CN100385200C - 不均检查装置及方法 - Google Patents

不均检查装置及方法 Download PDF

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Publication number
CN100385200C
CN100385200C CNB2005101097700A CN200510109770A CN100385200C CN 100385200 C CN100385200 C CN 100385200C CN B2005101097700 A CNB2005101097700 A CN B2005101097700A CN 200510109770 A CN200510109770 A CN 200510109770A CN 100385200 C CN100385200 C CN 100385200C
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China
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CNB2005101097700A
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English (en)
Chinese (zh)
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CN1758021A (zh
Inventor
谷口和隆
上田邦夫
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Skilling Group
Dainippon Screen Manufacturing Co Ltd
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Dainippon Screen Manufacturing Co Ltd
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Publication of CN1758021A publication Critical patent/CN1758021A/zh
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biomedical Technology (AREA)
  • Manufacturing & Machinery (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
CNB2005101097700A 2004-10-08 2005-09-20 不均检查装置及方法 Expired - Fee Related CN100385200C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004295672 2004-10-08
JP2004295672A JP4353479B2 (ja) 2004-10-08 2004-10-08 ムラ検査装置、ムラ検査方法、および、濃淡ムラをコンピュータに検査させるプログラム

Publications (2)

Publication Number Publication Date
CN1758021A CN1758021A (zh) 2006-04-12
CN100385200C true CN100385200C (zh) 2008-04-30

Family

ID=36375792

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005101097700A Expired - Fee Related CN100385200C (zh) 2004-10-08 2005-09-20 不均检查装置及方法

Country Status (4)

Country Link
JP (1) JP4353479B2 (ja)
KR (1) KR100730052B1 (ja)
CN (1) CN100385200C (ja)
TW (1) TWI260396B (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4702953B2 (ja) * 2006-06-01 2011-06-15 大日本スクリーン製造株式会社 ムラ検査方法、ムラ検査装置およびプログラム
JP4702952B2 (ja) * 2006-06-01 2011-06-15 大日本スクリーン製造株式会社 ムラ検査方法、ムラ検査装置およびプログラム
IL188825A0 (en) * 2008-01-16 2008-11-03 Orbotech Ltd Inspection of a substrate using multiple cameras
KR101970243B1 (ko) 2011-04-15 2019-04-18 제온 코포레이션 중합성 화합물, 중합성 조성물, 고분자, 및 광학 이방체
JP2013015389A (ja) * 2011-07-04 2013-01-24 Hitachi-Ge Nuclear Energy Ltd 溶接位置の検査方法及びその装置
TWI460395B (zh) * 2012-07-25 2014-11-11 Ind Tech Res Inst 平整度檢測裝置及其檢測方法
TWI477766B (zh) 2012-12-18 2015-03-21 Ind Tech Res Inst 檢測裝置以及檢測方法
CN103245309B (zh) * 2013-05-21 2017-12-12 杭州鼎热科技有限公司 一种激光平整度测量误差补偿方法
TWI509268B (zh) * 2013-12-16 2015-11-21 Machvision Inc 雙進料之電路板檢測方法及其系統
JP6638453B2 (ja) * 2016-02-16 2020-01-29 コニカミノルタ株式会社 不良画像発生予測システム及び不良画像発生予測プログラム
CN107945170B (zh) * 2017-12-04 2020-09-29 苏州精濑光电有限公司 一种判定线性制程不均匀的方法及装置
JP2021096195A (ja) * 2019-12-19 2021-06-24 コニカミノルタ株式会社 画像検査装置、画像形成装置及びプログラム

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06229736A (ja) * 1993-02-05 1994-08-19 Dainippon Printing Co Ltd 周期性パターンのムラ定量化方法
CN1133633A (zh) * 1993-10-26 1996-10-16 旭化成工业株式会社 光泽不均匀、印刷不均匀的测定方法及装置
JPH095057A (ja) * 1995-06-22 1997-01-10 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH0968412A (ja) * 1995-08-30 1997-03-11 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH0968497A (ja) * 1995-06-21 1997-03-11 Dainippon Screen Mfg Co Ltd ムラ検査方法および装置
JPH0968502A (ja) * 1995-08-30 1997-03-11 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
US5771068A (en) * 1994-03-14 1998-06-23 Orbotech Ltd. Apparatus and method for display panel inspection
JPH10197453A (ja) * 1997-01-16 1998-07-31 Dainippon Screen Mfg Co Ltd 光学的むら検査装置および光学的むら検査方法
JPH10206344A (ja) * 1997-01-17 1998-08-07 Dainippon Screen Mfg Co Ltd 光学的むら検査装置および光学的むら検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000228147A (ja) * 1999-02-08 2000-08-15 Nec Kansai Ltd 陰極線管の検査方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06229736A (ja) * 1993-02-05 1994-08-19 Dainippon Printing Co Ltd 周期性パターンのムラ定量化方法
CN1133633A (zh) * 1993-10-26 1996-10-16 旭化成工业株式会社 光泽不均匀、印刷不均匀的测定方法及装置
US5771068A (en) * 1994-03-14 1998-06-23 Orbotech Ltd. Apparatus and method for display panel inspection
JPH0968497A (ja) * 1995-06-21 1997-03-11 Dainippon Screen Mfg Co Ltd ムラ検査方法および装置
JPH095057A (ja) * 1995-06-22 1997-01-10 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH0968412A (ja) * 1995-08-30 1997-03-11 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH0968502A (ja) * 1995-08-30 1997-03-11 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH10197453A (ja) * 1997-01-16 1998-07-31 Dainippon Screen Mfg Co Ltd 光学的むら検査装置および光学的むら検査方法
JPH10206344A (ja) * 1997-01-17 1998-08-07 Dainippon Screen Mfg Co Ltd 光学的むら検査装置および光学的むら検査方法

Also Published As

Publication number Publication date
CN1758021A (zh) 2006-04-12
TW200615506A (en) 2006-05-16
JP4353479B2 (ja) 2009-10-28
KR20060052001A (ko) 2006-05-19
KR100730052B1 (ko) 2007-06-27
JP2006105884A (ja) 2006-04-20
TWI260396B (en) 2006-08-21

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Owner name: SCREEN GROUP CO., LTD.

Free format text: FORMER NAME: DAINIPPON SCREEN MFG. CO., LTD.

Owner name: DAINIPPON SCREEN MFG. CO., LTD.

Free format text: FORMER NAME: DAINIPPON MESH PLATE MFR. CO., LTD.

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Address after: Kyoto Japan

Patentee after: Skilling Group

Address before: Kyoto Japan

Patentee before: DAINIPPON SCREEN MFG Co.,Ltd.

Address after: Kyoto Japan

Patentee after: DAINIPPON SCREEN MFG Co.,Ltd.

Address before: Kyoto Japan

Patentee before: Dainippon Screen Mfg. Co.,Ltd.

CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080430

Termination date: 20200920

CF01 Termination of patent right due to non-payment of annual fee