CA2896018A1 - Effect of different parameter on devices correlation curves - Google Patents
Effect of different parameter on devices correlation curves Download PDFInfo
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- CA2896018A1 CA2896018A1 CA2896018A CA2896018A CA2896018A1 CA 2896018 A1 CA2896018 A1 CA 2896018A1 CA 2896018 A CA2896018 A CA 2896018A CA 2896018 A CA2896018 A CA 2896018A CA 2896018 A1 CA2896018 A1 CA 2896018A1
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
- G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
- G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/02—Improving the quality of display appearance
- G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/02—Improving the quality of display appearance
- G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
- G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/04—Maintaining the quality of display appearance
- G09G2320/041—Temperature compensation
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/04—Maintaining the quality of display appearance
- G09G2320/043—Preventing or counteracting the effects of ageing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2360/00—Aspects of the architecture of display systems
- G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
- G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
- G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel
- G09G2360/148—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel the light being detected by light detection means within each pixel
Abstract
A method of compensating for efficiency degradation of an OLED in an array-based semiconductor device having arrays of pixels that include OLEDs, including determining for a plurality of operating conditions interdependency curves relating changes in an electrical operating parameter of said OLEDs and the efficiency degradation of said OLEDs, the plurality of operating conditions can include temperature or initial device characteristics as well as stress conditions to more completely determine interdependency curves for a wide variety of OLEDs.
In some cases interdependency curves are updated remotely after fabrication of the array-based device. Some embodiments utilize degradation-time curves and methods which do not require storage of stress history.
In some cases interdependency curves are updated remotely after fabrication of the array-based device. Some embodiments utilize degradation-time curves and methods which do not require storage of stress history.
Description
Introduction Using interdependency curves to solve the aging issues in optoelectronic device can eliminate the needs for optical sensors. However, some devices may experience different aging behavior as function of temperature.
Aspects/Claims of the Invention In one aspect of the invention, the stress history and temperature history of pixels (or group of pixels) are stored. During status update period of the optoelectronic device, one or more interdependency curves are chosen based on temperature. Then from stress history and selected interdependency curves a correction factor is calculate. Here, an electrical measurement from the optoelectronic device or a representative device can be used to fetch proper points from the interdependency curves.
Interdependency curves are the relation between an OLED characteristics and its luminance degradation. In one example, the OLED characteristics can be OLED voltage shift for a given current as a result of stress.
In another aspect of the invention, the temperature is used in adjusting the stress history. Here, based on the temperature and the luminance value (it can be also current, voltage or ON time) of the pixel, the effective stress is calculated. For example, if the pixel is program to offer Li, at higher temperature the effective stress of Li can be similar to a higher stress case.
In another aspect of the invention, if the temperature of a pixel (or a group of pixels) is significantly different from a reference temperature, the stress history calculation for said pixel (or group of pixel) gets updated more often. In addition, the calculation for correction factor based on interdependency curves can be done faster.
In another aspect of the invention, the interdependency curves are the relation between stress history and luminance degradation of the OLED.
In another aspect of the invention, the interdependency curves are the relation between OLED electrical characteristic and the luminance degradation of the OLED.
In another aspect of the invention, the stress history is reset to a default value after the correction factor is updated. Here, the some parameters may get stored as to shows the new origin point in the interdependency curves. For example, correction factor, time or extracted OLED
parameter can be used.
Example for implementation of the invention MaxLife Algorithm fixes the drive circuit issues by extracting parameters related the driver circuit and also fixes the optoelectronic device issues such as burn-in with extracting parameters from the device (or other related parameters) and interdependency curves. Interdependency curve shows the relation between the extracted parameters (or stress history) for the optoelectronic device and its optical performance degradation. In one case, the stress history of a pixel (or a group of pixel) is calculated.
Based on the stress level one or more interdependency curves are selected from different interdependency curves representing different stress levels. From the said selected curves and the extracted parameters a correction factor is calculated.
One method of calculation of correction factor is extracting the relationship of the optical degradation and the given value of extracted parameter(s) as function of stress level.
Then extract the correction value from said function. One simple function can be a linear approximation.
