CA2344320A1 - Detecteur infrarouge a puits quantique pour temperature ambiante - Google Patents

Detecteur infrarouge a puits quantique pour temperature ambiante Download PDF

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Publication number
CA2344320A1
CA2344320A1 CA 2344320 CA2344320A CA2344320A1 CA 2344320 A1 CA2344320 A1 CA 2344320A1 CA 2344320 CA2344320 CA 2344320 CA 2344320 A CA2344320 A CA 2344320A CA 2344320 A1 CA2344320 A1 CA 2344320A1
Authority
CA
Canada
Prior art keywords
quantum well
infrared photodetector
photodetector according
doped
layers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2344320
Other languages
English (en)
Inventor
Hui Chun Liu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Council of Canada
Original Assignee
National Research Council of Canada
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Council of Canada filed Critical National Research Council of Canada
Priority to CA 2344320 priority Critical patent/CA2344320A1/fr
Publication of CA2344320A1 publication Critical patent/CA2344320A1/fr
Abandoned legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035236Superlattices; Multiple quantum well structures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
CA 2344320 2001-04-18 2001-04-18 Detecteur infrarouge a puits quantique pour temperature ambiante Abandoned CA2344320A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA 2344320 CA2344320A1 (fr) 2001-04-18 2001-04-18 Detecteur infrarouge a puits quantique pour temperature ambiante

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA 2344320 CA2344320A1 (fr) 2001-04-18 2001-04-18 Detecteur infrarouge a puits quantique pour temperature ambiante

Publications (1)

Publication Number Publication Date
CA2344320A1 true CA2344320A1 (fr) 2002-10-18

Family

ID=4168848

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2344320 Abandoned CA2344320A1 (fr) 2001-04-18 2001-04-18 Detecteur infrarouge a puits quantique pour temperature ambiante

Country Status (1)

Country Link
CA (1) CA2344320A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113130682A (zh) * 2021-04-13 2021-07-16 清华大学 内含调制掺杂局域电场的半导体红外探测器及其调控方法
WO2021198839A1 (fr) * 2020-03-31 2021-10-07 National Research Council Of Canada Systèmes d'imagerie infrarouge à courte portée

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021198839A1 (fr) * 2020-03-31 2021-10-07 National Research Council Of Canada Systèmes d'imagerie infrarouge à courte portée
CN113130682A (zh) * 2021-04-13 2021-07-16 清华大学 内含调制掺杂局域电场的半导体红外探测器及其调控方法
CN113130682B (zh) * 2021-04-13 2022-10-11 清华大学 内含调制掺杂局域电场的半导体红外探测器及其调控方法

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