AU2001290215A1 - Near field microwave resistivity microscope including a dielectric resonator - Google Patents

Near field microwave resistivity microscope including a dielectric resonator

Info

Publication number
AU2001290215A1
AU2001290215A1 AU2001290215A AU9021501A AU2001290215A1 AU 2001290215 A1 AU2001290215 A1 AU 2001290215A1 AU 2001290215 A AU2001290215 A AU 2001290215A AU 9021501 A AU9021501 A AU 9021501A AU 2001290215 A1 AU2001290215 A1 AU 2001290215A1
Authority
AU
Australia
Prior art keywords
near field
dielectric resonator
microscope including
field microwave
resistivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001290215A
Inventor
Dan Davidov
Avraham Frenkel
Michael Golosovsky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yissum Research Development Co of Hebrew University of Jerusalem
Original Assignee
Yissum Research Development Co of Hebrew University of Jerusalem
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yissum Research Development Co of Hebrew University of Jerusalem filed Critical Yissum Research Development Co of Hebrew University of Jerusalem
Publication of AU2001290215A1 publication Critical patent/AU2001290215A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
AU2001290215A 2000-09-08 2001-09-06 Near field microwave resistivity microscope including a dielectric resonator Abandoned AU2001290215A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/657,383 US6538454B1 (en) 2000-09-08 2000-09-08 Near field microwave resistivity microscope including a dielectric resonator
US09/657,383 2000-09-08
PCT/IL2001/000844 WO2002021147A2 (en) 2000-09-08 2001-09-06 Near field microwave resistivity microscope including a dielectric resonator

Publications (1)

Publication Number Publication Date
AU2001290215A1 true AU2001290215A1 (en) 2002-03-22

Family

ID=24636930

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001290215A Abandoned AU2001290215A1 (en) 2000-09-08 2001-09-06 Near field microwave resistivity microscope including a dielectric resonator

Country Status (4)

Country Link
US (1) US6538454B1 (en)
AU (1) AU2001290215A1 (en)
IL (1) IL154634A0 (en)
WO (1) WO2002021147A2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3731314B2 (en) * 1997-03-28 2006-01-05 王子製紙株式会社 Orientation measuring device
US6946835B1 (en) * 2002-02-09 2005-09-20 Intematix Corporation Spatially resolved spin resonance detection
US6693426B1 (en) * 2002-02-09 2004-02-17 Intematix Corporation Spatially resolved spin resonance detection
US7148683B2 (en) 2001-10-25 2006-12-12 Intematix Corporation Detection with evanescent wave probe
US6844738B2 (en) * 2001-12-10 2005-01-18 Intel Corporation Coaxial radio frequency adapter and method
US6709392B1 (en) * 2002-10-10 2004-03-23 Koninklijke Philips Electronics N.V. Imaging ultrasound transducer temperature control system and method using feedback
US6605283B1 (en) * 2002-11-01 2003-08-12 The United States Of America As Represented By The Secretary Of Agriculture Nucleotide sequence for the Avian Metapneumovirus (Colorado) attachment glycoprotein gene
US7187186B2 (en) * 2004-03-22 2007-03-06 Kla-Tencor Technologies Corp. Methods and systems for determining one or more properties of a specimen
US7190177B2 (en) * 2004-08-18 2007-03-13 The Curators Of The University Of Missouri Method and apparatus for nondestructive sample inspection
US20060284708A1 (en) * 2005-06-15 2006-12-21 Masions Of Thought, R&D, L.L.C. Dielectrically loaded coaxial resonator
ITTO20080687A1 (en) * 2008-09-19 2010-03-20 Consiglio Naz Delle Ricerche Infm Istituto SYSTEM AND PROCEDURE FOR MEASURING DIELECTRIC PERMETTIVITY AND MAGNETIC PERMEABILITY OF A MATERIAL IN REFLECTION / TRANSMISSION.
US8028588B2 (en) * 2009-09-25 2011-10-04 Rosemount Inc. Flow measurement using near field microwaves
DE102010019525B4 (en) * 2010-05-06 2012-06-21 Tutech Innovation Gmbh Near field sensor for local measurement of dielectric properties
US8933707B1 (en) * 2011-06-06 2015-01-13 Christos Tsironis Waveguide impedance tuners with planarity adjustment for wafer probing
US9194922B2 (en) * 2011-10-18 2015-11-24 Technion Research & Development Foundation Limited System and method for electron spin resonance
US20140262040A1 (en) * 2013-03-15 2014-09-18 Tokyo Electron Limited Method and system using plasma tuning rods for plasma processing
CN105548660B (en) * 2016-01-29 2018-06-22 美的集团武汉制冷设备有限公司 Sampling resistor correcting circuit, current detection circuit and driving circuit
RU2688579C1 (en) * 2018-05-28 2019-05-21 Акционерное общество "Обнинское научно-производственное предприятие "Технология" им. А.Г. Ромашина" Method of measuring specific resistance of materials in ultrahigh frequency band and device for its implementation
CN110531161B (en) * 2019-07-29 2020-10-23 北京航空航天大学 Non-contact type on-line testing device for input impedance of each position of printed circuit board
CN113970670B (en) * 2021-09-29 2022-08-09 西安电子科技大学 Foil strip air-mixed dielectric constant measuring method, system, equipment, medium and terminal

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69609336T2 (en) * 1995-09-11 2001-03-15 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Jerusalem/Jerusalajim NEARFIELD CONDUCTIVITY MICROSCOPE
JP3389819B2 (en) * 1996-06-10 2003-03-24 株式会社村田製作所 Dielectric waveguide resonator
US5821410A (en) 1996-09-20 1998-10-13 Regents Of The University Of California Scanning tip microwave near field microscope
US5900618A (en) 1997-08-26 1999-05-04 University Of Maryland Near-field scanning microwave microscope having a transmission line with an open end
US6209482B1 (en) * 1997-10-01 2001-04-03 Energy Conversion Devices, Inc. Large area microwave plasma apparatus with adaptable applicator
US6100703A (en) * 1998-07-08 2000-08-08 Yissum Research Development Company Of The University Of Jerusalum Polarization-sensitive near-field microwave microscope
US6376836B1 (en) 1999-03-12 2002-04-23 University Of Maryland Disentangling sample topography and physical properties in scanning near-field microwave microscopy
CA2313925A1 (en) * 2000-07-17 2002-01-17 Mitec Telecom Inc. Tunable bandpass filter

Also Published As

Publication number Publication date
WO2002021147A3 (en) 2002-10-24
IL154634A0 (en) 2003-09-17
US6538454B1 (en) 2003-03-25
WO2002021147A2 (en) 2002-03-14

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