BR112015019103A2 - erros de memória incorrigíveis reduzidos - Google Patents
erros de memória incorrigíveis reduzidosInfo
- Publication number
- BR112015019103A2 BR112015019103A2 BR112015019103A BR112015019103A BR112015019103A2 BR 112015019103 A2 BR112015019103 A2 BR 112015019103A2 BR 112015019103 A BR112015019103 A BR 112015019103A BR 112015019103 A BR112015019103 A BR 112015019103A BR 112015019103 A2 BR112015019103 A2 BR 112015019103A2
- Authority
- BR
- Brazil
- Prior art keywords
- memory
- array
- reduced
- memory errors
- uncorrectable memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0602—Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
- G06F3/0614—Improving the reliability of storage systems
- G06F3/0619—Improving the reliability of storage systems in relation to data integrity, e.g. data losses, bit errors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0638—Organizing or formatting or addressing of data
- G06F3/064—Management of blocks
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0668—Interfaces specially adapted for storage systems adopting a particular infrastructure
- G06F3/0671—In-line storage system
- G06F3/0673—Single storage device
- G06F3/0679—Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/27—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes using interleaving techniques
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/65—Purpose and implementation aspects
- H03M13/6508—Flexibility, adaptability, parametrability and configurability of the implementation
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
- H03M13/13—Linear codes
- H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
- H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
- H03M13/1515—Reed-Solomon codes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
- H03M13/13—Linear codes
- H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
- H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
- H03M13/152—Bose-Chaudhuri-Hocquenghem [BCH] codes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
- H03M13/13—Linear codes
- H03M13/19—Single error correction without using particular properties of the cyclic codes, e.g. Hamming codes, extended or generalised Hamming codes
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Probability & Statistics with Applications (AREA)
- Quality & Reliability (AREA)
- Human Computer Interaction (AREA)
- Computer Security & Cryptography (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Mathematical Physics (AREA)
- Algebra (AREA)
- Pure & Applied Mathematics (AREA)
- Detection And Correction Of Errors (AREA)
Abstract
resumo patente de invenção: "erros de memória incorrigíveis reduzidos". a presente invenção refere-se a erros de memória incorrigíveis que podem ser reduzidos determinando-se um endereço de arranjo lógico para um conjunto de arranjos de memória e transformando-se o endereço de arranjo lógico em pelo menos dois endereços de arranjo únicos com base, pelo menos em parte, em localizações lógicas de pelo menos dois arranjos de memória dentro do conjunto de arranjos de memória. os pelo menos dois arranjos de memória são, então, acessados com o uso dos pelo menos dois endereços de arranjo únicos, respectivamente.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/792,597 US9136873B2 (en) | 2013-03-11 | 2013-03-11 | Reduced uncorrectable memory errors |
US13/792,597 | 2013-03-11 | ||
PCT/US2014/020549 WO2014164099A1 (en) | 2013-03-11 | 2014-03-05 | Reduced uncorrectable memory errors |
Publications (2)
Publication Number | Publication Date |
---|---|
BR112015019103A2 true BR112015019103A2 (pt) | 2017-07-18 |
BR112015019103B1 BR112015019103B1 (pt) | 2022-05-17 |
Family
ID=51489439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112015019103-7A BR112015019103B1 (pt) | 2013-03-11 | 2014-03-05 | Método para reduzir erros de memória incorrigíveis, circuito integrado e sistema eletrônico |
Country Status (7)
Country | Link |
---|---|
US (4) | US9136873B2 (pt) |
EP (2) | EP3282361A1 (pt) |
JP (2) | JP6087470B2 (pt) |
KR (1) | KR101693664B1 (pt) |
CN (1) | CN104969193B (pt) |
BR (1) | BR112015019103B1 (pt) |
WO (1) | WO2014164099A1 (pt) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9378848B2 (en) * | 2012-06-07 | 2016-06-28 | Texas Instruments Incorporated | Methods and devices for determining logical to physical mapping on an integrated circuit |
US9136873B2 (en) | 2013-03-11 | 2015-09-15 | Intel Corporation | Reduced uncorrectable memory errors |
KR101767018B1 (ko) * | 2013-09-27 | 2017-08-09 | 인텔 코포레이션 | 비휘발성 메모리에서의 오류 정정 |
US9478315B2 (en) * | 2014-06-03 | 2016-10-25 | Sandisk Technologies Llc | Bit error rate mapping in a memory system |
US10438658B2 (en) | 2014-12-26 | 2019-10-08 | Intel Corporation | Refresh logic to refresh only memory cells having a first value |
US9672905B1 (en) * | 2016-07-22 | 2017-06-06 | Pure Storage, Inc. | Optimize data protection layouts based on distributed flash wear leveling |
KR102258140B1 (ko) | 2017-07-06 | 2021-05-28 | 삼성전자주식회사 | 반도체 메모리 장치의 에러 정정 회로, 반도체 메모리 장치 및 메모리 시스템 |
US10831596B2 (en) * | 2018-01-22 | 2020-11-10 | Micron Technology, Inc. | Enhanced error correcting code capability using variable logical to physical associations of a data block |
US10846175B2 (en) * | 2018-04-10 | 2020-11-24 | Micron Technology, Inc. | High throughput bit correction of data inside a word buffer for a product code decoder |
US10761918B2 (en) | 2018-04-18 | 2020-09-01 | International Business Machines Corporation | Method to handle corrected memory errors on kernel text |
DE102018112816A1 (de) * | 2018-05-29 | 2019-12-05 | Infineon Technologies Ag | Adresscodierter Zugriff auf Speicher |
JP7042716B2 (ja) * | 2018-07-26 | 2022-03-28 | キオクシア株式会社 | 記憶装置及び記憶制御方法 |
US10802909B2 (en) | 2018-08-17 | 2020-10-13 | Micron Technology, Inc. | Enhanced bit flipping scheme |
JP7224689B2 (ja) | 2018-10-12 | 2023-02-20 | スーパーメム,アイエヌシー. | 誤り訂正及びデータスクラビング回路を備えたメモリシステム |
US10817420B2 (en) * | 2018-10-30 | 2020-10-27 | Arm Limited | Apparatus and method to access a memory location |
US11042490B2 (en) | 2018-11-15 | 2021-06-22 | Micron Technology, Inc. | Address obfuscation for memory |
US11237891B2 (en) | 2020-02-12 | 2022-02-01 | International Business Machines Corporation | Handling asynchronous memory errors on kernel text |
KR20210132784A (ko) * | 2020-04-27 | 2021-11-05 | 삼성전자주식회사 | 메모리 장치 및 메모리 장치로부터 데이터를 읽는 방법 |
US11720273B2 (en) * | 2021-05-18 | 2023-08-08 | Micron Technology, Inc. | Codeword error leveling for 3DXP memory devices |
Family Cites Families (20)
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US4506364A (en) * | 1982-09-30 | 1985-03-19 | International Business Machines Corporation | Memory address permutation apparatus |
JPS6063651A (ja) * | 1983-09-17 | 1985-04-12 | Nippon Telegr & Teleph Corp <Ntt> | 記憶装置 |
JPH04167039A (ja) * | 1990-10-31 | 1992-06-15 | Toshiba Corp | データ書き込み方式 |
JPH09305494A (ja) * | 1996-05-13 | 1997-11-28 | Nec Corp | 拡張記憶装置のデータ転送制御回路 |
JP2000020409A (ja) * | 1998-07-07 | 2000-01-21 | Seiko Epson Corp | 半導体記憶装置 |
US6367047B1 (en) | 1998-10-20 | 2002-04-02 | Ecrix | Multi-level error detection and correction technique for data storage recording device |
US7062689B2 (en) * | 2001-12-20 | 2006-06-13 | Arm Limited | Method and apparatus for memory self testing |
JP2003345650A (ja) * | 2002-05-23 | 2003-12-05 | Mitsubishi Electric Corp | フラッシュメモリシステム |
JP2004139503A (ja) * | 2002-10-21 | 2004-05-13 | Matsushita Electric Ind Co Ltd | 記憶装置及びその制御方法 |
US20090013148A1 (en) | 2007-07-03 | 2009-01-08 | Micron Technology, Inc. | Block addressing for parallel memory arrays |
US8103934B2 (en) | 2007-12-21 | 2012-01-24 | Honeywell International Inc. | High speed memory error detection and correction using interleaved (8,4) LBCs |
JP4617405B2 (ja) | 2008-02-05 | 2011-01-26 | 富士通株式会社 | 不良メモリを検出する電子機器、不良メモリ検出方法およびそのためのプログラム |
US8060719B2 (en) * | 2008-05-28 | 2011-11-15 | Micron Technology, Inc. | Hybrid memory management |
US7864587B2 (en) * | 2008-09-22 | 2011-01-04 | Micron Technology, Inc. | Programming a memory device to increase data reliability |
TWI446350B (zh) | 2009-12-08 | 2014-07-21 | Silicon Motion Inc | 用來減少無法更正的錯誤之方法以及記憶裝置及其控制器 |
US8533564B2 (en) | 2009-12-23 | 2013-09-10 | Sandisk Technologies Inc. | System and method of error correction of control data at a memory device |
US8589766B2 (en) * | 2010-02-24 | 2013-11-19 | Apple Inc. | Codeword remapping schemes for non-volatile memories |
US8732557B2 (en) * | 2011-05-31 | 2014-05-20 | Micron Technology, Inc. | Data protection across multiple memory blocks |
US9378848B2 (en) | 2012-06-07 | 2016-06-28 | Texas Instruments Incorporated | Methods and devices for determining logical to physical mapping on an integrated circuit |
US9136873B2 (en) * | 2013-03-11 | 2015-09-15 | Intel Corporation | Reduced uncorrectable memory errors |
-
2013
- 2013-03-11 US US13/792,597 patent/US9136873B2/en active Active
-
2014
- 2014-03-05 JP JP2016500630A patent/JP6087470B2/ja active Active
- 2014-03-05 WO PCT/US2014/020549 patent/WO2014164099A1/en active Application Filing
- 2014-03-05 EP EP17194094.3A patent/EP3282361A1/en not_active Withdrawn
- 2014-03-05 KR KR1020157021602A patent/KR101693664B1/ko active IP Right Grant
- 2014-03-05 CN CN201480008297.4A patent/CN104969193B/zh active Active
- 2014-03-05 EP EP14779264.2A patent/EP2972876B1/en active Active
- 2014-03-05 BR BR112015019103-7A patent/BR112015019103B1/pt active IP Right Grant
-
2015
- 2015-09-03 US US14/844,843 patent/US9934088B2/en active Active
-
2017
- 2017-02-01 JP JP2017016797A patent/JP6240351B2/ja active Active
-
2018
- 2018-03-01 US US15/909,929 patent/US10324793B2/en active Active
-
2019
- 2019-06-18 US US16/444,480 patent/US10936418B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP6240351B2 (ja) | 2017-11-29 |
US20180253355A1 (en) | 2018-09-06 |
US9136873B2 (en) | 2015-09-15 |
JP2017117480A (ja) | 2017-06-29 |
US20190370112A1 (en) | 2019-12-05 |
US20160188409A1 (en) | 2016-06-30 |
CN104969193B (zh) | 2017-01-18 |
BR112015019103B1 (pt) | 2022-05-17 |
CN104969193A (zh) | 2015-10-07 |
EP2972876A4 (en) | 2016-11-23 |
WO2014164099A1 (en) | 2014-10-09 |
JP2016514327A (ja) | 2016-05-19 |
US9934088B2 (en) | 2018-04-03 |
EP2972876B1 (en) | 2017-12-20 |
US10936418B2 (en) | 2021-03-02 |
US10324793B2 (en) | 2019-06-18 |
KR20150106916A (ko) | 2015-09-22 |
US20140258804A1 (en) | 2014-09-11 |
JP6087470B2 (ja) | 2017-03-01 |
EP2972876A1 (en) | 2016-01-20 |
KR101693664B1 (ko) | 2017-01-06 |
EP3282361A1 (en) | 2018-02-14 |
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Legal Events
Date | Code | Title | Description |
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B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 05/03/2014, OBSERVADAS AS CONDICOES LEGAIS |