AT418067T - Optical analysis system - Google Patents

Optical analysis system

Info

Publication number
AT418067T
AT418067T AT03772569T AT03772569T AT418067T AT 418067 T AT418067 T AT 418067T AT 03772569 T AT03772569 T AT 03772569T AT 03772569 T AT03772569 T AT 03772569T AT 418067 T AT418067 T AT 418067T
Authority
AT
Austria
Prior art keywords
analysis system
optical analysis
optical
system
Prior art date
Application number
AT03772569T
Other languages
German (de)
Inventor
Robert Hendriks
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to EP02080427 priority Critical
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of AT418067T publication Critical patent/AT418067T/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3196Correlating located peaks in spectrum with reference data, e.g. fingerprint data
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/129Using chemometrical methods
AT03772569T 2002-12-19 2003-11-21 Optical analysis system AT418067T (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP02080427 2002-12-19

Publications (1)

Publication Number Publication Date
AT418067T true AT418067T (en) 2009-01-15

Family

ID=32668784

Family Applications (2)

Application Number Title Priority Date Filing Date
AT03772569T AT418067T (en) 2002-12-19 2003-11-21 Optical analysis system
AT03813697T AT381710T (en) 2002-12-19 2003-12-19 Optical analysis system

Family Applications After (1)

Application Number Title Priority Date Filing Date
AT03813697T AT381710T (en) 2002-12-19 2003-12-19 Optical analysis system

Country Status (8)

Country Link
US (2) US7245374B2 (en)
EP (2) EP1576345B1 (en)
JP (2) JP4633472B2 (en)
CN (2) CN100443867C (en)
AT (2) AT418067T (en)
AU (2) AU2003280199A1 (en)
DE (2) DE60325418D1 (en)
WO (2) WO2004057284A1 (en)

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Also Published As

Publication number Publication date
JP2006510897A (en) 2006-03-30
US7245374B2 (en) 2007-07-17
CN1729389A (en) 2006-02-01
CN100473961C (en) 2009-04-01
JP4633472B2 (en) 2011-02-23
AU2003296833A1 (en) 2004-07-14
WO2004057285A1 (en) 2004-07-08
US20060158734A1 (en) 2006-07-20
CN100443867C (en) 2008-12-17
DE60318249T2 (en) 2008-12-04
US20060176471A1 (en) 2006-08-10
EP1576345B1 (en) 2008-12-17
JP2006510899A (en) 2006-03-30
WO2004057284A1 (en) 2004-07-08
DE60318249D1 (en) 2008-01-31
EP1576346B1 (en) 2007-12-19
AU2003280199A1 (en) 2004-07-14
AT381710T (en) 2008-01-15
DE60325418D1 (en) 2009-01-29
CN1729388A (en) 2006-02-01
US7405825B2 (en) 2008-07-29
EP1576345A1 (en) 2005-09-21
EP1576346A1 (en) 2005-09-21

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