AT519123T - Contact pin for a testing head having vertical probes with improved scrubbing motion - Google Patents

Contact pin for a testing head having vertical probes with improved scrubbing motion

Info

Publication number
AT519123T
AT519123T AT08425075T AT08425075T AT519123T AT 519123 T AT519123 T AT 519123T AT 08425075 T AT08425075 T AT 08425075T AT 08425075 T AT08425075 T AT 08425075T AT 519123 T AT519123 T AT 519123T
Authority
AT
Austria
Prior art keywords
contact pin
testing head
vertical probes
scrubbing motion
improved scrubbing
Prior art date
Application number
AT08425075T
Other languages
German (de)
Inventor
Roberto Crippa
Guiseppe Crippa
Stefano Lazzari
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Priority to EP20080425075 priority Critical patent/EP2088443B1/en
Publication of AT519123T publication Critical patent/AT519123T/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
AT08425075T 2008-02-08 2008-02-08 Contact pin for a testing head having vertical probes with improved scrubbing motion AT519123T (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP20080425075 EP2088443B1 (en) 2008-02-08 2008-02-08 Contact probe for a testing head having vertical probes with improved scrub movement

Publications (1)

Publication Number Publication Date
AT519123T true AT519123T (en) 2011-08-15

Family

ID=39591189

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08425075T AT519123T (en) 2008-02-08 2008-02-08 Contact pin for a testing head having vertical probes with improved scrubbing motion

Country Status (2)

Country Link
EP (1) EP2088443B1 (en)
AT (1) AT519123T (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20102125A1 (en) * 2010-11-16 2012-05-17 Technoprobe Spa A contact probe for a testing head of electronic devices
ITMI20110615A1 (en) * 2011-04-12 2012-10-13 Technoprobe Spa Measuring head for an electronic device test apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
IT1317517B1 (en) * 2000-05-11 2003-07-09 Technoprobe S R L A testing head for microstructures
US7759949B2 (en) 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US7148709B2 (en) 2004-05-21 2006-12-12 Microprobe, Inc. Freely deflecting knee probe with controlled scrub motion
US7733101B2 (en) 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion

Also Published As

Publication number Publication date
EP2088443A1 (en) 2009-08-12
EP2088443B1 (en) 2011-08-03

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties