AT472090T - Method and device for thickness measurement - Google Patents

Method and device for thickness measurement

Info

Publication number
AT472090T
AT472090T AT07856418T AT07856418T AT472090T AT 472090 T AT472090 T AT 472090T AT 07856418 T AT07856418 T AT 07856418T AT 07856418 T AT07856418 T AT 07856418T AT 472090 T AT472090 T AT 472090T
Authority
AT
Austria
Prior art keywords
thickness measurement
measurement
thickness
Prior art date
Application number
AT07856418T
Other languages
German (de)
Inventor
Peter Schmitt
Guenther Kostka
Original Assignee
Fraunhofer Ges Forschung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE200610059415 priority Critical patent/DE102006059415A1/en
Application filed by Fraunhofer Ges Forschung filed Critical Fraunhofer Ges Forschung
Priority to PCT/EP2007/010613 priority patent/WO2008071338A1/en
Publication of AT472090T publication Critical patent/AT472090T/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/02Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G01B11/0691Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/24Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of wave or particle radiation
    • G01B15/02Measuring arrangements characterised by the use of wave or particle radiation for measuring thickness
    • G01B15/025Measuring arrangements characterised by the use of wave or particle radiation for measuring thickness by measuring absorption
AT07856418T 2006-12-15 2007-12-06 Method and device for thickness measurement AT472090T (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE200610059415 DE102006059415A1 (en) 2006-12-15 2006-12-15 Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation
PCT/EP2007/010613 WO2008071338A1 (en) 2006-12-15 2007-12-06 Method and device for thickness measurement

Publications (1)

Publication Number Publication Date
AT472090T true AT472090T (en) 2010-07-15

Family

ID=39092116

Family Applications (2)

Application Number Title Priority Date Filing Date
AT07856418T AT472090T (en) 2006-12-15 2007-12-06 Method and device for thickness measurement
AT07856417T AT472091T (en) 2006-12-15 2007-12-06 Method and device for thickness measurement

Family Applications After (1)

Application Number Title Priority Date Filing Date
AT07856417T AT472091T (en) 2006-12-15 2007-12-06 Method and device for thickness measurement

Country Status (7)

Country Link
US (2) US8228488B2 (en)
EP (2) EP2100092B1 (en)
JP (2) JP5334861B2 (en)
AT (2) AT472090T (en)
CA (2) CA2672679C (en)
DE (2) DE502007004215D1 (en)
WO (2) WO2008071337A1 (en)

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US9062964B1 (en) * 2012-05-07 2015-06-23 Clearwater Paper Corporation Laser caliper measurement of paper material
US8570537B1 (en) 2012-10-26 2013-10-29 Nissan North America, Inc. Method for bore chamfer measurement
JP6111495B2 (en) * 2012-12-13 2017-04-12 パナソニックIpマネジメント株式会社 Optical measuring device
DE102013111761B4 (en) * 2013-10-25 2018-02-15 Gerhard Schubert Gmbh Method and scanner for non-contact determination of the position and three-dimensional shape of products on a moving surface
US9575008B2 (en) * 2014-02-12 2017-02-21 ASA Corporation Apparatus and method for photographing glass in multiple layers
KR101639882B1 (en) * 2014-10-24 2016-07-25 주식회사 포스코 Apparatus and Method for measuring thickness/composition of metal foil
US10260865B1 (en) * 2016-09-13 2019-04-16 National Technology & Engineering Solutions Of Sandia, Llc High resolution, non-contact removal rate module for serial sectioning
JP2018199534A (en) * 2017-05-25 2018-12-20 株式会社神戸製鋼所 Rubber sheet monitoring device and rubber sheet monitoring method

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Also Published As

Publication number Publication date
JP5334861B2 (en) 2013-11-06
US20100073689A1 (en) 2010-03-25
US8228488B2 (en) 2012-07-24
JP2010512525A (en) 2010-04-22
AT472091T (en) 2010-07-15
EP2089670A1 (en) 2009-08-19
JP5707041B2 (en) 2015-04-22
WO2008071338A1 (en) 2008-06-19
WO2008071337A1 (en) 2008-06-19
EP2089670B1 (en) 2010-06-23
CA2672685A1 (en) 2008-06-19
CA2672679A1 (en) 2008-06-19
EP2100092A1 (en) 2009-09-16
US8064072B2 (en) 2011-11-22
US20100214555A1 (en) 2010-08-26
CA2672685C (en) 2011-07-12
DE502007004226D1 (en) 2010-08-05
JP2010512524A (en) 2010-04-22
DE502007004215D1 (en) 2010-08-05
CA2672679C (en) 2013-10-01
EP2100092B1 (en) 2010-06-23

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