AU6015200A - Exposure method and device therefor - Google Patents
Exposure method and device thereforInfo
- Publication number
- AU6015200A AU6015200A AU60152/00A AU6015200A AU6015200A AU 6015200 A AU6015200 A AU 6015200A AU 60152/00 A AU60152/00 A AU 60152/00A AU 6015200 A AU6015200 A AU 6015200A AU 6015200 A AU6015200 A AU 6015200A
- Authority
- AU
- Australia
- Prior art keywords
- exposure method
- device therefor
- therefor
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3175—Lithography
- H01J2237/31776—Shaped beam
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11/204195 | 1999-07-19 | ||
JP20419599 | 1999-07-19 | ||
PCT/JP2000/004707 WO2001006549A1 (en) | 1999-07-19 | 2000-07-13 | Exposure method and device therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
AU6015200A true AU6015200A (en) | 2001-02-05 |
Family
ID=16486417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU60152/00A Abandoned AU6015200A (en) | 1999-07-19 | 2000-07-13 | Exposure method and device therefor |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU6015200A (en) |
TW (1) | TW460933B (en) |
WO (1) | WO2001006549A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4112472B2 (en) | 2003-10-21 | 2008-07-02 | 株式会社東芝 | Semiconductor device manufacturing method and semiconductor device manufacturing apparatus |
JP5175713B2 (en) * | 2007-03-02 | 2013-04-03 | 株式会社アドバンテスト | Multi-column electron beam exposure mask, electron beam exposure apparatus and exposure method using multi-column electron beam exposure mask |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06151289A (en) * | 1992-10-30 | 1994-05-31 | Nec Corp | Magnetic field type electron lens alignment mechanism |
JPH10255706A (en) * | 1997-03-14 | 1998-09-25 | Nikon Corp | Adjusting method of axis moving type electro magnetic lens |
JPH1126371A (en) * | 1997-07-08 | 1999-01-29 | Nikon Corp | Electron beam transfer apparatus |
JP3993334B2 (en) * | 1998-04-27 | 2007-10-17 | 株式会社東芝 | Charged beam lithography system |
-
2000
- 2000-07-13 AU AU60152/00A patent/AU6015200A/en not_active Abandoned
- 2000-07-13 WO PCT/JP2000/004707 patent/WO2001006549A1/en active Application Filing
- 2000-07-18 TW TW89114308A patent/TW460933B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW460933B (en) | 2001-10-21 |
WO2001006549A1 (en) | 2001-01-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |