AR070418A1 - Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco - Google Patents
Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de focoInfo
- Publication number
- AR070418A1 AR070418A1 ARP090100485A ARP090100485A AR070418A1 AR 070418 A1 AR070418 A1 AR 070418A1 AR P090100485 A ARP090100485 A AR P090100485A AR P090100485 A ARP090100485 A AR P090100485A AR 070418 A1 AR070418 A1 AR 070418A1
- Authority
- AR
- Argentina
- Prior art keywords
- focus error
- sample
- frequency
- expansion
- magnitude
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/16—Investigating or analyzing materials by the use of thermal means by investigating thermal coefficient of expansion
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Se mide una senal de error de foco resultante de la dilatacion inducida fototérmicamente en una muestra del material bajo análisis. Se dispone un láser como fuente de calentamiento modulada periodicamente que se hace incidir en la muestra y un dispositivo de medicion de error de foco que incide en la superficie que esta siendo calentada. Un dispositivo medidor de error de foco genera una senal representativa del desplazamiento de la superficie del material en direccion perpendicular debido a la dilatacion producida por el calentamiento periodico, la cual es filtrada analogica o digitalmente para discriminar la componente del desplazamiento a la frecuencia en que fue modulado o a alguna otra frecuencia relacionada con ésta, como alguna armonica o suma con otra modulacion. La senal de error de foco, calibrada adecuadamente, da una medida precisa y sensible de la magnitud de la dilatacion. Dicha magnitud y su dependencia con la frecuencia de la modulacion permite determinar propiedades físicas como el coeficiente de dilatacion o el de difusividad térmica, el espesor de la película de recubrimiento o el coeficiente de absorcion de la luz incidente en el haz de calentamiento. Variando la longitud de onda de la radiacion incidente es posible determinar el espectro de absorcion de la muestra aun para partículas de muy pequeno tamano en que la fraccion de energía absorbida es minuscula.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ARP090100485A AR070418A1 (es) | 2009-02-12 | 2009-02-12 | Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco |
BRPI1000503-0A BRPI1000503A2 (pt) | 2009-02-12 | 2010-02-11 | mÉtodo para determinar a dilataÇço tÉrmica de um material e aparelho para determinar a dilataÇço tÉrmica de um material |
US12/704,879 US8622612B2 (en) | 2009-02-12 | 2010-02-12 | Method and apparatus for determining the thermal expansion of a material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ARP090100485A AR070418A1 (es) | 2009-02-12 | 2009-02-12 | Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco |
Publications (1)
Publication Number | Publication Date |
---|---|
AR070418A1 true AR070418A1 (es) | 2010-04-07 |
Family
ID=42138868
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ARP090100485A AR070418A1 (es) | 2009-02-12 | 2009-02-12 | Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco |
Country Status (3)
Country | Link |
---|---|
US (1) | US8622612B2 (es) |
AR (1) | AR070418A1 (es) |
BR (1) | BRPI1000503A2 (es) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012172524A1 (en) | 2011-06-17 | 2012-12-20 | Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) | Method and photothermal apparatus for contactless determination of thermal and optical properties of material |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010061950A1 (de) * | 2010-11-25 | 2012-05-31 | Carl Zeiss Smt Gmbh | Verfahren sowie Anordnung zum Bestimmen des Erwärmungszustandes eines Spiegels in einem optischen System |
US8992076B2 (en) | 2010-12-15 | 2015-03-31 | Waters Gmbh | Dilatometer for measuring metallic samples |
DE102011051561A1 (de) * | 2011-07-05 | 2013-01-10 | BÄHR-Thermoanalyse GmbH | Dilatometer zur Messung von metallischen Proben |
FR2980846B1 (fr) * | 2011-10-03 | 2014-05-30 | Commissariat Energie Atomique | Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant |
WO2014094882A1 (en) * | 2012-12-21 | 2014-06-26 | European Space Agency | Additive manufacturing method using focused light heating source |
FR3007831B1 (fr) * | 2013-07-01 | 2015-06-19 | Enovasense | Procede de mesure de l'epaisseur d'une couche d'un materiau, procede de galvanisation et dispositif de mesure associes |
US9939396B2 (en) * | 2015-01-30 | 2018-04-10 | Netzsch-Gerätebau GmbH | 3D diffusivity |
RU2610550C1 (ru) * | 2015-09-14 | 2017-02-13 | Шлюмберже Текнолоджи Б.В. | Способ определения температурного коэффициента линейного расширения материала и устройство для его осуществления |
WO2018175799A1 (en) | 2017-03-24 | 2018-09-27 | Corning Incorporated | Systems and methods for measuring the temperature of glass during tube conversion |
CN110057313A (zh) * | 2019-03-21 | 2019-07-26 | 天津大学 | 一种自动激光聚焦形貌测量系统 |
CN112881459B (zh) * | 2021-01-12 | 2021-10-26 | 清华大学 | 薄膜材料热膨胀系数的测试装置 |
CN113267526B (zh) * | 2021-05-13 | 2024-04-02 | 今化科技(武汉)有限公司 | 一种硅烷交联聚乙烯电缆料的热收缩性能测试方法 |
CN115561554B (zh) * | 2022-10-17 | 2023-07-14 | 中国空气动力研究与发展中心超高速空气动力研究所 | 基于聚光灯加热的热透波材料电性能的测试装置及方法 |
Family Cites Families (23)
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FI64465C (fi) * | 1982-03-15 | 1983-11-10 | Mauri Luukkala | Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer |
US4679946A (en) * | 1984-05-21 | 1987-07-14 | Therma-Wave, Inc. | Evaluating both thickness and compositional variables in a thin film sample |
US4989980A (en) * | 1989-03-02 | 1991-02-05 | Honeywell Inc. | Method and apparatus for measuring coefficient of thermal expansion |
US5479261A (en) * | 1991-05-29 | 1995-12-26 | Honeywell Inc. | Readout system for dilatometers |
US5645351A (en) * | 1992-05-20 | 1997-07-08 | Hitachi, Ltd. | Temperature measuring method using thermal expansion and an apparatus for carrying out the same |
JP3318795B2 (ja) * | 1993-10-08 | 2002-08-26 | ソニー株式会社 | 変位検出装置 |
CA2126481C (en) * | 1994-06-22 | 2001-03-27 | Andreas Mandelis | Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids |
US5991102A (en) * | 1994-11-25 | 1999-11-23 | Asahi Kogaku Kogyo Kabushiki Kaisha | Beam protecting device |
US6549271B2 (en) * | 1997-01-28 | 2003-04-15 | Nikon Corporation | Exposure apparatus and method |
US5936717A (en) * | 1997-05-06 | 1999-08-10 | Agfa Corporation | Thermal compensation focus adjustment |
DE10013172C2 (de) * | 2000-03-17 | 2002-05-16 | Wagner Internat Ag Altstaetten | Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung |
US20020011852A1 (en) * | 2000-03-21 | 2002-01-31 | Andreas Mandelis | Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials |
US6958967B2 (en) * | 2000-11-17 | 2005-10-25 | Matsushita Electric Industrial Co., Ltd. | Holographic optical information recording/reproducing device |
US20020094580A1 (en) * | 2001-01-16 | 2002-07-18 | Jorgenson James W. | Photothermal absorbance detection apparatus and method of using same |
US20040212802A1 (en) * | 2001-02-20 | 2004-10-28 | Case Steven K. | Optical device with alignment compensation |
US6917039B2 (en) * | 2002-02-13 | 2005-07-12 | Therma-Wave, Inc. | Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system |
EP1511022A4 (en) * | 2002-05-31 | 2008-12-24 | Panasonic Corp | LENS DISTRIBUTION MECHANISM, OPTICAL HEADSET AND OPTICAL INFORMATION PROCESSOR |
US6965434B2 (en) * | 2002-09-13 | 2005-11-15 | Centre National De La Recherche Scientifiques (C.N.R.S.) | Method and device for photothermal imaging tiny metal particles immersed in a given medium |
US6756591B1 (en) * | 2003-03-14 | 2004-06-29 | Centre National De La Recherche | Method and device for photothermal imaging tiny particles immersed in a given medium |
US7075058B2 (en) * | 2003-03-28 | 2006-07-11 | The United States Of America As Represented By The United States Department Of Energy | Photothermal imaging scanning microscopy |
US6865034B1 (en) * | 2003-04-01 | 2005-03-08 | Bae Systems Information And Electronic Systems Integration Inc. | Method and apparatus for eliminating alignment error in an optical system |
US7529043B2 (en) * | 2003-07-08 | 2009-05-05 | Panasonic Corporation | Beam shaping optical device, optical head, and optical information medium drive unit |
US8674257B2 (en) * | 2008-02-11 | 2014-03-18 | Applied Materials, Inc. | Automatic focus and emissivity measurements for a substrate system |
-
2009
- 2009-02-12 AR ARP090100485A patent/AR070418A1/es not_active Application Discontinuation
-
2010
- 2010-02-11 BR BRPI1000503-0A patent/BRPI1000503A2/pt not_active IP Right Cessation
- 2010-02-12 US US12/704,879 patent/US8622612B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012172524A1 (en) | 2011-06-17 | 2012-12-20 | Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) | Method and photothermal apparatus for contactless determination of thermal and optical properties of material |
Also Published As
Publication number | Publication date |
---|---|
BRPI1000503A2 (pt) | 2011-07-26 |
US8622612B2 (en) | 2014-01-07 |
US20100208242A1 (en) | 2010-08-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant, registration | ||
FD | Application declared void or lapsed, e.g., due to non-payment of fee |