AT426798T - Terahert testing device and testing method - Google Patents

Terahert testing device and testing method

Info

Publication number
AT426798T
AT426798T AT07105745T AT07105745T AT426798T AT 426798 T AT426798 T AT 426798T AT 07105745 T AT07105745 T AT 07105745T AT 07105745 T AT07105745 T AT 07105745T AT 426798 T AT426798 T AT 426798T
Authority
AT
Austria
Prior art keywords
testing
terahert
method
device
testing device
Prior art date
Application number
AT07105745T
Other languages
German (de)
Inventor
Toshihiko Ouchi
Shintaro Kasai
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2006125670A priority Critical patent/JP4709059B2/en
Application filed by Canon Kk filed Critical Canon Kk
Publication of AT426798T publication Critical patent/AT426798T/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
AT07105745T 2006-04-28 2007-04-05 Terahert testing device and testing method AT426798T (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006125670A JP4709059B2 (en) 2006-04-28 2006-04-28 Inspection apparatus and inspection method

Publications (1)

Publication Number Publication Date
AT426798T true AT426798T (en) 2009-04-15

Family

ID=38436785

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07105745T AT426798T (en) 2006-04-28 2007-04-05 Terahert testing device and testing method

Country Status (6)

Country Link
US (2) US7557588B2 (en)
EP (1) EP1850115B1 (en)
JP (1) JP4709059B2 (en)
CN (1) CN100520290C (en)
AT (1) AT426798T (en)
DE (1) DE602007000740D1 (en)

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JP4217646B2 (en) * 2004-03-26 2009-02-04 キヤノン株式会社 Authentication method and authentication apparatus
JP4390147B2 (en) * 2005-03-28 2009-12-24 キヤノン株式会社 Variable frequency oscillator
JP4250603B2 (en) * 2005-03-28 2009-04-08 キヤノン株式会社 Terahertz wave generating element and manufacturing method thereof
JP2006275910A (en) * 2005-03-30 2006-10-12 Canon Inc System and method for position sensing
JP4402026B2 (en) 2005-08-30 2010-01-20 キヤノン株式会社 Sensing device
JP4773839B2 (en) * 2006-02-15 2011-09-14 キヤノン株式会社 Detection device for detecting information of an object
JP4898472B2 (en) 2006-04-11 2012-03-14 キヤノン株式会社 Inspection device
JP5006642B2 (en) * 2006-05-31 2012-08-22 キヤノン株式会社 Terahertz wave oscillator
JP5196750B2 (en) 2006-08-25 2013-05-15 キヤノン株式会社 Oscillating element
JP4873746B2 (en) * 2006-12-21 2012-02-08 キヤノン株式会社 Oscillating element
US7869036B2 (en) * 2007-08-31 2011-01-11 Canon Kabushiki Kaisha Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information
JP5144175B2 (en) * 2007-08-31 2013-02-13 キヤノン株式会社 Inspection apparatus and inspection method using electromagnetic waves
JP5186176B2 (en) * 2007-10-19 2013-04-17 株式会社ジェーシービー Authentication system and portable media for authentication
JP4807707B2 (en) * 2007-11-30 2011-11-02 キヤノン株式会社 Waveform information acquisition device
JP4975001B2 (en) * 2007-12-28 2012-07-11 キヤノン株式会社 Waveform information acquisition apparatus and waveform information acquisition method
JP4834718B2 (en) * 2008-01-29 2011-12-14 キヤノン株式会社 Pulse laser device, terahertz generator, terahertz measuring device, and terahertz tomography device
JP5357531B2 (en) * 2008-02-05 2013-12-04 キヤノン株式会社 Information acquisition apparatus and information acquisition method
JP5178398B2 (en) * 2008-08-27 2013-04-10 キヤノン株式会社 Photoconductive element
JP5665305B2 (en) * 2008-12-25 2015-02-04 キヤノン株式会社 Analysis equipment
JP5612842B2 (en) 2009-09-07 2014-10-22 キヤノン株式会社 Oscillator
JP5654760B2 (en) 2010-03-02 2015-01-14 キヤノン株式会社 Optical element
JP2013167591A (en) * 2012-02-17 2013-08-29 Murata Mfg Co Ltd Material sensing method, and material sensing device
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CN103604985B (en) * 2013-10-25 2016-04-27 西北核技术研究所 A kind of HIGH-POWERED MICROWAVES pulse circular waveguide detecting structure and method
JP6517202B2 (en) * 2013-11-15 2019-05-22 ピコメトリクス、エルエルシー System for determining at least one property of a sheet dielectric sample using terahertz radiation
CN105057231B (en) * 2015-08-21 2017-07-28 爱德森(厦门)电子有限公司 A kind of method of online electromagnetism quality of material separator
CN106353634A (en) * 2016-10-17 2017-01-25 深圳市太赫兹科技创新研究院 Terahertz time-domain reflecting system

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JP4136858B2 (en) 2003-09-12 2008-08-20 キヤノン株式会社 Position detection device and information input device
CN1614391A (en) * 2003-11-03 2005-05-11 中国科学院上海应用物理研究所 Rapid non-loss analyzing method for Chinese Medicinal herb quality discrimination
JP2005157601A (en) 2003-11-25 2005-06-16 Canon Inc Layered object counting device and method using electromagnetic wave
JP4505629B2 (en) * 2004-01-19 2010-07-21 国立大学法人静岡大学 Interface detection apparatus and interface detection method
JP4217646B2 (en) 2004-03-26 2009-02-04 キヤノン株式会社 Authentication method and authentication apparatus
JP4546326B2 (en) 2004-07-30 2010-09-15 キヤノン株式会社 Sensing device
JP4250603B2 (en) 2005-03-28 2009-04-08 キヤノン株式会社 Terahertz wave generating element and manufacturing method thereof
JP4390147B2 (en) 2005-03-28 2009-12-24 キヤノン株式会社 Variable frequency oscillator
JP2006275910A (en) 2005-03-30 2006-10-12 Canon Inc System and method for position sensing
JP4402026B2 (en) 2005-08-30 2010-01-20 キヤノン株式会社 Sensing device
JP4773839B2 (en) 2006-02-15 2011-09-14 キヤノン株式会社 Detection device for detecting information of an object
JP5132146B2 (en) 2006-03-17 2013-01-30 キヤノン株式会社 Analysis method, analyzer, and specimen holding member
JP4481946B2 (en) 2006-03-17 2010-06-16 キヤノン株式会社 Detection element and image forming apparatus
JP4898472B2 (en) 2006-04-11 2012-03-14 キヤノン株式会社 Inspection device
JP5196750B2 (en) 2006-08-25 2013-05-15 キヤノン株式会社 Oscillating element

Also Published As

Publication number Publication date
US7782067B2 (en) 2010-08-24
JP4709059B2 (en) 2011-06-22
CN100520290C (en) 2009-07-29
DE602007000740D1 (en) 2009-05-07
US7557588B2 (en) 2009-07-07
EP1850115B1 (en) 2009-03-25
JP2007298358A (en) 2007-11-15
US20070252604A1 (en) 2007-11-01
US20090201030A1 (en) 2009-08-13
CN101063609A (en) 2007-10-31
EP1850115A1 (en) 2007-10-31

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties