BE620045A - - Google Patents

Info

Publication number
BE620045A
BE620045A BE620045DA BE620045A BE 620045 A BE620045 A BE 620045A BE 620045D A BE620045D A BE 620045DA BE 620045 A BE620045 A BE 620045A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE620045A publication Critical patent/BE620045A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • GPHYSICS
    • G04HOROLOGY
    • G04DAPPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/004Optical measuring and testing apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
BE620045D 1961-07-11 BE620045A (US06633600-20031014-M00021.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0074763 1961-07-11

Publications (1)

Publication Number Publication Date
BE620045A true BE620045A (US06633600-20031014-M00021.png)

Family

ID=7504877

Family Applications (1)

Application Number Title Priority Date Filing Date
BE620045D BE620045A (US06633600-20031014-M00021.png) 1961-07-11

Country Status (3)

Country Link
BE (1) BE620045A (US06633600-20031014-M00021.png)
CH (1) CH398092A (US06633600-20031014-M00021.png)
DE (1) DE1423597B2 (US06633600-20031014-M00021.png)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2750109C2 (de) * 1977-11-09 1991-03-07 Spindler & Hoyer GmbH & Co, 3400 Göttingen Vorrichtung zur kontaktlosen Messung linearer Wegstrecken, insbesondere des Durchmessers
FR2443078A1 (fr) * 1978-03-21 1980-06-27 Thomas Ets Louis Et Pierre Systeme optique pour controle de fabrication
JPS55110904A (en) * 1979-02-20 1980-08-27 Hajime Sangyo Kk Defect detecting device
JPS58103604A (ja) * 1981-12-16 1983-06-20 Teijin Ltd フイルムの厚さ測定方法及び測定装置
DE3314465A1 (de) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur optischen oberflaechenpruefung
DE3446354A1 (de) * 1984-12-19 1986-06-26 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronische vergleichsvorrichtung fuer strukturen auf ebenen oberflaechen oder fuer flaechige strukturen
FR2743147B1 (fr) * 1995-12-28 1998-02-27 Acep France Appareil de controle visuel des caracteristiques de surface de pieces reproduites
RU2179328C1 (ru) * 2001-06-19 2002-02-10 Кияшко Сергей Николаевич Способ дифференциально-фазовой профилометрии и/или профилографии и устройство для его реализации

Also Published As

Publication number Publication date
CH398092A (de) 1965-08-31
DE1423597A1 (de) 1969-05-22
DE1423597B2 (de) 1970-10-08

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