In another case, the stress history can be reset and the start point in interdependency curves is shifted for said pixel (or group of pixel) to the new extracted value.
In some optoelectronic devices, the temperature may affect the interdependency curves or effective stress. As a result, the system needs to accommodate for temperature effect as well. To do so the temperature profile of the panel is either measured or estimated.
In one embodiment demonstrated in Figure 1, there are few sets of interdependency curves based on different temperature. After the temperature for a pixel (or a group of pixels) is known, a set of interdependency curve which is selected (or based on few sets of interdependency curves a new set is extracted for the said pixel temperature). Then from the selected set of the interdependency curves and stress information the pixel correction factor is calculated which is used in MaxLife algorithm to fix for optical degradation of the optoelectronic device as explained before.
Here, one can easily change the order of temperature and stress history or mixed them in one selection function.
For calculating a new set of interdependency curves for a given temperature based on few sets, one can use optoelectronic device characteristic parameters to calculate it for just those parameters to reduce the calculation load. Here, the between value for each corresponding curve in the sets is extracted for the said parameters and then a function is generated for the extracted values and temperature. Here, the value for the given temperature then is calculated based on the said function. This is repeated for all the curves in the set.
-r! OLED Characteristic OLED Characteristic a Interdependency Curves C
Para ter(s) Parameter(s) 713' (Ti) n / 7 O I v, Selecting (or calculating) ________________________________________ 1 m .2. \ Selecting (or calculating) ___________________________________ Correction (or correction factor) o O __________________________________________________________________ Interdependency Curve Interdependency Curve _________________________________________________ Factor(s) ro m co ,-, Zµ ____________________________________________________ Z _______ Jr l0
Aspects/Claims of the Invention In one aspect of the invention, the stress history and temperature history of pixels (or group of pixels) are stored. During status update period of the optoelectronic device, one or more interdependency curves are chosen based on temperature. Then from stress history and selected interdependency curves a correction factor is calculate. Here, an electrical measurement from the optoelectronic device or a representative device can be used to fetch proper points from the interdependency curves.
Interdependency curves are the relation between an OLED characteristics and its luminance degradation. In one example, the OLED characteristics can be OLED voltage shift for a given current as a result of stress.
In another aspect of the invention, the temperature is used in adjusting the stress history. Here, based on the temperature and the luminance value (it can be also current, voltage or ON time) of the pixel, the effective stress is calculated. For example, if the pixel is program to offer Li, at higher temperature the effective stress of Li can be similar to a higher stress case.
In another aspect of the invention, if the temperature of a pixel (or a group of pixels) is significantly different from a reference temperature, the stress history calculation for said pixel (or group of pixel) gets updated more often. In addition, the calculation for correction factor based on interdependency curves can be done faster.
In another aspect of the invention, the interdependency curves are the relation between stress history and luminance degradation of the OLED.
In another aspect of the invention, the interdependency curves are the relation between OLED electrical characteristic and the luminance degradation of the OLED.
In another aspect of the invention, the stress history is reset to a default value after the correction factor is updated. Here, the some parameters may get stored as to shows the new origin point in the interdependency curves. For example, correction factor, time or extracted OLED
parameter can be used.
Example for implementation of the invention MaxLife Algorithm fixes the drive circuit issues by extracting parameters related the driver circuit and also fixes the optoelectronic device issues such as burn-in with extracting parameters from the device (or other related parameters) and interdependency curves. Interdependency curve shows the relation between the extracted parameters (or stress history) for the optoelectronic device and its optical performance degradation. In one case, the stress history of a pixel (or a group of pixel) is calculated.
Based on the stress level one or more interdependency curves are selected from different interdependency curves representing different stress levels. From the said selected curves and the extracted parameters a correction factor is calculated.
One method of calculation of correction factor is extracting the relationship of the optical degradation and the given value of extracted parameter(s) as function of stress level.
Then extract the correction value from said function. One simple function can be a linear approximation.
In another case, the stress history can be reset and the start point in interdependency curves is shifted for said pixel (or group of pixel) to the new extracted value.
In some optoelectronic devices, the temperature may affect the interdependency curves or effective stress. As a result, the system needs to accommodate for temperature effect as well. To do so the temperature profile of the panel is either measured or estimated.
In one embodiment demonstrated in Figure 1, there are few sets of interdependency curves based on different temperature. After the temperature for a pixel (or a group of pixels) is known, a set of interdependency curve which is selected (or based on few sets of interdependency curves a new set is extracted for the said pixel temperature). Then from the selected set of the interdependency curves and stress information the pixel correction factor is calculated which is used in MaxLife algorithm to fix for optical degradation of the optoelectronic device as explained before.
Here, one can easily change the order of temperature and stress history or mixed them in one selection function.
For calculating a new set of interdependency curves for a given temperature based on few sets, one can use optoelectronic device characteristic parameters to calculate it for just those parameters to reduce the calculation load. Here, the between value for each corresponding curve in the sets is extracted for the said parameters and then a function is generated for the extracted values and temperature. Here, the value for the given temperature then is calculated based on the said function. This is repeated for all the curves in the set.
-r! OLED Characteristic OLED Characteristic a Interdependency Curves C
Para ter(s) Parameter(s) 713' (Ti) n / 7 O I v, Selecting (or calculating) ________________________________________ 1 m .2. \ Selecting (or calculating) ___________________________________ Correction (or correction factor) o O __________________________________________________________________ Interdependency Curve Interdependency Curve _________________________________________________ Factor(s) ro m co ,-, Zµ ____________________________________________________ Z _______ Jr l0
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3 1-, Interdependency Curves 1=
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Figure 2: Effect of temperature on effective stress conditions.
In another embodiment demonstrated in Figure 1, there are few interdependency curves based on different stress conditions. Temperature effect is considered in effective stress conditions. Here, after the effective stress condition optoelectronic device parameters are passed to the module to select proper curves for the correction factor calculation. Then from the selected set of the interdependency curves and stress information the pixel correction factor is calculated which is used in MaxLife algorithm to fix for optical degradation of the optoelectronic device as explained before.
Here, one can easily change the order of temperature and stress history or mixed them in one selection function.
For calculating an effective stress condition based on temperature, one can either use models or lookup table.
One can easily mix the two methods describe here to improve the correction factor calculation. In addition, if the temperature difference between pixel (or group of pixels) temperature and reference temperature is larger than a threshold, calculation of the correction factor can be performed more often to reduce the effect of higher order conditions. For example, if there is a large temperature change for a short time, its effect maybe ignored in case of long-time update for OLED
correction factor.
In case, stress history is used as OLED parameter, the other parameter can be time. Here, the time constant can be a fix value or change depending on the stress level for each pixel.
New start point Stress 1 ____ _Stress 2 Calculated Curve based on Stress ____________________________________________ Stress 3 _ Time Figure 3: an example of correlation curves and updating the start point after updating the degradation factor.
After the degradation factor is updated by correlation curves (either the time and stress curve or electrical-optical curve), the start-point of the curves can be reset for the next update. One method is finding the related x-index for the degradation value for each curve and use that as the new start point for that curves.
Another method is to calculate the effective x-index from the stress (or temperature) level for each curve. This can be imperial or modeled for each curve. Or it can be measured from different reference devices being stressed at different levels.
The new effective x-index can be used as the new start point for each curve.
x-index could be time as shown in figure 3 or it can be other device parameters or temperature (or function of few parameters).
c _ -,,, IA
CU CU
U U
>- >-U U
C C
a) a)__--u ..'=" 77 ,-I
C C ---a) cu 0. 0-w a>
-a -a w w +, 4-, CC
Figure 2: Effect of temperature on effective stress conditions.
In another embodiment demonstrated in Figure 1, there are few interdependency curves based on different stress conditions. Temperature effect is considered in effective stress conditions. Here, after the effective stress condition optoelectronic device parameters are passed to the module to select proper curves for the correction factor calculation. Then from the selected set of the interdependency curves and stress information the pixel correction factor is calculated which is used in MaxLife algorithm to fix for optical degradation of the optoelectronic device as explained before.
Here, one can easily change the order of temperature and stress history or mixed them in one selection function.
For calculating an effective stress condition based on temperature, one can either use models or lookup table.
One can easily mix the two methods describe here to improve the correction factor calculation. In addition, if the temperature difference between pixel (or group of pixels) temperature and reference temperature is larger than a threshold, calculation of the correction factor can be performed more often to reduce the effect of higher order conditions. For example, if there is a large temperature change for a short time, its effect maybe ignored in case of long-time update for OLED
correction factor.
In case, stress history is used as OLED parameter, the other parameter can be time. Here, the time constant can be a fix value or change depending on the stress level for each pixel.
New start point Stress 1 ____ _Stress 2 Calculated Curve based on Stress ____________________________________________ Stress 3 _ Time Figure 3: an example of correlation curves and updating the start point after updating the degradation factor.
After the degradation factor is updated by correlation curves (either the time and stress curve or electrical-optical curve), the start-point of the curves can be reset for the next update. One method is finding the related x-index for the degradation value for each curve and use that as the new start point for that curves.
Another method is to calculate the effective x-index from the stress (or temperature) level for each curve. This can be imperial or modeled for each curve. Or it can be measured from different reference devices being stressed at different levels.
The new effective x-index can be used as the new start point for each curve.
x-index could be time as shown in figure 3 or it can be other device parameters or temperature (or function of few parameters).
Claims (19)
1. A method of compensating for efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having arrays of pixels that include OLEDs, said method comprising:
determining for a plurality of operating conditions interdependency curves relating changes in an electrical operating parameter of said OLEDs and the efficiency degradation of said OLEDs in said array-based semiconductor device, the plurality of operating conditions comprising at least two operating condition types;
determining at least one operating condition for the OLED in respect of the at least two operating condition types;
measuring the electrical operating parameter of said OLED;
determining an efficiency degradation of said OLED using said interdependency curves, said at least one operation condition for the OLED, and said measured electrical operating parameter;
determining a correction factor for the OLED with use of said efficiency degradation;
and compensating for said efficiency degradation with use of said correction factor.
determining for a plurality of operating conditions interdependency curves relating changes in an electrical operating parameter of said OLEDs and the efficiency degradation of said OLEDs in said array-based semiconductor device, the plurality of operating conditions comprising at least two operating condition types;
determining at least one operating condition for the OLED in respect of the at least two operating condition types;
measuring the electrical operating parameter of said OLED;
determining an efficiency degradation of said OLED using said interdependency curves, said at least one operation condition for the OLED, and said measured electrical operating parameter;
determining a correction factor for the OLED with use of said efficiency degradation;
and compensating for said efficiency degradation with use of said correction factor.
2. The method of claim 1 wherein the at least two operating condition types comprise a temperature condition and a stress condition, and the at least one operation condition for the OLED comprises a temperature history and a stress history.
3. The method of claim 2 wherein each interdependency curve has an associated temperature condition and a stress condition, and wherein determining an efficiency degradation comprises:
determining at least one temperature associated interdependency curve with use of said temperature history; and determining from said at least one temperature associated interdependency curve and said stress history and said measured electrical operating parameter, the efficiency degradation of the OLED.
determining at least one temperature associated interdependency curve with use of said temperature history; and determining from said at least one temperature associated interdependency curve and said stress history and said measured electrical operating parameter, the efficiency degradation of the OLED.
4. The method of claim 2 wherein each interdependency curve has an associated effective stress history as a function of at least the temperature condition and a stress condition, and wherein determining an efficiency degradation comprises:
determining an effective stress history for the OLED with use of the temperature history and the stress history; and determining from said interdependency curves and said effective stress history and said measured electrical operating parameter the efficiency degradation of the OLED.
determining an effective stress history for the OLED with use of the temperature history and the stress history; and determining from said interdependency curves and said effective stress history and said measured electrical operating parameter the efficiency degradation of the OLED.
5. The method of claim 3 wherein after the correction factor for the OLED
has been determined, a start point associated with the interdependency curves is reset, after which the temperature history and the stress history only comprise temporary histories.
has been determined, a start point associated with the interdependency curves is reset, after which the temperature history and the stress history only comprise temporary histories.
6. The method of claim 4 wherein after the correction factor for the OLED
has been determined, a start point associated with the interdependency curves is reset, after which the temperature history and the stress history only comprise temporary histories.
has been determined, a start point associated with the interdependency curves is reset, after which the temperature history and the stress history only comprise temporary histories.
7. The method of claim 1 wherein the at least two operating condition types comprise a temperature condition and an initial device characteristic condition, and the at least one operation condition for the OLED comprises a temperature history and initial device characteristics.
8. The method of claim 7 wherein each interdependency curve has an associated initial device characteristic condition and a stress condition, and wherein determining an efficiency degradation comprises:
determining at least one initial device characteristic associated interdependency curve with use of said initial device characteristics; and determining from said at least one initial device characteristic associated interdependency curve and said stress history and said measured electrical operating parameter, the efficiency degradation of the OLED.
determining at least one initial device characteristic associated interdependency curve with use of said initial device characteristics; and determining from said at least one initial device characteristic associated interdependency curve and said stress history and said measured electrical operating parameter, the efficiency degradation of the OLED.
9. The method of claim 8, wherein determining for a plurality of operating conditions interdependency curves comprises:
extracting initial characteristics for each of a plurality of test OLEDs;
repeatedly subjecting the test OLEDs to different stress conditions until all test OLEDs are measured; and extracting interdependency curves for said test OLEDs and storing said interdependency curves such that each interdependency curve is associated with at least one stress condition and an initial device characteristic condition.
extracting initial characteristics for each of a plurality of test OLEDs;
repeatedly subjecting the test OLEDs to different stress conditions until all test OLEDs are measured; and extracting interdependency curves for said test OLEDs and storing said interdependency curves such that each interdependency curve is associated with at least one stress condition and an initial device characteristic condition.
10. The method according to claim 9 further comprising:
updating remotely a set of interdependency curves stored with the array-based semiconductor device with a set of prepared interdependency curves from a remote interdependency curve library at least twice after fabrication of the array-based semiconductor device.
updating remotely a set of interdependency curves stored with the array-based semiconductor device with a set of prepared interdependency curves from a remote interdependency curve library at least twice after fabrication of the array-based semiconductor device.
11. The method according to claim 10, wherein the updating remotely occurs at least twice including at the time of at least two of shipping the array-based semiconductor device to the manufacturer, integrating the array-based semiconductor device into a product, and operation of the array-based semiconductor device at a consumer site.
12. The method of claim 1, wherein determining the efficiency degradation comprises:
initializing a total effective stress time value;
sampling brightness data for said OLED;
calculating an effective stress time corresponding to said sampling for at least one given reference stress level;
updating the total effective stress time for said OLED based on the at least one given stress level;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total effective stress, and the interdependency curves.
initializing a total effective stress time value;
sampling brightness data for said OLED;
calculating an effective stress time corresponding to said sampling for at least one given reference stress level;
updating the total effective stress time for said OLED based on the at least one given stress level;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total effective stress, and the interdependency curves.
13. The method of claim 12, wherein determining whether to sample more brightness data comprises comparing the total effective stress time with a predetermined threshold.
14. The method of claim 1, wherein determining the efficiency degradation comprises:
initializing a total change in degradation factor;
sampling brightness data for said OLED;
calculating a change in degradation corresponding to the sampled brightness;
updating the total change in degradation factor for said OLED;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total change in degradation factor, and the interdependency curves.
initializing a total change in degradation factor;
sampling brightness data for said OLED;
calculating a change in degradation corresponding to the sampled brightness;
updating the total change in degradation factor for said OLED;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total change in degradation factor, and the interdependency curves.
15. The method of claim 14, wherein determining whether to sample more brightness data comprises comparing the total change in degradation factor with a predetermined change in degradation threshold.
16. A method of compensating for efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having arrays of pixels that include OLEDs, said method comprising:
determining for a plurality of operating conditions at least one degradation-time curve relating changes in a stress time parameter associated with said OLEDs and the efficiency degradation of said OLEDs in said array-based semiconductor device, the plurality of operating stress conditions comprising at least two operating stress condition types;
measuring at least one operating stress condition for the OLED in respect of the at least two operating stress condition types;
determining an efficiency degradation of said OLED using said at least one degradation-time curve, and said at least one operating stress condition for the OLED;
determining a correction factor for the OLED with use of said efficiency degradation;
and compensating for said efficiency degradation with use of said correction factor.
determining for a plurality of operating conditions at least one degradation-time curve relating changes in a stress time parameter associated with said OLEDs and the efficiency degradation of said OLEDs in said array-based semiconductor device, the plurality of operating stress conditions comprising at least two operating stress condition types;
measuring at least one operating stress condition for the OLED in respect of the at least two operating stress condition types;
determining an efficiency degradation of said OLED using said at least one degradation-time curve, and said at least one operating stress condition for the OLED;
determining a correction factor for the OLED with use of said efficiency degradation;
and compensating for said efficiency degradation with use of said correction factor.
17. The method of claim 16 wherein after the correction factor for the OLED
has been determined, a start point associated with the at least one degradation-time curve is reset.
has been determined, a start point associated with the at least one degradation-time curve is reset.
18. The method of claim 16, wherein determining the efficiency degradation comprises:
initializing a total effective stress time value;
sampling brightness data for said OLED;
calculating an effective stress time corresponding to said sampling for at least one given reference stress level;
updating the total effective stress time for said OLED based on the at least one given stress level;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total effective stress, and the at least one degradation-time curve.
initializing a total effective stress time value;
sampling brightness data for said OLED;
calculating an effective stress time corresponding to said sampling for at least one given reference stress level;
updating the total effective stress time for said OLED based on the at least one given stress level;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total effective stress, and the at least one degradation-time curve.
19. The method of claim 16, wherein determining the efficiency degradation comprises:
initializing a total change in degradation factor;
sampling brightness data for said OLED;
calculating a change in degradation corresponding to the sampled brightness;
updating the total change in degradation factor for said OLED;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total change in degradation factor, and the at least one degradation-time curve.
initializing a total change in degradation factor;
sampling brightness data for said OLED;
calculating a change in degradation corresponding to the sampled brightness;
updating the total change in degradation factor for said OLED;
determining whether to sample more brightness data; and in a case no more brightness data are to be sampled, updating the efficiency degradation with use of the total change in degradation factor, and the at least one degradation-time curve.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2896018A CA2896018A1 (en) | 2015-06-30 | 2015-06-30 | Effect of different parameter on devices correlation curves |
| US15/198,981 US10163401B2 (en) | 2010-02-04 | 2016-06-30 | System and methods for extracting correlation curves for an organic light emitting device |
| US16/193,605 US10699648B2 (en) | 2010-02-04 | 2018-11-16 | System and methods for extracting correlation curves for an organic light emitting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2896018A CA2896018A1 (en) | 2015-06-30 | 2015-06-30 | Effect of different parameter on devices correlation curves |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2896018A1 true CA2896018A1 (en) | 2016-12-30 |
Family
ID=57590969
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2896018A Abandoned CA2896018A1 (en) | 2010-02-04 | 2015-06-30 | Effect of different parameter on devices correlation curves |
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| Country | Link |
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| CA (1) | CA2896018A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113257144A (en) * | 2021-05-13 | 2021-08-13 | 长春希达电子技术有限公司 | Method for improving splicing brightness consistency among box bodies of LED display screen after single-box correction |
-
2015
- 2015-06-30 CA CA2896018A patent/CA2896018A1/en not_active Abandoned
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113257144A (en) * | 2021-05-13 | 2021-08-13 | 长春希达电子技术有限公司 | Method for improving splicing brightness consistency among box bodies of LED display screen after single-box correction |
| CN113257144B (en) * | 2021-05-13 | 2022-07-12 | 长春希达电子技术有限公司 | Method for improving splicing brightness consistency among box bodies of LED display screen after single-box correction |
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