AU9183498A - Equipment for performing electrical and environmental tests on semiconductor electronic devices - Google Patents

Equipment for performing electrical and environmental tests on semiconductor electronic devices

Info

Publication number
AU9183498A
AU9183498A AU91834/98A AU9183498A AU9183498A AU 9183498 A AU9183498 A AU 9183498A AU 91834/98 A AU91834/98 A AU 91834/98A AU 9183498 A AU9183498 A AU 9183498A AU 9183498 A AU9183498 A AU 9183498A
Authority
AU
Australia
Prior art keywords
equipment
electronic devices
semiconductor electronic
performing electrical
environmental tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU91834/98A
Inventor
Antonio Zaffarami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ELES EQUIPMENT Srl
Original Assignee
ELES EQUIPMENT Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ELES EQUIPMENT Srl filed Critical ELES EQUIPMENT Srl
Publication of AU9183498A publication Critical patent/AU9183498A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AU91834/98A 1998-08-19 1998-08-19 Equipment for performing electrical and environmental tests on semiconductor electronic devices Abandoned AU9183498A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IT1998/000234 WO2000011487A1 (en) 1998-08-19 1998-08-19 Equipment for performing electrical and environmental tests on semiconductor electronic devices

Publications (1)

Publication Number Publication Date
AU9183498A true AU9183498A (en) 2000-03-14

Family

ID=11332906

Family Applications (2)

Application Number Title Priority Date Filing Date
AU91834/98A Abandoned AU9183498A (en) 1998-08-19 1998-08-19 Equipment for performing electrical and environmental tests on semiconductor electronic devices
AU53870/99A Abandoned AU5387099A (en) 1998-08-19 1999-08-17 An apparatus for performing electrical and environmental tests on electronic semiconductor devices

Family Applications After (1)

Application Number Title Priority Date Filing Date
AU53870/99A Abandoned AU5387099A (en) 1998-08-19 1999-08-17 An apparatus for performing electrical and environmental tests on electronic semiconductor devices

Country Status (3)

Country Link
EP (1) EP1129364A1 (en)
AU (2) AU9183498A (en)
WO (2) WO2000011487A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3025899B1 (en) * 2014-09-11 2016-11-04 Bibench Systems / Charlu Sas DEVICE FOR CONTROLLING THE TEMPERATURE OF A CONTROL MODULE OF AN ELECTRONIC COMPONENT
KR102678331B1 (en) * 2021-10-15 2024-06-25 송은희 Fatigue and reliability test module that is easy to detach and combine

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3013215A1 (en) * 1980-04-03 1981-10-15 Luther & Maelzer Gmbh, 3050 Wunstorf ADAPTER FOR A SELF-PROGRAMMABLE CIRCUIT TEST DEVICE
DE3630548A1 (en) * 1986-09-08 1988-03-10 Mania Gmbh DEVICE FOR ELECTRONICALLY CHECKING CIRCUITS WITH CONTACT POINTS IN 1/20 INCH GRID
US4900948A (en) * 1988-03-16 1990-02-13 Micro Control Company Apparatus providing signals for burn-in of integrated circuits
JP3194483B2 (en) * 1991-11-08 2001-07-30 富士通株式会社 Burn-in test method and burn-in test apparatus
US5402078A (en) * 1992-10-13 1995-03-28 Micro Control Company Interconnection system for burn-in boards
KR960011265B1 (en) * 1993-06-25 1996-08-21 삼성전자 주식회사 Test socket for no good die array

Also Published As

Publication number Publication date
AU5387099A (en) 2000-03-14
WO2000011488A1 (en) 2000-03-02
WO2000011487A1 (en) 2000-03-02
EP1129364A1 (en) 2001-09-05

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase