AU2003253428A1 - Nonvolatile memory device - Google Patents
Nonvolatile memory deviceInfo
- Publication number
- AU2003253428A1 AU2003253428A1 AU2003253428A AU2003253428A AU2003253428A1 AU 2003253428 A1 AU2003253428 A1 AU 2003253428A1 AU 2003253428 A AU2003253428 A AU 2003253428A AU 2003253428 A AU2003253428 A AU 2003253428A AU 2003253428 A1 AU2003253428 A1 AU 2003253428A1
- Authority
- AU
- Australia
- Prior art keywords
- memory device
- nonvolatile memory
- nonvolatile
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/101—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including resistors or capacitors only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K19/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
- H10K19/80—Interconnections, e.g. terminals
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002229907 | 2002-08-07 | ||
JP2002-229907 | 2002-08-07 | ||
JP2003201732A JP2004128471A (en) | 2002-08-07 | 2003-07-25 | Nonvolatile memory device |
JP2003-201732 | 2003-07-25 | ||
PCT/JP2003/010017 WO2004015778A1 (en) | 2002-08-07 | 2003-08-06 | Nonvolatile memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003253428A1 true AU2003253428A1 (en) | 2004-02-25 |
Family
ID=31719842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003253428A Abandoned AU2003253428A1 (en) | 2002-08-07 | 2003-08-06 | Nonvolatile memory device |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2004128471A (en) |
AU (1) | AU2003253428A1 (en) |
TW (1) | TW200402873A (en) |
WO (1) | WO2004015778A1 (en) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7608855B2 (en) | 2004-04-02 | 2009-10-27 | Spansion Llc | Polymer dielectrics for memory element array interconnect |
DE102004025675B4 (en) * | 2004-05-26 | 2008-02-14 | Qimonda Ag | Integrated semiconductor memory with organic selection transistor |
DE102004025676B4 (en) * | 2004-05-26 | 2008-09-04 | Qimonda Ag | Integrated semiconductor memory with organic selection transistor |
JP2006033809A (en) * | 2004-06-14 | 2006-02-02 | Semiconductor Energy Lab Co Ltd | Copy machine with copy control function, scanner and facsimile, semiconductor device contained paper and semiconductor device contained film |
WO2005121908A1 (en) * | 2004-06-14 | 2005-12-22 | Semiconductor Energy Laboratory Co., Ltd. | Copy machine with copy control function, scanner and facsimile, and piece of paper and film each installed with semiconductor device |
US8698262B2 (en) | 2004-09-14 | 2014-04-15 | Semiconductor Energy Laboratory Co., Ltd. | Wireless chip and manufacturing method of the same |
WO2006043573A1 (en) | 2004-10-18 | 2006-04-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method of the same |
CN100592520C (en) | 2004-10-22 | 2010-02-24 | 株式会社半导体能源研究所 | Semiconductor device and display device comprising same |
WO2006043611A1 (en) * | 2004-10-22 | 2006-04-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP4809658B2 (en) * | 2004-10-29 | 2011-11-09 | 株式会社半導体エネルギー研究所 | Display device and electronic apparatus using the same |
US7795617B2 (en) * | 2004-10-29 | 2010-09-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, IC card, IC tag, RFID, transponder, paper money, valuable securities, passport, electronic device, bag, and clothes |
US9734901B2 (en) | 2004-10-29 | 2017-08-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device with semiconductor memory cell |
KR101187400B1 (en) | 2004-11-26 | 2012-10-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device |
JP4912671B2 (en) * | 2004-11-26 | 2012-04-11 | 株式会社半導体エネルギー研究所 | Semiconductor device |
JP4954537B2 (en) * | 2004-12-03 | 2012-06-20 | 株式会社半導体エネルギー研究所 | Semiconductor device |
WO2006059554A1 (en) * | 2004-12-03 | 2006-06-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP5025134B2 (en) * | 2005-01-21 | 2012-09-12 | 株式会社半導体エネルギー研究所 | Semiconductor device |
WO2006085633A1 (en) * | 2005-02-10 | 2006-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Memory element and semiconductor device |
US7926726B2 (en) | 2005-03-28 | 2011-04-19 | Semiconductor Energy Laboratory Co., Ltd. | Survey method and survey system |
JP5008323B2 (en) * | 2005-03-28 | 2012-08-22 | 株式会社半導体エネルギー研究所 | Memory device |
TWI475667B (en) | 2005-03-28 | 2015-03-01 | Semiconductor Energy Lab | Memory device and manufacturing method the same |
US7358590B2 (en) | 2005-03-31 | 2008-04-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
US7700984B2 (en) | 2005-05-20 | 2010-04-20 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device including memory cell |
US7688272B2 (en) | 2005-05-30 | 2010-03-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP4932329B2 (en) * | 2005-05-31 | 2012-05-16 | 株式会社半導体エネルギー研究所 | Semiconductor device |
US8188461B2 (en) | 2005-05-31 | 2012-05-29 | Semiconductor Energy Laboratory Co., Ltd. | Organic memory device |
US7868320B2 (en) | 2005-05-31 | 2011-01-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US7660145B2 (en) | 2005-07-01 | 2010-02-09 | Semiconductor Energy Laboratory Co., Ltd. | Storage device and semiconductor device |
KR101369864B1 (en) | 2005-08-12 | 2014-03-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device and method for manufacturing the same |
JP5019821B2 (en) * | 2005-08-12 | 2012-09-05 | 株式会社半導体エネルギー研究所 | Semiconductor device |
JP5157448B2 (en) * | 2005-10-19 | 2013-03-06 | 富士通株式会社 | Resistance memory element and nonvolatile semiconductor memory device |
EP1946374A4 (en) | 2005-11-09 | 2014-01-01 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
US7566899B2 (en) * | 2005-12-21 | 2009-07-28 | Palo Alto Research Center Incorporated | Organic thin-film transistor backplane with multi-layer contact structures and data lines |
EP1850378A3 (en) | 2006-04-28 | 2013-08-07 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and semicondutor device |
JP5137453B2 (en) * | 2006-04-28 | 2013-02-06 | 株式会社半導体エネルギー研究所 | Method for manufacturing semiconductor device |
US7719001B2 (en) | 2006-06-28 | 2010-05-18 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device with metal oxides and an organic compound |
WO2008041716A1 (en) | 2006-10-04 | 2008-04-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101441348B1 (en) | 2006-10-24 | 2014-09-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device including storage device and method for driving the same |
KR101416876B1 (en) | 2006-11-17 | 2014-07-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device and method for manufacturing the same |
US7988057B2 (en) | 2006-11-28 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and semiconductor device |
US7994607B2 (en) | 2007-02-02 | 2011-08-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US8283724B2 (en) | 2007-02-26 | 2012-10-09 | Semiconductor Energy Laboratory Co., Ltd. | Memory element and semiconductor device, and method for manufacturing the same |
JP5525694B2 (en) | 2007-03-14 | 2014-06-18 | 株式会社半導体エネルギー研究所 | Semiconductor device and manufacturing method of semiconductor device |
KR101234598B1 (en) * | 2011-02-28 | 2013-02-19 | 한국전자통신연구원 | Read/write apparatus and method of rom cell using organic thin film transistor |
KR101361690B1 (en) * | 2011-07-26 | 2014-02-12 | 광주과학기술원 | Switching device and resistance variable memory device using the same |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3170101B2 (en) * | 1993-04-15 | 2001-05-28 | 株式会社東芝 | Semiconductor device and manufacturing method thereof |
JP3559580B2 (en) * | 1993-12-17 | 2004-09-02 | 財団法人国際科学振興財団 | Semiconductor device |
US6385407B1 (en) * | 1998-12-28 | 2002-05-07 | Hitachi Maxell, Ltd. | Accommodating enclosure and management system |
KR20020030272A (en) * | 2000-03-28 | 2002-04-24 | 롤페스 요하네스 게라투스 알베르투스 | Integrated circuit with programmable memory element |
-
2003
- 2003-07-25 JP JP2003201732A patent/JP2004128471A/en not_active Withdrawn
- 2003-08-06 WO PCT/JP2003/010017 patent/WO2004015778A1/en active Application Filing
- 2003-08-06 TW TW092121497A patent/TW200402873A/en unknown
- 2003-08-06 AU AU2003253428A patent/AU2003253428A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2004128471A (en) | 2004-04-22 |
WO2004015778A1 (en) | 2004-02-19 |
TW200402873A (en) | 2004-02-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |