AT510222T - Photo diodes self-test - Google Patents

Photo diodes self-test


Publication number
AT510222T AT08763125T AT08763125T AT510222T AT 510222 T AT510222 T AT 510222T AT 08763125 T AT08763125 T AT 08763125T AT 08763125 T AT08763125 T AT 08763125T AT 510222 T AT510222 T AT 510222T
Prior art keywords
photo diodes
Prior art date
Application number
Other languages
German (de)
Gordian Prescher
Thomas Frach
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US94599807P priority Critical
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Priority to PCT/IB2008/052083 priority patent/WO2009001237A1/en
Publication of AT510222T publication Critical patent/AT510222T/en



    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/248Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
AT08763125T 2007-06-25 2008-05-27 Photo diodes self-test AT510222T (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US94599807P true 2007-06-25 2007-06-25
PCT/IB2008/052083 WO2009001237A1 (en) 2007-06-25 2008-05-27 Photodiode self-test

Publications (1)

Publication Number Publication Date
AT510222T true AT510222T (en) 2011-06-15



Family Applications (1)

Application Number Title Priority Date Filing Date
AT08763125T AT510222T (en) 2007-06-25 2008-05-27 Photo diodes self-test

Country Status (5)

Country Link
US (2) US8193815B2 (en)
EP (1) EP2160615B1 (en)
CN (1) CN101688894B (en)
AT (1) AT510222T (en)
WO (1) WO2009001237A1 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8188736B2 (en) * 2007-01-11 2012-05-29 Koninklijke Philips Electronics N.V. PET/MR scanners for simultaneous PET and MR imaging
CN101688894B (en) 2007-06-25 2014-01-29 皇家飞利浦电子股份有限公司 Photodetector, photodetection device and method
WO2009019659A2 (en) * 2007-08-08 2009-02-12 Koninklijke Philips Electronics N.V. Silicon photomultiplier readout circuitry
WO2009019660A2 (en) 2007-08-08 2009-02-12 Koninklijke Philips Electronics N.V. Silicon photomultiplier trigger network
WO2009144607A2 (en) * 2008-05-28 2009-12-03 Koninklijke Philips Electronics, N.V. Geometrical transformations preserving list-mode format
US8476571B2 (en) 2009-12-22 2013-07-02 Siemens Aktiengesellschaft SiPM photosensor with early signal digitization
US8859944B2 (en) * 2010-09-07 2014-10-14 King Abdulaziz City Science And Technology Coordinated in-pixel light detection method and apparatus
US9052497B2 (en) 2011-03-10 2015-06-09 King Abdulaziz City For Science And Technology Computing imaging data using intensity correlation interferometry
WO2012137109A2 (en) 2011-04-05 2012-10-11 Koninklijke Philips Electronics N.V. Detector array with time-to-digital conversion having improved temporal accuracy
US9099214B2 (en) 2011-04-19 2015-08-04 King Abdulaziz City For Science And Technology Controlling microparticles through a light field having controllable intensity and periodicity of maxima thereof
DE102011107645A1 (en) * 2011-07-12 2013-01-17 Leica Microsystems Cms Gmbh Apparatus and method for detecting light
US9176241B2 (en) 2011-08-03 2015-11-03 Koninklijke Philips N.V. Position-sensitive readout modes for digital silicon photomultiplier arrays
KR101964891B1 (en) 2013-01-28 2019-08-07 삼성전자주식회사 Digital Silicon Photomultiplier Detector Cell
GB2510891A (en) * 2013-02-18 2014-08-20 St Microelectronics Res & Dev Apparatus
CN104345257B (en) * 2013-07-25 2017-04-05 凌通科技股份有限公司 The light-emitting diode assembly of built-in fast automatic test circuit
US9854231B2 (en) * 2014-12-18 2017-12-26 General Electric Company Silicon photomultipliers with internal calibration circuitry
US9606245B1 (en) 2015-03-24 2017-03-28 The Research Foundation For The State University Of New York Autonomous gamma, X-ray, and particle detector
CN204789902U (en) * 2015-07-03 2015-11-18 中国科学院物理研究所 System for an electric charge and electric field response for detecting semiconductor device
CN107449516B (en) * 2017-07-06 2019-07-23 东南大学 A kind of the photon counting linear array reading circuit and method of self-adaptive detection mode
GB201719443D0 (en) * 2017-11-23 2018-01-10 Secr Defence Detector and method for detection of airbourne beta particles

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1258740A2 (en) * 1994-12-23 2002-11-20 Digirad Semiconductor gamma-ray camera and medical imaging system
JP3770034B2 (en) 2000-02-29 2006-04-26 横河電機株式会社 Photodiode array module
IT1316793B1 (en) * 2000-03-09 2003-05-12 Milano Politecnico active shutdown and recovery monolithic circuit active perfotodiodi avalanche
WO2004099865A2 (en) 2003-05-02 2004-11-18 Massachusetts Institute Of Technology Digital photon-counting geiger-mode avalanche photodiode solid-state monolithic intensity imaging focal-plane with scalable readout circuitry
US6815973B1 (en) * 2003-06-13 2004-11-09 Xilinx, Inc. Optical testing port and wafer level testing without probe cards
EP1743384B1 (en) * 2004-03-30 2015-08-05 Phoseon Technology, Inc. Led array having array-based led detectors
CN2781392Y (en) 2004-06-15 2006-05-17 飞博创(成都)科技有限公司 Avalanche photodiode temp bias voltage tester
JP4105170B2 (en) * 2005-03-02 2008-06-25 日本テキサス・インスツルメンツ株式会社 Semiconductor device and inspection method thereof
US7626389B2 (en) 2005-04-22 2009-12-01 Koninklijke Philips Electronics N.V. PET/MR scanner with time-of-flight capability
BRPI0610720B1 (en) 2005-04-22 2018-01-16 Koninklijke Philips N. V. Pixel detector for use in conjunction with a cintilator converting a radiation particular for a burst of light, radiation detector, tomography image generation system for postronon emission of trajectory duration (tof-pet), 5 method carried out radiation particle for a burst of light, and radiation detector including a cintilator and circuits?
GB2426575A (en) 2005-05-27 2006-11-29 Sensl Technologies Ltd Photon detector using controlled sequences of reset and discharge of a capacitor to sense photons
CN1696726A (en) 2005-05-27 2005-11-16 韩金龙 Automated testing system and method for light emitting diode
US8488849B2 (en) * 2006-02-22 2013-07-16 Koninklijke Philips Electronics N.V. Image reconstruction using data ordering
CN101688894B (en) 2007-06-25 2014-01-29 皇家飞利浦电子股份有限公司 Photodetector, photodetection device and method
WO2009019660A2 (en) 2007-08-08 2009-02-12 Koninklijke Philips Electronics N.V. Silicon photomultiplier trigger network

Also Published As

Publication number Publication date
US20120129274A1 (en) 2012-05-24
CN101688894A (en) 2010-03-31
EP2160615A1 (en) 2010-03-10
US20100182011A1 (en) 2010-07-22
US8975907B2 (en) 2015-03-10
CN101688894B (en) 2014-01-29
EP2160615B1 (en) 2011-05-18
US8193815B2 (en) 2012-06-05
WO2009001237A1 (en) 2008-12-31

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