CN100428530C - 有机电致发光显示装置的制造方法 - Google Patents
有机电致发光显示装置的制造方法 Download PDFInfo
- Publication number
- CN100428530C CN100428530C CNB2004100576188A CN200410057618A CN100428530C CN 100428530 C CN100428530 C CN 100428530C CN B2004100576188 A CNB2004100576188 A CN B2004100576188A CN 200410057618 A CN200410057618 A CN 200410057618A CN 100428530 C CN100428530 C CN 100428530C
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims description 22
- 238000005401 electroluminescence Methods 0.000 title claims description 17
- 239000012528 membrane Substances 0.000 claims description 47
- 239000000463 material Substances 0.000 claims description 30
- 239000000758 substrate Substances 0.000 claims description 21
- 239000011521 glass Substances 0.000 claims description 20
- 230000003760 hair shine Effects 0.000 claims description 9
- 230000005855 radiation Effects 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 claims description 6
- 241000931526 Acer campestre Species 0.000 claims 1
- 238000007789 sealing Methods 0.000 claims 1
- 239000012044 organic layer Substances 0.000 abstract 2
- 239000010410 layer Substances 0.000 abstract 1
- 230000007547 defect Effects 0.000 description 10
- 230000008439 repair process Effects 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 8
- 230000015572 biosynthetic process Effects 0.000 description 6
- 230000002950 deficient Effects 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 238000007689 inspection Methods 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 230000001678 irradiating effect Effects 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000000862 absorption spectrum Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
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- 238000010998 test method Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/861—Repairing
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP087527/2004 | 2004-03-24 | ||
JP2004087527A JP2005276600A (ja) | 2004-03-24 | 2004-03-24 | 有機エレクトロルミネセンス表示装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1674726A CN1674726A (zh) | 2005-09-28 |
CN100428530C true CN100428530C (zh) | 2008-10-22 |
Family
ID=34990632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100576188A Expired - Lifetime CN100428530C (zh) | 2004-03-24 | 2004-08-20 | 有机电致发光显示装置的制造方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7258586B2 (zh) |
JP (1) | JP2005276600A (zh) |
CN (1) | CN100428530C (zh) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006221982A (ja) * | 2005-02-10 | 2006-08-24 | Toshiba Matsushita Display Technology Co Ltd | アレイ基板の製造方法及び有機el表示装置の製造方法 |
JP2006269108A (ja) * | 2005-03-22 | 2006-10-05 | Hitachi Displays Ltd | 有機発光表示装置及びその欠陥画素の修復方法 |
EP2027616A1 (en) * | 2006-05-22 | 2009-02-25 | Philips Intellectual Property & Standards GmbH | A method for separating a non-emission region from a light emission region within an organic light emitting diode (oled) |
JP2007317384A (ja) * | 2006-05-23 | 2007-12-06 | Canon Inc | 有機el表示装置、その製造方法、リペア方法及びリペア装置 |
US8062085B2 (en) * | 2007-03-23 | 2011-11-22 | Canon Kabushiki Kaisha | Method of producing organic light emitting device |
JP2009016195A (ja) * | 2007-07-05 | 2009-01-22 | Canon Inc | 有機発光装置のリペア方法及びそれを用いた有機発光装置の製造方法 |
JP2009064607A (ja) | 2007-09-05 | 2009-03-26 | Sony Corp | 有機発光表示装置のリペア方法 |
JP2009266917A (ja) * | 2008-04-23 | 2009-11-12 | Rohm Co Ltd | 有機発光素子および有機発光素子のリペア装置 |
KR101415788B1 (ko) * | 2008-07-21 | 2014-07-04 | 삼성디스플레이 주식회사 | 유기전계발광 표시장치의 배선수리방법 |
KR100932989B1 (ko) | 2008-08-20 | 2009-12-21 | 삼성모바일디스플레이주식회사 | 유기 발광 표시 장치 및 그 제조 방법 |
WO2010122782A1 (ja) | 2009-04-24 | 2010-10-28 | パナソニック株式会社 | 有機elディスプレイおよびその製造方法 |
JP5173985B2 (ja) | 2009-11-05 | 2013-04-03 | パナソニック株式会社 | 有機elディスプレイの製造方法 |
US9040967B2 (en) | 2010-12-01 | 2015-05-26 | Joled Inc. | Method for manufacturing organic electroluminescence device and organic electroluminescence device |
JP2012146529A (ja) * | 2011-01-12 | 2012-08-02 | Hitachi High-Technologies Corp | 薄膜表示素子の検査修正方法及び検査修正装置 |
WO2012140691A1 (ja) | 2011-04-12 | 2012-10-18 | パナソニック株式会社 | 有機el素子の製造方法及びレーザー焦点位置設定方法 |
JP5310773B2 (ja) | 2011-04-15 | 2013-10-09 | パナソニック株式会社 | 有機elディスプレイの製造方法 |
WO2012143974A1 (ja) | 2011-04-20 | 2012-10-26 | パナソニック株式会社 | 有機エレクトロルミネッセンス素子の製造方法および有機エレクトロルミネッセンス素子 |
KR101176474B1 (ko) * | 2011-05-12 | 2012-08-24 | 주식회사 코윈디에스티 | 픽셀재생장치 및 이를 이용한 픽셀재생방법 |
WO2012168973A1 (ja) * | 2011-06-08 | 2012-12-13 | パナソニック株式会社 | 有機el素子及び有機el素子の製造方法 |
CN103392381B (zh) | 2011-06-16 | 2016-05-25 | 株式会社日本有机雷特显示器 | 有机电致发光元件的制造方法以及有机电致发光元件 |
EP2538313B1 (en) * | 2011-06-20 | 2015-05-20 | Melfas, Inc. | Touch sensor panel |
WO2013038454A1 (ja) | 2011-09-15 | 2013-03-21 | パナソニック株式会社 | 有機el素子の製造方法及び評価方法 |
US9711761B2 (en) | 2011-09-15 | 2017-07-18 | Joled Inc. | Electro luminescence panel and method for manufacturing electro luminescence panel |
JP5963343B2 (ja) * | 2011-11-24 | 2016-08-03 | 株式会社Joled | 有機el素子の製造方法 |
JP5963342B2 (ja) * | 2011-11-24 | 2016-08-03 | 株式会社Joled | 有機el素子の製造方法 |
JP6142212B2 (ja) * | 2012-06-14 | 2017-06-07 | 株式会社Joled | 欠陥検出方法、有機el素子のリペア方法、および有機el表示パネル |
CN105988070A (zh) * | 2015-02-04 | 2016-10-05 | 上海和辉光电有限公司 | 判定有机发光二极管阴阳极短路的方法 |
JP6561290B2 (ja) | 2015-11-02 | 2019-08-21 | 株式会社Joled | 表示パネルの製造方法および表示パネル |
JP6778504B2 (ja) * | 2016-04-07 | 2020-11-04 | 株式会社小糸製作所 | 車両用灯具、及び有機el素子の検査方法 |
US10678076B2 (en) * | 2017-01-30 | 2020-06-09 | Facebook Technologies, Llc | Treating display panel using laser |
WO2018216137A1 (ja) * | 2017-05-24 | 2018-11-29 | シャープ株式会社 | 表示デバイス、欠陥修正装置、製造装置、および欠陥修正方法 |
JP2022076273A (ja) * | 2020-11-09 | 2022-05-19 | 株式会社Joled | 自発光型表示パネル、及び自発光型表示パネルの製造方法 |
CN112858390B (zh) * | 2020-12-31 | 2022-11-15 | 云谷(固安)科技有限公司 | 异物测试装置和异物测试方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020142697A1 (en) * | 2000-12-28 | 2002-10-03 | Hirokazu Yamagata | Method of manufacturing a light emitting device and thin film forming apparatus |
CN1447630A (zh) * | 2002-03-20 | 2003-10-08 | 三洋电机株式会社 | 有机el面板的减光化方法及有机el面板 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5017755A (en) * | 1988-10-26 | 1991-05-21 | Kabushiki Kaisha Toshiba | Method of repairing liquid crystal display and apparatus using the method |
JP3188678B2 (ja) | 1998-12-25 | 2001-07-16 | ティーディーケイ株式会社 | 有機el表示装置およびその製造方法 |
JP3386735B2 (ja) * | 1999-02-10 | 2003-03-17 | シャープ株式会社 | アクティブマトリクス基板の欠陥修正方法及び液晶パネルの製造方法 |
JP3840010B2 (ja) | 1999-10-19 | 2006-11-01 | 東北パイオニア株式会社 | 発光ディスプレイの製造方法 |
JP2001176672A (ja) | 1999-12-20 | 2001-06-29 | Toray Ind Inc | 有機電界発光装置およびその製造方法 |
JP2002303860A (ja) * | 2001-04-05 | 2002-10-18 | Matsushita Electric Ind Co Ltd | 液晶表示装置 |
TW200428062A (en) * | 2003-06-03 | 2004-12-16 | Au Optronics Corp | Method for repairing foreign objects in liquid crystal display |
-
2004
- 2004-03-24 JP JP2004087527A patent/JP2005276600A/ja active Pending
- 2004-06-29 US US10/878,550 patent/US7258586B2/en active Active
- 2004-08-20 CN CNB2004100576188A patent/CN100428530C/zh not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020142697A1 (en) * | 2000-12-28 | 2002-10-03 | Hirokazu Yamagata | Method of manufacturing a light emitting device and thin film forming apparatus |
CN1447630A (zh) * | 2002-03-20 | 2003-10-08 | 三洋电机株式会社 | 有机el面板的减光化方法及有机el面板 |
Also Published As
Publication number | Publication date |
---|---|
JP2005276600A (ja) | 2005-10-06 |
US7258586B2 (en) | 2007-08-21 |
US20050215163A1 (en) | 2005-09-29 |
CN1674726A (zh) | 2005-09-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: IPS ALPHA SUPPORT CO., LTD. Effective date: 20111213 Owner name: PANASONIC LCD CO., LTD. Free format text: FORMER OWNER: IPS ALPHA SUPPORT CO., LTD. Effective date: 20111213 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111213 Address after: Chiba County, Japan Co-patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Co-patentee before: IPS pioneer support society Patentee before: Hitachi Displays, Ltd. Effective date of registration: 20111213 Address after: Chiba County, Japan Co-patentee after: IPS Pioneer Support Society Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: JAPAN DISPLAY, INC. Free format text: FORMER NAME: APAN DISPLAY EAST, INC. Owner name: APAN DISPLAY EAST, INC. Free format text: FORMER NAME: HITACHI DISPLAY CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Japan Display East Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. Address after: Chiba County, Japan Patentee after: Japan Display East Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
|
CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: JAPAN DISPLAY Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
|
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20050928 Assignee: BOE TECHNOLOGY GROUP Co.,Ltd. Assignor: JAPAN DISPLAY Inc.|Panasonic Liquid Crystal Display Co.,Ltd. Contract record no.: 2013990000688 Denomination of invention: Method for manufacturing organic electroluminescent display device Granted publication date: 20081022 License type: Common License Record date: 20131016 |
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LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180919 Address after: Gyeonggi Do, South Korea Patentee after: SAMSUNG DISPLAY Co.,Ltd. Address before: Tokyo, Japan Co-patentee before: Panasonic Liquid Crystal Display Co.,Ltd. Patentee before: JAPAN DISPLAY Inc. |
|
CX01 | Expiry of patent term |
Granted publication date: 20081022 |