BR8605251A - Metodo e microscopio de forcas atomicas para a geracao de imagem de superficies com resolucao atomica - Google Patents

Metodo e microscopio de forcas atomicas para a geracao de imagem de superficies com resolucao atomica

Info

Publication number
BR8605251A
BR8605251A BR8605251A BR8605251A BR8605251A BR 8605251 A BR8605251 A BR 8605251A BR 8605251 A BR8605251 A BR 8605251A BR 8605251 A BR8605251 A BR 8605251A BR 8605251 A BR8605251 A BR 8605251A
Authority
BR
Brazil
Prior art keywords
atomic
microscope
image generation
forces
resolution
Prior art date
Application number
BR8605251A
Other languages
English (en)
Inventor
Gerd Karl Binning
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of BR8605251A publication Critical patent/BR8605251A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
BR8605251A 1985-11-26 1986-10-28 Metodo e microscopio de forcas atomicas para a geracao de imagem de superficies com resolucao atomica BR8605251A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US80212385A 1985-11-26 1985-11-26

Publications (1)

Publication Number Publication Date
BR8605251A true BR8605251A (pt) 1987-07-28

Family

ID=25182892

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8605251A BR8605251A (pt) 1985-11-26 1986-10-28 Metodo e microscopio de forcas atomicas para a geracao de imagem de superficies com resolucao atomica

Country Status (5)

Country Link
EP (1) EP0223918B1 (pt)
JP (1) JPH0754249B2 (pt)
BR (1) BR8605251A (pt)
CA (1) CA1270132A (pt)
DE (1) DE3675158D1 (pt)

Families Citing this family (50)

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JPH0752102B2 (ja) * 1987-07-10 1995-06-05 株式会社日立製作所 微小部力測定方法及び装置
WO1989001603A1 (en) * 1987-08-12 1989-02-23 Olympus Optical Co., Ltd. Scanning type tunnel microscope
JPS6421316U (pt) * 1987-08-26 1989-02-02
JPS6421322U (pt) * 1987-08-26 1989-02-02
JPS6421318U (pt) * 1987-08-26 1989-02-02
JPS6421314U (pt) * 1987-08-26 1989-02-02
US4906840A (en) * 1988-01-27 1990-03-06 The Board Of Trustees Of Leland Stanford Jr., University Integrated scanning tunneling microscope
JP2594452B2 (ja) * 1988-03-04 1997-03-26 日本電信電話株式会社 表面形状測定装置
JPH01259210A (ja) * 1988-04-08 1989-10-16 Nippon Telegr & Teleph Corp <Ntt> 表面形状測定装置
JP2656536B2 (ja) * 1988-04-13 1997-09-24 株式会社日立製作所 プローブおよびその製造方法
DE3820518C1 (pt) * 1988-06-16 1990-01-11 Wild Leitz Gmbh, 6330 Wetzlar, De
US5212987A (en) * 1988-06-16 1993-05-25 Hommelwerke Gmbh Acoustic screen scan microscope for the examination of an object in the short-range field of a resonant acoustic oscillator
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
US5019707A (en) * 1989-03-23 1991-05-28 International Business Machines Corporation High speed waveform sampling with a tunneling microscope
US5260824A (en) * 1989-04-24 1993-11-09 Olympus Optical Co., Ltd. Atomic force microscope
US5266801A (en) * 1989-06-05 1993-11-30 Digital Instruments, Inc. Jumping probe microscope
EP0413042B1 (en) * 1989-08-16 1992-12-16 International Business Machines Corporation Method of producing micromechanical sensors for the afm/stm profilometry and micromechanical afm/stm sensor head
GB2238161A (en) * 1989-08-18 1991-05-22 Rosser Roy J Attractive atomic force microscope
US4992728A (en) * 1989-12-21 1991-02-12 International Business Machines Corporation Electrical probe incorporating scanning proximity microscope
JPH03209104A (ja) * 1990-01-11 1991-09-12 Shizuoka Univ 原子間力センサヘッド
US5144128A (en) * 1990-02-05 1992-09-01 Hitachi, Ltd. Surface microscope and surface microscopy
US5253515A (en) * 1990-03-01 1993-10-19 Olympus Optical Co., Ltd. Atomic probe microscope and cantilever unit for use in the microscope
JPH0833296B2 (ja) * 1990-07-13 1996-03-29 松下電器産業株式会社 走査型原子間力トンネル顕微鏡
JP2515052Y2 (ja) * 1990-08-27 1996-10-23 関東自動車工業株式会社 板金部品の板合わせ不具合解析用検査治具
JP3053456B2 (ja) * 1990-08-31 2000-06-19 オリンパス光学工業株式会社 走査型プローブ顕微鏡用カンチレバー及びその作製方法
JPH0758193B2 (ja) * 1990-09-14 1995-06-21 三菱電機株式会社 原子間力顕微鏡の微動走査機構
DE69118319T2 (de) * 1990-11-06 1996-08-08 Texas Instruments Inc Anwendung eines STM-artigen Systems zur Messung der Knotenspannung in integrierten Schaltungen
US5264696A (en) * 1991-05-20 1993-11-23 Olympus Optical Co., Ltd. Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios
USRE36488E (en) * 1992-08-07 2000-01-11 Veeco Instruments Inc. Tapping atomic force microscope with phase or frequency detection
US5412980A (en) * 1992-08-07 1995-05-09 Digital Instruments, Inc. Tapping atomic force microscope
US5526165A (en) * 1992-08-21 1996-06-11 Olympus Optical Co., Ltd. Scanner system
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US5929438A (en) * 1994-08-12 1999-07-27 Nikon Corporation Cantilever and measuring apparatus using it
US5883387A (en) * 1994-11-15 1999-03-16 Olympus Optical Co., Ltd. SPM cantilever and a method for manufacturing the same
DE19646120C2 (de) * 1996-06-13 2001-07-26 Ibm Mikromechanischer Sensor für die AFM/STM Profilometrie
JP2925114B2 (ja) * 1996-07-22 1999-07-28 株式会社日立製作所 測定装置
JP3497734B2 (ja) * 1997-07-24 2004-02-16 オリンパス株式会社 走査型プローブ顕微鏡
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US6198299B1 (en) 1998-08-27 2001-03-06 The Micromanipulator Company, Inc. High Resolution analytical probe station
US6545276B1 (en) 1999-04-14 2003-04-08 Olympus Optical Co., Ltd. Near field optical microscope
US6469288B1 (en) 1999-05-17 2002-10-22 Olympus Optcial Co., Ltd. Near field optical microscope and probe for near field optical microscope
US7483363B2 (en) * 2004-10-14 2009-01-27 International Business Machines Corporation Data storage device and method for operating a data storage device
CN100585324C (zh) * 2005-09-08 2010-01-27 国际商业机器公司 用于感测探针位置的设备和方法
JP2007147347A (ja) * 2005-11-25 2007-06-14 Seiko Epson Corp 探針、片持ち梁、走査型プローブ顕微鏡、及び走査型トンネル顕微鏡の測定方法
JP4810241B2 (ja) * 2006-01-25 2011-11-09 キヤノン株式会社 プローブユニットおよび原子間力顕微鏡
JP4866695B2 (ja) 2006-09-21 2012-02-01 みずほ情報総研株式会社 シミュレーション装置、シミュレーション方法及びシミュレーションプログラム
JP4936541B2 (ja) * 2007-08-10 2012-05-23 キヤノン株式会社 原子間力顕微鏡
JP5100248B2 (ja) * 2007-08-10 2012-12-19 キヤノン株式会社 原子間力顕微鏡
CN106996926A (zh) * 2017-04-01 2017-08-01 福建师范大学 肿瘤细胞有丝分裂过程生物力学特征监测装置与监测方法
JP2023087533A (ja) * 2021-12-13 2023-06-23 株式会社ユニソク 防振除振機構付きａｆｍホルダー

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH643397A5 (de) * 1979-09-20 1984-05-30 Ibm Raster-tunnelmikroskop.

Also Published As

Publication number Publication date
EP0223918A3 (en) 1988-07-27
EP0223918A2 (en) 1987-06-03
EP0223918B1 (en) 1990-10-24
DE3675158D1 (de) 1990-11-29
JPS62130302A (ja) 1987-06-12
CA1270132A (en) 1990-06-12
JPH0754249B2 (ja) 1995-06-07

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Legal Events

Date Code Title Description
B21A Expiry acc. art. 78, item i of ipl- expiry of the term of protection

Free format text: PATENTE EXTINTA EM 28/10/2001