CA1060108A - Test code generator - Google Patents

Test code generator

Info

Publication number
CA1060108A
CA1060108A CA253,254A CA253254A CA1060108A CA 1060108 A CA1060108 A CA 1060108A CA 253254 A CA253254 A CA 253254A CA 1060108 A CA1060108 A CA 1060108A
Authority
CA
Canada
Prior art keywords
data
signal
bit
mfm
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA253,254A
Other languages
English (en)
French (fr)
Inventor
Charles J. Fassbender
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Application granted granted Critical
Publication of CA1060108A publication Critical patent/CA1060108A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B20/182—Testing using test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/02—Recording, reproducing, or erasing methods; Read, write or erase circuits therefor
    • G11B5/09—Digital recording
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CA253,254A 1975-07-07 1976-05-25 Test code generator Expired CA1060108A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/594,145 US3996612A (en) 1975-07-07 1975-07-07 Test code generator

Publications (1)

Publication Number Publication Date
CA1060108A true CA1060108A (en) 1979-08-07

Family

ID=24377721

Family Applications (1)

Application Number Title Priority Date Filing Date
CA253,254A Expired CA1060108A (en) 1975-07-07 1976-05-25 Test code generator

Country Status (6)

Country Link
US (1) US3996612A (US20110009641A1-20110113-C00160.png)
JP (1) JPS5210035A (US20110009641A1-20110113-C00160.png)
CA (1) CA1060108A (US20110009641A1-20110113-C00160.png)
DE (1) DE2630160C3 (US20110009641A1-20110113-C00160.png)
FR (1) FR2317707A1 (US20110009641A1-20110113-C00160.png)
GB (1) GB1513635A (US20110009641A1-20110113-C00160.png)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58161116A (ja) * 1982-03-19 1983-09-24 Matsushita Electric Ind Co Ltd デイスク再生装置
US4520408A (en) * 1983-02-22 1985-05-28 Vsp Labs, Inc. Clock signal synchronization apparatus and method for decoding self-clocking encoded data
JPS61105778A (ja) * 1984-06-05 1986-05-23 メモレツクス・コ−ポレ−シヨン 磁気記憶装置システムの検査方法
US4612586A (en) * 1984-06-05 1986-09-16 Memorex Corporation Method for measuring timing asymmetry in a magnetic storage system
DE102004033266A1 (de) * 2004-07-09 2006-02-02 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zur Positionsmessung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641526A (en) * 1969-12-29 1972-02-08 Ibm Intra-record resynchronization
US3821798A (en) * 1972-02-18 1974-06-28 Ibm Resynchronizable recording system
US3864735A (en) * 1973-09-12 1975-02-04 Burroughs Corp Read/write system for high density magnetic recording

Also Published As

Publication number Publication date
DE2630160A1 (de) 1977-01-13
FR2317707B1 (US20110009641A1-20110113-C00160.png) 1979-07-20
JPS5210035A (en) 1977-01-26
FR2317707A1 (fr) 1977-02-04
GB1513635A (en) 1978-06-07
DE2630160B2 (de) 1978-10-26
US3996612A (en) 1976-12-07
DE2630160C3 (de) 1979-06-28

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