AU2001264362A1 - A display apparatus of magnetic flux density using 2-d array magnetic sensor and3-d magnetic fluid - Google Patents
A display apparatus of magnetic flux density using 2-d array magnetic sensor and3-d magnetic fluidInfo
- Publication number
- AU2001264362A1 AU2001264362A1 AU2001264362A AU6436201A AU2001264362A1 AU 2001264362 A1 AU2001264362 A1 AU 2001264362A1 AU 2001264362 A AU2001264362 A AU 2001264362A AU 6436201 A AU6436201 A AU 6436201A AU 2001264362 A1 AU2001264362 A1 AU 2001264362A1
- Authority
- AU
- Australia
- Prior art keywords
- magnetic
- and3
- display apparatus
- flux density
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/10—Plotting field distribution ; Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/74—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR0043130 | 2000-07-26 | ||
KR10-2000-0043130A KR100376892B1 (en) | 2000-07-26 | 2000-07-26 | A display apparatus of magnetic flux dendity using 2D array magnetic sensor and 3D magnetic fluid |
PCT/KR2001/000999 WO2002008745A1 (en) | 2000-07-26 | 2001-06-12 | A display apparatus of magnetic flux density using 2-d array magnetic sensor and 3-d magnetic fluid |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001264362A1 true AU2001264362A1 (en) | 2002-02-05 |
Family
ID=19680105
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001264362A Abandoned AU2001264362A1 (en) | 2000-07-26 | 2001-06-12 | A display apparatus of magnetic flux density using 2-d array magnetic sensor and3-d magnetic fluid |
Country Status (4)
Country | Link |
---|---|
US (1) | US6683452B2 (en) |
KR (1) | KR100376892B1 (en) |
AU (1) | AU2001264362A1 (en) |
WO (1) | WO2002008745A1 (en) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6838874B1 (en) | 2003-01-23 | 2005-01-04 | National Semiconductor Corporation | System for detecting metal content on a semiconductor surface and method of operating the same |
US6847207B1 (en) | 2004-04-15 | 2005-01-25 | Tdw Delaware, Inc. | ID-OD discrimination sensor concept for a magnetic flux leakage inspection tool |
KR100761998B1 (en) * | 2006-08-03 | 2007-09-28 | 조선대학교산학협력단 | Defect detecting apparatus having enhanced detecting ability |
GB2449422B (en) * | 2007-05-18 | 2009-09-16 | Kraft Foods R & D Inc | Improvements in or relating to beverage preparation machines |
US20100188078A1 (en) * | 2009-01-28 | 2010-07-29 | Andrea Foletto | Magnetic sensor with concentrator for increased sensing range |
TWI403752B (en) | 2009-12-14 | 2013-08-01 | Magqu Co Ltd | A device for measuring alternating current magnetic permeability and method of measuring the same |
EP2612105A1 (en) * | 2010-10-14 | 2013-07-10 | Halliburton Energy Services, Inc. | Method for measuring remote field eddy current thickness in multiple tubular configuration |
MX341497B (en) * | 2011-04-12 | 2016-08-22 | Honda Motor Co Ltd | Non-destructive testing device. |
US8629539B2 (en) | 2012-01-16 | 2014-01-14 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having non-conductive die paddle |
US9494660B2 (en) | 2012-03-20 | 2016-11-15 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame |
US9812588B2 (en) | 2012-03-20 | 2017-11-07 | Allegro Microsystems, Llc | Magnetic field sensor integrated circuit with integral ferromagnetic material |
US9666788B2 (en) | 2012-03-20 | 2017-05-30 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame |
US10234513B2 (en) | 2012-03-20 | 2019-03-19 | Allegro Microsystems, Llc | Magnetic field sensor integrated circuit with integral ferromagnetic material |
