CN100593821C - Delay locked loop circuit and method for provding delay locked loop clock of synchronous memory device - Google Patents
Delay locked loop circuit and method for provding delay locked loop clock of synchronous memory device Download PDFInfo
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- CN100593821C CN100593821C CN200610107595A CN200610107595A CN100593821C CN 100593821 C CN100593821 C CN 100593821C CN 200610107595 A CN200610107595 A CN 200610107595A CN 200610107595 A CN200610107595 A CN 200610107595A CN 100593821 C CN100593821 C CN 100593821C
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/225—Clock input buffers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
- H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2227—Standby or low power modes
Abstract
A synchronous memory device having a normal mode and a power down mode includes a power down mode controller for generating a power down mode control signal in response to a clock enable signal, thereby determining onset or termination of a power down mode. A clock buffering unit buffers an external clock signal in response to the power down mode control signal and outputs first and second internal clock signals. A clock selection unit selects one of the first and second internal clock signals based on the power down mode control signal to output the selected signal as an intermediate output clock signal. A phase update unit performs a phase update operation by using the intermediate output clock signal to output a delay locked loop (DLL) clock signal, the first internal clock signal differing in frequency from the second internal clock signal.
Description
Technical field
The present invention relates to a kind of delay-locked loop (DLL) circuit of synchronous dram, and more particularly, the present invention relates to a kind of DLL circuit of carrying out stable operation at battery saving mode (low-power operation that is used for semiconductor devices) down.
Background technology
Synchronous semiconductor memory device such as Double Data Rate synchronous dram (DDR SDRAM), use with from internal clock signal such as the external timing signal genlocing of the external devices input of Memory Controller, carry out data transmission with external devices.In order stably to transmit data, inevitably by the data transmission of each parts and be loaded into the time delay that the mistiming between the data in the bus causes, these data should accurately be positioned the edge or the center of clock by compensation.
The clock synchronization circuit that is used for the compensating delay time is phaselocked loop (PLL) or delay-locked loop (DLL).If the external timing signal frequency is different from the internal clock signal frequency, then need utilize double frequency function (frequency multiplying function).Therefore, the described PLL of main in this case use.On the contrary, if the frequency of external timing signal equates with internal clock signal, then use DLL.The DLL circuit postpones component (it betides clock signal is transferred to the data output end period of the day from 11 p.m. to 1 a.m in the semiconductor memory by each parts) by compensating clock, produces internal clock signal.Therefore, the DLL circuit makes the clock signal that is used for final I/O data can be synchronized with external timing signal.Compare with the PLL circuit, the advantage of DLL circuit is that the low and available small size of noise realizes.Therefore, wish usually to adopt the DLL circuit as the synchronizing circuit in the semiconductor memory.In all kinds DLL, state-of-the-art technology provides a kind of DLL circuit that is subjected to register controlled, and it can shorten the time that locking first clock is spent.
In the middle of during the outage source, the DLL circuit that is subjected to register controlled with register of the length of delay that can store locking, the length of delay of locking is stored in this register, and when energized once more, be subjected to the DLL circuit of register controlled to be written into the length of delay that is stored in the locking in the register, so that the length of delay of locking is used for locked clock immediately.
Fig. 1 is the concept map of the basic operation of explanation general delay-locked loop (DLL) circuit.
The DLL circuit receives external timing signal, and the delay of compensation in the internal clocking that produces DRAM.The DLL circuit is guaranteed output signal and the external timing signal homophase of DRAM.When the output of external clock and DRAM had same phase, data can transfer to chipset error-free.
Fig. 2 is the calcspar of the DLL circuit that is subjected to register controlled of prior art.
This DLL circuit comprises: clock buffer 10, power down mode controller 20, phase comparator 30, delay controller 40, lag line 50, illusory lag line 60 and late replicating model 70.Dll clock signal DLL_CLK from the output of DLL circuit transfers to output buffer 90 via clock cable 80, with the output timing of control data.
When DRAM entered battery saving mode, power down mode controller 20 disconnected clock buffer 10.For low-power operation DRAM when the no read, when clock enable signal CKE became logic level " low ", this DRAM entered battery saving mode.At this moment, because clock buffer 10 does not produce internal clock signal REF_CLK, so clock buffer 10 disconnects to be used to store the current state of DLL circuit.
By comparing input clock and output clock phase place to each other, phase comparator 30 detects the input clock of DLL circuit and the phase differential between the output clock.Usually, in order to reduce the power consumption of DLL circuit, the frequency division of the frequency of the external clock imported is become preset frequency, then phase comparator 30 clock of this frequency division relatively via Clock dividers.In Fig. 2,, omit Clock dividers for the convenience that illustrates.At phase comparator 30 places,, compare mutually with the feedback clock signal FB_CLK that after internal circuit, feeds back to by the DLL circuit by the internal clock signal REF_CLK of clock buffer 10.Phase comparator 30 is control lag controller 40 as a result based on the comparison.
This delay controller 40 disposes logical circuit (being used for determining the input path of lag line 50) and bidirectional shift register (this path direction is used to be shifted).Receive four input signals and carry out the shift register of shifting function, by constructing its initial input condition so that its right signal or left signal are in logic level " height ", thereby have maximum or minimum delay.The signal that is input in the shift register has two move to right signal and two signals that move to left.For shifting function, logic level should not overlap each other for two signals of " height ".
Late replicating model 70 is for being used for the circuit of modelling delay factor, and wherein these delay factors influences external clock and input to the clock sequential that chip is exported from chip until clock via lag line 50.Accurately delay factor is determined the degradation values of the function of DLL circuit.By shrinking, simplify or do not utilize with in statu quo having any modification the method for a basic circuit, realize late replicating model 70.In fact, late replicating model 70 modelling clock buffer, dll clock driver, R/F frequency divider and output buffer same as before.
Fig. 3 is the sequential chart that is used for the DLL of application drawing 2.
As shown, when entering battery saving mode, clock enable signal CKE is converted to logic level " low " from logic level " height ".At this moment, the DLL circuit stops excute phase and upgrades operation, and with the storage current state, and the information of the previous locking of storage is to enter frozen state (frozen state).In this article, term " phase place upgrade operation " the feedback clock signal FB_CLK that means the DLL circuit does bit comparison mutually with the internal clock signal REF_CLK of to be determined and Continuous Tracking.Term " frozen state " means the information of the wherein previous locking of storage and the state that phase place is no longer upgraded.
Simultaneously, under the situation of precharge battery saving mode, the time that stays in the battery saving mode is in the scope of minimum three clocks to maximum 7.8 μ s.At this moment, clock buffer 10 is disconnected by power down mode controller 20, not produce the dll clock signal DLL_CLK of DLL circuit.
When battery saving mode keep one long-time after, such as among Fig. 3 displaying, to maximum 7.8 μ s (this section time durations does not upgrade phase place), the current locking information of DLL circuit is attributable to the variation of semiconductor devices environment (such as external temperature) and is different from previous locking information before the battery saving mode from minimum approximately 3CLK.
When withdrawing from battery saving mode with this understanding, when promptly current locking information did not match each other with previous locking information, the phase place of the dll clock signal DLL_CLK of DLL circuit was different from the phase place of target clock to be locked.As a result, be difficult to accurately to transfer data to DRAM/ and receive data, because the phase place of external timing signal is different from the phase place of the dll clock signal DLL_CLK of DLL circuit from DRAM.
Summary of the invention
Therefore, delay-locked loop (DLL) circuit of purpose of the present invention for a kind of semiconductor memory is provided, it is used to prevent that the locking failure takes place the variation because of semiconductor device environment (such as external temperature) during long relatively battery saving mode.
According to an aspect of the present invention, a kind of synchronous memories device with normal mode and battery saving mode is provided, it comprises: power down mode controller, and it is used for producing the battery saving mode control signal in response to the clock enable signal, and then the initial or termination of definite battery saving mode; Clock buffer cell, it is used for cushioning external timing signal in response to the battery saving mode control signal, and exports first internal clock signal and second internal clock signal; The clock selecting unit, it is used for selecting first internal clock signal and second internal clock signal one based on the battery saving mode control signal, is exported as intermediate output clock signal will select signal; And phase update unit, it is used for by using this intermediate output clock signal to come excute phase to upgrade operation, and with output delay locked loop (DLL) clock signal, wherein the frequency of this first internal clock signal is different from the frequency of second internal clock signal.
According to another aspect of the present invention, provide a kind of delay-locked loop (DLL), it comprises: power down mode controller, and it is used for producing the battery saving mode control signal in response to the clock enable signal, and then the initial or termination of definite battery saving mode; First clock buffer cell, it is used for cushioning external timing signal in response to the battery saving mode control signal, and will be somebody's turn to do through the buffering clock signal exported as first internal clock signal; The second clock buffer cell, it is used for cushioning external timing signal in response to this battery saving mode control signal and will be somebody's turn to do through the clock signal of buffering being exported as second internal clock signal, and the frequency of this second internal clock signal is lower than the frequency of this first internal clock signal; The clock selecting unit, it is by selecting first internal clock signal and select second internal clock signal in battery saving mode, the output intermediate output clock signal in normal mode based on the battery saving mode control signal; And phase update unit, it is used for by using this intermediate output clock signal to come excute phase to upgrade operation, with output delay locked loop (DLL) clock signal.
According to a further aspect of the invention, provide a kind of method that is used to produce delay-locked loop (DLL) clock of the synchronous memories device with normal mode and battery saving mode, it comprises: produce first internal clock signal by the buffering external clock; Produce second internal clock signal by cushioning this external clock, the frequency of this second internal clocking is different from the frequency of this first internal clock signal; Select in first internal clock signal and second internal clock signal one according to mode control signal; In normal mode, carry out the DLL phase place and upgrade operation based on first internal clock signal; And in battery saving mode, carry out the DLL phase place and upgrade operation based on second internal clock signal.
Description of drawings
Above-mentioned and other purpose and feature of the present invention becomes better understood with reference to the following description of the preferred embodiment that provides in conjunction with the accompanying drawings, in the accompanying drawings:
Fig. 1 is the concept map of the basic operation of explanation general delay-locked loop (DLL) circuit;
Fig. 2 is the calcspar of DLL circuit;
Fig. 3 is the sequential chart of the DLL operation of Fig. 2;
Fig. 4 is the calcspar of DLL circuit according to an embodiment of the invention;
Fig. 5 is the power down mode controller of being showed among Fig. 4 and the detailed circuit diagram of second clock impact damper;
Fig. 6 is the detailed circuit diagram of the clock converting unit of being showed among Fig. 5;
Fig. 7 is the detailed circuit diagram of 2 Clock dividers showed among Fig. 6; And
Fig. 8 is the sequential chart of the analog result of explanation when according to embodiments of the invention the DLL of Fig. 4 being applied to semiconductor memory.
The critical piece symbol description
10 clock buffers, 20 power down mode controller
30 phase comparators, 40 delay controllers
50 lag lines, 60 illusory lag lines
70 late replicating models, 80 clock cables
90 output buffers, 100 power down mode controller
200 first clock buffers, 300 second clock impact dampers
320 differential amplifiers, 340 clock converting units
360 output units, 362 transmission gates
364 phase inverters, 400 clock selecting unit
500 phase update unit, 520 lag lines
530 illusory lag line 540 late replicating models
550 phase comparators, 560 delay controllers
800 output buffers 810A~810N2 Clock dividers
820A~820N fuse cell
Embodiment
To describe delay-locked loop (DLL) circuit in detail referring to accompanying drawing according to exemplary embodiment of the present invention.
Fig. 4 is the calcspar of DLL circuit according to an embodiment of the invention.
Power down mode controller 100 produces battery saving mode control signal CTRL in response to clock enable signal CKE, and it is determined the initial of battery saving mode or stops.
Second clock impact damper 300 receives and cushions this external timing signal CLK and this external clock inhibit signal CLKB in response to battery saving mode control signal CTRL, thereby will be exported as the second internal clock signal ICLK_PD through the signal of buffering.The second internal clock signal ICLK_PD has the frequency that is lower than the first internal clock signal ICLK_NM.
The intermediate output clock signal CLKOUT of lag line 520 receive clock selected cells 400 is with one schedule time of phase delay with intermediate output clock signal CLKOUT.Illusory lag line 530 is identical with lag line 520 substantially.Late replicating model 540 passes through with external timing signal CLK in the semiconductor memory and the delay factor of external clock inhibit signal CLKB, the output signal of coming the illusory lag line 530 of modelling, thereby output feedback clock signal FB_CLK.Phase differential between the intermediate output clock signal CLKOUT of phase comparator 550 detection clock selecting unit 400 and the feedback clock signal FB_CLK of late replicating model 540.Delay controller 560 comes pilot delay line 520 and illusory lag line 530 based on the output signal of phase comparator 550.
The dll clock signal DLL_CLK of DLL circuit 600 transfers to output buffer 800 via clock cable 700, with the output timing of control data.
Therefore, in DLL circuit 600 of the present invention, power down mode controller 100 is controlled clock selecting unit 400 based on battery saving mode control signal CTRL.The intermediate output clock signal CLKOUT that phase update unit 500 is exported in response to from clock selecting unit 400 (its select the first internal clock signal ICLK_NM and the second internal clock signal ICLK_PD one), excute phase upgrades operation.
Owing to this reason, with in battery saving mode not the excute phase DLL circuit that upgrades the prior art of operation compare, DLL circuit of the present invention is carried out at least one phase place and is upgraded and operate in the battery saving mode based on the second internal clock signal ICLK_PD.
Fig. 5 is the power down mode controller 100 of being showed among Fig. 4 and the detailed circuit diagram of second clock impact damper 300.
Power down mode controller 100 comprises the first phase inverter INV1 and the second phase inverter INV2 and first and non-(NAND) door NAND1.
The first phase inverter INV1 makes clock enable signal CKE anti-phase; The first Sheffer stroke gate NAND1 carries out NAND operation to output signal and the idle signal IDLE of the first phase inverter INV1, and the phase place of idle signal is opposite with the phase place of clock enable signal CKE in battery saving mode.The second phase inverter INV2 makes the output signal of the first Sheffer stroke gate NAND1 anti-phase, so that this anti-phase signal is exported as battery saving mode control signal CTRL.Under battery saving mode, clock enable signal CKE has logic level " low " and idle signal IDLE has logic level " height ".
Second clock impact damper 300 comprises differential amplifier 320, clock converting unit 340 and output unit 360.
This differential amplifier 320 comparison external timing signal CLK and external clock inhibit signal CLKB are with amplification ratio result; The output signal of 340 pairs of these differential amplifiers 320 of this clock converting unit is carried out frequency transformation.Output unit 360 is exported the output signal of clock converting unit 340 in response to battery saving mode control signal CTRL as the second internal clock signal ICLK_PD.
The differential amplifier 320 of second clock impact damper 300 comprises that one enables nmos pass transistor N1, input NMOS transistor N2 and N3 and output PMOS transistor P1 and P2.
Enable nmos pass transistor N1 and control the operation of differential amplifier 320 in response to enable signal ENABLE.Input NMOS transistor N2 and N3 control the output signal of differential amplifier 320 in response to external timing signal CLK and external clock inhibit signal CLKB, promptly temporary transient clock signal TMP_CLK.Output PMOS transistor P1 and P2 are connected between the node of source voltage and temporary transient clock signal TMP_CLK, to be used for determining temporary transient clock signal TMP_CLK according to input NMOS transistor N2 and N3.
Compare with first clock buffer 200, second clock impact damper 300 comprises the clock converting unit 340 between differential amplifier 320 and the output unit 360.This clock converting unit 340 can comprise at least one Clock dividers that is connected in series.
Fig. 6 is the detailed circuit diagram of the clock converting unit 340 of being showed among Fig. 5, and Fig. 7 is the detailed circuit diagram of the 2 Clock dividers 810A of unit that showed among Fig. 6.
Referring to Fig. 6, clock converting unit 340 of the present invention comprises a plurality of 2 Clock dividers 810A to 810N and a plurality of fuse cell 820A to 820N.
A plurality of 2 Clock dividers 810A to 810N of unit are connected in series and have a plurality of clocks of different clocks unit with generation, for example, and 2 clocks to 2
nClock; And a plurality of fuse cell 810A to 810N are by the selected fuse of fusing, select of output clock of a plurality of units 2 Clock dividers.
Exemplary configurations among Fig. 7 is showed the 2 Clock dividers 810A of a unit among the 2 Clock dividers 810A to 810N of unit.The 2 Clock dividers 810A of unit are by producing output clock OUT with input clock IN divided by 2.
Therefore, clock converting unit 340 of the present invention is used as 2 Clock dividers, by two 4 Clock dividers that unit 2 Clock dividers are formed of series connection, or by n unit 2 Clock dividers of connecting form 2
nClock dividers.As a result, in battery saving mode, clock converting unit 340 can be upgraded opereating specification according to desired phase place and set desired clock by using a plurality of 2 Clock dividers.
That is, in the present invention, clock converting unit 340 is implemented and produces a plurality of clocks through frequency division, and selects of this a plurality of clocks through frequency division for use by test.Perhaps, it is possible using metal to select for use processing unit (metal option process unit) to substitute a plurality of fuse cell 820A to 820N.
Fig. 8 for explanation when according to embodiments of the invention with the DLL circuit application of Fig. 4 the sequential chart of the analog result during in semiconductor memory.
As shown, according to embodiments of the invention, under precharge battery saving mode situation, even battery saving mode is kept one section long-time such as 7.8 μ s, still the second internal clock signal ICLK_PD of the second clock impact damper 300 by being used for battery saving mode carries out the DLL phase place at least again and upgrades operation.
Therefore, can during long battery saving mode, prevent the locking failure, wherein owing to cause previous locking information to be different from current locking information as the variation of the semiconductor devices environment of the variation of external temperature.
As described above,,, upgrade operation more than once, effectively prevent DLL locking failure by carrying out the DLL phase place even semiconductor memory stays in the battery saving mode for a long time according to the present invention.As a result, the DLL circuit operation is more stable.
The application's case contains the 2005-91659﹠amp with korean patent application case KR; The relevant theme of 2005-127734 (respectively at submitting Korean Patent office on September 29th, 2005, on Dec 22nd, 2005), its whole contents is incorporated herein with way of reference.
Though describe the present invention with reference to some preferred embodiment, it will be apparent to one skilled in the art that under the spirit of the present invention and scope situation that do not depart from by the claim definition, can make various variations and modification.
Claims (20)
1. synchronous memories device with normal mode and battery saving mode, it comprises:
Power down mode controller, it is used for producing the battery saving mode control signal in response to the clock enable signal, and then the initial or termination of definite battery saving mode;
Clock buffer cell, it is used for cushioning external timing signal in response to this battery saving mode control signal, and exports first internal clock signal and second internal clock signal;
The clock selecting unit, it is used for selecting this first internal clock signal and this second internal clock signal one based on this battery saving mode control signal, is exported as intermediate output clock signal should select signal; And
Phase update unit, it is used for by using this intermediate output clock signal to come excute phase to upgrade operation, with output delay locked loop clock signal,
Wherein the frequency of this first internal clock signal is different from the frequency of this second internal clock signal.
2. synchronous memories device as claimed in claim 1, wherein this first internal clock signal is exported based on this battery saving mode control signal in this clock selecting unit in this normal mode, and exports this second internal clock signal in this battery saving mode.
3. synchronous memories device as claimed in claim 2, wherein this clock buffer cell comprises:
First clock buffer, it is used for cushioning this external timing signal in response to this battery saving mode control signal, and then will be somebody's turn to do through the buffering clock signal exported as first internal clock signal; And
The second clock impact damper, it is used for cushioning this external timing signal in response to this battery saving mode control signal, and then will be somebody's turn to do through the buffering clock signal exported as second internal clock signal, the frequency of this second internal clock signal is lower than the frequency of this first internal clock signal.
4. synchronous memories device as claimed in claim 3, wherein this second clock impact damper comprises:
Differential amplifier, its be used for relatively this external timing signal with through anti-phase external timing signal, with amplification ratio result;
The clock converting unit, it is used for the output signal of this differential amplifier is carried out frequency transformation; And
Output unit, it is used for the output signal based on this battery saving mode control signal and this clock converting unit, exports second internal clock signal.
5. synchronous memories device as claimed in claim 4, wherein this clock converting unit comprises Clock dividers.
6. synchronous memories device as claimed in claim 4, wherein this clock converting unit comprises:
Be used to produce a plurality of units 2 Clock dividers that are connected in series of a plurality of clocks, each has different unit clock; And
A plurality of fuse cells, it is used for the selected fuse by a plurality of fuses that fuse, and selects from one of the clock of this a plurality of units 2 Clock dividers output.
7. synchronous memories device as claimed in claim 4, wherein this clock converting unit comprises:
Be used to produce a plurality of units 2 Clock dividers that are connected in series of a plurality of clocks, each has different unit clock; And
A plurality of processing units of selecting for use, it is used for selecting processing unit for use by metal, selects from one of the clock of this a plurality of units 2 Clock dividers output.
8. synchronous memories device as claimed in claim 4, wherein this output unit comprises:
Transmission gate, it is used for the output in response to this clock converting unit, transmits this battery saving mode control signal;
The odd number phase inverter that is connected in series, it was used for by anti-phase one schedule time of output delay with this clock converting unit, to export through anti-phase inhibit signal; And
Sheffer stroke gate, it is used for this through anti-phase inhibit signal and battery saving mode control signal actuating logic NAND operation by the transmission of this transmission gate, and then exports second internal clock signal.
9. synchronous memories device as claimed in claim 2, wherein this power down mode controller comprises:
First phase inverter, it is used to make this clock enable signal anti-phase;
Sheffer stroke gate, it is used for the output signal of this first phase inverter and an idle signal are carried out NAND operation, and in this battery saving mode, the phase place of this idle signal is opposite with the phase place of this clock enable signal; And
Second phase inverter, it is used to make the output signal of this Sheffer stroke gate anti-phase, and will be somebody's turn to do through anti-phase signal and be exported as this battery saving mode control signal.
10. synchronous memories device as claimed in claim 2, wherein this phase update unit comprises:
Lag line, it is used to postpone the phase place of intermediate output clock signal, and the intermediate output clock signal of output delay;
Illusory lag line, the structure with this lag line is identical substantially for its structure;
The late replicating model, it is used for each delay factor according to the clock signal of this storage component part, the output signal of coming this illusory lag line of modelling, and output feedback clock signal;
Phase comparator, it is used for relatively this intermediate output clock signal and this feedback clock signal, to detect phase differential therebetween; And
Delay controller, it is used to receive the output signal of this phase comparator, controlling the phase delay of this lag line and this illusory lag line, and then exports this delay-locked loop clock signal.
11. a delay-locked loop, it comprises:
Power down mode controller, it is used for producing the battery saving mode control signal in response to the clock enable signal, and then the initial or termination of definite battery saving mode;
First clock buffer cell, it is used for cushioning external timing signal in response to this battery saving mode control signal, and will be somebody's turn to do through the buffering clock signal exported as first internal clock signal;
The second clock buffer cell, it is used for cushioning this external timing signal in response to this battery saving mode control signal, and will be somebody's turn to do through the clock signal of buffering and be exported as second internal clock signal, wherein the frequency of this second internal clock signal is lower than the frequency of this first internal clock signal;
The clock selecting unit, it is used for selecting this first internal clock signal in normal mode, and select this second internal clock signal in this battery saving mode by based on this battery saving mode control signal, thus the output intermediate output clock signal; And
Phase update unit, it is used for by using this intermediate output clock signal to come excute phase to upgrade operation, with output delay locked loop clock signal.
12. as the delay-locked loop of claim 11, wherein this second clock buffer cell comprises:
Differential amplifier, its be used for relatively this external timing signal with through anti-phase external timing signal, to amplify comparative result;
The clock converting unit, it is used for the output signal of differential amplifier is carried out frequency transformation; And
Output unit, it is used for the output signal in response to this battery saving mode control signal and this clock converting unit, exports this second internal clock signal.
13. as the delay-locked loop of claim 12, wherein this clock converting unit comprises Clock dividers.
14. as the delay-locked loop of claim 12, wherein this clock converting unit comprises:
Be used to produce a plurality of units 2 Clock dividers that are connected in series of a plurality of clocks, each has different unit clock; And
A plurality of fuse cells, it is used for the selected fuse by a plurality of fuses that fuse, and selects from one of the clock of this a plurality of units 2 Clock dividers output.
15. as the delay-locked loop of claim 12, wherein this output unit comprises:
Transmission gate, it is used for the output in response to this clock converting unit, transmits this battery saving mode control signal;
The odd number phase inverter that is connected in series, it was used for by anti-phase one schedule time of output delay with this clock converting unit, to export through anti-phase inhibit signal; And
Sheffer stroke gate, it is used for this is reached the battery saving mode control signal actuating logic NAND operation of being transmitted by this transmission gate through anti-phase inhibit signal, and then exports second internal clock signal.
16. as the delay-locked loop of claim 11, wherein this power down mode controller comprises:
First phase inverter, it is used to make the clock enable signal anti-phase;
Sheffer stroke gate, it is used for the output signal of first phase inverter and an idle signal are carried out NAND operation, and in this battery saving mode, the phase place of this idle signal is opposite with the phase place of this clock enable signal; And
Second phase inverter, it is used to make the output signal of Sheffer stroke gate anti-phase, and will be somebody's turn to do through anti-phase signal and be exported as the battery saving mode control signal.
17. as the delay-locked loop of claim 11, wherein this phase update unit comprises:
Lag line, it is used to postpone the phase place of this intermediate output clock signal, and exports delayed intermediate output clock signal;
Illusory lag line, the structure with this lag line is identical substantially for its structure;
The late replicating model, it is used for each delay factor according to the clock signal of semiconductor memory, the output signal of this illusory lag line of modelling, and output feedback clock signal;
Phase comparator, it is used to receive this intermediate output clock signal and this feedback clock signal, to detect phase differential therebetween; And
Delay controller, it is used to receive the output signal of this phase comparator, controlling the phase delay of this lag line and this illusory lag line, and then exports this delay-locked loop clock signal.
18. a method that is used to produce the delay-locked loop clock of the synchronous memories device with normal mode and battery saving mode, it comprises:
Produce first internal clock signal by the buffering external clock;
Produce second internal clock signal by cushioning this external clock, the frequency of this second internal clock signal is different from the frequency of this first internal clock signal;
Select in this first internal clock signal and this second internal clock signal one according to mode control signal;
In this normal mode, carry out the delay-locked loop phase place based on this first internal clock signal and upgrade operation; And
In this battery saving mode, carry out the delay-locked loop phase place based on this second internal clock signal and upgrade operation.
19. as the method for claim 18, wherein the frequency of this second internal clock signal is lower than the frequency of this first internal clock signal.
20. as the method for claim 19, wherein this mode control signal comprises and shows that this storage component part is in normal mode or is in information in the battery saving mode.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20050091659 | 2005-09-29 | ||
KR91659/05 | 2005-09-29 | ||
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CN200610107595A Expired - Fee Related CN100593821C (en) | 2005-09-29 | 2006-07-26 | Delay locked loop circuit and method for provding delay locked loop clock of synchronous memory device |
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KR (1) | KR100753101B1 (en) |
CN (1) | CN100593821C (en) |
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KR100863010B1 (en) * | 2007-04-11 | 2008-10-13 | 주식회사 하이닉스반도체 | Semiconductor integrated circuit |
KR100907002B1 (en) | 2007-07-12 | 2009-07-08 | 주식회사 하이닉스반도체 | Delay Locked Loop And Method For controlling The Same |
KR100940849B1 (en) * | 2008-08-08 | 2010-02-09 | 주식회사 하이닉스반도체 | Semiconductor integrated circuit and method of controlling the same |
CN102142268B (en) * | 2010-02-02 | 2014-04-30 | 慧荣科技股份有限公司 | Control device and relevant control method thereof |
KR101923023B1 (en) | 2011-08-10 | 2018-11-28 | 에스케이하이닉스 주식회사 | Delay locked loop |
KR102099406B1 (en) | 2013-12-30 | 2020-04-09 | 에스케이하이닉스 주식회사 | Semiconductor apparatus |
CN104134457B (en) * | 2014-07-17 | 2018-01-09 | 北京航空航天大学 | A kind of resistance characteristic using non-volatile component realizes the circuit that signal is delayed on piece |
KR102439583B1 (en) * | 2018-04-30 | 2022-09-05 | 에스케이하이닉스 주식회사 | Memory device and signal transmitting circuit for the same |
US10515670B1 (en) * | 2018-06-13 | 2019-12-24 | Nanya Technology Corporation | Memory apparatus and voltage control method thereof |
CN116545438B (en) * | 2023-07-03 | 2023-11-03 | 麦斯塔微电子(深圳)有限公司 | Frequency divider and multi-modulus frequency divider |
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KR100529041B1 (en) * | 2003-05-16 | 2005-11-17 | 주식회사 하이닉스반도체 | Delay lock loop and phase locking method of synchronous dram |
KR100543460B1 (en) * | 2003-07-07 | 2006-01-20 | 삼성전자주식회사 | Delay Locked Loop |
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KR100753101B1 (en) | 2007-08-29 |
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