP04104452.0 2004-09-15
PCT/IB2005/052907 WO2006030345A1 (en) 2004-09-15 2005-09-06 Radiation measuring device, radiation control system, and radiation measuring method

Publications (2)

Publication Number Publication Date
CN101023329A CN101023329A (zh) 2007-08-22
CN101023329B true CN101023329B (zh) 2011-06-08

Family

ID=35355757

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2005800311279A Expired - Fee Related CN101023329B (zh) 2004-09-15 2005-09-06 辐射测量设备、辐射控制系统及辐射测量方法

Country Status (5)

Country Link
EP (1) EP1794553B1 (https=)
JP (1) JP5033629B2 (https=)
CN (1) CN101023329B (https=)
AT (1) ATE556303T1 (https=)
WO (1) WO2006030345A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102288300B (zh) * 2011-05-10 2012-11-07 中国科学技术大学 一种基于双材料微悬臂梁的辐射热通量测量装置
CN102879107B (zh) * 2012-09-25 2015-02-25 中国科学院地理科学与资源研究所 热红外下行辐射测定装置及其测定方法
CN104501949B (zh) * 2014-12-29 2016-08-24 中国科学院长春光学精密机械与物理研究所 基于替代法和探测器效率的腔体吸收率测量方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3300646A (en) * 1964-02-06 1967-01-24 Eastman Kodak Co Light integrator using diffuse surface of a light-conducting rod
US3457407A (en) * 1966-07-27 1969-07-22 Us Navy Apparatus for quantitatively detecting foreign particles present in atmospheric air
CN1316052A (zh) * 1998-09-16 2001-10-03 布劳恩有限公司 具有多个传感器元件的辐射温度计和辐射传感器以及测定温度的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1281342A (en) * 1968-10-09 1972-07-12 English Clays Lovering Pochin Apparatus for measuring concentration of solids in a fluid
JPS545777A (en) * 1977-06-15 1979-01-17 Matsushita Electric Works Ltd Infrated absorption type gas alarming device
JPS639826A (ja) * 1986-06-30 1988-01-16 Hochiki Corp 炎検出装置
JPS6463822A (en) * 1987-09-03 1989-03-09 Toshiba Corp Measuring device for energy of electromagnetic wave
EP0695932A1 (de) * 1994-08-03 1996-02-07 Hl Planartechnik Gmbh Thermoelektrisches Bauelement
JPH1164104A (ja) * 1997-08-20 1999-03-05 Tec Corp 光センサ装置および照明器具

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3300646A (en) * 1964-02-06 1967-01-24 Eastman Kodak Co Light integrator using diffuse surface of a light-conducting rod
US3457407A (en) * 1966-07-27 1969-07-22 Us Navy Apparatus for quantitatively detecting foreign particles present in atmospheric air
CN1316052A (zh) * 1998-09-16 2001-10-03 布劳恩有限公司 具有多个传感器元件的辐射温度计和辐射传感器以及测定温度的方法

Also Published As

Publication number Publication date
EP1794553B1 (en) 2012-05-02
JP5033629B2 (ja) 2012-09-26
EP1794553A1 (en) 2007-06-13
JP2008513764A (ja) 2008-05-01
ATE556303T1 (de) 2012-05-15
CN101023329A (zh) 2007-08-22
WO2006030345A1 (en) 2006-03-23

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GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: Holland Ian Deho Finn

Patentee after: KONINKLIJKE PHILIPS N.V.

Address before: Holland Ian Deho Finn

Patentee before: Koninklijke Philips Electronics N.V.

CP01 Change in the name or title of a patent holder
TR01 Transfer of patent right

Effective date of registration: 20170309

Address after: Eindhoven

Patentee after: KONINKLIJKE PHILIPS N.V.

Address before: Holland Ian Deho Finn

Patentee before: KONINKLIJKE PHILIPS N.V.

TR01 Transfer of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110608

Termination date: 20180906

CF01 Termination of patent right due to non-payment of annual fee