KR101441750B1 (en) * | 2012-10-19 | 2014-09-17 | 주식회사 포스코아이씨티 | Apparatus for detecting magnetic flex leakage |
US9411025B2 (en) | 2013-04-26 | 2016-08-09 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame and a magnet |
US10060881B2 (en) | 2014-04-16 | 2018-08-28 | Texas Instruments Incorporated | Surface sensing method for corrosion sensing via magnetic modulation |
US10458822B2 (en) | 2016-07-11 | 2019-10-29 | Entegra LLP | Dynamic spacer for a smart pipeline inspection gauge |
US10921391B2 (en) | 2018-08-06 | 2021-02-16 | Allegro Microsystems, Llc | Magnetic field sensor with spacer |
US10991644B2 (en) | 2019-08-22 | 2021-04-27 | Allegro Microsystems, Llc | Integrated circuit package having a low profile |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3532969A (en) * | 1968-02-20 | 1970-10-06 | Nat Lead Co | Method for magnetically measuring wall thickness of metal pipes and plate structures |
JPS5571064A (en) * | 1978-11-22 | 1980-05-28 | Denki Onkyo Co Ltd | Magnetoelectric converter |
US4806863A (en) * | 1986-10-17 | 1989-02-21 | Westinghouse Electric Corp. | Eddy current apparatus including cylindrical coil with flux concentrator for high resolution detection of flaws in conductive objects |
JPH05264685A (en) * | 1992-01-21 | 1993-10-12 | Sony Corp | Magnetic sensor |
JP3166987B2 (en) * | 1992-07-14 | 2001-05-14 | マツダ株式会社 | Current sensor |
US5394083A (en) * | 1992-08-20 | 1995-02-28 | Iowa State University Research Foundation, Inc. | Magnetic imaging system for display of local variations of magnetic properties in magnetic material |
US5729135A (en) * | 1993-07-12 | 1998-03-17 | Sumitomo Electric Industries, Ltd. | Non-destructive testing equipment employing SQUID-type magnetic sensor in magnetic shield container |
US5698977A (en) * | 1993-10-12 | 1997-12-16 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Eddy current method for fatigue testing |
JP3395402B2 (en) * | 1994-10-14 | 2003-04-14 | 住友電気工業株式会社 | Travel detector |
JP3011090U (en) * | 1994-11-11 | 1995-05-16 | 株式会社キョクトー | Spot welding nugget inspection equipment |
US5942894A (en) * | 1995-09-13 | 1999-08-24 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes |
US5847562A (en) * | 1996-05-08 | 1998-12-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm |
DE19628028A1 (en) * | 1996-07-11 | 1998-01-22 | Siemens Ag | Test device and method for non-destructive material testing |
KR19980043462A (en) * | 1996-12-03 | 1998-09-05 | 김광호 | Magnetizing ratio and magnetic flux density measuring device of rotor |
JPH11311617A (en) * | 1998-02-26 | 1999-11-09 | Topy Ind Ltd | Method and apparatus for diagnosis of defects |
US6317048B1 (en) * | 1999-09-16 | 2001-11-13 | Automotive Systems Laboratory, Inc. | Magnetic field sensor |
JP3300810B2 (en) | 1999-11-08 | 2002-07-08 | 岩手大学長 | Non-destructive method for measuring the aging of the strength of ferromagnetic structural materials |
-
2000
- 2000-07-26 KR KR10-2000-0043130A patent/KR100376892B1/en not_active IP Right Cessation
-
2001
- 2001-06-12 WO PCT/KR2001/000999 patent/WO2002008745A1/en active Application Filing
- 2001-06-12 AU AU2001264362A patent/AU2001264362A1/en not_active Abandoned
- 2001-11-30 US US09/997,258 patent/US6683452B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100376892B1 (en) | 2003-03-28 |
US6683452B2 (en) | 2004-01-27 |
KR20020009743A (en) | 2002-02-02 |
US20020101234A1 (en) | 2002-08-01 |
WO2002008745A1 (en) | 2002-01-31 |
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